Reference voltage source chip test experiment device

Abstract

The utility model discloses a reference voltage source chip test experiment device, and relates to the field of test experiments of reference voltage source chips. Comprising a liquid crystal input display module, a signal conversion circuit, a relay switching circuit, a signal input circuit, a reference voltage source chip test circuit, a load transient response circuit, a power-on response time test circuit, a sleep response test circuit, an output signal measurement circuit and a reference voltage source discrete device circuit. According to the reference voltage source chip test experiment device, two test circuits of different reference voltage source chips are provided, a beginner can better understand and understand the internal structures and the using methods of the different reference voltage source chips, the source meter is used as an input signal unit and an output measurement unit, and the reference voltage source chip test experiment device has the advantages of being simple in structure and convenient to use. The testing precision is higher and more reliable, subtle changes caused by circuit changes can be observed, and meanwhile the problems that traditional testing equipment is high in manufacturing cost and large in size are solved.

Description

Technical Field

[0001] This utility model relates to the field of testing experiments for reference voltage source chips, and in particular to a testing experimental device for reference voltage source chips. Background Technology

[0002] Reference voltage source chips are a type of high-performance analog chip widely used in power management chips, data acquisition systems, voltage regulators, and other systems requiring data acquisition. The reference voltage source chip provides a stable reference voltage to the circuit, and its accuracy and reliability directly determine the accuracy and reliability of the system. Only by understanding the internal structure of the reference voltage source chip and the meaning of its various parameters can one better utilize this type of chip.

[0003] Currently, when learning to use reference voltage source chips, users mainly rely on the data parameters provided in the manufacturer's datasheet to determine whether to use the chip. They cannot intuitively observe the internal structure of the chip and the impact of input voltage and current on the chip parameters, which is not conducive to beginners learning to use reference voltage source chips.

[0004] Therefore, it is necessary to propose a reference voltage source chip testing experimental device to solve the above problems. Utility Model Content

[0005] The main purpose of this invention is to provide a test device for a reference voltage source chip, which can effectively solve the problems in the background art.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0007] An experimental apparatus for testing a reference voltage source chip includes a liquid crystal input display module, a signal conversion circuit, a relay switching circuit, a signal input circuit, a reference voltage source chip testing circuit, a load transient response circuit, a power-on response time testing circuit, a sleep response testing circuit, an output signal measurement circuit, and a reference voltage source discrete device circuit. The liquid crystal input display module is electrically connected to the signal conversion circuit. The signal conversion circuit is electrically connected to the relay switching circuit. The relay switching circuit is electrically connected to the load transient response circuit, the power-on response time testing circuit, and the sleep response testing circuit. The load transient response circuit, the power-on response time testing circuit, and the sleep response testing circuit are electrically connected to the output signal measurement circuit and the reference voltage source chip testing circuit. The output signal measurement circuit is electrically connected to the reference voltage source discrete device circuit. The reference voltage source discrete device circuit is electrically connected to the signal input circuit, and the signal input circuit is electrically connected to the reference voltage source chip testing circuit.

[0008] Preferably, the liquid crystal input display module is a display and key input module of the experimental device. The liquid crystal input display module is connected to a signal conversion circuit via an RS485 communication line and is used to control the relay switching circuit to achieve the function of switching different test circuits. The signal conversion circuit is used to convert the command signal of the liquid crystal input display module into an electrical signal to control the switching of the relay switching circuit, thereby achieving the purpose of switching different test circuits. One end of the signal conversion circuit is connected to the liquid crystal input display module via an RS485 communication line and receives the command signal of the liquid crystal input display module. The other end of the signal conversion circuit is connected to the relay switching circuit to control the relay switching.

[0009] Preferably, the relay switching circuit includes two sets of relay switching: one set for electrical structure switching and the other set for input / output socket switching, used to receive input control signals from the signal conversion circuit for controlling the switching of different test circuits; the signal input circuit includes at least one signal generator, one digital source meter, BNC sockets and banana sockets for connecting instruments and test circuits, and is used to provide input test signals to the reference voltage source chip test circuit.

[0010] Preferably, the reference voltage source chip test circuit includes a test socket adaptable to all SOP packaged chips and three different test circuits: one is a load transient response circuit, the second is a power-on response time test circuit, and the third is a sleep response test circuit; the load transient response circuit is used to detect the reference voltage source chip's ability to withstand sudden changes in load current, the input signal is provided by a digital source meter, the digital source meter is connected to the banana plug VIN, and the output is measured using the source meter.

[0011] Preferably, the power-on response time test circuit is used to test the response time of the chip to output a reference voltage after receiving an input voltage. The input signal of the power-on response time test circuit is provided by a digital source meter connected to the banana socket VIN, or it can be provided by a signal generator. The output of the power-on response time test circuit is measured using a source meter. The power-on response time of the chip is measured by measuring the difference in voltage rise time between the input and output terminals. The sleep response test circuit is used to test the conditions under which the chip enters a sleep state after receiving an external sleep signal. An external signal is input to the chip through a signal generator, and the sleep state of the chip is determined by observing the output source meter. The input signal of the sleep response test circuit is provided by a digital source meter and a signal generator. The digital source meter is connected to the banana socket VIN, and the signal generator is connected to the BNC socket SLEEP. The output of the sleep response test circuit is measured using a source meter.

[0012] Preferably, the output signal measurement circuit includes at least one oscilloscope, one digital source meter, a BNC connector and a banana plug for connecting the instrument and the test circuit. The output signal measurement circuit is used to provide the test output signal for the reference voltage source chip test circuit. The reference voltage source discrete device circuit includes an input transistor, a voltage-regulating reference transistor, a mirror constant current source, a differential amplifier, an output composite transistor, resistors, and capacitors. The output voltage of the reference voltage source discrete device circuit is adjusted by two resistors. The input signal of the reference voltage source discrete device circuit is provided by the digital source meter, which is connected to the banana plugs FL_VIN and FL_GND. The output of the reference voltage source discrete device circuit is measured using the digital source meter, which is connected to the banana plugs FL_VOUT and FL_GND.

[0013] Compared with the prior art, the present invention has the following beneficial effects:

[0014] This reference voltage source chip testing experimental device provides test circuits for two different reference voltage source chips, allowing beginners to better understand and recognize the internal structure and usage of different reference voltage source chips. Using a source meter as the input signal unit and output measurement unit, the test accuracy is higher and more reliable. It can observe subtle changes caused by circuit variations. The test accuracy is high and the space occupied is extremely small, making it easy to transport and carry. It solves the problems of high cost and large size of traditional test equipment, and has high convenience and flexibility in the testing process. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0016] Figure 2 This is a diagram of the test circuit setup for this utility model;

[0017] Figure 3 This is the circuit diagram of this utility model.

[0018] Figure 4 This is the circuit diagram of this utility model;

[0019] Figure 5 This is the circuit diagram of this utility model;

[0020] Figure 6 This is the circuit diagram of this utility model;

[0021] Figure 7 This is a schematic diagram of the discrete components for the reference voltage source of this utility model;

[0022] Figure 8 This is the PCB diagram of this utility model;

[0023] Figure 9This is a test flowchart for this utility model.

[0024] In the diagram: 1. LCD input display module; 2. Signal conversion circuit; 3. Relay switching circuit; 4. Signal input circuit; 5. Reference voltage source chip test circuit; 6. Load transient response circuit; 7. Power-on response time test circuit; 8. Sleep response test circuit; 9. Output signal measurement circuit; 10. Reference voltage source discrete component circuit. Detailed Implementation

[0025] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0026] like Figures 1-9 As shown, a reference voltage source chip testing experimental device includes a liquid crystal input display module 1, a signal conversion circuit 2, a relay switching circuit 3, a signal input circuit 4, a reference voltage source chip testing circuit 5, a load transient response circuit 6, a power-on response time testing circuit 7, a sleep response testing circuit 8, an output signal measurement circuit 9, and a reference voltage source discrete device circuit 10. The liquid crystal input display module 1 is electrically connected to the signal conversion circuit 2. The signal conversion circuit 2 is electrically connected to the relay switching circuit 3. The relay switching circuit 3 is electrically connected to the load transient response circuit 6, the power-on response time testing circuit 7, and the sleep response testing circuit 8. The load transient response circuit 6, the power-on response time testing circuit 7, and the sleep response testing circuit 8 are electrically connected to the output signal measurement circuit 9 and the reference voltage source chip testing circuit 5. The output signal measurement circuit 9 is electrically connected to the reference voltage source discrete device circuit 10. The reference voltage source discrete device circuit 10 is electrically connected to the signal input circuit 4. The signal input circuit 4 is electrically connected to the reference voltage source chip testing circuit 5.

[0027] The LCD input display module 1 is the display and key input module of the experimental device. The LCD input display module 1 is connected to the signal conversion circuit 2 via an RS485 communication line and is used to control the relay switching circuit 3 to achieve the function of switching different test circuits. The signal conversion circuit 2 is used to convert the command signal of the LCD input display module 1 into an electrical signal to control the switching of the relay switching circuit 3, thereby achieving the purpose of switching different test circuits. One end of the signal conversion circuit 2 is connected to the LCD input display module 1 via an RS485 communication line and receives the command signal from the LCD input display module 1. The other end of the signal conversion circuit 2 is connected to the relay switching circuit 3 to control the relay switching.

[0028] The relay switching circuit 3 includes two sets of relay switching. One set of relay switching circuit 3 is for electrical structure switching, and the other set is for input / output socket switching. It is used to receive input control signals from the signal conversion circuit 2 and to control the switching of different test circuits. The signal input circuit 4 includes at least one signal generator, one digital source meter, BNC sockets and banana sockets for connecting instruments and test circuits. The signal input circuit 4 is used to provide input test signals to the reference voltage source chip test circuit 5.

[0029] The reference voltage source chip test circuit 5 includes a test socket suitable for all SOP packaged chips and three different test circuits: one is a load transient response circuit 6, the second is a power-on response time test circuit 7, and the third is a sleep response test circuit 8. The load transient response circuit 6 is used to detect the reference voltage source chip's ability to withstand sudden changes in load current. The input signal is provided by a digital source meter, which is connected to the banana plug VIN, and the output is measured using the source meter.

[0030] The power-on response time test circuit 7 is used to test the response time of the chip to output a reference voltage after receiving an input voltage. The input signal of the power-on response time test circuit 7 is provided by a digital source meter, which is connected to the banana socket VIN, or it can be provided by a signal generator. The output of the power-on response time test circuit 7 is measured by the source meter. The power-on response time of the chip is measured by measuring the difference between the rise time of the voltage at the input and output terminals. The sleep response test circuit 8 is used to test the conditions under which the chip enters a sleep state after receiving an external sleep signal. An external signal is input to the chip through a signal generator, and the sleep state of the chip is determined by observing the output source meter. The input signal of the sleep response test circuit 8 is provided by a digital source meter and a signal generator. The digital source meter is connected to the banana socket VIN, and the signal generator is connected to the BNC socket SLEEP. The output of the sleep response test circuit 8 is measured by the source meter.

[0031] The output signal measurement circuit 9 includes at least one oscilloscope, one digital source meter, BNC connectors for connecting instruments and test circuits, and banana plug connectors. The output signal measurement circuit 9 is used to test the output signal of the reference voltage source chip test circuit 5. The reference voltage source discrete device circuit 10 includes an input transistor, a voltage-regulating reference transistor, a mirror constant current source, a differential amplifier, an output composite transistor, resistors, and capacitors. The output voltage of the reference voltage source discrete device circuit 10 is adjusted by two resistors. The input signal of the reference voltage source discrete device circuit 10 is provided by the digital source meter, which is connected to the banana plug connectors FL_VIN and FL_GND. The output of the reference voltage source discrete device circuit 10 is measured using the digital source meter, which is connected to the banana plug connectors FL_VOUT and FL_GND.

[0032] like Figure 6 As shown, this utility model is a reference voltage source chip testing experimental device. When using it, step S1: Selecting the test circuit means that this experimental device provides two types of reference voltage source chip test circuits. One is an integrated reference voltage source chip test circuit, which is used to test various parameters of the integrated reference voltage source chip. The other is a reference voltage source chip discrete device circuit built using discrete components, which is used to observe the internal structure of the reference voltage source chip and the reference voltage output by the test circuit.

[0033] Step S2: The discrete component circuit of the reference voltage source chip refers to the discrete component circuit of the reference voltage source chip built using discrete components, which is used to observe the internal structure of the reference voltage source chip and test the output reference voltage of the circuit.

[0034] Step S3: Connect the first digital source meter. The second digital source meter refers to the first digital source meter connected to the signal input terminal of the discrete device circuit of the reference voltage source chip. The first digital source meter acts as a voltage source, providing an input signal. The voltage output terminal of the discrete device circuit of the reference voltage source chip is connected to the second digital source meter. The second digital source meter is set to the voltage measurement mode to measure the output voltage.

[0035] Step S4: Start the test and read the parameters. This means that after setting the source meter parameters, turn on the source meter output switch, measure the output reference voltage, and analyze how the discrete circuit achieves the reference voltage.

[0036] Step S5: The integrated reference voltage source chip test circuit consists of three different test circuits for testing the integrated reference voltage source chip: one is the load transient response test circuit 6, the second is the power-on response time test circuit 7, and the third is the sleep response time test circuit 8.

[0037] Step S6: Selecting test items refers to selecting different test circuits on the LCD screen, including load transient response test circuit 6, power-on response time test circuit 7, and sleep response time test circuit 8. The relay switching is completed by clicking the button.

[0038] Step S7: Connect the load transient response test circuit 6 to the test instrument. The test parameters refer to connecting the first digital meter as the voltage output terminal to the banana plug VIN and GND, and the second digital meter as the voltage measurement terminal to the banana plug VOUT and GND; set the parameters of the first digital meter and the second digital meter, start the test, and measure the parameters.

[0039] Step S8: Connect the power-on response time test circuit 7 to the test instrument. The test parameters refer to connecting the first digital meter as the voltage output terminal to the banana socket VIN and GND, and the second digital meter as the voltage measurement terminal to the banana socket VOUT and GND; set the parameters of the first digital meter and the second digital meter, start the test, and measure the parameters.

[0040] Step S9: Sleep Response Time Test: Connect the test instruments. The test parameters refer to using the first digital meter as the voltage output terminal, connecting the digital source meter to the banana plug VIN and GND, connecting the signal generator to the BNC plug SLEEP, and using the second digital meter as the voltage measurement terminal, connecting it to the banana plug VOUT and GND; set the parameters of the first digital meter, signal generator, and second digital meter, start the test, and measure the parameters.

[0041] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. A reference voltage source chip test experiment device, comprising a liquid crystal input display module (1), a signal conversion circuit (2), a relay switching circuit (3), a signal input circuit (4), a reference voltage source chip test circuit (5), a load transient response circuit (6), a power-on response time test circuit (7), a sleep response test circuit (8), an output signal measurement circuit (9), and a reference voltage source discrete device circuit (10), characterized in that: The liquid crystal input display module (1) is electrically connected with a signal conversion circuit (2), the signal conversion circuit (2) is electrically connected with a relay switching circuit (3), the relay switching circuit (3) is electrically connected with a load transient response circuit (6), a power-on response time test circuit (7) and a sleep response test circuit (8), the load transient response circuit (6), the power-on response time test circuit (7) and the sleep response test circuit (8) are electrically connected with an output signal measurement circuit (9) and a reference voltage source chip test circuit (5), the output signal measurement circuit (9) is electrically connected with a reference voltage source discrete device circuit (10), the reference voltage source discrete device circuit (10) is electrically connected with a signal input circuit (4), and the signal input circuit (4) is electrically connected with the reference voltage source chip test circuit (5).

2. The reference voltage source chip test experimental device according to claim 1, characterized in that: The liquid crystal input display module (1) is a display and key input module of an experimental device, the liquid crystal input display module (1) is connected with a signal conversion circuit (2) through an RS485 communication line, and is used for controlling a relay switching circuit (3) to achieve the function of switching different test circuits; the signal conversion circuit (2) is used for converting a command signal of the liquid crystal input display module (1) into an electric signal to control switching of the relay switching circuit (3), and based on this, the purpose of switching different test circuits is achieved; one end of the signal conversion circuit (2) is connected to the liquid crystal input display module (1) through the RS485 communication line and receives a command signal of the liquid crystal input display module (1), and the other end of the signal conversion circuit (2) is connected to the relay switching circuit (3) and is used for controlling the relay switching.

3. The reference voltage source chip test experimental device according to claim 1, characterized in that: The relay switching circuit (3) comprises two groups of relay switches, one group of the relay switching circuit (3) is used for switching an electrical structure, and the other group of the relay switching circuit (3) is used for switching an input and output socket and is used for receiving an input control signal from the signal conversion circuit (2) and is used for controlling switching of different test circuits; the signal input circuit (4) comprises at least one signal generator, one digital source table, a BNC socket connected with an instrument, a banana socket, and the signal input circuit (4) is used for providing an input test signal for the reference voltage source chip test circuit (5).

4. The reference voltage source chip test experimental device according to claim 1, characterized in that: The reference voltage source chip test circuit (5) comprises a test base suitable for all SOP packaged chips and three different test circuits, one of the reference voltage source chip test circuit (5) is a load transient response circuit (6), the second is a power-on response time test circuit (7), and the third is a sleep response test circuit (8); the load transient response circuit (6) is used for detecting the strain capacity of a reference voltage source chip to a sudden change of a load current, an input end signal is provided by a digital source table, the digital source table is connected to a banana socket VIN, and an output end is measured by using a source table.

5. The reference voltage source chip test experimental device according to claim 4, characterized in that: The power-on response time test circuit (7) is used to test the response time of the chip outputting reference voltage after receiving input terminal voltage, the input terminal signal of the power-on response time test circuit (7) is provided by a digital source table connected to a banana socket VIN, and can also be provided by a signal generator, the output terminal of the power-on response time test circuit (7) is measured by using a source table, the power-on response time of the chip is measured by measuring the time difference of voltage rising edges of the input terminal and the output terminal; the sleep response test circuit (8) is used to test the condition of the chip entering sleep state after receiving external sleep signal, the chip is given external signal input by a signal generator, and the sleep state of the chip is observed by using a source table connected to the output terminal, the input terminal signal of the sleep response test circuit (8) is provided by a digital source table and a signal generator, the digital source table is connected to a banana socket VIN, and the signal generator is connected to a BNC socket SLEEP, and the output terminal of the sleep response test circuit (8) is measured by using a source table.

6. The reference voltage source chip test experimental device according to claim 1, characterized in that: The output signal measurement circuit (9) contains at least one oscilloscope, a digital source table, a BNC socket connected to the instrument, a banana socket, and a test circuit, and the output signal measurement circuit (9) is used to test the output signal of the reference voltage source chip test circuit (5); the reference voltage source discrete device circuit (10) comprises an input transistor, a voltage reference transistor, a mirror constant current source, a differential amplifier, an output composite transistor, a resistor and a capacitor, and the output voltage of the reference voltage source discrete device circuit (10) is adjusted by two resistors; the input terminal signal of the reference voltage source discrete device circuit (10) is provided by a digital source table connected to banana sockets FL_VIN and FL_GND, and the output terminal of the reference voltage source discrete device circuit (10) is measured by using a digital source table connected to banana sockets FL_VOUT and FL_GND.

Images