High-frequency probe testing device

Abstract

The utility model discloses a high-frequency probe testing device, which comprises a testing box (3), a bracket (1) and a pressing assembly (2), wherein a testing circuit is arranged in the testing box (3); the pressing assembly (2) comprises a test plate (211); the test board (211) is provided with a plurality of groups of jacks; a carrier plate (213) and an indicating lamp (217) are fixed at the top of the test box (3); a plurality of groups of test points are arranged on the carrier plate (213); the test points and the indicating lamp (217) are electrically connected with the test circuit. The downward pressing assembly (2) is connected with the support (1). And the test plate (211) is arranged above the carrier plate (213) in a sliding manner. The high-frequency probe testing device disclosed by the utility model is convenient to operate, and the testing efficiency is effectively improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to probe test technical field especially relates to a high frequency probe testing device. BACKGROUND

[0002] The probe can be a kind of high-end precision electronic component, mainly applied in mobile phone and other electronic products, and plays a connecting role.The test probe is equivalent to a medium, and the head of the probe can be used to contact the electronic product to be tested during testing, and the other end is used to transmit signals or current.

[0003] The existing detection mode generally adopts the mode of manually holding detection pen to contact probe to detect, and the detection efficiency of this mode is low, the detection personnel are disturbed by subjective factors, which can affect the detection result, and only one probe is measured each time, so the efficiency is low. UTILITY MODEL CONTENT

[0004] The utility model provides a kind of high frequency probe testing device.

[0005] The high frequency probe testing device provided in the embodiment includes test box (3) with test circuit inside, support (1) and press-down component (2);The press-down component (2) includes test plate (211);The test plate (211) is equipped with multiple groups of jacks;The top of the test box (3) is fixed with carrier plate (213) and indicator light (217);The carrier plate (213) is equipped with multiple groups of test points;The test point and indicator light (217) are electrically connected with the test circuit;The press-down component (2) is connected with the support (1);The test plate (211) is slidably arranged above the carrier plate (213).

[0006] Preferably, the support (1) includes first plate body (103);The press-down component (2) further includes base (206), slide rod (203), fixed block (212), movable plate (210), first screw (202) and second screw (201);One end of the base (206) is equipped with sliding hole (207);The slide rod (203) is vertically downward and slidably arranged in the sliding hole (207);The outer wall of one end of the slide rod (203) is equipped with screw thread;The fixed block (212) is equipped with first through hole (214);The threaded end of the slide rod (203) is sequentially inserted into first screw (202), first fixed block (212) and second screw (201);The fixed block (212) is fixed with the movable plate (210).

[0007] Preferably, the movable plate (210) is equipped with needle hole (215) with same number and position as the jack;The carrier plate (213) is fixed on the top of the movable plate (210);The needle hole (215) and jack are coaxially arranged.

[0008] Preferably, the lower pressing assembly (2) further comprises a connecting piece (205) and a handle (204); one end of the connecting piece (205) is hinged to the end of the slide rod (203) away from the fixed block (212), and the other end is hinged to the handle (204); one end of the handle (204) is hinged to the end of the base (206) away from the slide hole (207).

[0009] Preferably, the support (1) comprises a second plate body (102) and a third plate body (104); the second plate body (102) and the third plate body (104) are arranged in parallel and are both vertically fixed to the top of the test box (3); the first plate body (103) is fixed to the front end of the third plate body (104) and the second plate body (102) close to the top; the base (206) is fixed to the first plate body (103).

[0010] Preferably, the lower pressing assembly (2) further comprises two groups of guide rods (208) and two linear bearings (209); the support (1) further comprises a fourth plate body (101); the fourth plate body (101) is fixed between the second plate body (102) and the third plate body (104); one end of each of the two guide rods (208) is fixed to the top of the test box (3), and the other end is fixed to the fourth plate body (101); the movable plate (210) is further provided with two groups of shaft holes (216); the two linear bearings (209) are respectively fixed in the two shaft holes (216); the two linear bearings (209) respectively slide on the two guide rods (208).

[0011] Preferably, the top of the test box (3) is further provided with a switch (218); the switch (218) is electrically connected to the test circuit.

[0012] The high-frequency probe testing device is convenient to operate and can effectively improve the testing efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0013] Figure 1 It is a schematic view of the three-dimensional structure of the high-frequency probe testing device provided by the utility model;

[0014] Figure 2 It is a schematic view of the three-dimensional structure of the high-frequency probe testing device provided by the utility model; Figure 1

[0015] Figure 3 It is a schematic view of the structure of the base, the slide rod, the connecting piece, the handle, the first screw and the second screw provided by the utility model embodiment;

[0016] Figure 4 ​The structure schematic view of the fixed block provided by the embodiment of the utility model;

[0017] Figure 5 The structure schematic view of the movable plate provided by the embodiment of the utility model;

[0018] Figure 6 The structure schematic view of the linear bearing provided by the embodiment of the utility model. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the technical scheme in the embodiments of the utility model will be described clearly and completely below in combination with the drawings in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0020] As Figures 1-6 The high-frequency probe testing device provided by the embodiment comprises a test box 3 internally provided with a test circuit (not shown in the drawing), a support 1 and a pressing assembly 2. The pressing assembly 2 comprises a test plate 211. The test plate 211 is provided with a plurality of groups of jacks. The top of the test box 3 is fixedly provided with a carrier plate 213 and an indicator lamp 217. The carrier plate 213 is provided with a plurality of groups of test points. The test points and the indicator lamp 217 are electrically connected with the test circuit. The pressing assembly 2 is connected with the support 1. The test plate 211 is slidingly arranged above the carrier plate 213. Those skilled in the art can understand that the staff needs to insert the high-frequency probe 4 into the jack, clamp the wire connected with the test circuit to the tail of the high-frequency probe 4, and press down the pressing assembly 2 to make the high-frequency probe 4 on the test plate 211 abut against the test point on the carrier plate 213. The indicator lamp 217 is bright, which indicates that the group of high-frequency probes 4 is qualified. The indicator lamp 217 is not bright, which indicates that the group of high-frequency probes 4 has defects. The test circuit is the prior art in the field and will not be described here. The device has simple structure, convenient operation and can effectively improve the testing efficiency.

[0021] Further, the support 1 comprises a first plate body 103; the pressing assembly 2 further comprises a base 206, a slide rod 203, a fixed block 212, a movable plate 210, a first screw 202 and a second screw 201; one end of the base 206 is provided with a slide hole 207; the slide rod 203 is vertically downward and is arranged in the slide hole 207 in a sliding mode; the outer wall of one end of the slide rod 203 is provided with a screw thread; the fixed block 212 is provided with a first through hole 214; the end of the slide rod 203 with the screw thread is sequentially inserted into the first screw 202, the first fixed block 212 and the second screw 201; the fixed block 212 and the movable plate 210 are fixed. Those skilled in the art can understand that the fixed block 212 is locked at one end of the slide rod 203 through the first screw 202 and the second screw 201.

[0022] Further, the movable plate 210 is provided with a plurality of pinholes 215 which are the same in number and position as the insertion holes; the carrier plate 213 is fixed on the top of the movable plate 210; the pinholes 215 and the insertion holes are coaxially arranged.

[0023] Further, the pressing assembly 2 further comprises a connecting piece 205 and a handle 204; one end of the connecting piece 205 is hingedly connected to the end of the slide rod 203 away from the fixed block 212, and the other end is hingedly connected to the handle 204; one end of the handle 204 is hingedly connected to the end of the base 206 away from the slide hole 207. Those skilled in the art can understand that the sliding of the slide rod 203 is controlled by pulling the handle 204.

[0024] Further, the support 1 comprises a second plate body 102 and a third plate body 104; the second plate body 102 and the third plate body 104 are arranged in parallel and are both vertically fixed on the top of the test box 3; the first plate body 103 is fixed on the front end of the third plate body 104 and the second plate body 102 close to the top; the base 206 is fixed with the first plate body 103.

[0025] Further, the pressing assembly 2 further comprises two groups of guide rods 208 and two linear bearings 209; the support 1 further comprises a fourth plate body 101; the fourth plate body 101 is fixed between the second plate body 102 and the third plate body 104; one end of each of the two guide rods 208 is fixed to the top of the test box 3, and the other end is fixed to the fourth plate body 101; the movable plate 210 is further provided with two groups of shaft holes 216; the two linear bearings 209 are respectively fixed in the two shaft holes 216; the two linear bearings 209 respectively slide on the two guide rods 208. Those skilled in the art can understand that the stability of the upward and downward sliding of the movable plate 210 is improved through the two guide rods 208, so as to improve the accuracy of the contact of the high-frequency probe 4 with the test points, thereby improving the test accuracy.

[0026] Further, the top of the test box 3 is also equipped with a switch 218; the switch 218 is electrically connected with the test circuit.

[0027] Finally, it should be noted that: the above examples are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing examples, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing examples, or make equivalent replacement for part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A high frequency probe testing apparatus characterized by comprising: The utility model provides a test box, it includes test box (3) that is equipped with test circuit in the inside, support (1) and down pressure subassembly (2), down pressure subassembly (2) includes test board (211), test board (211) is equipped with multiple groups of jack, the top of test box (3) is fixed with carrier board (213) and pilot lamp (217), carrier board (213) is equipped with multiple groups of test point, test point and pilot lamp (217) all with test circuit electricity is connected, down pressure subassembly (2) with support (1) is connected, test board (211) is above carrier board (213) sliding arrangement.

2. The high frequency probe testing apparatus according to claim 1, wherein Support (1) includes first plate body (103), down pressure subassembly (2) still includes base (206), slide rod (203), fixed block (212), movable plate (210), first screw (202) and second screw (201), one end of base (206) is equipped with slide hole (207), slide rod (203) is vertically downward and is above the slide hole (207) sliding arrangement, the outer wall of one end of slide rod (203) is equipped with screw thread, first through -hole (214) is equipped on fixed block (212), the end of slide rod (207) with screw thread is inserted first screw (202), first fixed block (212) and second screw (201) in proper order, fixed block (212) with movable plate (210) are fixed.

3. The high frequency probe testing apparatus according to claim 2, wherein Movable plate (210) is equipped with needle hole (215) of same number and location with jack, carrier board (213) is fixed in the top of movable plate (210), needle hole (215) and jack are arranged coaxially.

4. The high frequency probe testing apparatus according to claim 3, wherein Down pressure subassembly (2) still includes connecting piece (205) and handle (204), one end of connecting piece (205) and the end of slide rod (203) away from fixed block (212) hinged, the other end and the handle (204) handle body hinged, one end of handle (204) and the end of base (206) away from slide hole (207) hinged.

5. The high frequency probe testing apparatus according to claim 4, wherein Support (1) includes second plate body (102) and third plate body (104), second plate body (102) and third plate body (104) parallelly arranged, and all are vertically fixed in the top of test box (3), first plate body (103) is fixed in the front end of third plate body (104) and second plate body (102) close to top, base (206) with first plate body (103) are fixed.

6. The high frequency probe testing apparatus according to claim 5, wherein The lower pressing assembly (2) further comprises two groups of guide rods (208) and two linear bearings (209); the support (1) further comprises a fourth plate body (101); the fourth plate body (101) is fixed between the second plate body (102) and the third plate body (104); one end of each of the two guide rods (208) is fixed to the top of the test box (3), and the other end is fixed to the fourth plate body (101); the movable plate (210) is further provided with two groups of shaft holes (216); the two linear bearings (209) are respectively fixed in the two shaft holes (216); the two linear bearings (209) slide on the two guide rods (208) respectively.

7. The high frequency probe testing apparatus according to claim 6, wherein The top of the test box (3) is further provided with a switch (218); the switch (218) is electrically connected with the test circuit.

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