Module test board

Abstract

The utility model discloses a module test board suitable for a temperature control alarm module, and relates to the technical field of low-voltage circuit breaker detection equipment, and the module test board comprises a test board housing, a push clamp assembly, a sliding mechanism, a display screen, an interaction device and a test circuit. The sliding mechanism is provided with a front-back structural member installed in front of and behind the multi-station installation position, a plurality of groups of probes with the same number as the stations are installed on the face, facing the to-be-tested product, of the front-back structural member, and the sliding mechanism controls front-back movement through the push clamp assembly so that the probes can make contact with pins of the to-be-tested product. The problem that in the prior art, there is no effective method for efficiently detecting the temperature control alarm module on a large scale is solved, and the beneficial effects of improving efficiency, reducing labor intensity and improving quality stability are achieved.

Description

Technical Field

[0001] This application relates to the technical field of low-voltage circuit breaker testing equipment, specifically a module test bench suitable for temperature control alarm modules. Background Technology

[0002] Low-voltage circuit breaker modules typically include a temperature alarm module, which requires testing of all functions before leaving the factory. Current technology mostly relies on manual testing, where the wires at both ends are manually connected using plug-in terminals, similar to inserting a plug into a socket. However, when the alarm module has many pins, manual connection is time-consuming and poses quality risks; it cannot meet the requirements for large-scale testing. Summary of the Invention

[0003] To address the shortcomings of existing technologies, this application provides a module test bench suitable for temperature control alarm modules, thereby solving the problem that existing technologies lack an effective method for large-scale, high-efficiency testing of temperature control alarm modules.

[0004] To achieve the above objectives, this application provides the following technical solution:

[0005] A modular test bench includes an electrical control component and a structural component. The structural component includes a test bench housing, a pusher assembly, and a sliding mechanism. The electrical control component includes a display screen, an interactive device, and a test circuit. The test bench housing has multiple mounting positions, a display screen, and an interactive device on its surface. The mounting positions are parallel to each other, with more than two positions, and are secured using a front-to-back guiding device to place the product to be tested. The sliding mechanism has front and rear structural members mounted before and after the mounting positions. Several sets of probes, the same number as the number of mounting positions, are mounted on the front and rear surfaces of the front and rear structural members facing the product to be tested. The number and position of each set of probes correspond to the front and rear pins of each product to be tested. The distance between the probes of the front and rear structural members of the sliding mechanism is greater than the front-to-back length of the product to be tested. The front structural member is connected to the pusher assembly and slides back and forth under the action of the pusher assembly to ensure effective contact between the front and rear pins of the product to be tested and the front and rear probes of the sliding mechanism. The test circuit is located inside the test bench housing and connects each set of probes. The interactive device controls the start of the test and outputs the results to the display screen.

[0006] Preferably, the guide fixing device uses partitions, and the spacing between the partitions matches the width of the product to be tested.

[0007] Preferably, the sliding mechanism includes a guide shaft support, a guide shaft, a linear bearing, a front probe plate, a rear probe plate, and baffles. Two parallel guide shafts are respectively mounted on two sets of guide shaft supports fixed on the platform and placed one in front of the other. The two baffles are respectively fitted on the two guide shafts to form a front-to-back relationship, with the rear baffle being fixedly fitted and the front baffle being slidably fitted through the linear bearing. The front and rear probe plates are made of insulating material and are respectively mounted on the opposite sides of the two baffles. The probes are mounted on the front and rear probe plates.

[0008] Preferably, the baffle is made of aluminum alloy.

[0009] Preferably, the push clamp assembly includes a push clamp, a push clamp mounting bracket, and a floating joint. The push clamp mounting bracket is fixed to the center of the front baffle on the table. The push clamp is mounted on the push clamp mounting bracket and connected to the front baffle through the floating joint, so that the front baffle can slide back and forth along the guide shaft under the action of the push clamp.

[0010] Preferably, the number of workstations in the multi-station installation position is five.

[0011] Preferably, the interactive device includes a power button, which is used to control the power supply to the electronic control components.

[0012] Preferably, the interactive device includes a power indicator light, which is used to display the power-on status of the electronic control components.

[0013] Preferably, the interactive device includes a start button and a stop button, wherein the start button is used to start the test and the stop button is used to stop the test.

[0014] Preferably, the interactive device includes a gear selection device for controlling the depth to which the probe extends into the module pin.

[0015] Compared to existing technologies, this solution offers the following advantages: It eliminates the need for manual terminal insertion, allowing direct contact via conductive probes, saving time and effort. The integrated design concentrates the entire testing platform on a single surface, enabling multi-station setup and rapid clamping. Multiple products can be placed and tested simultaneously. The sliding mechanism utilizes a frame structure, ensuring structural stability and smooth operation. All probes are mounted on insulated probe plates, which in turn are mounted on baffles made of aluminum alloy, providing both strength and lightweight design. The push clamps are securely mounted on the mounting bracket, using floating connectors to counteract non-parallelism and ensure smooth sliding. Multiple products can be tested simultaneously, separated by partitions; simply place them in without clamping. This solution has been put into production and is being used on the production line with excellent results and positive employee feedback. The automatic probe connection facilitates multi-station operation. The entire testing process is completed by the equipment, reducing manual operation and intervention, resulting in significantly higher overall efficiency compared to previous solutions. Full automation eliminates the possibility of false tests. In summary, this solution achieves the beneficial effects of improving efficiency, reducing labor intensity, and enhancing quality stability. Attached Figure Description

[0016] Figure 1 This is a perspective view of the entire machine according to an embodiment of this application;

[0017] Figure 2 This is a top view of the overall structure of an embodiment of this application;

[0018] Figure 3 This is a three-dimensional schematic diagram of a sliding mechanism according to an embodiment of this application;

[0019] Figure 4 This is a perspective view of a pusher assembly according to an embodiment of this application;

[0020] Figure 5 This is an exploded view of a pusher assembly according to an embodiment of this application;

[0021] Figure 6 This is a schematic diagram of the operation flow using an embodiment of this application;

[0022] Among them, 1-Module test stand, 11-Test stand housing, 111-Multi-station mounting position, 111a-First station, 111b-Second station, 111c-Third station, 111d-Fourth station, 111e-Fifth station, 112-Baffle, 12-Push clamp assembly, 121-Push clamp, 122-Push clamp mounting bracket, 123-Floating joint, 1231-Floating joint core, 1232-Floating joint seat, 13-Sliding mechanism, 131-Guide shaft support, 132-Guide shaft, 133-Linear bearing, 134-Front probe plate, 135-Rear probe plate, 136-Baffle, 137-Probe, 14-Display screen, 15-Interactive device, 151-Power light, 152-Power button, 153-Start button, 154-Stop button, 155-Gear selection device, 2-Product to be tested. Detailed Implementation

[0023] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0024] This embodiment provides a technical solution: In this application, a modular test bench is used to test components including electronic control components and structural components. The structural components include a test bench housing 11, a push clamp assembly 12, and a sliding mechanism 13. The electronic control components include a display screen 14, an interactive device 15, and a test circuit. The test bench housing 11 has a multi-station mounting position 111, a display screen 14, and an interactive device 15 arranged on its surface. The multi-station mounting positions 111 are parallel to each other, with more than two positions, and use a front-to-back guiding and fixing device to place the product 2 to be tested. The sliding mechanism 13 has front and rear structural components installed at the front and rear of the multi-station mounting positions 111. Five sets of probes 137, the same number as the number of workstations, are installed on the surface facing the product under test 2. The number and position of each set of probes 137 correspond to the front and rear pins of each product under test 2. The distance between the probes 137 of the front and rear structural components of the sliding mechanism 13 is greater than the front and rear length of the product under test 2. The front structural component is connected to a push clamp assembly 12 and slides back and forth under the action of the push clamp assembly 12 so that the front and rear pins of the product under test 2 can effectively contact the front and rear probes 137 of the sliding mechanism 13. The test circuit is set in the test bench housing 11 to connect each set of probes 137 and controls the start of the test through the interactive device 15 to output the results to the display screen 14 for display.

[0025] The guide fixing device uses partitions 112, and the spacing between the partitions 112 matches the width of the product 2 to be tested. The guide fixing device can also use structures such as sliding bottom grooves set at the front and rear, and is not limited to this partition scheme.

[0026] In this embodiment, the sliding mechanism 13 includes a guide shaft support 131, a guide shaft 132, a linear bearing 133, a front probe plate 134, a rear probe plate 135, and baffles 136. Two parallel guide shafts 132 are respectively mounted on two sets of guide shaft supports 131 fixed to the platform and placed one in front of the other. Two baffles 136 are respectively fitted onto the two guide shafts 132 on both sides, forming a front-to-back relationship. The rear baffle is fixedly mounted, while the front baffle is slidably mounted via the linear bearing 133. The front probe plate 134 and the rear probe plate 135 are made of insulating material and are respectively mounted on the opposite sides of the two baffles 136. The probe 137 is mounted on the front probe plate 134 and the rear probe plate 135. Besides using guide shafts 132, the sliding mechanism 13 can also use similar mechanisms such as guide clamps on both sides, all of which can achieve the same functional requirements.

[0027] In this embodiment, the baffle 136 is made of aluminum alloy, which can ensure the strength and weight requirements. Other suitable materials, such as carbon fiber, can also be used.

[0028] In this embodiment, the push clamp assembly 12 includes a push clamp 121, a push clamp mounting bracket 122, and a floating joint 123. The push clamp mounting bracket 122 is fixed to the center of the front baffle 136 on the table. The push clamp 121 is mounted on the push clamp mounting bracket 122 and connected to the front baffle 136 through the floating joint 123, so that the front baffle 136 can slide back and forth along the guide shaft 132 under the action of the push clamp 121. The push clamp 121 has a push rod at the front and a push-pull clamping clamp in the middle and rear. The push clamp 121 is fixed to both ends of the push rod hole of the push clamp mounting bracket 122 by nuts at the base of the rod. The floating joint 123 includes a floating joint core 1231 and a floating joint seat 1232. The floating joint seat 1232 is fixed to a front baffle 136 by fasteners. The floating joint seat 1232 may have a hemispherical groove in the middle, which, in conjunction with the hemispherical feature of the head of the floating joint core 1231, can cope with the situation where the parallelism between the push rod of the push clamp 121 and the guide shaft 132 is not high. In addition to the manual mechanical method in this embodiment, the push clamp assembly 12 can also use a semi-automatic or automatic push-pull method, such as using a motor to drive a lead screw.

[0029] In this embodiment, the multi-station installation position 111 has five workstations, corresponding to the first workstation 111a, the second workstation 111b, the third workstation 111c, the fourth workstation 111d, and the fifth workstation 111e. These workstations can be distinguished by silkscreen markings on the back of the multi-station installation position 111. The number of workstations can be adjusted according to actual needs.

[0030] In this embodiment, the interactive device 15 includes a power indicator 151, a power button 152, a start button 153, a stop button 154, and a gear selection device 155. The power button 152 is used to control the power supply of the electronic control component. The power indicator 151 is used to display the power supply status of the electronic control component. The start button 153 is used to start the test. After the test is started, the test circuit can output the test results to the display screen 14. The stop button 154 is used to stop the test. The interactive device 15 also includes a gear selection device 155, which is used to control the depth of the probe 137 inserted into the module pin.

[0031] In addition to the above-described embodiments, the interactive device 15 can also be implemented using other methods, such as touch screen control, or integrated into the display screen 14 for functional integration.

[0032] In this embodiment, when using the module test bench, after the equipment is ready, five products to be tested 2 (temperature control alarm modules) are taken out and placed on the multi-station mounting position 111. Pushing the push clamp 121 moves the front probe plate 134. The probes 137 on the front probe plate 134 contact the products to be tested 2 and move forward together with them, until they contact the probes 137 on the rear probe plate 135 and maintain a certain amount of compression. At this point, the push clamp 121 self-locks, and the equipment automatically starts testing. The test results are displayed on the display screen 14 on the right side of the multi-station mounting position 111. The entire testing process is completed by the equipment, improving efficiency, reducing labor intensity, and ensuring stable quality.

[0033] The module testing station 1 provided in this solution is not limited to the testing of temperature control alarm modules. It can also be extended to the testing of other similar products and controllers that come into contact with the module. The corresponding equivalent replacements or changes made according to this solution can be regarded as being covered within the protection scope required by this application.

[0034] The above description is only a preferred embodiment of the present solution, but the scope of protection claimed by the present solution is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in this application, based on the technical solution and inventive concept of this application, should be included within the scope of protection of this application.

Claims

1. A modular test bench, comprising an electrical control component and a structural component, characterized in that: The structural components include a test bench housing (11), a push clamp assembly (12), and a sliding mechanism (13). The electronic control components include a display screen (14), an interactive device (15), and a test circuit. The test bench housing (11) has a multi-station mounting position (111), a display screen (14), and an interactive device (15) on its surface. The multi-station mounting positions (111) are parallel to each other and have more than two positions. The product to be tested (2) is placed using a front-to-back guiding and fixing device. The sliding mechanism (13) has front and rear structural members installed at the front and rear of the multi-station mounting positions (111). The front and rear structural members have the same number of positions as the number of positions installed on their surfaces facing the product to be tested (2). The test mechanism (13) has several sets of probes (137), and the number and position of each set of probes (137) correspond to the front and rear pins of each product under test (2). The distance between the probes (137) of the front and rear structural components of the sliding mechanism (13) is greater than the front and rear length of the product under test (2). The front structural component is connected to a push clamp assembly (12) and slides back and forth under the action of the push clamp assembly (12) so that the front and rear pins of the product under test (2) can effectively contact the front and rear probes (137) of the sliding mechanism (13). The test circuit is set in the test bench housing (11) to connect each set of probes (137) and controls the start of the test through the interactive device (15) to output the results to the display screen (14).

2. The module test bench according to claim 1, characterized in that: The guide fixing device uses partitions (112), and the spacing between the partitions (112) matches the width of the product (2) to be tested.

3. The module test bench according to claim 1, characterized in that: The sliding mechanism (13) includes a guide shaft support (131), a guide shaft (132), a linear bearing (133), a front probe plate (134), a rear probe plate (135), and baffles (136). Two parallel guide shafts (132) are respectively mounted on two sets of guide shaft supports (131) fixed on the platform and placed one in front of the other. The two baffles (136) are respectively fitted on the two guide shafts (132) to form a front-to-back relationship. The rear one is fixedly fitted, and the front one is slidably fitted through the linear bearing (133). The front probe plate (134) and the rear probe plate (135) are made of insulating material and are respectively installed on the opposite sides of the two baffles (136). The probe (137) is installed on the front probe plate (134) and the rear probe plate (135).

4. The module test bench according to claim 3, characterized in that: The baffle (136) is made of aluminum alloy.

5. The module test bench according to claim 3, characterized in that: The push clamp assembly (12) includes a push clamp (121), a push clamp mounting bracket (122), and a floating joint (123). The push clamp mounting bracket (122) is fixed to the center of the front baffle (136) on the table. The push clamp (121) is mounted on the push clamp mounting bracket (122) and connected to the front baffle (136) through the floating joint (123), so that the front baffle (136) can slide back and forth along the guide shaft (132) under the action of the push clamp (121).

6. The module test bench according to claim 1, characterized in that: The multi-station installation position (111) has five workstations.

7. The module test bench according to claim 1, characterized in that: The interactive device (15) includes a power button (152), which is used to control the power supply of the electronic control components.

8. The module test bench according to claim 1, characterized in that: The interactive device (15) includes a power light (151) for displaying the power-on status of the electronic control components.

9. The module test bench according to claim 1, characterized in that: The interactive device (15) includes a start button (153) and a stop button (154). The start button (153) is used to start the test, and the stop button (154) is used to stop the test.

10. The module test bench according to claim 1, characterized in that: The interactive device (15) includes a gear selection device (155) for controlling the depth to which the probe (137) extends into the module pin.

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