MOS tube test fixture

Abstract

The utility model relates to an MOS tube test clamp, comprising a pedestal, a lower slot position arranged on the pedestal and used for plugging a short elastic thimble, an upper slot position arranged on the pedestal and used for plugging a long elastic thimble, a positioning hole arranged on the pedestal, a guide pin fixed on the positioning hole, and the other end of the guide pin passing through a small guide hole of an upper seat. The base is provided with a guide post, the guide post is in clearance fit with a large guide hole of the upper seat, the upper seat is provided with a test hole for an MOS tube body to pass through, and the base is provided with a pin jack. Through the arrangement of the base and the upper seat, during testing, the upper seat is pressed down, the MOS tube body penetrates through the testing hole of the upper seat, the upper seat is loosened, at the moment, the short elastic ejector pin and the long elastic ejector pin can automatically clamp the MOS tube, then testing is carried out, after testing is finished, the upper seat is pressed down, the MOS tube is unlocked, and at the moment, the MOS tube can be taken out. According to the novel structure, automatic detection of the MOS tube can be conveniently realized.

Description

Technical Field

[0001] This utility model relates to the field of testing technology for electronic components, and in particular to a MOS transistor test fixture. Background Technology

[0002] Because MOSFETs have complex operating conditions, they need to be tested before use in order to make better selections. The existing testing methods generally involve manually testing each MOSFET one by one using a testing instrument (such as a multi-function voltmeter). In order to facilitate the automatic testing of MOSFETs, a fixture needs to be designed to limit the MOSFETs for testing. Summary of the Invention

[0003] The purpose of this invention is to provide a MOSFET test fixture to solve the problems mentioned in the background art.

[0004] To solve the above-mentioned technical problems, this utility model is achieved through the following technical measures: a MOS transistor test fixture, characterized in that: it includes a base, the base is provided with a lower slot for inserting a short elastic pin, the base is provided with an upper slot for inserting a long elastic pin, the base is provided with a positioning hole, a guide pin is fixed in the positioning hole, the other end of the guide pin passes through a small guide hole in the upper seat, a guide post is provided on the base, the guide post is clearance-fitted with a large guide hole in the upper seat, the upper seat is provided with a test hole for passing through the MOS transistor body, and the base is provided with pin insertion holes.

[0005] Compared with existing technologies, the advantages of this invention are as follows: By setting a base and an upper seat, during testing, pressing down the upper seat allows the MOSFET body to pass through the test hole of the upper seat. Releasing the upper seat allows the short and long elastic pins to automatically clamp the MOSFET for testing. After the test, pressing down the upper seat unlocks the MOSFET, allowing it to be removed. This novel structure facilitates automatic detection of MOSFETs.

[0006] As an improvement to this utility model, there are two positioning holes, diagonally arranged on the base, and two guide posts, also diagonally arranged on the base. The purpose of this design is to provide positioning and guiding devices at the four corners, which makes the relative movement between the upper and lower seats of the entire fixture more stable.

[0007] As an improvement of this utility model, the short elastic pin includes a test pin portion, a first insertion portion integrally extending from the upper part of the test pin portion, a first limiting portion extending from one side of the first insertion portion, and a first elastic portion extending from the other side of the first insertion portion. A first contact portion and a first wedge-shaped portion are provided in front of the first elastic portion, and a first latch is provided between the first limiting portion and the test pin portion. The purpose of this design is as follows: the first insertion portion and the first limiting portion fix the short elastic pin in the lower slot; the first elastic portion and the first contact portion increase the elastic potential energy to achieve better contact; the first wedge-shaped portion overcomes the elastic force of the first elastic portion when the upper part is lowered, pushing open the first contact portion so that the pin of the MOSFET can smoothly enter the pin socket; the first latch forms a lock, further securing the short elastic pin.

[0008] As an improvement of this utility model, the first elastic part has a semi-circular shape. The purpose of choosing this design is that the semi-circular structure can have a certain degree of elasticity.

[0009] As an improvement of this utility model, the lower slot area is provided with a first insertion hole and a first step. The purpose of this design is that the first insertion hole is used to place the test probe, and the first step is used to place the first limiting part, so as to achieve the initial fixation of the short elastic pin.

[0010] As an improvement of this utility model, the upper slot area is provided with a second insertion hole, a second stepped portion, and a third insertion hole. The purpose of this design is that the second insertion hole is used to place the second insertion part, the third insertion hole is used to place the third buckle, and the second stepped portion cooperates with the second limiting portion to fix the long elastic pin.

[0011] As an improvement to this utility model, a third buckle is provided on the long elastic pin. The purpose of this design is to place the third buckle inside the third insertion hole to achieve initial fixation of the long elastic pin. Attached Figure Description

[0012] The accompanying drawings, which form part of this utility model, are used to provide a further understanding of this utility model. The illustrative embodiments of this utility model and their descriptions are used to explain this utility model and do not constitute an improper limitation of this utility model.

[0013] In the attached diagram:

[0014] Figure 1 This is an exploded view of the test fixture described in this utility model.

[0015] Figure 2 This is a perspective view of the base described in this utility model.

[0016] Figure 3 This is a cross-sectional view of the base described in this utility model.

[0017] Figure 4 This is a perspective view of the short elastic ejector pin described in this utility model.

[0018] Figure 5 This is a perspective view of the long elastic ejector pin described in this utility model.

[0019] Figure 6 This is a perspective view of the upper seat described in this utility model.

[0020] Figure 7 This is a schematic diagram of the MOS transistor being inserted and clamped according to this utility model.

[0021] Explanation of reference numerals in the attached drawings: 1. Base; 2. Short elastic ejector pin; 3. Lower slot; 4. Long elastic ejector pin; 5. Upper slot; 6. Positioning hole; 7. Guide pin; 8. Upper seat; 9. Small guide hole; 10. Guide post; 11. Large guide hole; 12. Test hole; 13. Pin socket; 14. Test pin portion; 15. First insertion portion; 16. First limiting portion; 17. First elastic portion; 18. First contact portion; 19. First wedge-shaped portion; 20. First latch; 21. First insertion hole; 22. First step portion; 23. Second insertion hole; 24. Second step portion; 25. Third insertion hole; 26. Third latch; 27. MOSFET; 28. Second latch; 29. ​​Second insertion portion; 30. Second limiting portion; 31. Second elastic portion; 32. Second contact portion; 33. Second wedge-shaped portion. Detailed Implementation

[0022] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0023] Example 1

[0024] Please refer to Figure 1 -7.

[0025] This embodiment provides a MOSFET test fixture, including a base 1. The base 1 has a lower slot 3 for inserting a short elastic pin 2 and an upper slot 5 for inserting a long elastic pin 4. The base 1 has a positioning hole 6, and a guide pin 7 is fixed in the positioning hole 6. The other end of the guide pin 7 passes through a small guide hole 9 of an upper seat 8. The base 1 has a guide post 10, which is clearance-fitted with a large guide hole 11 of the upper seat 8. The upper seat 8 has a test hole 12 for passing through the body of a MOSFET 27. The base 1 has a pin insertion hole 13.

[0026] In the embodiments of this utility model application, please refer to Figure 2There are two positioning holes 6, which are diagonally arranged on the base 1, and two guide posts 10, which are diagonally arranged on the base 1. Positioning and guiding devices are provided at the four corners, which can make the relative movement between the upper seat 8 and the lower seat of the entire fixture more stable.

[0027] In the embodiments of this utility model application, please refer to Figure 4 The short elastic pin 2 includes a test pin 14 (replacing the pin of the MOSFET; measuring the test pin 14 with a multimeter is equivalent to measuring the pin of the MOSFET 27). A first insertion part 15 (inserted into the first insertion hole 21 of the base 1) extends integrally from the test pin 14. A first limiting part 16 (pressing against the first step part 22 of the base 1) extends from one side of the first insertion part 15. A first elastic part 17 extends from the other side of the first insertion part 15. A first contact part 18 (directly contacting the pin of the MOSFET 27) and a first wedge part 19 are provided in front of the first elastic part 17 (when the upper seat 8 is pressed down, the first wedge part 19 can be directly pushed to the left to form elastic potential energy, so that the first contact part 18 presses tightly against the pin of the MOSFET 27 to realize the connection of electrical signals). A first latch 20 is provided between the first limiting part 16 and the test pin 14. The first insertion part 15 and the first limiting part 16 are used to fix the short elastic pin 2 in the lower slot 3. The first elastic part 17 and the first contact part 18 are used to increase the elastic potential energy and achieve better contact. The first wedge part 19 is used to overcome the elastic force of the first elastic part 17 and push open the first contact part 18 when the upper seat 8 is lowered, so that the pin of the MOS transistor 27 can smoothly enter the pin socket 13. The first latch 20 is used to form a lock and further fix the short elastic pin 2.

[0028] In the embodiments of this utility model application, please refer to Figure 5 The structure of the long elastic pin 4 is similar to that of the short elastic pin 2. Specifically, the long elastic pin 4 includes a second insertion part 29 (which is connected to the second insertion hole 23 of the base 1), a third buckle 26 extending integrally from the upper side (which is inserted into the third insertion hole 25 of the base 1), a second limiting part 30 on the upper side abutting against the second step part 24 of the base 1, and a second elastic part 31 extending from the other side. A second contact part 32 (which directly contacts the body of the MOS transistor 27) and a second wedge part 33 are provided in front of the second elastic part 31 (when the upper seat 8 is pressed down, the second wedge part 33 can be directly pushed to the right to form elastic potential energy, so that the second contact part 32 presses tightly against the body of the MOS transistor 27 (see Figure 7 To make it more intuitive, the cross-sectional lines of the two entities interfere with each other, illustrating a tendency to compress (achieving a reliable electrical connection).

[0029] In the embodiments of this utility model application, the first elastic part 17 has a semi-circular shape. The semi-circular structure has a certain degree of elasticity and low manufacturing cost.

[0030] In the embodiments of this utility model application, please refer to Figure 5 The lower slot 3 area is provided with a first insertion hole 21 and a first step portion 22. The first insertion hole 21 is used to place the test pin portion 14, and the first step portion 22 is used to place the first limiting portion 16, so as to achieve the initial fixation of the short elastic pin 2.

[0031] Furthermore, the upper slot 5 area is provided with a second insertion hole 23, a second step portion 24, and a third insertion hole 25. The second insertion hole 23 is used to place the second insertion part 29, the third insertion hole 25 is used to place the third buckle 26, and the second step portion 24 cooperates with the second limiting part 30 to fix the long elastic pin 4.

[0032] Further, please refer to Figure 5 The long elastic pin 4 is provided with a second buckle 28. The second buckle 28 cooperates with the inner wall of the base 1 (concave-convex fit) to further fix the long elastic pin 4.

[0033] Further, please refer to Figure 5 The long elastic pin 4 is provided with a third buckle 26. The third buckle 26 is placed in the third insertion hole 25 to further fix the long elastic pin 4.

[0034] This embodiment provides a MOSFET test fixture; please refer to [reference needed]. Figure 1 and Figure 7 They are connected as follows: the upper seat 8 and the lower seat are connected vertically by guide pin 7, etc.; the short elastic pin 2 is inserted into the first socket 21 and then fixedly connected; the long elastic pin 4 is inserted into the second socket 23 and the third socket 25 and then fixedly connected.

[0035] This embodiment provides a MOSFET test fixture. During normal use, a robotic arm presses down on the upper seat 8. The inner wall of the upper seat 8 presses down the first wedge-shaped portion 19 of the short elastic pin 2, thus pushing the short elastic pin 2 away (slightly to the left). At this time, the MOSFET 27 can be smoothly lowered into the base 1 through the test hole 12 of the upper seat 8. Releasing the upper seat 8 resets the short elastic pin 2, thus firmly pressing the pins of the MOSFET 27. The body of the MOSFET 27 is firmly pressed by the second contact portion 32 of the long elastic pin 4, thus fixing the MOSFET 27. After the test is completed, pressing the upper seat 8 again unlocks the MOSFET 27, allowing it to be removed. This novel structure facilitates automatic testing of MOSFETs.

[0036] In the description of this utility model, it should be noted that the terms "vertical", "up", "down", "horizontal", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0037] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0038] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A MOSFET test fixture, characterized in that: The device includes a base (1), a lower slot (3) for inserting a short elastic pin (2) on the base (1), an upper slot (5) for inserting a long elastic pin (4) on the base (1), a positioning hole (6) on the base (1), a guide pin (7) fixed on the positioning hole (6), the other end of the guide pin (7) passing through a small guide hole (9) of an upper seat (8), a guide post (10) on the base (1), the guide post (10) being clearance-fitted with a large guide hole (11) of the upper seat (8), a test hole (12) for passing through the MOS transistor body on the upper seat (8), and a pin socket (13) on the base (1).

2. The MOS transistor test fixture according to claim 1, characterized in that: There are two positioning holes (6) and they are diagonally arranged on the base (1). There are two guide posts (10) and they are diagonally arranged on the base (1).

3. The MOS transistor test fixture according to claim 1, characterized in that: The short elastic pin (2) includes a test pin portion (14), a first insertion portion (15) integrally extending on the upper side of the test pin portion (14), a first limiting portion (16) extending on one side of the first insertion portion (15), a first elastic portion (17) extending on the other side of the first insertion portion (15), a first contact portion (18) and a first wedge portion (19) provided in front of the first elastic portion (17), and a first buckle (20) provided between the first limiting portion (16) and the test pin portion (14).

4. The MOS transistor test fixture according to claim 3, characterized in that: The first elastic part (17) has a semi-circular shape.

5. The MOS transistor test fixture according to claim 1, characterized in that: The lower slot (3) area is provided with a first insertion hole (21) and a first step (22).

6. The MOS transistor test fixture according to claim 1, characterized in that: The upper slot (5) area is provided with a second insertion hole (23), a second step (24) and a third insertion hole (25).

7. The MOS transistor test fixture according to claim 1, characterized in that: The long elastic pin (4) is provided with a third buckle (26).

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