Electronic circuit on-line detection component device

Abstract

The utility model discloses an electronic circuit on-line detection component device, which comprises a detection platform, a detection probe, a microprocessor and a display module, and further comprises an active test module, the active test module comprises a square wave generating circuit and a signal receiving and detecting circuit, the square wave generating circuit can generate square wave signals, and the signal receiving and detecting circuit can receive and detect the square wave signals. And the signal is input to the to-be-tested component as a test signal. According to the design, a flexible and adjustable signal source is provided, so that the device can generate proper test signals according to test requirements of different components, and the performance of the components can be evaluated more comprehensively and deeply. Through flexible signal source design, efficient noise reduction and signal processing capability, accurate component performance evaluation and integrated detection probe design, the detection precision and reliability of the on-line component detection device for the electronic circuit are remarkably improved.

Description

Technical Field

[0001] This utility model relates to the field of electronic circuit testing technology, and in particular to an online testing device for electronic circuit components. Background Technology

[0002] In the field of electronic engineering, online monitoring of the performance and health status of components in electronic circuits is crucial. This not only ensures the normal operation of electronic equipment but also allows for timely detection and resolution of problems before failures occur, thus preventing greater losses. However, existing online component monitoring devices still need improvement in terms of accuracy and reliability. Especially when processing complex signals such as high-frequency and low-amplitude signals, existing detection circuits are often susceptible to noise interference, leading to inaccurate test results.

[0003] For example, a high-speed signal detection device for electronic circuit boards, authorized by publication number CN 107505567 B, primarily focuses on the detection and processing of high-speed signals. Through a signal acquisition module and a high-speed processing unit, it achieves real-time capture and analysis of high-speed signals on electronic circuit boards. However, regarding the performance testing of electronic components themselves, since some components only exhibit their true performance characteristics under signal excitation, and this device cannot provide a flexible and adjustable signal source, it limits the comprehensiveness and depth of component performance evaluation. Furthermore, due to the insufficient noise reduction and signal processing capabilities of existing devices, it is difficult to extract useful signal information from complex electronic environments, leading to deviations in the detection results.

[0004] Therefore, this utility model provides a new solution to this problem. Utility Model Content

[0005] In view of the above situation and to overcome the defects of the prior art, the purpose of this utility model is to provide an online testing device for electronic circuit components.

[0006] The technical solution is: an online testing device for electronic circuit components, including a testing platform, a testing probe, a microprocessor, and a display module, and further including an active testing module, wherein the active testing module includes:

[0007] A square wave generating circuit is used to generate a square wave signal and input the square wave signal as a test signal to the component under test.

[0008] The signal receiving and detection circuit includes a coupling noise reduction unit and a root mean square (RMS) detection unit. The coupling noise reduction unit is used to receive the response signal from the device under test and perform noise reduction processing on the response signal in the process. The RMS detection unit is used to convert the output signal of the coupling noise reduction unit into its RMS value and then send it to the microprocessor.

[0009] Preferably, the square wave generating circuit includes an operational amplifier AR1. The inverting input terminal of the operational amplifier AR1 is connected to one end of resistors R1, R2, R3, and capacitor C1, and the cathode of Zener diode DZ1. The other end of resistor R1 is connected to power supply VCC. The other end of resistor R2 and capacitor C1 is grounded to the anode of Zener diode DZ1. The non-inverting input terminal of the operational amplifier AR1 is connected to the adjustment terminal of adjustable rheostat RP1. One end of adjustable rheostat RP1 is connected to one end of resistor R5. The other end of adjustable rheostat RP1 is grounded through resistor R6. The output terminal of the operational amplifier AR1 is connected through resistor R4 to the other end of resistors R3 and R5, one end of bidirectional Zener diode D1, and the signal output terminal of the active test module.

[0010] Preferably, the coupling noise reduction unit includes an optocoupler U1. The anode of the emitter of the optocoupler U1 is connected to the signal receiver of the active test module through a resistor R7. The cathode of the emitter of the optocoupler U1 is grounded. The collector of the receiver of the optocoupler U1 is connected to the power supply VCC. The emitter of the receiver of the optocoupler U1 is connected to the drain of the MOS transistor Q1, the cathode of the Zener diode DZ2, and one end of the resistor R9 and capacitor C2. The gate of the MOS transistor Q1 is connected to the other end of the resistor R9. The source of the MOS transistor Q1 and the anode of the Zener diode DZ2 are grounded through a resistor R10. The other end of the capacitor C2 is grounded.

[0011] Preferably, the root mean square detector unit includes a multiplier, an integrator, and a square root circuit connected in sequence. The input terminal of the multiplier is connected to the output terminal of the coupling noise reduction unit, and the output terminal of the square root circuit is connected to the microprocessor.

[0012] Preferably, the integrator includes an operational amplifier AR2. The inverting input of the operational amplifier AR2 is connected to the output of the multiplier through a resistor R11, and the output of the operational amplifier AR2 is connected to the input of the square root circuit through a parallel resistor R13 and a capacitor C3. The non-inverting input of the operational amplifier AR2 is grounded through a resistor I2.

[0013] Preferably, the detection probe includes:

[0014] A sensor is used to be electrically connected to the device under test (DUT) and to convert the physical parameters of the DUT into electrical signals.

[0015] The signal conditioning circuit is used to amplify and filter the electrical signal, and then send the processed signal to the microprocessor.

[0016] Preferably, the signal conditioning circuit includes:

[0017] The differential amplifier includes an operational amplifier AR3. The inverting input terminal of the operational amplifier AR3 is connected to the first detection terminal of the detection probe through a resistor R14, and is connected to the output terminal of the operational amplifier AR3 through a resistor R17. The non-inverting input terminal of the operational amplifier AR3 is connected to the second detection terminal of the detection probe through a resistor R15, and is grounded through a resistor R16.

[0018] The filter includes capacitors C4 and C5 and resistor R18. One end of capacitor C4 and resistor R18 is connected to the output terminal of operational amplifier AR3, the other end of resistor R18 is connected to one end of capacitor C5 and the microprocessor, and the other end of capacitors C4 and C5 is grounded.

[0019] Preferably, the microprocessor is an MSP430 microcontroller.

[0020] Through the above technical solutions, the beneficial effects of this utility model are as follows:

[0021] 1. This application introduces an active test module, in which a square wave generator circuit can generate a square wave signal, which is then input as a test signal to the component under test. This design provides a flexible and adjustable signal source, enabling the device to generate appropriate test signals according to the testing requirements of different components, thereby providing a more comprehensive and in-depth evaluation of the component's performance;

[0022] 2. The signal receiving and detection circuit adopts a coupling noise reduction unit to achieve electrical isolation of the signal, effectively reducing the impact of external noise and interference on the signal; at the same time, combined with the root mean square detection unit, the root mean square value of the signal is accurately calculated, which significantly improves the signal extraction capability of the device in complex electronic environments and ensures the accuracy and reliability of the detection results.

[0023] 3. The detection probe in the device integrates a sensor and a signal conditioning circuit, which enables accurate acquisition and preprocessing of the physical parameters of the component under test. This not only simplifies the system structure but also reduces errors and uncertainties in the testing process. Attached Figure Description

[0024] Figure 1 This is a system module structure diagram of the present invention;

[0025] Figure 2 This is a schematic diagram of the square wave generating circuit of this utility model;

[0026] Figure 3 This is a schematic diagram of the signal receiving and detection circuit in this utility model;

[0027] Figure 4 This is a block diagram of the detection probe in this utility model;

[0028] Figure 5This is a schematic diagram of the signal conditioning circuit in this utility model. Detailed Implementation

[0029] The foregoing and other technical contents, features and effects of this utility model are described in conjunction with the appendix below. Figure 1 To be continued Figure 5 The detailed description of the embodiments will make this clear. All structural details mentioned in the following embodiments are based on the accompanying drawings.

[0030] Exemplary embodiments of the present invention will now be described with reference to the accompanying drawings.

[0031] An online testing device for electronic circuit components includes a testing platform, a testing probe, a microprocessor, and a display module. The testing platform carries the electronic circuit board to be tested and has an automatic conveying function to ensure smooth movement of the circuit board during the testing process.

[0032] like Figure 1 As shown, this online component testing device also includes an active testing module, specifically comprising:

[0033] A square wave generator circuit is used to generate a square wave signal and input the square wave signal as a test signal to the component under test.

[0034] The signal receiving and detection circuit includes a coupling noise reduction unit and a root mean square (RMS) detection unit. The coupling noise reduction unit is used to receive the response signal from the device under test and to perform noise reduction processing on the response signal in the process. The RMS detection unit is used to convert the output signal of the coupling noise reduction unit into its RMS value and then send it to the microprocessor.

[0035] In the above, such as Figure 2 As shown, the square wave generating circuit includes an operational amplifier AR1. The inverting input terminal of the operational amplifier AR1 is connected to one end of resistors R1, R2, R3, and capacitor C1, and the cathode of Zener diode DZ1. The other end of resistor R1 is connected to the power supply VCC. The other ends of resistor R2 and capacitor C1 are grounded to the anode of Zener diode DZ1. The non-inverting input terminal of the operational amplifier AR1 is connected to the adjustment terminal of adjustable rheostat RP1. One end of adjustable rheostat RP1 is connected to one end of resistor R5. The other end of adjustable rheostat RP1 is grounded through resistor R6. The output terminal of the operational amplifier AR1 is connected to the other ends of resistors R3 and R5, one end of bidirectional Zener diode D1, and the signal output terminal of the active test module through resistor R4.

[0036] In the square wave generator circuit, resistors R1 and R2 form a voltage divider to supply power to the VCC power supply, while Zener diode DZ1 ensures the stability of the power supply voltage. Operational amplifier AR1 and external RC components form an oscillation circuit. Utilizing the charging and discharging characteristics of capacitor C1 and the circuit's feedback mechanism, a stable square wave signal is output. By adjusting the values ​​of the resistors and capacitors, the frequency and duty cycle of the square wave signal can be controlled; simultaneously, by adjusting the resistance of adjustable rheostat RP1, the amplitude of the square wave signal can be changed.

[0037] In signal receiving and detection circuits, such as Figure 3 As shown, the coupling noise reduction unit includes an optocoupler U1. The anode of the emitter of the optocoupler U1 is connected to the signal receiver of the active test module through a resistor R7. The cathode of the emitter of the optocoupler U1 is grounded. The collector of the receiver of the optocoupler U1 is connected to the power supply VCC. The emitter of the receiver of the optocoupler U1 is connected to the drain of the MOSFET Q1, the cathode of the Zener diode DZ2, and one end of the resistor R9 and capacitor C2. The gate of the MOSFET Q1 is connected to the other end of the resistor R9. The source of the MOSFET Q1 and the anode of the Zener diode DZ2 are grounded through a resistor R10. The other end of the capacitor C2 is grounded.

[0038] The optocoupler U1 converts the received electrical signal into an optical signal, and then converts the optical signal back into an electrical signal through an internal photosensitive element. This process achieves electrical isolation of the signal, helping to reduce the transmission of noise and interference. The MOSFET Q1 stabilizes the output signal of the optocoupler U1, while the amplitude stabilization effect of the Zener diode DZ2 and the filtering effect of the capacitor C2 ensure a stable output of the received signal.

[0039] like Figure 3 As shown, the root mean square detector unit includes a multiplier U2, an integrator, and a square root circuit U3 connected in sequence. The input of the multiplier U2 is connected to the output of the coupling noise reduction unit, and the output of the square root circuit U3 is connected to the microprocessor.

[0040] The integrator includes operational amplifier AR2. The inverting input of operational amplifier AR2 is connected to the output of the multiplier through resistor R11, and the output of operational amplifier AR2 and the input of the square root circuit are connected through parallel resistor R13 and capacitor C3. The non-inverting input of operational amplifier AR2 is grounded through resistor 12.

[0041] The workflow of the active test module described above is as follows: First, after the active test module is started, the square wave generator circuit begins to operate. The square wave generator circuit generates a periodic square wave signal, which is then sent to the device under test (DUT) as a test signal. Upon receiving the square wave signal, the DUT generates a corresponding response signal based on its internal characteristics and operating state. This response signal contains important information about the device's performance, such as impedance, gain, and phase. Next, the response signal is sent to the signal receiving and detection circuit for processing. The coupling noise reduction unit utilizes the photoelectric conversion principle to achieve electrical isolation of the signal, effectively reducing the impact of external noise and interference on the signal. After stabilization filtering, the signal's signal-to-noise ratio is improved. The noise-reduced signal then enters the root-mean-square (RMS) detector unit. The signal is first squared using a multiplier, then averaged using an integrator, and finally the RMS value is obtained through a square root circuit. The RMS value calculated by the RMS detector unit is sent to the microprocessor, which evaluates and judges the device's performance based on this value and a preset threshold. If the performance parameters of the component under test exceed the normal range, the microprocessor will issue an alarm or take other corresponding measures to ensure the stable operation of electronic equipment and safe production.

[0042] As another embodiment of this application, such as Figure 4 As shown, the device's detection probe includes:

[0043] A sensor is used to electrically connect to the component under test and convert the physical parameters of the component under test into electrical signals.

[0044] Signal conditioning circuits are used to amplify and filter electrical signals, and then send the processed signals to the microprocessor.

[0045] Among them, such as Figure 5 As shown, the signal conditioning circuit specifically includes:

[0046] The differential amplifier includes operational amplifier AR3. The inverting input of operational amplifier AR3 is connected to the first probe terminal (Sensor-) of the detection probe through resistor R14, and to the output terminal of operational amplifier AR3 through resistor R17. The non-inverting input of operational amplifier AR3 is connected to the second probe terminal (Sensor+) of the detection probe through resistor R15, and grounded through resistor R16. Through its unique circuit structure, the differential amplifier can effectively suppress common-mode noise and interference, while amplifying the differential signal between the two probe terminals.

[0047] The filter includes capacitors C4 and C5 and resistor R18. One end of capacitor C4 and resistor R18 is connected to the output of operational amplifier AR3, and the other end of resistor R18 is connected to one end of capacitor C5 and the microprocessor. The other ends of capacitors C4 and C5 are grounded. The filter adopts a π-type RC filter, which effectively prevents high-frequency noise and interference signals from entering subsequent circuits, ensuring the accuracy and validity of the detection data.

[0048] The specific workflow of the aforementioned detection probe is as follows: First, the sensor in the detection probe is electrically connected to the component under test (DUT) to capture the DUT's physical parameters, such as current, voltage, and temperature. Then, the electrical signal converted by the sensor is sent to a signal conditioning circuit for amplification and filtering to ensure accurate and reliable detection of the DUT's parameters. Finally, the signal is sent to a microprocessor for analysis and evaluation.

[0049] In the specific implementation, the MSP430 microcontroller was selected as the microprocessor. This microcontroller has a built-in A / D (analog-to-digital) conversion function, which can efficiently convert the output data of the active test module and detection probe into digital signals, facilitating subsequent digital signal processing, analysis, and storage. Furthermore, the MSP430 microcontroller provides rich peripheral and communication interfaces, enabling convenient transmission of digitized data to external devices or systems. Through communication interfaces such as UART, SPI, and I2C, the MSP430 can send processed data to a host computer, display module, or other monitoring devices in real time, achieving remote monitoring and data sharing.

[0050] In summary, this application introduces an active test module, in which a square wave generator circuit can generate a square wave signal, which is then input as a test signal to the component under test (DUT). This design provides a flexible and adjustable signal source, enabling the device to generate appropriate test signals according to the testing requirements of different components, thereby providing a more comprehensive and in-depth evaluation of component performance. The signal receiving and detection circuit employs a coupling noise reduction unit to achieve electrical isolation of the signal, effectively reducing the impact of external noise and interference on the signal. Simultaneously, combined with a root mean square (RMS) detector unit, the RMS value of the signal is accurately calculated, significantly improving the device's signal extraction capability in complex electronic environments and ensuring the accuracy and reliability of the test results. Furthermore, the detection probe in the device integrates a sensor and signal conditioning circuit, enabling precise acquisition and preprocessing of the physical parameters of the DUT, which not only simplifies the system structure but also reduces errors and uncertainties during the testing process.

[0051] This application significantly improves the detection accuracy and reliability of online electronic circuit component testing devices through flexible signal source design, efficient noise reduction and signal processing capabilities, accurate component performance evaluation, and integrated detection probe design.

[0052] The above description is a further detailed explanation of the present utility model in conjunction with specific embodiments, and it should not be considered that the specific implementation of the present utility model is limited to this. For those skilled in the art to which the present utility model pertains and related fields, any extensions, operation methods, and data substitutions made based on the technical solution concept of the present utility model should fall within the protection scope of the present utility model.

Claims

1. An electronic circuit on-line detecting component device apparatus, comprising a detecting platform, a detecting probe, a microprocessor and a display module, characterized in that, The active test module further comprises: a square wave generating circuit for generating a square wave signal and inputting the square wave signal as a test signal to the component to be tested; a signal receiving and detecting circuit comprising a coupling noise reduction unit and a square root detecting unit, the coupling noise reduction unit being configured to receive a response signal from the component to be tested and to reduce noise of the response signal in the process, and the square root detecting unit being configured to convert an output signal of the coupling noise reduction unit into a root mean square value and then send the root mean square value into the microprocessor.

2. The device according to claim 1, wherein the device is an electronic circuit on-line detecting device. The square wave generating circuit comprises an operational amplifier AR1, an inverting input terminal of the operational amplifier AR1 being connected with a resistor R1, a resistor R2, a resistor R3, one end of a capacitor C1 and a cathode of a voltage stabilizing diode DZ1, the other end of the resistor R1 being connected with a power supply VCC, the other end of the resistor R2 and the capacitor C1 being grounded with an anode of the voltage stabilizing diode DZ1, a non-inverting input terminal of the operational amplifier AR1 being connected with an adjusting end of an adjustable resistor RP1, one end of the adjustable resistor RP1 being connected with one end of a resistor R5, the other end of the adjustable resistor RP1 being grounded through a resistor R6, and an output terminal of the operational amplifier AR1 being connected with the other end of the resistor R3, the other end of the resistor R5, one end of a bidirectional voltage stabilizing tube D1 and a signal output terminal of the active test module through a resistor R4. ​ 3. The device according to claim 1, wherein the device is an electronic circuit on-line detecting device. The coupling noise reduction unit comprises an optical coupler U1, an anode of an emitting end of the optical coupler U1 being connected with a signal receiving end of the active test module through a resistor R7, a cathode of the emitting end of the optical coupler U1 being grounded, a collector of a receiving end of the optical coupler U1 being connected with the power supply VCC, an emitter of the receiving end of the optical coupler U1 being connected with a drain of a MOS tube Q1, a cathode of a voltage stabilizing diode DZ2 and one end of a resistor R9 and a capacitor C2, the other end of the resistor R9 being connected with a gate of the MOS tube Q1, the source of the MOS tube Q1 and an anode of the voltage stabilizing diode DZ2 being grounded through a resistor R10, and the other end of the capacitor C2 being grounded. ​ 4. The device according to claim 3, wherein the device is an electronic circuit on-line detecting device. The square root detecting unit comprises a multiplier, an integrator and a square root circuit connected in sequence, an input terminal of the multiplier being connected with an output terminal of the coupling noise reduction unit, and an output terminal of the square root circuit being connected with the microprocessor.

5. The device according to claim 4, wherein the device is an electronic circuit on-line detecting device. The integrator comprises an operational amplifier AR2, an inverting input terminal of the operational amplifier AR2 being connected with an output terminal of the multiplier through a resistor R11, and an output terminal of the operational amplifier AR2 and an input terminal of the square root circuit being connected with a capacitor C3 in parallel through a resistor R13, and a non-inverting input terminal of the operational amplifier AR2 being grounded through a resistor R12.

6. The device according to claim 5, wherein the device is an electronic circuit on-line detecting device. The detection probe comprises: a sensor for electrically connecting with the component to be tested and converting a physical parameter of the component to be tested into an electric signal; a signal conditioning circuit for amplifying and filtering the electric signal and sending the processed signal into the microprocessor.

7. The device according to claim 6, wherein the device is an electronic circuit on-line detecting device. The signal conditioning circuit comprises: The differential amplifier comprises an operational amplifier AR3, an inverting input end of the operational amplifier AR3 is connected with a first detecting end of the detecting probe through a resistor R14 and connected with an output end of the operational amplifier AR3 through a resistor R17, a non-inverting input end of the operational amplifier AR3 is connected with a second detecting end of the detecting probe through a resistor R15 and grounded through a resistor R16; The filter comprises a capacitor C4, a capacitor C5 and a resistor R18, one end of the capacitor C4 and the resistor R18 is connected with the output end of the operational amplifier AR3, the other end of the resistor R18 is connected with one end of the capacitor C5 and the microprocessor, the other ends of the capacitor C4 and the capacitor C5 are grounded.

8. The device according to any one of claims 1-7, wherein the device is an on-line detection device for electronic components.

8. The device according to any one of claims 1-7, wherein the device is an on-line detection device for electronic components. The microprocessor is selected from an MSP430 type microcontroller.

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