Voltage measuring circuit
By designing a voltage measurement circuit that includes a microprocessor and a filtering unit, the problems of noise filtering and reverse voltage protection are solved, achieving high-precision and stable voltage measurement and ensuring circuit safety and measurement accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-10
- Publication Date
- 2026-03-17
AI Technical Summary
Existing voltage measurement circuits have deficiencies in terms of insufficient noise filtering and reverse voltage protection, which affect measurement accuracy and circuit safety.
A voltage measurement circuit design is adopted, which includes a microprocessor, a power supply circuit and a test circuit. A filter unit composed of Zener diodes and transistors is used for noise filtering, and reverse voltage and overvoltage protection are provided by diodes and Zener diodes. Accurate voltage sampling is achieved by combining a voltage divider circuit.
It improves the accuracy and stability of voltage measurement, ensures that the circuit is not damaged under reverse voltage and overvoltage conditions, and outputs clear and accurate measurement results.
Smart Images

Figure CN224005167U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of circuit measurement technology, specifically to voltage measurement circuits. Background Technology
[0002] In modern electronic devices, voltage measurement circuits are widely used in various applications, such as power monitoring, industrial automation, and home appliances. These applications place stringent requirements on the accuracy, stability, and reliability of voltage measurement. Traditional voltage measurement methods typically rely on simple voltage divider resistor networks and analog instrument displays, but these methods have limitations in terms of accuracy and stability.
[0003] While current digital voltage measurement circuits have improved measurement accuracy and stability to some extent, they still have certain shortcomings. First, noise filtering in existing circuit designs is insufficient, affecting measurement accuracy. Second, some circuits fail to effectively handle reverse voltage and overvoltage conditions, increasing the risk of circuit damage. Utility Model Content
[0004] The present invention aims to overcome the shortcomings of the prior art by providing a voltage measurement circuit that can provide a long-lasting fixed display detection effect, as well as improved detection accuracy and more effective overvoltage protection.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a voltage measurement circuit, comprising: an input module connected to a test module, the test module connected to an output module, the input module including an input terminal having at least two pins for connecting the test module and grounding respectively; a test module containing a microprocessor, the test module also containing a power supply circuit for powering the microprocessor and a test circuit for connecting the input terminal and the microprocessor for voltage sampling, the power supply circuit providing power and also providing reverse voltage protection and overvoltage protection; and an output module containing a digital tube connected to the microprocessor for displaying test results.
[0006] Furthermore, the power supply circuit includes: diode D1, Zener diode D2, Zener diode D3, resistor R2, resistor R3, transistor Q2, and transistor Q1. The anode of diode D1 is connected to the input terminal, and the cathode of diode D1 is connected to the anode of Zener diode D2 and the emitter of transistor Q1. The cathode of Zener diode D2 is grounded through resistor R2, and the cathode of Zener diode D2 is also connected to the base of transistor Q2 through resistor R3. The collector of transistor Q2 is connected to the base of transistor Q1, and the collector of transistor Q1 outputs a stable voltage to power the microprocessor.
[0007] Furthermore, the test circuit includes resistors R4, R5, and R6, which are connected in series and connected to the microprocessor from the input terminal.
[0008] Furthermore, the digital tube includes: a first pin to an eleventh pin disposed on both sides of the digital tube; the ends of the first pin to the eleventh pin of the digital tube are respectively connected to a first terminal to an eleventh terminal; the seventh pin of the microprocessor is connected to the first terminal; the sixth pin of the microprocessor is connected to the second terminal; the fifth pin of the microprocessor is connected to the third terminal; the fourth pin of the microprocessor is connected to the eleventh terminal; the third pin of the microprocessor is connected to the fourth terminal; the second pin of the microprocessor is connected to the fifth terminal; the twelfth pin of the microprocessor is connected to the sixth terminal; the eleventh pin of the microprocessor is connected to the first seventh terminal; the tenth pin of the microprocessor is connected to the eighth terminal; the ninth pin of the microprocessor is connected to the ninth terminal; and the eighth pin of the microprocessor is connected to the tenth terminal.
[0009] Furthermore, the collector of the transistor Q1 is connected to a capacitor C2 with a capacitance of 10uF, and the other end of the capacitor C2 is connected to the fourteenth pin of the microprocessor.
[0010] Furthermore, the test circuit also includes a resistor R1 and a capacitor C1, wherein the resistor R1 and the capacitor C1 are connected in parallel, and one end of the resistor R1 and the capacitor C1 is connected to a resistor R6, and the other end of the resistor R1 and the capacitor C1 is connected to a ground wire.
[0011] The advantages of this invention are that it improves the accuracy of voltage sampling by using an effective filtering unit within the test component, and provides a stable power supply to the internal processor by utilizing multiple protection units integrated in the power supply component, while effectively preventing damage caused by reverse voltage or abnormal high voltage. The output module can stably present the measurement results and maintain clear and accurate readings even during long-term operation. Attached Figure Description
[0012] Figure 1 This is a schematic diagram of the overall process of this utility model.
[0013] Figure 2 This is a schematic diagram of the operation of the microprocessor of this utility model.
[0014] Figure 3 This is a schematic diagram of the digital tube connection of this utility model.
[0015] Figure 1-3 In the middle: 1-Input module; 101-Input terminal; 2-Test module; 201-Power supply circuit; 202-Test circuit; 203-Microprocessor; 3-Output module; 301-Digital tube. Detailed Implementation
[0016] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0017] The following disclosure provides many different embodiments or examples for implementing different structures of this application. To simplify the disclosure, specific examples of components and arrangements are described below. Of course, these are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, various specific examples of processes and materials are provided in this application, but those skilled in the art will recognize the application of other processes and / or the use of other materials.
[0018] This application provides a voltage measurement circuit. This circuit improves voltage sampling accuracy through an effective filtering unit within the test component and provides a stable power supply to the internal processor using multiple protection units integrated in the power supply component. It also effectively prevents damage caused by reverse voltage or abnormally high voltage. The output module stably presents the measurement results, maintaining clear and accurate readings even during long-term operation. The voltage measurement circuit is described in detail below. It should be noted that the order of description of the following embodiments is not intended to limit the preferred order of the embodiments.
[0019] The present application will now be described in detail with reference to the accompanying drawings and specific embodiments.
[0020] Please see Figure 1-3 This embodiment provides a voltage measurement circuit, comprising: an input module 1 connected to a test module 2, and an output module 3 connected to the test module 2; the input module 1 includes an input terminal 101, which has at least two pins for connecting to the test module 2 and grounding respectively; the test module 2 includes a microprocessor 203, and further includes a power supply circuit 201 for powering the microprocessor 203 and a test circuit 202 for connecting the input terminal 101 and the microprocessor 203 for voltage sampling; the power supply circuit 201 provides power, reverse voltage protection, and overvoltage protection; and the output module 3 includes a digital tube 301 connected to the microprocessor 203 for displaying test results.
[0021] The power supply circuit 201 includes: diode D1, Zener diode D2, Zener diode D3, resistor R2, resistor R3, transistor Q2, and transistor Q1. The positive terminal of diode D1 is connected to the input terminal 101, and the negative terminal of diode D1 is connected to the positive terminal of Zener diode D2 and the emitter of transistor Q1. The negative terminal of Zener diode D2 is grounded through resistor R2. The negative terminal of Zener diode D2 is also connected to the base of transistor Q2 through resistor R3. The collector of transistor Q2 is connected to the base of transistor Q1. The collector of transistor Q1 outputs a stable voltage to power the microprocessor 203.
[0022] During operation, current enters the circuit through diode D1, flowing from the cathode of diode D1 to the anode of Zener diode D2. The cathode of Zener diode D2 is grounded through resistor R2 and connected to the base of transistor Q2 through resistor R3. The collector of transistor Q2 is connected to the base of transistor Q1, and the collector of transistor Q1 outputs a stable voltage to supply the microprocessor 203. Zener diodes D2 and D3 stabilize the voltage, ensuring a stable power supply for the microprocessor 203. Simultaneously, diode D1 prevents reverse voltage from damaging the circuit, while Zener diodes D2 and D3 provide overvoltage protection. Diode D1 prevents reverse voltage from damaging the circuit, protecting its safety, while Zener diodes D2 and D3 provide overvoltage protection under abnormal voltage conditions, ensuring the circuit continues to operate normally even in extreme situations.
[0023] The collector of transistor Q1 is connected to a capacitor C2 with a capacitance of 10uF. The other end of capacitor C2 is connected to the fourteenth pin of microprocessor 203. The current is filtered through capacitor C2, which can make the voltage more stable.
[0024] The test circuit 202 includes resistors R4, R5, and R6, which are connected in series and connected to the microprocessor 203 from the input terminal 101. During use, the test circuit 202 achieves accurate sampling of the input voltage by dividing the voltage through resistors R4, R5, and R6. The voltage divider circuit can accurately convert the input voltage into a signal suitable for processing by the microprocessor 203.
[0025] The test circuit 202 also includes a resistor R1 and a capacitor C1. The resistor R1 and the capacitor C1 are connected in parallel, and one end of the resistor R1 and the capacitor C1 is connected to the resistor R6. The other end of the resistor R1 and the capacitor C1 is connected to the ground wire. The parallel combination of the resistor R1 and the capacitor C1 further filters out noise and improves the measurement accuracy.
[0026] In this embodiment, the digital tube 301 is connected to the microprocessor 203, which can intuitively display the measurement results. The digital tube 301 can clearly display the measurement results, which is convenient for users to read quickly. By controlling different segments of the digital tube 301, multi-digit displays can be achieved, providing more information.
[0027] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.
[0028] The voltage measurement circuit provided in the embodiments of this application has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the technical solutions and core ideas of this application. Those skilled in the art should understand that they can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A voltage measurement circuit, characterized by, The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit. The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit. The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit. The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit.
2. The voltage measurement circuit of claim 1, wherein, The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit.
3. The voltage measurement circuit of claim 1, wherein, The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit.
4. The voltage measurement circuit of claim 2, wherein, The utility model relates to a test module and a test circuit, and belongs to the field of test module and test circuit.
5. The voltage measurement circuit of claim 3, wherein,