Testing device for realizing hot plug of multiple PCIE (Peripheral Component Interface Express) devices
By introducing an adapter test board and power module into the server, hot-swapping of PCIe cards is achieved, solving the inefficiency problem caused by server restarts in traditional testing methods, and realizing efficient decoupled testing and fault location between cards.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-22
- Publication Date
- 2026-03-10
AI Technical Summary
Traditional server PCIe card testing methods require a server restart, resulting in low testing efficiency and an inability to achieve decoupled testing between cards under test, making troubleshooting difficult.
Design a test device that includes a server and an adapter test board. The adapter test board is equipped with multiple PCIe card slots and a power module. By controlling the power module to supply power to or cut off the power to the PCIe card slots, hot-swapping of the card under test can be achieved, supporting card replacement for testing without restarting the server.
It improves testing efficiency, enabling the replacement of the card under test without restarting the server system, achieving decoupled testing of the card under test, accurately locating the faulty card, and improving troubleshooting efficiency.
Smart Images
Figure CN223986321U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of testing technology, and in particular to a testing device for hot-plugging multiple PCIe devices. Background Technology
[0002] Traditional server PCIe card functional testing methods have shortcomings. Each card must be tested while waiting for the server to power on and restart, which is extremely time-consuming and wastes a lot of time, resulting in low testing efficiency.
[0003] The current testing approach involves using a server paired with a riser card to perform setup tests on PCIe cards. However, each time the card under test is changed, the server needs to be restarted, resulting in low testing efficiency and making it impossible to perform decoupled testing between the cards under test, thus hindering troubleshooting. Utility Model Content
[0004] The present invention aims to solve at least one of the technical problems mentioned in the background art.
[0005] To address the aforementioned problems, this utility model provides a testing device for hot-swapping multiple PCIe devices, comprising a server and an adapter test board. The server is connected to the adapter test board, which has multiple PCIe card slots and a power module. The adapter test board is connected to the power module, which is connected to the PCIe card slots. The PCIe card slots are used to connect to the card under test. The adapter test board can control the power module to supply power to or disconnect the power supply to the PCIe card slots.
[0006] A further technical solution is that the adapter test board includes an I2C interface, which is connected to the server.
[0007] A further technical solution is that the adapter test board includes an INT interface, which is connected to the server.
[0008] A further technical solution is that the test device for realizing hot-swapping of multiple PCIe devices also includes a control button, which is connected to the adapter test board.
[0009] A further technical solution is that the power module includes an EN pin, which is connected to the adapter test board.
[0010] A further technical solution is that the power module includes a PG pin, which is connected to the adapter test board.
[0011] A further technical solution is that the test device for hot-swapping multiple PCIe devices also includes a power indicator light, which is connected to the adapter test board.
[0012] A further technical solution is that the test device for realizing hot-swapping of multiple PCIe devices further includes a first resistor, which is connected in series with the power indicator light.
[0013] A further technical solution is that the test device for hot-swapping multiple PCIe devices also includes a connection indicator light, which is connected to the adapter test board.
[0014] A further technical solution is that the test device for realizing hot-swapping of multiple PCIe devices also includes a second resistor, which is connected in series with the connection indicator light.
[0015] Compared with the prior art, the technical effects achieved by the embodiments of this utility model include:
[0016] In the technical solution of this utility model embodiment, the test device for hot-swapping multiple PCIe devices includes a server and an adapter test board. The server is connected to the adapter test board, which is provided with multiple PCIe card slots and a power module. The adapter test board is connected to the power module, and the power module is connected to the PCIe card slots. The PCIe card slots are used to connect to the card under test. The adapter test board can control the power module to supply power to or cut off the power supply to the PCIe card slots. By setting multiple PCIe card slots on the adapter test board and independently supplying power to each PCIe card slot, hot-swapping of the card under test can be realized. That is, the card under test can be replaced for testing without restarting the server system, which greatly improves the testing efficiency and avoids the time wasted by server restart.
[0017] Furthermore, this invention enables decoupled testing between cards under test, which can more accurately locate faulty cards and improve troubleshooting efficiency. Attached Figure Description
[0018] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the present invention and, together with the description, serve to explain the principles of the present invention.
[0019] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0020] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.
[0021] Figure 1 This is a schematic diagram of the structure of a test device for hot-plugging multiple PCIe devices according to an embodiment of the present invention;
[0022] Figure 2 A schematic diagram of a single PCIe card slot for a testing device that enables hot-swapping of multiple PCIe devices, as proposed in an embodiment of this utility model;
[0023] Figure 3 This is a schematic diagram of the connection relationship of a test device for hot-swapping multiple PCIe devices proposed in an embodiment of the present invention, wherein PCIEX16-slot1-PCIEX16-slot10 are PCIe card slots;
[0024] Figure 4 A circuit diagram of a single PCIe card slot for a test device that enables hot-swapping of multiple PCIe devices, as proposed in an embodiment of this utility model.
[0025] Figure 5 This is a schematic diagram of the test process for a test device that enables hot-swapping of multiple PCIe devices, as proposed in an embodiment of this utility model.
[0026] Figure Labels
[0027] Server 10, adapter test board 20, card under test 30, power module 40, control button 50, power indicator light 60, connection indicator light 70, first resistor 80, second resistor 90, PCIe card slot 100. Detailed Implementation
[0028] The technical solutions in the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Similar component reference numerals in the drawings represent similar components. Obviously, the embodiments described below are only some embodiments of this utility model, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model.
[0029] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.
[0030] It should also be understood that the terminology used in this specification of embodiments of the present invention is for the purpose of describing particular embodiments only and is not intended to limit the embodiments of the present invention. As used in this specification of embodiments of the present invention and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.
[0031] join Figures 1-5 This utility model provides a testing device for hot-swapping multiple PCIe devices, enabling hot-swapping of the card under test (30). This means that the card under test (30) can be replaced for testing without restarting the server 10 system, thus greatly improving testing efficiency. To achieve the above technical objectives, the testing device for hot-swapping multiple PCIe devices includes a server 10 and an adapter test board 20.
[0032] The server 10 is connected to the adapter test board 20. For example, the server 10 can be connected to the adapter test board 20 via an MCIO cable. This utility model does not specifically limit this connection.
[0033] The adapter test board 20 is provided with multiple PCIe card slots 100 and a power module 40. The number of PCIe card slots 100 can be 10, but this utility model does not specifically limit it.
[0034] The adapter test board 20 is connected to the power module 40, which is connected to the PCIe card slot 100. The power module 40 provides power to the PCIe card slot 100. The PCIe card slot 100 is used to connect to the card under test 30, allowing the card under test 30 to be connected to the server 10 for testing.
[0035] In this embodiment of the invention, the adapter test board 20 can control the power module 40 to supply power to or cut off the power supply to the PCIe card slot 100. When the card under test 30 is connected to the PCIe card slot 100, the adapter test board 20 controls the power module 40 to supply power to the PCIe card slot 100, and then the card under test 30 is connected to the server 10 for testing. After the test is completed, the adapter test board 20 controls the power module 40 to cut off the power supply to the PCIe card slot 100, and the card under test 30 can be removed. Then, other cards under test 30 can be connected for testing. In the above process, there is no need to restart the server 10 system, which can realize hot-swapping of the card under test 30, thereby greatly improving the testing efficiency.
[0036] In the technical solution of this utility model embodiment, the test device for hot-swapping multiple PCIe devices includes a server 10 and an adapter test board 20. The server 10 is connected to the adapter test board 20. The adapter test board 20 is provided with multiple PCIe card slots 100 and a power module 40. The adapter test board 20 is connected to the power module 40, and the power module 40 is connected to the PCIe card slots 100. The PCIe card slots 100 are used to connect to the card under test 30. The adapter test board 20 can control the power module 40 to supply power to or cut off the power supply to the PCIe card slots 100. By setting multiple PCIe card slots 100 on the adapter test board 20 and independently supplying power to each PCIe card slot 100, hot-swapping of the card under test 30 can be realized. That is, the card under test 30 can be replaced for testing without restarting the server 10 system, which greatly improves the testing efficiency and avoids the time waste caused by restarting the server 10.
[0037] Furthermore, decoupled testing between the 30 cards under test was achieved, which can more accurately locate the faulty card and improve the efficiency of fault diagnosis.
[0038] Furthermore, in some embodiments, such as this one, the adapter test board 20 includes an I2C interface, which is connected to the server 10. I2C communication between the adapter test board 20 and the server 10 can be achieved through the I2C interface.
[0039] Furthermore, in some embodiments, such as this embodiment, the adapter test board 20 includes an INT interface, which is connected to the server 10. The INT interface is mainly used to realize communication scheduling and synchronization between the adapter test board 20 and the server 10. Through the interrupt signal of the INT interface, the adapter test board 20 can promptly inform the server 10 of the data preparation status, thereby achieving efficient data transmission and processing.
[0040] Furthermore, in some embodiments, such as this embodiment, the test device for enabling hot-swapping of multiple PCIe devices further includes a control button 50, which is connected to the adapter test board 20. The control button 50 is used for user input of control signals.
[0041] Furthermore, in some embodiments, such as this one, the power module 40 includes an EN pin, which is connected to the adapter test board 20. The adapter test board 20 is used to control the power supply / power-off of the power module 40 via the EN pin.
[0042] Furthermore, in some embodiments, such as this one, the power module 40 includes a PG pin, which is connected to the adapter test board 20. The power module 40 is used to provide feedback on its status via the PG pin.
[0043] Furthermore, in some embodiments, such as this embodiment, the testing device for hot-swapping multiple PCIe devices provided by this utility model embodiment further includes a power indicator light 60, which is connected to the adapter test board 20. The power indicator light 60 is used to indicate the working status of the power module 40.
[0044] Furthermore, the testing device for hot-swapping multiple PCIe devices provided in this embodiment of the invention also includes a first resistor 80, which is connected in series with the power indicator light 60. Specifically, the power indicator light 60 is connected to the power supply through the first resistor 80, which limits the current and prevents the power indicator light 60 from burning out.
[0045] Furthermore, in some embodiments, such as this embodiment, the testing device for hot-swapping multiple PCIe devices provided by this utility model embodiment further includes a connection indicator light 70, which is connected to the adapter test board 20. The connection indicator light 70 is used to indicate the access status of the PCIe card slot 100.
[0046] Furthermore, the testing device for hot-swapping multiple PCIe devices provided in this embodiment of the invention also includes a second resistor 90, which is connected in series with the connection indicator light 70. Specifically, the connection indicator light 70 is connected to the power supply through the second resistor 90, which limits the current and prevents the connection indicator light 70 from burning out.
[0047] See Figure 4 The working principle of the testing device for hot-swapping multiple PCIe devices provided in this embodiment is as follows:
[0048] I. Inserting the Test Card (30 steps)
[0049] Connect the card under test 30 to the PCIE slot 100 and press Button# (control button 50). The PRSNT# signal and the Button signal will be sent to the PCA9555 (adapter test board 20). The CPU of the server 10 will be notified to read the IO status of the PCA9555 through the INT interrupt signal of I2C. If the card under test 30 is found to be in place, the 12V & 3.3V power module 40 will be controlled to output power and the PWRLED indicator (power indicator 60) will be lit. The PCIE slot 100 will be connected to the card. During the connection process, the ATNLED indicator (connection indicator 70) will flash to remind you. After the connection is completed, it will turn on and remain lit. The card under test 30 has been successfully connected.
[0050] II. Procedure for Inserting and Removing the Test Card (30 steps)
[0051] Pressing the Button button triggers an interrupt signal INT to notify the CPU I2C scan of the PCA9555's I / O on server 10. During the unloading process of the card under test 30, the ATNLED indicator flashes and turns off upon completion of unloading. As the 12V & 3.3V power module 40 shuts down, the PWELED turns off, and the card under test 30 can be removed.
[0052] Furthermore, the testing procedure for the test card 30 is as follows: Figure 5 As shown, the specific test process will not be described in detail in this embodiment.
[0053] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0054] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.
[0055] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.
[0056] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0057] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0058] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. The illustrative expressions of the above terms in this specification should not be construed as necessarily referring to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.
[0059] Obviously, those skilled in the art can make various modifications and variations to this utility model without departing from its spirit and scope. Since these modifications and variations fall within the scope of the claims of this utility model and their equivalents, this utility model also intends to include these modifications and variations.
[0060] The above description describes specific embodiments of this utility model, but the scope of protection of this utility model is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this utility model, and these modifications or substitutions should all be covered within the scope of protection of this utility model. Therefore, the scope of protection of this utility model should be determined by the scope of the claims.
Claims
1. A testing device for implementing hot plug of multiple PCIE devices, characterized in that, The test device for realizing hot plug of multiple PCIE devices comprises a server and a switching test board, the server is connected with the switching test board, the switching test board is provided with multiple PCIE card slots and a power module, the switching test board is connected with the power module, the power module is connected with the PCIE card slots, the PCIE card slots are used for being connected with test cards, wherein the switching test board can control the power module to supply power to the PCIE card slots or cut off the power supply of the PCIE card slots.
2. The test device for enabling hot plug of multiple PCIE devices according to claim 1, wherein, The switching test board comprises an I2C interface, and the I2C interface is connected with the server.
3. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 1, wherein, The switching test board comprises an INT interface, and the INT interface is connected with the server.
4. The testing device for implementing hot plug of multiple PCIE devices according to claim 1, wherein, The test device for realizing hot plug of multiple PCIE devices further comprises a control button, and the control button is connected with the switching test board.
5. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 1, wherein, The power module comprises an EN pin, and the EN pin is connected with the switching test board.
6. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 1, wherein, The power module comprises a PG pin, and the PG pin is connected with the switching test board.
7. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 1, wherein, The test device for realizing hot plug of multiple PCIE devices further comprises a power indicator, and the power indicator is connected with the switching test board.
8. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 7, wherein, The test device for realizing hot plug of multiple PCIE devices further comprises a first resistor, and the first resistor is connected with the power indicator in series.
9. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 7, wherein, The test device for realizing hot plug of multiple PCIE devices further comprises a connection indicator, and the connection indicator is connected with the switching test board.
10. The test apparatus for enabling hot plug of multiple PCIE devices according to claim 9, wherein, The test device for realizing hot plug of multiple PCIE devices further comprises a second resistor, and the second resistor is connected with the connection indicator in series.