High and low temperature test equipment for solid state disk
By setting up inlet and outlet air ducts in the solid-state drive testing equipment, combined with BP boards and guide plates arranged in a rectangular array, the problem of uneven temperature inside the test chamber was solved, achieving temperature uniformity and accuracy of test results, while reducing the risk of electrostatic damage and equipment costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-14
- Publication Date
- 2026-03-20
AI Technical Summary
Existing high and low temperature testing equipment for solid-state drives suffers from slow return air speed and slow airflow speed, resulting in localized high temperatures and poor temperature uniformity within the test chamber, leading to inaccurate test results.
Design a high and low temperature testing device for solid-state drives. By setting up air inlet and outlet air ducts on the left and right sides of the test chamber, a complete air circulation is formed. Combined with the BP board and guide plate arranged in a rectangular array, the airflow is ensured to be evenly distributed. Antistatic silicone is placed between the BP board and the BP sheet metal to prevent static electricity accumulation.
This improved the temperature uniformity within the test chamber, kept the ambient temperature deviation within ±3℃, ensured the accuracy of test results, reduced the risk of electrostatic damage to the hard drive, and improved heat dissipation and equipment cost-effectiveness.
Smart Images
Figure CN224020451U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of high and low temperature testing equipment, and in particular to a high and low temperature testing device for solid-state drives. Background Technology
[0002] Storage devices are memory devices in computer systems used to store programs and data. The development of modern computers is closely related to storage devices. Solid-state drives (SSDs), among storage devices, are increasingly widely used in the industry due to their advantages such as high performance, high speed, and small size. During use, SSDs generate relatively concentrated heat on their controller and NAND flash memory chips due to their high data transfer speed and large data volume, coupled with their inherently small size. Under frequent and heavy read / write operations, heat buildup and persistently high temperatures can easily occur. Therefore, SSDs typically undergo rigorous high and low temperature testing during production and testing.
[0003] Currently, high and low temperature testing equipment for solid-state drives (SSDs) typically places the air inlet duct above the test chamber and the air outlet duct below it. Furthermore, SSDs are usually placed into the test chamber in an irregular order. This results in slow return air speed, slow airflow speed through the test chamber, high local temperatures within the test chamber, and inconsistent and large deviations in the uniformity of the test environment temperature, leading to inaccurate SSD test data. Utility Model Content
[0004] To address the shortcomings of existing technologies, this invention provides a high and low temperature testing device for solid-state drives (SSDs). This device provides a stable and controllable environmental testing system for SSD testing, ensuring the accuracy of test results.
[0005] This utility model is achieved through the following technical solution:
[0006] A high and low temperature testing device for solid-state drives, comprising:
[0007] At least one test chamber, with an air inlet duct and an air outlet duct respectively provided on the left and right sides of the test chamber. The air inlet duct is connected to the air inlet of the test chamber, and the air outlet duct is connected to the air outlet of the test chamber.
[0008] The blower has its outlet connected to the air inlet duct.
[0009] Temperature regulating component, the air inlet of the temperature regulating component is connected to the air outlet duct, and the air outlet is connected to the air inlet of the blower;
[0010] The test chamber array is equipped with multiple BP boards, and the BP boards are arrayed with N test ports. The test ports are arranged horizontally on the BP boards, and solid-state drives are plugged into the test ports.
[0011] The blower generates airflow, which flows sequentially through the air inlet duct, test chamber, solid-state drive, air outlet duct, and temperature control components, and then returns to the blower, forming an airflow circulation.
[0012] Furthermore, multiple BP boards are arranged in a rectangular array within the test chamber.
[0013] Furthermore, the number of layers in the multiple BP boards arrangement is greater than or equal to the number of columns.
[0014] Furthermore, the N test ports are arranged in a rectangular array on the BP board, and N is a multiple of 4.
[0015] Furthermore, the BP board is equipped with multiple brackets to support solid-state drives, and multiple ventilation holes are provided on both sides of the brackets, with the ventilation holes located between two adjacent solid-state drive layers.
[0016] Furthermore, the solid-state drives (SSDs) are plugged into the test port in a horizontal direction, following the airflow direction, with the airflow flowing between adjacent SSD layers.
[0017] Furthermore, the high and low temperature testing equipment also includes a guide plate, which forms the side wall of the testing chamber, and multiple guide holes are evenly opened on the guide plate.
[0018] Furthermore, at least one test chamber includes two test chambers, with the airflow directions within the two test chambers being opposite.
[0019] Furthermore, the two air inlet ducts are located between the two test chambers and are interconnected, with the blower simultaneously discharging air into both air inlet ducts.
[0020] Furthermore, the two air outlet ducts are located between the two test chambers and are interconnected. The temperature control component simultaneously regulates the airflow from the two air outlet ducts.
[0021] Compared with existing technologies, the advantages of this utility model are:
[0022] 1. By setting up air inlet and outlet ducts, a complete air circulation is formed between the blower, test chamber and temperature control components, providing a stable and controllable environmental testing system for solid-state drive testing. The ambient temperature deviation of the solid-state drive during the testing process is controlled within ±3℃, ensuring the accuracy of the test results.
[0023] 2. By connecting the solid-state drives (SSDs) to the test port in the direction of airflow and horizontally, the airflow speed through each SSD layer is made more uniform, thus achieving the best heat dissipation effect for the product.
[0024] 3. By evenly opening multiple guide holes on the guide plate, the uniformity of airflow entering and exiting the test chamber is improved, further enhancing the temperature uniformity within the test chamber.
[0025] 4. By placing anti-static silicone between the BP board and the BP sheet metal, static electricity accumulation during testing is prevented, reducing the risk of damage to the solid-state drive. Attached Figure Description
[0026] Figure 1 This is a three-dimensional assembly drawing of a high and low temperature testing device for solid-state drives according to an embodiment of the present invention;
[0027] Figure 2 for Figure 1 Enlarged view of section A in the middle;
[0028] Figure 3 for Figure 1 Enlarged view of section B;
[0029] Figure 4 This is a schematic diagram of the structure of a specific embodiment 1 of the present utility model. Figure 1 ;
[0030] Figure 5 This is a schematic diagram of the structure of a specific embodiment 1 of the present utility model. Figure 2 ;
[0031] Figure 6 This is a schematic diagram of the structure of a specific embodiment 2 of the present utility model;
[0032] Figure 7 This is a structural schematic diagram of a specific embodiment 3 of the present utility model;
[0033] Figure 8 This is a schematic diagram of the structure of a specific embodiment 4 of the present utility model;
[0034] Figure 9 This is a structural schematic diagram of specific embodiment 5 of the present utility model;
[0035] Figure 10 This is a structural schematic diagram of specific embodiment 6 of the present utility model;
[0036] Figure 11 This is a schematic diagram of the structure of specific embodiment 7 of the present utility model;
[0037] Figure 12 This is a structural schematic diagram of specific embodiment 8 of the present utility model.
[0038] Labeling Explanation: 10. Test Chamber; 11. Air Inlet Duct; 12. Air Outlet Duct; 13. Guide Plate; 131. Guide Hole; 2. Blower; 3. Temperature Control Component; 4. BP Board; 40. Test Port; 41. BP Sheet Metal; 42. Antistatic Silicone Pad; 5. Solid State Drive; 51. Bracket; 511. Air Vent. Detailed Implementation
[0039] The following detailed, non-limiting description of the utility model's technical solution, in conjunction with preferred embodiments and accompanying drawings, is provided. In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this utility model, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.
[0040] like Figures 1 to 10 As shown, an embodiment of the present invention provides a high and low temperature testing device for solid-state drives (SSDs), comprising at least one testing chamber 10, a blower 2, and a temperature regulating component 3. The testing chamber 10 has an inlet air duct 11 and an outlet air duct 12 on its left and right sides, respectively. The inlet air duct 11 connects to the air inlet of the testing chamber 10, and the outlet air duct 12 connects to the air outlet of the testing chamber 10. Multiple BP boards 4 are arrayed within the testing chamber 10, and N test ports 40 are arrayed on the BP boards 4. The test ports 40 are arranged horizontally on the BP boards 4, and the SSDs 5 are plugged into the test ports 40. The outlet of the blower 2 connects to the inlet air duct. The inlet of the temperature regulating component 3 connects to the outlet air duct, and its outlet connects to the inlet of the blower 2. The blower 2 and the temperature regulating component 3 are located on the same side of the testing chamber 10. The blower 2 generates airflow during operation. Specifically… Figures 3 to 10The direction of the middle arrow indicates the airflow direction. The airflow flows sequentially through the air inlet duct 11, the test chamber 10, the solid-state drive 5, the air outlet duct 12, and the temperature control component 3, and then flows back to the blower 2, forming an airflow circulation. This further improves the temperature uniformity within the test chamber 10, providing a stable and controllable environmental testing system for solid-state drive testing. It controls the ambient temperature deviation of the solid-state drive during the testing process within ±3℃, thereby ensuring the accuracy of the test results.
[0041] Further reference Figure 2 The high and low temperature testing equipment also includes a guide plate 13, which forms the side wall of the testing chamber 10, and a plurality of guide holes 131 are evenly distributed on the guide plate 13. The airflow in the air inlet duct 11 enters the interior of the testing chamber 10 through the guide holes 131, and flows out through the guide holes 131 on the other side of the guide plate 13 into the air outlet duct 12. Since the airflow can only enter and exit the testing chamber 10 through the guide holes 131 on the left and right side walls of the testing chamber 10, combined with the even distribution of the guide holes 131, the uniformity of the airflow entering and exiting the testing chamber 10 is improved, further improving the temperature uniformity within the testing chamber 10.
[0042] like Figure 3 As shown, the inner wall of the test chamber 10 is formed by BP sheet metal 41, and the BP plate 4 is fixedly connected to the BP sheet metal 41 by screws (not shown in the figure). Furthermore, anti-static silicone 42 is provided between the BP plate 4 and the BP sheet metal 41 to prevent the accumulation of static electricity during testing and reduce the risk of damage to the solid-state drive 5. In this embodiment, multiple BP plates 4 are arranged in a rectangular array within the test chamber 10, and the number of layers is greater than the number of columns.
[0043] Furthermore, in this embodiment, N test ports 40 are arranged in a rectangular array on the BP board 4, and the number of test ports 40 layers is at least two. N is a multiple of 4, so that the number of solid-state drives connected to the test ports 40 can be continuously increased or decreased in multiples of 4.
[0044] A bracket 51 is fixedly connected to the BP board 4 with screws. The solid-state drive 5 is inserted into the test port 40 in the direction of airflow and rests on the bracket 51. During testing, airflow flows between two adjacent solid-state drives 5. Furthermore, the bracket 51 is provided with multiple air vents 511, which are located between two adjacent solid-state drives 5 to allow airflow to flow smoothly across the upper and lower surfaces of the solid-state drives 5. Specific Implementation Example 1
[0046] like Figure 4 and Figure 5As shown, in this specific embodiment, there are a total of sixty-four solid-state drives 5 to be tested. At least one test cavity 10 is included. Among them, the air inlet duct 11 is located on the right side of the test cavity 10, and the air outlet duct 12 is located on the left side of the test cavity 10.
[0047] Inside the test chamber 10, there are four BP boards 4 arranged in a row, and each BP board 4 has sixteen test ports 40, that is, the specific number of N is 16. A solid-state drive 5 is plugged into each test port 40.
[0048] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the right air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the left air outlet duct 12, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 2
[0050] like Figure 6 As shown, in this specific embodiment, there are a total of sixty-four solid-state drives 5 to be tested. At least one test cavity 10 is included. Among them, the air inlet duct 11 is located on the right side of the test cavity 10, and the air outlet duct 12 is located on the left side of the test cavity 10.
[0051] Inside the test chamber 10, there are four layers and four columns of BP boards 4, and each BP board 4 has four test ports 40, that is, the specific number of N is 4, and a solid-state drive 5 is plugged into each test port 40.
[0052] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the right air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the left air outlet duct 12, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 3
[0054] like Figure 7 As shown, in this specific embodiment, there are a total of 256 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0055] Specifically, two air outlet ducts 12 are located at the leftmost and rightmost edges of the two test chambers 10, and each air outlet duct 12 is connected to a temperature regulating element 3. Two air inlet ducts 11 are located between the two test chambers 10 and are interconnected, with the blower 2 simultaneously discharging air into both air inlet ducts 11. In this embodiment, the two test chambers 10 share one blower 2, eliminating the need for a separate blower 2 for each test chamber 10, thus reducing equipment costs.
[0056] Inside each test chamber 10, there are eight layers and four columns of BP boards 4, and each BP board 4 has four test ports 40, that is, the specific number of N is 4, and a solid-state drive 5 is plugged into each test port 40.
[0057] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the middle air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the air outlet ducts 12 on both sides, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 4
[0059] like Figure 8 As shown, in this specific embodiment, there are a total of 256 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0060] Specifically, two air inlet ducts 11 are located at the leftmost and rightmost edges of the two test chambers 10, and each air inlet duct 11 is connected to a blower 2. Two air outlet ducts 12 are located between the two test chambers 10 and are interconnected. The temperature regulating component 3 simultaneously adjusts the airflow from the two air outlet ducts 12. In this embodiment, the two test chambers 10 share a single temperature regulating component 3, eliminating the need for a separate temperature regulating component 3 for each test chamber 10, thus reducing equipment costs.
[0061] Inside each test chamber 10, there are four layers and two columns of BP boards 4, and each BP board 4 has sixteen test ports 40, that is, the specific number of N is 16, and a solid-state drive 5 is plugged into each test port 40.
[0062] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the air inlet ducts 11 on both sides, flows through the upper and lower surfaces of each solid-state drive 5, then flows out from the air outlet duct 12 in the middle, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 5
[0064] like Figure 9 As shown, in this specific embodiment, there are a total of 512 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0065] Specifically, two air inlet ducts 11 are located at the leftmost and rightmost edges of the two test chambers 10, and each air inlet duct 11 is connected to a blower 2. Two air outlet ducts 12 are located between the two test chambers 10 and are interconnected. The temperature regulating component 3 simultaneously adjusts the airflow from the two air outlet ducts 12. In this embodiment, the two test chambers 10 share a single temperature regulating component 3, eliminating the need for a separate temperature regulating component 3 for each test chamber 10, thus reducing equipment costs.
[0066] Inside each test chamber 10, there are eight layers of two columns of BP boards 4, and each BP board 4 has sixteen test ports 40, that is, the specific number of N is 16. A solid-state drive 5 is plugged into each test port 40.
[0067] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the air inlet ducts 11 on both sides, flows through the upper and lower surfaces of each solid-state drive 5, then flows out from the air outlet duct 12 in the middle, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 6
[0069] like Figure 10 As shown, in this specific embodiment, there are a total of 512 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0070] Specifically, two air outlet ducts 12 are located at the leftmost and rightmost edges of the two test chambers 10, and each air outlet duct 12 is connected to a temperature regulating element 3. Two air inlet ducts 11 are located between the two test chambers 10 and are interconnected, with the blower 2 simultaneously discharging air into both air inlet ducts 11. In this embodiment, the two test chambers 10 share one blower 2, eliminating the need for a separate blower 2 for each test chamber 10, thus reducing equipment costs.
[0071] Inside each test chamber 10, there are eight layers of two columns of BP boards 4, and each BP board 4 has sixteen test ports 40, that is, the specific number of N is 16. A solid-state drive 5 is plugged into each test port 40.
[0072] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the middle air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the air outlet ducts 12 on both sides, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 7
[0074] like Figure 11As shown, in this specific embodiment, there are a total of 576 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0075] Specifically, two air outlet ducts 12 are located at the leftmost and rightmost edges of the two test chambers 10, and each air outlet duct 12 is connected to a temperature regulating element 3. Two air inlet ducts 11 are located between the two test chambers 10 and are interconnected, with the blower 2 simultaneously discharging air into both air inlet ducts 11. In this embodiment, the two test chambers 10 share one blower 2, eliminating the need for a separate blower 2 for each test chamber 10, thus reducing equipment costs.
[0076] Inside each test chamber 10, there are six layers of two columns of BP boards 4, and each BP board 4 has twenty-four test ports 40, that is, the specific number of N is 24. A solid-state drive 5 is plugged into each test port 40.
[0077] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the middle air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the air outlet ducts 12 on both sides, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation. Specific Implementation Example 8
[0079] like Figure 12 As shown, in this specific embodiment, there are a total of 128 solid-state drives 5 to be tested. At least one test chamber 10 includes two test chambers 10, and the airflow directions in the two test chambers 10 are opposite.
[0080] Specifically, two air outlet ducts 12 are located at the leftmost and rightmost edges of the two test chambers 10, and each air outlet duct 12 is connected to a temperature regulating element 3. Two air inlet ducts 11 are located between the two test chambers 10 and are interconnected, with the blower 2 simultaneously discharging air into both air inlet ducts 11. In this embodiment, the two test chambers 10 share one blower 2, eliminating the need for a separate blower 2 for each test chamber 10, thus reducing equipment costs.
[0081] Inside each test chamber 10, there are four layers and two columns of BP boards 4, and each BP board 4 has eight test ports 40, that is, the specific number of N is 8. A solid-state drive 5 is plugged into each test port 40.
[0082] During operation, the blades of the blower 2 rotate to form airflow; during testing, the airflow enters the test chamber 10 from the middle air inlet duct 11, flows through the upper and lower surfaces of each solid-state drive 5, and then flows out from the air outlet ducts 12 on both sides, passes through the temperature regulating component 3, and finally flows back to the blower 2, thus forming an airflow circulation.
[0083] This utility model discloses a high and low temperature testing device for solid-state drives (SSDs). By setting up an inlet air duct 11 and an outlet air duct 12, a complete airflow circulation is formed between the blower 2, the test chamber 10, and the temperature control component 3. This provides a stable and controllable environmental testing system for SSD testing, controlling the ambient temperature deviation of the SSD 5 within ±3℃ during the testing process, ensuring the accuracy of the test results. Anti-static silicone 42 is placed between the BP plate 4 and the BP sheet metal 41 to prevent the accumulation of static electricity during testing, reducing the risk of damage to the SSD 5. By inserting the SSD 5 horizontally into the test port 40 along the airflow direction, the airflow speed through each layer of the SSD 5 is made more uniform, thereby optimizing the product's heat dissipation effect. Multiple guide holes 131 are evenly distributed on the guide plate 13, improving the uniformity of airflow entering and exiting the test chamber 10, further enhancing the temperature uniformity within the test chamber 10. In this embodiment, the two test chambers 10 share a single temperature control element 3, eliminating the need for a separate temperature control element 3 for each test chamber 10, thus reducing equipment costs. Similarly, in this embodiment, the two test chambers 10 share a single blower 2, eliminating the need for a separate blower 2 for each test chamber 10, further reducing equipment costs.
[0084] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.
Claims
1. A high and low temperature testing device for solid-state drives, characterized in that, include: At least one test chamber (10) is provided with an air inlet duct (11) and an air outlet duct (12) on the left and right sides of the test chamber (10), respectively. The air inlet duct (11) is connected to the air inlet of the test chamber (10), and the air outlet duct (12) is connected to the air outlet of the test chamber (10). Blower (2), the air outlet of the blower (2) is connected to the air inlet duct (11); Temperature regulating component (3), the air inlet of the temperature regulating component (3) is connected to the air outlet duct (12), and the air outlet is connected to the air inlet of the blower (2); The test chamber (10) is equipped with an array of multiple BP boards (4), and the BP boards (4) are equipped with an array of N test ports (40). The test ports (40) are arranged horizontally on the BP boards (4), and the solid-state drive (5) is plugged into the test ports (40). The blower (2) generates airflow, which flows sequentially through the air inlet duct (11), the test chamber (10), the solid-state drive (5), the air outlet duct (12), and the temperature control component (3), and then flows back to the blower (2), forming an airflow circulation.
2. The high and low temperature testing equipment for solid-state drives according to claim 1, characterized in that, Multiple BP plates (4) are arranged in a rectangular array within the test cavity (10).
3. The high and low temperature testing equipment for solid-state drives according to claim 2, characterized in that, The number of layers of the multiple BP boards (4) arranged is greater than or equal to the number of columns.
4. The high and low temperature testing equipment for solid-state drives according to claim 2, characterized in that, The N test ports (40) are arranged in a rectangular array on the BP board (4), and N is a multiple of 4.
5. The high and low temperature testing equipment for solid-state drives according to claim 1, characterized in that, The BP board is equipped with multiple brackets (51), which are used to support the solid-state drive (5). Multiple ventilation holes (511) are provided on both sides of the brackets (51), and the ventilation holes (511) are located between two adjacent solid-state drives (5).
6. The high and low temperature testing equipment for solid-state drives according to claim 5, characterized in that, The solid-state drive (5) is inserted into the test port (40) in the direction of the airflow and in a horizontal direction, and the airflow flows between two adjacent solid-state drives (5).
7. The high and low temperature testing equipment for solid-state drives according to claim 1, characterized in that, The high and low temperature testing equipment also includes a guide plate (13), which forms the side wall of the test chamber (10), and a plurality of guide holes (131) are evenly opened on the guide plate (13).
8. The high and low temperature testing equipment for solid-state drives according to claim 1, characterized in that, The at least one test chamber (10) includes two test chambers (10), and the airflow directions in the two test chambers (10) are opposite.
9. The high and low temperature testing equipment for solid-state drives according to claim 8, characterized in that, The two air inlet ducts (11) are located between the two test chambers (10) and are interconnected. The blower (2) simultaneously discharges air into the two air inlet ducts (11).
10. The high and low temperature testing equipment for solid-state drives according to claim 8, characterized in that, The two air outlet ducts (12) are located between the two test chambers (10) and are interconnected. The temperature regulating component (3) simultaneously regulates the airflow from the two air outlet ducts (12).