High-frequency testing plug terminal and ddr testing device

Abstract

The utility model discloses a high frequency test plug terminal and ddr test device, relates to the memory test technical field, the high frequency test plug terminal comprises a first abutting section, a second abutting section and a mounting section, the first abutting section abuts against a circuit module, the second abutting section is connected with the first abutting section, and the mounting section is connected with the second abutting section. The second abutting section is used for abutting against a circuit board, the installation section is connected to one end, deviating from the first abutting section, of the second abutting section, the installation section is installed in the limiting groove, the sum of the height of the first abutting section and the height of the second abutting section in the thickness direction of the shell is h1, and h2 is larger than h3. The sum of the height of the second abutting section and the height of the mounting section in the thickness direction of the shell is h2, and h2 is smaller than 1 / 3 h1. According to the technical scheme provided by the utility model, the antenna effect of the high-frequency test plug terminal is reduced, and the high-frequency effect of the high-frequency test plug terminal is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of memory test, especially relates to a high -frequency test plug terminal and ddr's testing arrangement. BACKGROUND

[0002] With the rapid development of information technology, high-frequency electronic products are increasingly widely used, and the performance requirements for their internal components are also increasingly high. However, the transmission of high-frequency signals is often accompanied by more complex electromagnetic interference problems, among which the antenna effect is an important factor affecting the quality of high-frequency signals.

[0003] Chinese patent CN220773976U discloses a kind of DDR5 high-frequency test spring, refer to Figure 5 Since the left segment of the limiting block 16 in the high-frequency spring is arranged to abut against the cavity wall of the thin sheet-shaped cavity, the left segment of the high-frequency spring is improved in elasticity compared with the right segment, so that the upper contact point of the high-frequency spring is tightly abutted against the memory stick to be tested. However, this structure causes the left segment of the high-frequency spring provided with the limiting block 16 to have a relatively high height, thereby resulting in a high antenna effect of the test spring, and further reducing the high-frequency effect of the test spring. SUMMARY

[0004] The main purpose of the utility model is to provide a kind of high-frequency test plug terminal and ddr's testing arrangement, to reduce the antenna effect of high-frequency test plug terminal, improve the high-frequency effect of high-frequency test plug terminal.

[0005] To achieve the above-mentioned purpose, the high-frequency test plug terminal provided by the utility model comprises:

[0006] a first abutment segment, which abuts against the circuit module;

[0007] a second abutment segment, which is connected to the first abutment segment and is used to abut against the circuit board; and

[0008] a mounting segment, which is connected to one end of the second abutment segment away from the first abutment segment, is installed in the limiting groove, and has a height h1 along the thickness direction of the shell, and the second abutment segment and the mounting segment have a height h2 along the thickness direction of the shell, and h2 < 1 / 3 h1.

[0009] In an embodiment, the first abutment segment comprises a straight segment and a first arc-shaped segment connected in sequence, the second abutment segment is arranged in an arc shape, the mounting segment is arranged in a straight line, the straight segment and the mounting segment are both connected to the limiting groove, and the first arc-shaped segment and the second abutment segment abut against the circuit module and the circuit board, respectively.

[0010] In an embodiment, the width of the high-frequency test plug terminal is arranged to decrease from the second abutting section to the first abutting section.

[0011] The utility model discloses a kind of test devices of ddr, comprising:

[0012] Bottom plate;

[0013] Shell, the shell is connected to the bottom plate, at least one slot and multiple limit slots are provided on the shell, the slot is used to be inserted with circuit module, multiple limit slots are separately arranged on the two side walls opposite to the slot;

[0014] Elastic member, the elastic member is connected to the shell;And

[0015] The high-frequency test plug terminal as described above, the high-frequency test plug terminal is elastically abutted with the elastic member.

[0016] In an embodiment, the elastic member is an elastic block, and the elastic block is connected to the first abutting section and the second abutting section.

[0017] In an embodiment, the first abutting section of the high-frequency test plug terminal further includes a second arc-shaped section, the second arc-shaped section is provided with an abutting surface on one side facing the elastic block, and the abutting surface is a plane.

[0018] In an embodiment, the corners of the elastic block are chamfered.

[0019] In an embodiment, the elastic block is adhesively fixed to the high-frequency test plug terminal.

[0020] In an embodiment, two guide grooves are provided on the shell, and the two guide grooves are separately arranged at two ends of the slot and communicate with the slot.

[0021] In an embodiment, the shell includes a first shell and a second shell, the first shell and the second shell enclose the limit slots, and the first shell and the second shell are detachably connected.

[0022] The utility model technical scheme optimizes the size of the high-frequency test plug terminal by h2<1 / 3h1, thereby greatly reducing the height of the installation section of the high-frequency test plug terminal in the technical scheme of the application compared with the spring structure in the prior art, wherein the antenna effect refers to a phenomenon that a conductive body (such as a metal wire) in an integrated circuit receives or transmits electromagnetic waves as an antenna, thereby interfering with the performance of the circuit, therefore, reducing the height of the installation section can reduce the area of the high-frequency test plug terminal as an antenna, thereby weakening the antenna effect, and further improving the high-frequency effect of the high-frequency test plug terminal. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced below, and obviously, the drawings described below are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative labor.

[0024] Figure 1 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank.

[0025] Figure 2 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank. Figure 1 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank.

[0026] Figure 3 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank. Figure 1 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank.

[0027] Figure 4 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank. Figure 3 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank.

[0028] Figure 5 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank. Figure 1 The structure schematic diagram of the test device of the ddr provided by the present application is equipped with a memory bank.

[0029] BRIEF DESCRIPTION OF DRAWINGS

[0030] 10, bottom plate; 20, shell; 21, first shell; 22, second shell; 23, slot; 24, limiting groove; 25, guide groove; 30, circuit board; 40, elastic block; 50, high-frequency test plug terminal; 51, first abutting section; 51a, straight section; 51b, first arc section; 51c, second arc section; 51c1, abutting surface; 52, second abutting section; 53, mounting section; 60, memory.

[0031] The realization, functional characteristics and advantages of the present application will be further described with reference to the embodiments and the drawings. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application, and obviously, the described embodiments are only some embodiments of the present application, and not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the present application.

[0033] It should be noted that if the embodiments of the utility model have the direction indication (such as up, down, left, right, front, back), the direction indication is only used to explain the relative position relationship, movement condition and the like between components in a certain posture, if the certain posture changes, then the direction indication also changes accordingly.

[0034] In addition, if the embodiments of the utility model have the description of "first", "second" and the like, the description of "first", "second" and the like is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first", "second" can be explicitly or implicitly included at least one feature. In addition, "and / or" or "and / or" appearing in the whole text means that the three parallel schemes are included, for example, "A and / or B" includes A scheme, or B scheme, or A and B scheme. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the realization of ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, also not within the protection scope required by the utility model.

[0035] Referring to Figures 1 to 5 The utility model provides a kind of test device of ddr, comprising:

[0036] Bottom plate 10;

[0037] Shell 20, the shell 20 is connected to the bottom plate 10, at least one slot 23 and multiple limit slots 24 are equipped on the shell 20, the slot 23 is used to be inserted with circuit module, multiple limit slots 24 are separately arranged in the two side walls opposite to the slot 23;And

[0038] Elastic member and high-frequency test plug terminal 50, the elastic member is connected to the shell 20, and the elastic member and the high-frequency test plug terminal 50 are elastically abutted, the high-frequency test plug terminal 50 includes first abutment section 51, second abutment section 52 and installation section 53 connected in sequence, the first abutment section 51 is abutted with the circuit module, the second abutment section 52 is used to be abutted with circuit board 30, the installation section 53 is installed in the limit slot 24, the sum of the height of the first abutment section 51 and the second abutment section 52 along the thickness direction of the shell 20 is h1, the sum of the height of the second abutment section 52 and the installation section 53 along the thickness direction of the shell 20 is h2, h2 <1 / 3 h1.

[0039] The utility model discloses technical scheme through h2 1 / 3h1, thereby optimized the size of high frequency test plug terminal 50, thereby compared with the spring piece structure in prior art scheme, the height of high frequency test plug terminal 50 installation section 53 is greatly reduced in the technical scheme of the application, thereby weaken the antenna effect, and then improve the high frequency effect of high frequency test plug terminal 50.Among them, the antenna effect refers to the integrated circuit, and the conductive body (such as metal wire) is received or emits electromagnetic wave as antenna, thereby the phenomenon of interference circuit performance, therefore, reduce the height of installation section 53 and second abutment section 52 can reduce the area of high frequency test plug terminal 50 as antenna, thereby weaken the antenna effect.Meanwhile, the shorter conductive body path can reduce the loss and interference in signal transmission, and it is favorable to improve the integrity and frequency response of signal, thereby reach the high frequency effect of high frequency test plug terminal 50 is improved.

[0040] The utility model discloses technical scheme in the ddr of the test device mainly used in DDR, DDR4, DDR5 and so on product, and DDR is the abbreviation of Double Data Rate Synchronous Dynamic Random Access Memory, namely double data rate synchronous dynamic random access memory 60, is a kind of memory technology widely used in computer and mobile device.

[0041] Specifically, the first abutment section 51 includes a straight line segment 51a and a first arc segment 51b connected in turn, the second abutment section 52 is arranged in an arc shape, the installation section 53 is arranged in a straight line type, the straight line segment 51a and the installation section 53 are connected in the limiting groove 24, the first arc segment 51b and the second abutment section 52 are respectively in abutment with the circuit module and the circuit board 30. Among them, the straight line segment 51a is used for abutting with the groove wall of the limiting groove 24, so it is set as the straight line segment 51a, thereby increasing the limiting abutment surface 51c1 of the first abutment section 51 and the limiting groove 24, and further improving the abutment effect of the first abutment section 51. The first arc segment 51b is mainly used for electrically connecting with the circuit module of the memory to be tested 60, so by setting the first arc segment 51b, the tightness of the first abutment section 51 and the circuit module is increased, and the stability and reliability of the high frequency test plug terminal 50 and the circuit module are improved.

[0042] Further, the width of the high-frequency test plug terminal 50 is arranged to decrease from the second abutting section 52 to the first abutting section 51. The narrower width of the high-frequency test plug terminal 50 thus reduces its area as an antenna, thereby weakening the antenna effect. The antenna effect is a common problem in high-frequency circuits, which can cause signal interference and performance degradation. By reducing the width of the high-frequency test plug terminal 50, the reception and emission of electromagnetic waves can be reduced, thereby reducing the impact of the antenna effect on circuit performance. In high-frequency signal transmission, the narrower width of the high-frequency test plug terminal 50 helps to reduce the loss and interference in signal transmission, because a narrower conductor path can reduce the radiation and scattering of electromagnetic waves, thereby improving the integrity and stability of the signal.

[0043] The utility model technical scheme further provides a test device of ddr, include:

[0044] The bottom plate 10 is arranged on the circuit module and the circuit board 30.

[0045] The shell 20 is connected to the bottom plate 10, and at least one slot 23 and multiple limiting grooves 24 are arranged on the shell 20. The slot 23 is used for plugging with the circuit module, and multiple limiting grooves 24 are arranged on the opposite two side walls of the slot 23.

[0046] The elastic member is connected to the shell 20.

[0047] The high-frequency test plug terminal 50 as described above is in elastic abutment with the elastic member.

[0048] The utility model technical scheme sets up the elastic member, thereby making the first abutting section 51 and the second abutting section 52 of high-frequency test plug terminal 50 respectively abut with the circuit module and the circuit board 30, thereby improving the stability and reliability of the electrical connection of high-frequency test plug terminal 50 with the PCB board and the circuit module. At the same time, by setting the elastic member, the installation section 53 in the technical scheme of the present application does not need to provide elastic force to the first abutting section 51, so that the installation section 53 in the technical scheme of the present application does not need to provide elastic force to the first abutting section 51, thereby the height of the installation section 53 can be reduced, and the high-frequency effect of the high-frequency test plug terminal 50 is improved.

[0049] Specifically, the elastic member is an elastic block 40, and the elastic block 40 is connected with the first abutting section 51 and the second abutting section 52. It can be understood that, by arranging the elastic block 40 so that the elastic block 40 can simultaneously apply pressure to the first abutting section 51 and the second abutting section 52 of the high-frequency test plug terminal 50, the first abutting section 51 and the second abutting section 52 are respectively tightly abutted with the circuit module and the circuit board 30, thereby improving the stability and reliability of the high-frequency test plug terminal 50. At the same time, the structure of the elastic block 40 is simple, easy to install, and low in cost, thereby reducing the structural complexity of the ddr test device and reducing the production cost of the ddr test device. The elastic block 40 can be made of rubber, silicone or the like.

[0050] Further, the first abutting section 51 of the high-frequency test plug terminal further comprises a second arc-shaped section 51c, and the second arc-shaped section 51c is provided with an abutting surface 51c1 on one side of the elastic block 40, and the abutting surface 51c1 is a plane. The second arc-shaped section 51c is arranged to make the first arc-shaped section 51b more tightly abut the circuit module when the elastic member pushes the first abutting section 51. At the same time, the abutting surface 51c1 arranged as a plane on the second arc-shaped section 51c increases the abutting surface 51c1 of the elastic member and the second arc-shaped section 51c, thereby increasing the pushing force of the elastic member on the second arc-shaped section 51c, and making the second arc-shaped section 51c more stable, thereby increasing the stability and reliability of the high-frequency test plug terminal 50.

[0051] In an embodiment, the corners of the elastic block 40 are chamfered. It can be understood that the first abutting section 51 and the second abutting section 52 both have arc-shaped sections, so by chamfering the corners of the elastic block 40, the abutting surface 51c1 of the high-frequency test plug terminal 50 and the elastic member is increased, thereby improving the stability and reliability of the abutting of the elastic member and the high-frequency test plug terminal 50.

[0052] Specifically, the elastic block 40 is adhesively fixed to the high-frequency test plug terminal 50. By adhesively fixing the high-frequency test plug terminal 50 to the elastic block 40, the possibility of deviation of the high-frequency test plug terminal 50 is further reduced, and the stability and tightness of the abutting between the high-frequency test plug terminal 50 and the circuit module and the circuit board 30 are also improved, thereby improving the stability and reliability of the high-frequency test plug terminal 50.

[0053] In an embodiment, the housing 20 is provided with two guide grooves 25, and the two guide grooves 25 are respectively arranged at two ends of the insertion slot 23 and are in communication with the insertion slot 23. By arranging the guide grooves 25, the memory bar is facilitated to be inserted into the insertion slot 23, thereby improving the user experience.

[0054] In an embodiment, the shell 20 comprises a first shell 2120 and a second shell 2220, the first shell 2120 and the second shell 2220 enclose the limiting groove 24, and the first shell 2120 and the second shell 2220 are detachably connected. By arranging the first shell 2120 and the second shell 2220, the installation of the elastic member and the high-frequency test plug terminal 50 is facilitated, and the production efficiency of the ddr test device is improved.

[0055] Specifically, the first shell 2120 and the second shell 2220 are respectively provided with a first mounting hole and a second mounting hole, and the first shell 2120 is detachably mounted on the second shell 2220 through cooperation of the first mounting hole, the second mounting hole and a screw. The mounting mode of the first mounting hole, the second mounting hole and the screw is simple and reliable, has strong stability, and has low cost, thereby improving the stability of the ddr test device and reducing the production cost of the ddr test device.

[0056] The above is only an exemplary embodiment of the present application, and does not limit the patent scope of the present application, and any equivalent structural transformation, direct / indirect application in other related technical fields based on the technical concept of the present application and the content of the present application are included in the patent protection scope of the present application.

Claims

1. A high frequency test plug terminal characterized by, The high-frequency test plug terminal comprises: a first abutting section abutting against a circuit module; a second abutting section connected to the first abutting section and used for abutting against a circuit board; and a mounting section connected to one end of the second abutting section away from the first abutting section, mounted in a limiting groove, and having a height h2 along a thickness direction of a shell, wherein h2 < 1 / 3h1, h1 being a sum of heights of the first abutting section and the second abutting section along the thickness direction of the shell.

2. The high frequency test plug terminal of claim 1, wherein, The first abutting section comprises a straight section and a first arc-shaped section connected in sequence, the second abutting section is arc-shaped, the mounting section is straight, the straight section and the mounting section are both connected in the limiting groove, and the first arc-shaped section and the second abutting section abut against the circuit module and the circuit board, respectively.

3. The high frequency test plug terminal of claim 1, wherein The width of the high-frequency test plug terminal decreases from the second abutting section to the first abutting section.

4. A testing apparatus for a ddr, characterized by, The high-frequency test plug terminal comprises: a bottom plate; a shell connected to the bottom plate, the shell being provided with at least one insertion slot used for inserting a circuit module and a plurality of limiting grooves arranged on opposite side walls of the insertion slot; an elastic member connected to the shell; and the high-frequency test plug terminal according to any one of claims 1 to 3, the high-frequency test plug terminal being elastically abutted against the elastic member. The elastic member is an elastic block connected to the first abutting section and the second abutting section.

5. The test apparatus for ddr as claimed in claim 4, wherein, The first abutting section of the high-frequency test plug terminal further comprises a second arc-shaped section, one side of the second arc-shaped section being provided with an abutting surface which is a plane.

6. The test apparatus for ddr as claimed in claim 5, wherein, The elastic block is chamfered at corners.

7. The test apparatus for ddr as claimed in claim 5, wherein, The elastic block is adhesively fixed to the high-frequency test plug terminal.

8. The test apparatus for ddr as claimed in claim 5, wherein, The shell is provided with two guide grooves arranged at two ends of the insertion slot and in communication with the insertion slot.

9. The test apparatus for ddr as claimed in claim 4, wherein, The shell comprises a first shell and a second shell, the first shell and the second shell enclosing the limiting groove, and the first shell and the second shell being detachably connected.

10. The test apparatus for ddr as claimed in claim 4, wherein, ​

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