M.2 32G high-speed testing device

Abstract

The utility model discloses an M.2 32G high-speed testing device, which relates to the technical field of solid state disks, and comprises a base, a shell, a plurality of plastic blocks and a plurality of terminals, the shell is connected to the base, the shell is provided with a slot and a plurality of limiting slots, the plurality of terminals are arranged at intervals and connected to the plastic blocks, one limiting slot at least corresponds to one group of terminals, each group of terminals are arranged side by side, and the plastic blocks are connected with the limiting slots. Each terminal comprises a first abutting section, a first connecting section, a second connecting section, a third connecting section and a second abutting section which are connected in sequence, the first abutting sections abut against the circuit module, the second abutting sections abut against the circuit board, the second connecting sections are connected to the plastic block, the distance between the first connecting sections of every two adjacent terminals in the same group is s1, and the distance between the second connecting sections of every two adjacent terminals in the same group is s2. The distance between the second connecting sections of the two adjacent terminals in the same group is s2, the distance between the third connecting sections of the two adjacent terminals in the same group is s3, s2 is larger than s1, and s2 is larger than s3; according to the technical scheme provided by the utility model, the transmission loss of the terminal is reduced.

Description

Technical Field

[0001] This utility model relates to the technical field of solid-state drives, and in particular to an M.2 32G high-speed testing device. Background Technology

[0002] With the continuous advancement of storage technology, M.2 interface solid-state drives (SSDs) have been widely used in computer systems due to their high performance, miniaturization, and flexibility. To ensure the quality and stability of M.2 drives in production and subsequent applications, comprehensive performance testing is crucial. The test fixture, acting as a bridge between the M.2 drive and the testing equipment, directly impacts the accuracy and efficiency of the testing process due to its well-designed structure.

[0003] However, the design of traditional M.2 test fixtures has some potential problems. In particular, due to the high-speed data transmission requirements of M.2, even slight changes in the gap between terminals may cause signal interference, transmission delay, or even test failure, resulting in significant transmission loss at the terminals. Utility Model Content

[0004] The main objective of this invention is to propose an M.2 32G high-speed testing device, which aims to reduce the transmission loss of the terminals.

[0005] To achieve the above objectives, the M.2 32G high-speed testing device proposed in this utility model includes:

[0006] Base;

[0007] The housing is connected to the base. The housing is provided with a slot and a plurality of limiting slots. The slot is connected to the limiting slots, and the plurality of limiting slots are respectively disposed on opposite sides of the slot wall. The slot is used for the insertion of circuit modules.

[0008] Multiple plastic blocks, all of which are connected to the housing and located within the limiting grooves; and

[0009] Multiple terminals are spaced apart and connected to the plastic block. Each limiting groove corresponds to at least one group of terminals. Each group of terminals is arranged side by side. Each terminal includes a first abutting section, a first connecting section, a second connecting section, a third connecting section, and a second abutting section connected in sequence. The first abutting section abuts against the circuit module, the second abutting section abuts against the circuit board, and the second connecting section is connected to the plastic block. The distance between the first connecting sections of two adjacent terminals in the same group is s1, the distance between the second connecting sections of two adjacent terminals in the same group is s2, and the distance between the third connecting sections of two adjacent terminals in the same group is s3, where s2 > s1 and s2 > s3.

[0010] In one embodiment, the second connecting segment is arranged in a straight line.

[0011] In one embodiment, the first connecting segment and the third connecting segment are arranged in an arc shape.

[0012] In one embodiment, the first abutting segment is arc-shaped; and / or the second abutting segment is arc-shaped.

[0013] In one embodiment, the M.2 32G high-speed testing device further includes a direction identification pin, and the housing is provided with an identification groove, which is connected to the slot, and the direction identification pin is located in the identification groove.

[0014] In one embodiment, the housing is provided with a guide groove, which is located at the opening of the slot.

[0015] In one embodiment, the length of the limiting groove is L1, and the length of the plastic block is L2, where L1 < L2.

[0016] In one embodiment, the housing is provided with heat dissipation holes, which are connected to the limiting groove.

[0017] In one embodiment, the housing is detachably mounted on the base, and the housing and the base together form the limiting groove.

[0018] In one embodiment, the housing is provided with a first mounting hole, and the base is provided with a second mounting hole. The housing is locked to the base through the cooperation of the first mounting hole, the second mounting hole, and screws.

[0019] In this utility model, multiple terminals are spaced apart and connected to a plastic block. Each limiting groove corresponds to at least one set of terminals, and each set of terminals is arranged side by side. At least one set of terminals is provided on both sides of the slot, so that when the circuit module is inserted into the slot, the circuit module is clamped by the two sets of opposing terminals in the limiting groove. The first abutting section of the terminal abuts against the circuit module, and the third abutting section of the terminal abuts against the circuit board inside the M.2 32G high-speed test device, thereby completing the transmission of information. Furthermore, the spacing between the first connecting segments of two adjacent terminals in the same group is s1, the spacing between the second connecting segments of two adjacent terminals in the same group is s2, and the spacing between the third connecting segments of two adjacent terminals in the same group is s3, where s2 > s1 and s2 > s3. Understandably, since the dielectric constant of plastic is higher than that of air, the signal in the second connecting segment will be subject to a stronger electric field shielding effect. This results in a denser distribution of the electric field in the plastic, increasing the interaction between the electric field and the plastic material. This interaction leads to signal energy loss and waveform distortion, thereby increasing the signal transmission loss in the plastic. Therefore, by increasing the spacing between two adjacent second connecting segments, the density of the electric field in the plastic can be reduced, thereby weakening the shielding effect of the plastic on the electric field and reducing the transmission loss of the terminals. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0021] Figure 1 A schematic diagram of an embodiment of the M.2 32G high-speed testing device provided by this utility model;

[0022] Figure 2 for Figure 1 A sectional view;

[0023] Figure 3 for Figure 2 A magnified view of a section at point A in the middle;

[0024] Figure 4 for Figure 1 Schematic diagram of the middle terminal;

[0025] Figure 5 for Figure 1 A schematic diagram of the structure of the circuit removal module;

[0026] Figure 6 for Figure 1 A schematic diagram of the assembly of the middle terminal and the plastic block;

[0027] Figure 7 for Figure 6 Schematic diagram of the structure of the medium-length terminal module;

[0028] Figure 8 for Figure 6 A schematic diagram of the structure of the medium and short terminal module.

[0029] Explanation of icon numbers:

[0030] 10. Base; 20. Housing; 21. Slot; 22. Limiting groove; 23. Guide groove; 24. Heat dissipation hole; 25. First mounting hole; 30. Plastic block; 31. Mounting protrusion; 32. Mounting groove; 4a. Long terminal module; 4b. Short terminal module; 40. Terminal; 41. First abutment section; 42. First connecting section; 43. Second connecting section; 44. Third connecting section; 45. Second abutment section; 50. Circuit board; 60. Direction identification pin.

[0031] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0033] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0034] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or" or "and / or" throughout the text includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0035] Reference Figures 1 to 5 This utility model proposes an M.2 32G high-speed testing device, comprising:

[0036] Base 10;

[0037] The housing 20 is connected to the base 10. The housing 20 is provided with a slot 21 and a plurality of limiting grooves 22. The slot 21 is connected to the limiting grooves 22, and the plurality of limiting grooves 22 are respectively disposed on opposite sides of the slot wall of the slot 21. The slot 21 is used for the insertion of circuit modules.

[0038] Multiple plastic blocks 30, each of which is connected to the housing 20 and located within the limiting groove 22; and

[0039] Multiple terminals 40 are spaced apart and connected to the plastic block 30. Each limiting groove 22 corresponds to at least one group of terminals 40. Each group of terminals 40 is arranged side by side. Each terminal 40 includes a first abutting section 41, a first connecting section 42, a second connecting section 43, a third connecting section 44, and a second abutting section 45 connected in sequence. The first abutting section 41 abuts against the circuit module. The second abutting section 45 abuts against the circuit board 50. The second connecting section 43 is connected to the plastic block 30. The distance between the first connecting sections 42 of two adjacent terminals 40 in the same group is s1. The distance between the second connecting sections 43 of two adjacent terminals 40 in the same group is s2. The distance between the third connecting sections 44 of two adjacent terminals 40 in the same group is s3. s2 > s1, s2 > s3.

[0040] In the technical solution of this utility model, multiple terminals 40 are spaced apart and connected to the plastic block 30. Each limiting groove 22 corresponds to at least one set of terminals 40. Each set of terminals 40 is arranged side by side. At least one set of terminals 40 is provided on both sides of the slot 21. So that when the circuit module is inserted into the slot 21, the circuit module is clamped by the two sets of opposing terminals 40 in the limiting groove 22. The first abutting section 41 of the terminal 40 abuts against the circuit module, and the third abutting section of the terminal 40 abuts against the circuit board 50 inside the M.2 32G high-speed test device, thereby completing the transmission of information. Furthermore, the distance between the first connecting segments 42 of two adjacent terminals 40 in the same group is s1, the distance between the second connecting segments 43 of two adjacent terminals 40 in the same group is s2, and the distance between the third connecting segments 44 of two adjacent terminals 40 in the same group is s3, where s2 > s1 and s2 > s3. Understandably, since the dielectric constant of plastic is higher than that of air, the signal of the second connecting segment 43 will be subject to a stronger electric field shielding effect. This will lead to a denser distribution of the electric field in the plastic, thereby increasing the interaction between the electric field and the plastic material. This interaction will cause signal energy loss and waveform distortion, thus increasing the signal transmission loss in the plastic. Therefore, by increasing the distance between two adjacent second connecting segments 43, the density of the electric field in the plastic can be reduced, thereby weakening the shielding effect of the plastic on the electric field and reducing the transmission loss of the terminal 40. Of course, setting s2 > s1 and s2 > s3 is equivalent to increasing the spacing of the second connection segment 43 between two adjacent terminals 40, thereby reducing the risk of current breakdown of the plastic and improving the safety and reliability of the test device.

[0041] The M.2 32G high-speed testing device in this utility model is mainly used in solid-state drives (SSDs). M.2 is a new interface specification introduced by Intel to replace mSATA, also known as NGFF (Next Generation Form Factor), which is the next generation of storage form factor. The size of M.2 interface SSDs is much smaller than that of traditional interfaces such as SATA3.0 and mSATA, and can even be as small as a fingernail.

[0042] Specifically, the second connecting segment 43 is arranged in a straight line. First, the straight second connecting segment 43 is easy to manufacture, thereby reducing the manufacturing cost of the terminal 40. Second, in the straight second connecting segment 43, the signal can be transmitted stably along the straight direction, reducing signal reflection and loss caused by bending or turning, thereby improving the signal transmission efficiency and ensuring the integrity and stability of the signal.

[0043] Furthermore, the first connecting segment 42 and the third connecting segment 44 are arranged in an arc shape. By setting the first connecting segment 42 and the third connecting segment 44 in an arc shape, a certain deformation force is provided to the first abutting segment 41 and the second abutting segment 45, so that the first abutting segment 41 and the second abutting segment 45 are bent to a certain extent through the first connecting segment 42 and the third connecting segment 44, thereby making the first abutting segment 41 and the second abutting segment 45 fit more tightly and reliably with the circuit module and the circuit board 50.

[0044] In one embodiment, the first abutment segment 41 is arc-shaped; and / or the second abutment segment 45 is arc-shaped. By making the first abutment segment 41 and the second abutment segment 45 arc-shaped, the first abutment segment 41 and the second abutment segment 45 abut against the circuit module and the circuit board 50 more tightly and reliably, thereby improving the stability of the connection between the terminal 40 and the circuit module and the circuit board 50.

[0045] In one embodiment, the M.2 32G high-speed testing device further includes a direction identification pin 60. The housing 20 has an identification groove that communicates with the slot 21, and the direction identification pin 60 is located within the identification groove. The direction identification pin 60 prevents the solid-state drive's circuit module from being inserted backwards when inserted into the slot 21, thus providing a foolproof protection mechanism.

[0046] Furthermore, the housing 20 is provided with a guide groove 23, which is located at the opening of the slot 21. By providing the guide groove 23, it is easier for the solid-state drive to be inserted into the slot 21, reducing the alignment process required during insertion, lowering the difficulty of fixing the hard drive, and thus improving the user experience.

[0047] Specifically, the length of the limiting groove 22 is L1, and the length of the plastic block 30 is L2, where L1 < L2. This increases the length of the plastic block 30. On one hand, increasing the length of the plastic block 30 provides better limiting of the plastic block 30, thereby improving its stability and reliability. On the other hand, increasing the length of the plastic block 30 increases the width of the plastic block 30 located at the second connecting section 43 of the terminals 40 at both ends, thereby increasing the signal transmission loss in the plastic. This reduces the density of the electric field in the plastic, weakening the shielding effect of the plastic on the electric field, and further reducing the transmission loss of the terminals 40. This also reduces the risk of the ends of the plastic block 30 being punctured by the terminals 40.

[0048] In one embodiment, the housing 20 is provided with heat dissipation holes 24, which are connected to the limiting groove 22. By providing heat dissipation holes 24, the internal heat can be easily dissipated during the operation of the testing device, thereby improving the stability and reliability of the testing device. Simultaneously, the heat dissipation holes 24 can also be mold opening holes, i.e., holes used for mold opening during the molding process of the housing 20.

[0049] In one embodiment, the housing 20 is detachably mounted on the base 10, and the housing 20 and the base 10 together form the limiting groove 22. By forming the limiting groove 22 by the base 10 and the housing 20, the terminal 40 and the plastic block 30 can be installed into the limiting groove 22 before the base 10 is installed, which facilitates the production and manufacturing of the testing device.

[0050] Specifically, the housing 20 is provided with a first mounting hole 25, and the base 10 is provided with a second mounting hole. The housing 20 is locked to the base 10 through the cooperation of the first mounting hole 25, the second mounting hole, and screws. The locking method of the first mounting hole 25, the second mounting hole, and screws is simple, reliable, stable, and low in cost.

[0051] In one embodiment, the M.2 32G high-speed testing device further includes a long terminal module 4a and a short terminal module 4b. The long terminal module 4a and the short terminal module 4b respectively abut against the corresponding circuit modules on the solid-state drive (SSD) to test the corresponding modules of the SSD. The long terminal module 4a indicates that more terminals 40 are mounted on the plastic block 30, while the short terminal module 4b indicates that fewer terminals 40 are mounted on the plastic block 30. Further, the plastic block 30 is provided with mounting protrusions 31 and mounting grooves 32, wherein a set of long terminal modules 4a and a set of short terminal modules 4b... Each sub-module 4b includes two plastic blocks 30 and multiple terminals 40. The two opposing plastic blocks 30 are quickly installed by inserting and connecting them through mounting protrusions 31 and mounting grooves 32. Since the plastic blocks 30 are made of plastic, the two opposing plastic blocks 30 can be interference-fitted through mounting protrusions 31 and mounting grooves 32, resulting in a high connection strength between the two opposing plastic blocks 30. This improves the stability of the long terminal module 4a and the short terminal module 4b, thereby improving the installation efficiency of the long terminal module 4a and the short terminal module 4b.

[0052] The above description is merely an exemplary embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural transformations made based on the technical concept of the present utility model and the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. A high-speed M.2 32G testing device, characterized in that, include: Base; The housing is connected to the base. The housing is provided with a slot and a plurality of limiting slots. The slot is connected to the limiting slots, and the plurality of limiting slots are respectively disposed on opposite sides of the slot wall. The slot is used for the insertion of circuit modules. Multiple plastic blocks are connected to the housing and located within the limiting grooves. as well as Multiple terminals are spaced apart and connected to the plastic block. Each limiting groove corresponds to at least one group of terminals. Each group of terminals is arranged side by side. Each terminal includes a first abutting section, a first connecting section, a second connecting section, a third connecting section, and a second abutting section connected in sequence. The first abutting section abuts against the circuit module, the second abutting section abuts against the circuit board, and the second connecting section is connected to the plastic block. The distance between the first connecting sections of two adjacent terminals in the same group is s1, the distance between the second connecting sections of two adjacent terminals in the same group is s2, and the distance between the third connecting sections of two adjacent terminals in the same group is s3, where s2 > s1 and s2 > s3.

2. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The second connecting segment is arranged in a straight line.

3. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The first connecting segment and the third connecting segment are arranged in an arc shape.

4. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The first abutment section is arc-shaped; and / or the second abutment section is arc-shaped.

5. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The M.232G high-speed testing device also includes a direction recognition pin. The housing is provided with a recognition groove, which is connected to the slot. The direction recognition pin is located in the recognition groove.

6. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The housing is provided with a guide groove, which is located at the opening of the slot.

7. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The length of the limiting groove is L1, and the length of the plastic block is L2, where L1 < L2.

8. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The housing is provided with heat dissipation holes, which are connected to the limiting groove.

9. The M.2 32G high-speed testing device as described in claim 1, characterized in that, The housing is detachably installed on the base, and the housing and the base together form the limiting groove.

10. The M.2 32G high-speed testing device as described in claim 9, characterized in that, The housing has a first mounting hole, and the base has a second mounting hole. The housing is locked to the base through the cooperation of the first mounting hole, the second mounting hole, and screws.

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