Horizontal double-sided module test seat

Abstract

The utility model discloses a horizontal double-sided module test seat, which comprises a base, a test seat is fixed at the upper end of the base, a cover body is mounted on one side of the upper end of the test seat, notches are formed in two sides of the upper end of the test seat, and a plurality of groups of wide-pin probes are mounted on the test seat in an array manner at the part of the notches. The beneficial effects of the utility model lie in that the test seat designed by the utility model can accommodate a wide-surface flat angle of a horizontal double-sided module fully and fix a narrow bending angle safely, so that the wide-surface flat angle and the narrow bending angle can be contacted with the test seat at the same time for testing, and a test probe is optimized; therefore, larger current can pass through the test seat, the production loss of the test seat is reduced, the current passing capacity of the test seat is improved, and the test seat has higher use performance.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing technology, specifically to a horizontal double-sided module test stand. Background Technology

[0002] With the development of the new energy vehicle industry, automakers have put forward various testing requirements for power modules and other electronic components used in these vehicles. Unlike conventional electronic components, these components are usually products customized by manufacturers based on the internal space and structural design of the vehicle and commissioned to electronic component manufacturers. Horizontal double-sided modules are one such product.

[0003] Existing horizontal double-sided modules have pins with both wide flat angles and narrow curved angles, which prevents them from being tested using conventional test sockets or directly soldered onto circuit boards. Therefore, there is an urgent need for a horizontal double-sided module test socket to solve these problems. Utility Model Content

[0004] (a) Technical problems to be solved

[0005] The technical problem to be solved by this utility model is to provide a horizontal double-sided modular test socket that is suitable for test device pin corners of different shapes, ensures safe fixation of the pin corners and good contact with the probes, and optimizes the design of the test socket probes so that the test socket can carry a larger current, reduces the production loss of the test socket, and improves the current carrying capacity of the test socket.

[0006] (II) Technical Solution

[0007] This utility model is achieved through the following technical solution: This utility model proposes a horizontal double-sided module test base, including a base, a test base fixed on the upper end of the base, a cover installed on one side of the upper end of the test base, slots opened on both sides of the upper end of the test base, an array of multiple sets of wide-leg probes installed on the portion of the test base located in the slots, an array of multiple sets of narrow-leg fixing holes opened on one side of the upper end of the test base, and narrow-leg probes installed on one side of the narrow-leg fixing holes, each of the wide-leg probes and the narrow-leg probes consisting of a probe upper part, a probe spring and a probe lower part.

[0008] Furthermore, the cover is hinged to one side of the upper end of the test base, and both the cover and the test base are equipped with latches.

[0009] By adopting the above technical solution, the horizontal double-sided module is placed inside the test seat, the cover is closed, and the horizontal double-sided module is fixed by the latch.

[0010] Furthermore, the slot is formed on the test base, and the wide-legged probe is fixed inside the test base.

[0011] By adopting the above technical solution, the slot can accommodate the wide pins of the horizontal double-sided module, and the wide-pin probe can test the wide pins of the horizontal double-sided module.

[0012] Furthermore, the narrow-leg fixing hole is formed on the test seat, and the narrow-leg fixing hole has an I-shaped structure.

[0013] By adopting the above technical solution, the narrow foot fixing hole can securely fix the narrow curved foot of the horizontal double-sided module.

[0014] Furthermore, the narrow-legged probe is fixed inside the test socket, and the narrow-legged probe and the wide-legged probe have the same structure.

[0015] By adopting the above technical solution, the narrow-leg probe can test the narrow curved legs of the horizontal double-sided module.

[0016] Furthermore, the upper part of the probe and the lower part of the probe are both formed on the narrow-legged probe and the wide-legged probe.

[0017] By adopting the above technical solution, the wide-leg probe and the narrow-leg probe can simultaneously test the wide-face pins and narrow curved pins of the horizontal double-sided module.

[0018] Furthermore, the probe spring sleeve is located between the upper part of the probe and the lower part of the probe, and the probe spring is externally mounted.

[0019] By adopting the above technical solution, the probe spring is used as a structural component of the test probe, rather than a separate compression or conductive component. The purpose is to improve the current carrying capacity of the test socket (when the probe spring is built into the test socket, the diameter is small, which leads to a small spring wire diameter, thus making it unable to withstand the passage of large currents). Furthermore, by dividing the wide-leg probe and the narrow-leg probe into three completely independent parts, the yield rate and maintainability are improved.

[0020] Furthermore, a first heat dissipation block is embedded in the upper end of the cover, and a second heat dissipation block is embedded in the middle of the test seat, with the positions of the first heat dissipation block and the second heat dissipation block corresponding to each other.

[0021] By adopting the above technical solution, the first heat sink and the second heat sink can play a role in heat dissipation of the horizontal double-sided module during the test.

[0022] (III) Beneficial Effects

[0023] Compared with the prior art, this utility model has the following advantages:

[0024] To address the issue that existing horizontal double-sided modules, with their wide-face flat-angle and narrow-face curved-angle pins, cannot be tested using conventional test sockets or directly soldered onto circuit boards, this invention designs a test socket that provides ample space for the wide-face flat-angle pins and securely fixes the narrow-face curved-angle pins. This allows both the wide-face flat-angle and narrow-face curved-angle pins to simultaneously contact and be tested with the test socket. Furthermore, the test probes are optimized to allow the test socket to handle larger currents, reduce production losses, and improve current carrying capacity, resulting in superior performance. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the structure of the horizontal double-sided module test stand described in this utility model;

[0026] Figure 2 This is a top view of the horizontal double-sided module testing process in the horizontal double-sided module test stand described in this utility model;

[0027] Figure 3 This is a schematic diagram of the narrow-legged probe in the horizontal double-sided module test holder of this utility model.

[0028] The annotations in the attached figures are explained as follows:

[0029] 1. Base; 2. Test base; 3. Cover; 4. First heat sink; 5. Second heat sink; 6. Slot; 7. Narrow-leg fixing hole; 8. Narrow-leg probe; 9. Wide-leg probe; 10. Horizontal double-sided module; 11. Red lock; 12. Upper part of probe; 13. Probe spring; 14. Lower part of probe. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0031] like Figures 1-3As shown, the horizontal double-sided module test stand in this embodiment includes a base 1, a test stand 2 fixed to the upper end of the base 1, and a cover 3 installed on one side of the upper end of the test stand 2. A horizontal double-sided module 10 is placed inside the test stand 2, the cover 3 is closed, and the horizontal double-sided module 10 is fixed by a latch 11. The test stand 2 has slots 6 on both sides of its upper end. Multiple sets of wide-leg probes 9 are arrayed on the portion of the test stand 2 located in the slots 6. The slots 6 can accommodate the wide-face pins of the horizontal double-sided module 10, and the wide-leg probes 9 can test the wide-face pins of the horizontal double-sided module 10. Multiple sets of narrow-leg fixing holes 7 are arrayed on one side of the upper end of the test stand 2, and the narrow-leg fixing holes 7 can test the narrow-leg pins of the horizontal double-sided module 10. The narrow curved foot is securely fixed. A narrow-foot probe 8 is installed on one side of the narrow-foot fixing hole 7. The narrow-foot probe 8 can test the narrow curved foot of the horizontal double-sided module 10. Both the wide-foot probe 9 and the narrow-foot probe 8 are composed of a probe upper part 12, a probe spring 13, and a probe lower part 14. The probe spring 13 is used as a structural component of the test probe, rather than a separate compression or conductive component. The purpose is to improve the current carrying capacity of the test base 2. When the probe spring 13 of the test base 2 is built in, the diameter is small, which leads to a small spring wire diameter. Therefore, it cannot withstand the passage of large current. By dividing the wide-foot probe 9 and the narrow-foot probe 8 into three completely independent parts, the yield rate and maintainability are improved.

[0032] like Figures 1-3 As shown, in this embodiment, the cover 3 is hinged to one side of the upper end of the test base 2. Both the cover 3 and the test base 2 are equipped with latches 11. The slot 6 is formed on the test base 2. The wide-leg probe 9 is fixed inside the test base 2. The narrow-leg fixing hole 7 is formed on the test base 2. The narrow-leg fixing hole is an I-shaped structure. The narrow-leg probe 8 is fixed inside the test base 2. The narrow-leg probe 8 and the wide-leg probe 9 have the same structure.

[0033] like Figures 1-3 As shown, in this embodiment, the upper probe 12 and the lower probe 14 are both formed on the narrow-legged probe 8 and the wide-legged probe 9. The probe spring 13 is sleeved between the upper probe 12 and the lower probe 14. The probe spring 13 is externally placed. The upper end of the cover 3 is embedded with a first heat sink 4. The middle part of the test seat 2 is embedded with a second heat sink 5. The positions of the first heat sink 4 and the second heat sink 5 are corresponding. The first heat sink 4 and the second heat sink 5 can play the role of heat dissipation for the horizontal double-sided module 10 during the test.

[0034] The specific implementation process of this embodiment is as follows: In use, open the cover 3 and place the horizontal double-sided module 10 into the test socket 2. At this time, the slot 6 accommodates the wide pins of the horizontal double-sided module 10, and the narrow foot fixing hole 7 securely fixes the narrow curved foot of the horizontal double-sided module 10. Then close the cover 3 and fix the cover 3 with the latch 11. During the test, the narrow foot probe 8 can test the narrow curved foot of the horizontal double-sided module 10, and the wide foot probe 9 can test the wide pins of the horizontal double-sided module 10, so that the wide flat angle and the narrow curved angle can simultaneously contact and test the test socket 2. At the same time, the position of the probe spring 13 can allow the test socket 2 to pass a larger current, reduce the production loss of the test socket 2, improve the current carrying capacity of the test socket 2, and improve the yield and maintainability. The first heat sink 4 and the second heat sink 5 can dissipate heat for the horizontal double-sided module 10 during the test.

[0035] The above description of the disclosed embodiments enables those skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A horizontal double-sided modular test stand, characterized in that: Includes a base (1), a test seat (2) fixed on the upper end of the base (1), a cover (3) installed on one side of the upper end of the test seat (2), slots (6) are opened on both sides of the upper end of the test seat (2), multiple sets of wide-leg probes (9) are arrayed on the part of the test seat (2) located in the slots (6), multiple sets of narrow-leg fixing holes (7) are arrayed on one side of the upper end of the test seat (2), and narrow-leg probes (8) are installed on one side of the narrow-leg fixing holes (7). Both the wide-leg probes (9) and the narrow-leg probes (8) consist of an upper part (12) of the probe, a probe spring (13) and a lower part (14) of the probe.

2. The horizontal double-sided module test stand according to claim 1, characterized in that: The cover (3) is hinged to one side of the upper end of the test seat (2), and both the cover (3) and the test seat (2) are equipped with latches (11).

3. The horizontal double-sided module test stand according to claim 2, characterized in that: The slot (6) is formed on the test base (2), and the wide-leg probe (9) is fixed inside the test base (2).

4. The horizontal double-sided module test stand according to claim 2, characterized in that: The narrow foot fixing hole (7) is formed on the test seat (2), and the narrow foot fixing hole is an I-shaped structure.

5. The horizontal double-sided module test stand according to claim 4, characterized in that: The narrow-legged probe (8) is fixed inside the test seat (2), and the narrow-legged probe (8) and the wide-legged probe (9) have the same structure.

6. The horizontal double-sided module test stand according to claim 5, characterized in that: The upper part (12) and the lower part (14) of the probe are both formed on the narrow-legged probe (8) and the wide-legged probe (9).

7. The horizontal double-sided module test stand according to claim 6, characterized in that: The probe spring (13) is located between the upper part (12) of the probe and the lower part (14) of the probe, and the probe spring (13) is external.

8. The horizontal double-sided module test stand according to claim 1, characterized in that: The upper end of the cover (3) is embedded with a first heat sink (4), and the middle part of the test seat (2) is embedded with a second heat sink (5). The positions of the first heat sink (4) and the second heat sink (5) are corresponding.

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