Conveying table with classification function for testing semiconductor devices

Abstract

The utility model discloses a conveying table with a classification function for testing semiconductor devices, which comprises a conveyor body and a first support frame, the outer wall of the conveyor body is provided with the first support frame, and the outer wall of the first support frame is provided with a testing device body. A first conveying channel is arranged at the end, away from the first supporting frame, of the outer wall of the conveyor body, a second conveying channel is arranged on the portion, on one side of the first conveying channel, of the outer wall of the conveyor body, an electric push rod is movably installed at the bottom end of the conveyor body, and a connecting block is installed at the output end of the electric push rod. And a supporting rod is arranged at the bottom end of the conveyor body on one side of the electric push rod. According to the rotary type conveying table, convenient rotary type clamping and straightening are achieved, blocking type output of unqualified products is facilitated, rotary type classified conveying is facilitated, the labor intensity of manual classification is relieved, and the classified conveying efficiency of the conveying table is improved.

Description

Technical Field

[0001] This utility model relates to the field of conveyor technology, specifically a conveyor with sorting function for semiconductor device testing. Background Technology

[0002] Semiconductor devices are electronic devices whose conductivity lies between that of a good conductor and an insulator. They utilize the special electrical properties of semiconductor materials to perform specific functions. They can be used to generate, control, receive, transform, and amplify signals, and to perform energy conversion. The semiconductor materials in semiconductor devices are silicon, germanium, or gallium arsenide, and they can be used as rectifiers, oscillators, light emitters, amplifiers, photometers, and other equipment. To distinguish them from integrated circuits, they are sometimes also called discrete devices.

[0003] For example, the logistics conveying device with efficient material sorting function disclosed in the authorization announcement number CN216574277U includes a mounting frame, a bracket, an electrostatic generator and an electrostatic adsorption plate. The bracket is fixed on one side wall of the mounting frame, and the bracket is connected to the mounting frame by screws. The electrostatic generator is provided at the upper end of the bracket.

[0004] While it achieves the goal of collecting and adsorbing dust near the scanning probe by setting up an electrostatic generator and an electrostatic adsorption plate, thus preventing dust from falling on the scanning probe surface and affecting the scanning accuracy and reading rate, thereby ensuring the high efficiency of the device's identification and improving its practicality and classification efficiency, it does not solve the problems of the existing conveyor table's inconvenience in convenient rotating clamping and alignment, its inconvenience in blocking the output of unqualified products, its inconvenience in rotating classification and conveying, its increased labor intensity in manual classification, and its significant impact on the efficiency of the conveyor table's classification and conveying. Utility Model Content

[0005] The purpose of this utility model is to provide a conveyor with a sorting function for semiconductor device testing, so as to solve the problems mentioned in the background art, such as the inconvenience of convenient rotating clamping and straightening of the conveyor, the inconvenience of blocking the output of unqualified products, the inconvenience of rotating sorting and conveying, the increase of manual sorting labor intensity, and the impact on the efficiency of sorting and conveying of the conveyor.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a semiconductor device testing conveyor with a classification function, comprising a conveyor body and a first support frame. The first support frame is installed on the outer wall of the conveyor body, and a testing device body is installed on the outer wall of the first support frame. A first conveying channel is provided on the outer wall of the conveyor body away from the first support frame. A second conveying channel is provided on the outer wall of the conveyor body on one side of the first conveying channel. An electric push rod is movably installed at the bottom of the conveyor body. A connecting block is installed at the output end of the electric push rod. A support rod is provided at the bottom of the conveyor body on one side of the electric push rod. A connecting arm is fitted on the surface of the support rod. A connecting shaft is installed at the end of the connecting arm near the connecting block, and the connecting arm is movably connected to the connecting block through the connecting shaft. Support seats are symmetrically installed on the outer wall of the conveyor body on one side of the support rod. Connecting rods are movably installed inside each support seat, and the connecting rods extend to the outside of the support seat. A leveling frame is installed on the surface of each connecting rod above the support seat. Connecting sleeves are installed at both ends of each support rod.

[0007] Preferably, a rocker arm is installed at the bottom of the connecting rod on one side of the connecting sleeve, and a movable shaft is installed at the end of the rocker arm near the connecting sleeve, and the rocker arm is movably connected to the connecting sleeve through the movable shaft.

[0008] Preferably, a support box is installed on the outer wall of the conveyor body on one side of the first support frame, a first motor is installed on the outer wall of the support box, a first worm gear is provided inside the support box on one side of the first motor, and the output end of the first motor is connected to the first worm gear.

[0009] Preferably, a support shaft is movably installed inside the support box on one side of the first worm gear, and the support shaft extends to the outside of the support box, with a movable arm installed at the top of the support shaft.

[0010] Preferably, a first worm gear is fitted onto the surface of the support shaft inside the support box, and the first worm and the first worm gear mesh with each other. A conveying slide is provided on the outer wall of the conveyor body on the side away from the support box.

[0011] Preferably, a second support frame is installed on the outer wall of the conveyor body on one side of the support box, a connecting box is installed at the top of the second support frame, a second motor is installed inside the connecting box, a rotating shaft is movably installed inside the connecting box on one side of the second motor, and the rotating shaft extends to the outside of the connecting box, and a baffle is fitted on the surface of the rotating shaft outside the connecting box.

[0012] Preferably, a second worm is installed at the output end of the second motor, and a second worm wheel is fitted on the surface of the rotating shaft on one side of the second worm, and the second worm and the second worm wheel mesh with each other.

[0013] Preferably, a control panel is installed on the outer wall of the conveyor body, and the output end of the control panel is electrically connected to the input ends of the conveyor body, the test device body, the electric push rod, the first motor, and the second motor.

[0014] Compared with the prior art, the beneficial effects of this utility model are: the conveyor table not only realizes convenient rotating clamping and straightening, which facilitates the blocking output of unqualified products and facilitates rotating sorting and conveying, but also reduces the labor intensity of manual sorting and improves the efficiency of sorting and conveying of the conveyor table.

[0015] The semiconductor device under test is transported by the conveyor body. The connecting block is driven by an electric push rod to move. The connecting block drives the connecting arm to move via the connecting shaft. The connecting arm drives the support rod to move. The support rod drives the connecting sleeve to move. The connecting sleeve drives the rocker arm to rotate via the movable shaft. The rocker arm drives the connecting rod to rotate. The connecting rod drives the alignment frame to rotate. This facilitates the rotational clamping and alignment of the semiconductor device by two sets of alignment frames. The semiconductor device is tested by the testing device body. The first motor drives the first worm gear to rotate. The first worm gear drives the first worm wheel to rotate. The first worm wheel drives the support shaft to rotate. The support shaft drives the movable arm to rotate. This facilitates the movable arm to rotate to one side of the conveyor slide. The movable arm blocks the semiconductor device being transported, facilitating its transport to the next process via the conveyor slide. This achieves convenient rotational clamping and alignment of the conveyor table, facilitating the testing of semiconductor devices, and enabling the blocking output of defective products, thus improving the convenience of the conveyor table.

[0016] The second motor drives the second worm gear to rotate, which in turn drives the second worm wheel to rotate. The worm wheel then drives the rotating shaft to rotate, which in turn drives the baffle to rotate. This allows the baffle to rotate to one side of the second conveying channel, facilitating the transport of semiconductor devices through the first conveying channel to the next process. When the semiconductor devices pass the test and meet the Class II standard, the connecting box is rotated in the opposite direction, causing the rotating shaft to drive the baffle to rotate to one side of the first conveying channel, facilitating the transport of semiconductor devices through the second conveying channel to the next process. This achieves convenient rotary sorting and transport of the conveyor, reducing the labor intensity of manual sorting and improving the efficiency of the conveyor's sorting and transport. Attached Figure Description

[0017] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0018] Figure 2 This is a three-dimensional structural diagram of the movable arm of this utility model;

[0019] Figure 3 This is a front view structural diagram of the present utility model;

[0020] Figure 4 This is a three-dimensional enlarged structural diagram of the electric actuator of this utility model;

[0021] Figure 5 This is an enlarged rear cross-sectional view of the support box of this utility model.

[0022] Figure 6 For the present utility model Figure 5 Enlarged structural diagram at point A in the middle.

[0023] In the diagram: 1. Conveyor body; 2. First support frame; 3. Test device body; 4. First conveying channel; 5. Second conveying channel; 6. Electric push rod; 7. Connecting block; 8. Support rod; 9. Connecting arm; 10. Connecting shaft; 11. Support base; 12. Connecting rod; 13. Rocker arm; 14. Connecting sleeve; 15. Movable shaft; 16. Alignment frame; 17. Support box; 18. First motor; 19. First worm gear; 20. First worm wheel; 21. Movable shaft; 22. Movable arm; 23. Conveying slide; 24. Second support frame; 25. Connecting box; 26. Second motor; 27. Second worm gear; 28. Second worm wheel; 29. ​​Rotating shaft; 30. Baffle; 31. Control panel. Detailed Implementation

[0024] To further illustrate the technical means and effects adopted by this utility model in order to achieve the intended utility model purpose, the following detailed description of the specific implementation methods, structure, features and effects of this utility model is provided in conjunction with the accompanying drawings and preferred embodiments.

[0025] Please see Figure 1-6This utility model provides an embodiment of a semiconductor device testing conveyor with a sorting function, comprising a conveyor body 1 and a first support frame 2. The first support frame 2 is mounted on the outer wall of the conveyor body 1, and a testing device body 3 is mounted on the outer wall of the first support frame 2. A first conveying channel 4 is provided at one end of the outer wall of the conveyor body 1 away from the first support frame 2, and a second conveying channel 5 is provided on the outer wall of the conveyor body 1 on one side of the first conveying channel 4. An electric push rod 6 is movably mounted at the bottom end of the conveyor body 1. The electric push rod 6 provides power output. A connecting block 7 is installed at the output end of the electric push rod 6. A support rod 8 is located at the bottom of the conveyor body 1 on one side of the electric push rod 6. A connecting arm 9 is fitted onto the surface of the support rod 8. A connecting shaft 10 is installed at the end of the connecting arm 9 near the connecting block 7, and the connecting arm 9 is movably connected to the connecting block 7 via the connecting shaft 10. Support seats 11 are symmetrically installed on the outer wall of the conveyor body 1 on one side of the support rod 8. Connecting rods 12 are movably installed inside each support seat 11, and each connecting rod 12 extends to the outside of the support seat 11. A leveling frame 16 is installed on the surface of the connecting rod 12 above the seat 11. Connecting sleeves 14 are installed at both ends of the support rod 8. A rocker arm 13 is installed at the bottom of the connecting rod 12 on one side of the connecting sleeve 14. A movable shaft 15 is installed at the end of each rocker arm 13 near the connecting sleeve 14, and the rocker arm 13 is movably connected to the connecting sleeve 14 via the movable shaft 15. A support box 17 is installed on the outer wall of the conveyor body 1 on one side of the first support frame 2. A first motor 18 is installed on the outer wall of the support box 17, and the first motor 18 provides power output. A first worm gear 19 is provided inside the support box 17 on one side of the first motor 18, and the output end of the first motor 18 is connected to the first worm gear 19. A support shaft 21 is movably installed inside the support box 17 on one side of the first worm gear 19, and the support shaft 21 extends to the outside of the support box 17. A movable arm 22 is installed at the top of the support shaft 21. A first worm wheel 20 is fitted on the surface of the support shaft 21 inside the support box 17, and the first worm gear 19 and the first worm wheel 20 mesh with each other. A conveying slide 23 is provided on the outer wall of the conveyor body 1 on the side away from the support box 17.

[0026] In use, the conveyor body 1 is opened via the control panel 31, and the conveyor body 1 transports the semiconductor device under test. When the semiconductor device deviates from its designated position, the electric push rod 6 is opened via the control panel 31. Supported by the conveyor body 1, the electric push rod 6 drives the connecting block 7 to move. The connecting block 7 drives the connecting arm 9 to move via the connecting shaft 10. The connecting arm 9 drives the support rod 8 to move. The support rod 8 drives the connecting sleeve 14 to move. The connecting sleeve 14 drives the rocker arm 13 to rotate via the movable shaft 15. Supported by the support base 11, the rocker arm 13 drives the connecting rod 12 to rotate. The connecting rod 12 drives the alignment frame 16 to rotate, facilitating the rotational clamping and alignment of the semiconductor device by the two sets of alignment frames 16. The testing device body 3 is then opened via the control panel 31, and the testing device body 3 performs... When a test fails, feedback is sent from the testing device body 3 to the control panel 31. The control panel 31 then activates the first motor 18. Supported by the support box 17, the first motor 18 drives the first worm gear 19 to rotate. Under the meshing action of the first worm gear 19 and the first worm wheel 20, the first worm gear 19 drives the first worm wheel 20 to rotate, which in turn drives the support shaft 21 to rotate. The support shaft 21 then drives the movable arm 22 to rotate, facilitating the rotation of the movable arm 22 to one side of the conveyor slide 23. The movable arm 22 then blocks the incoming semiconductor device, allowing it to be transported to the next process via the conveyor slide 23. This achieves convenient rotating clamping and alignment of the conveyor table, facilitating the testing of semiconductor devices and the blocking output of defective products, thus improving the convenience of the conveyor table.

[0027] A second support frame 24 is installed on the outer wall of the conveyor body 1 on one side of the support box 17. A connecting box 25 is installed at the top of the second support frame 24. A second motor 26 is installed inside the connecting box 25. The second motor 26 provides power output. A rotating shaft 29 is movably installed inside the connecting box 25 on one side of the second motor 26. The rotating shaft 29 extends to the outside of the connecting box 25. A baffle 30 is fitted on the surface of the rotating shaft 29 outside the connecting box 25. A second worm 27 is installed at the output end of the second motor 26. A second worm wheel 28 is fitted on the surface of the rotating shaft 29 on one side of the second worm 27. The second worm 27 and the second worm wheel 28 mesh with each other. A control panel 31 is installed on the outer wall of the conveyor body 1. The output end of the control panel 31 is electrically connected to the input ends of the conveyor body 1, the test device body 3, the electric push rod 6, the first motor 18, and the second motor 26.

[0028] In use, when the semiconductor device passes the Class I standard test, the first motor 18 is rotated in the reverse direction to move the movable arm 22 away from one side of the conveyor slide 23, facilitating the continued conveying of the semiconductor device by the conveyor body 1. The second motor 26 is then activated via the control panel 31. Supported by the connecting box 25, the second motor 26 drives the second worm 27 to rotate. Through the meshing of the second worm 27 and the second worm wheel 28, the second worm 27 drives the second worm wheel 28 to rotate, which in turn drives the rotating shaft 29 to rotate. The rotating shaft 29 drives the baffle 30 to rotate to one side of the second conveying channel 5, facilitating the transport of semiconductor devices through the first conveying channel 4 to the next process. When the semiconductor device passes the test and meets the Class II standard, the connecting box 25 is rotated in the opposite direction to make the rotating shaft 29 drive the baffle 30 to rotate to one side of the first conveying channel 4, facilitating the transport of semiconductor devices through the second conveying channel 5 to the next process. This realizes convenient rotating classification and transport of the conveyor, reduces the labor intensity of manual classification, and improves the efficiency of the conveyor's classification and transport.

[0029] Working Principle: During use, an external power supply is connected. The conveyor body 1 transports the semiconductor device under test. When the semiconductor device deviates from its designated path, the electric push rod 6 drives the connecting block 7 to move. The connecting block 7, through the connecting shaft 10, drives the connecting arm 9 to move. The connecting arm 9 drives the support rod 8 to move. The support rod 8 drives the connecting sleeve 14 to move. The connecting sleeve 14, through the movable shaft 15, drives the rocker arm 13 to rotate. Supported by the support base 11, the rocker arm 13 drives the connecting rod 12 to rotate. The connecting rod 12 drives the alignment frame 16 to rotate, facilitating the rotational clamping and alignment of the semiconductor device by the two alignment frames 16. The testing device body 3 then tests the semiconductor device. If the test fails, the control panel 31 activates the first motor 18, which drives the first worm gear 19 to rotate. The first worm gear 19 drives the first worm wheel 20 to rotate, which in turn drives the support shaft 21 to rotate. The support shaft 21 then drives the movable arm 22 to rotate, facilitating the rotation of the movable arm 22 to the conveyor slide 23. On one side, the movable arm 22 blocks the incoming semiconductor device to facilitate its transport through the conveyor slide 23 to the next process. When the semiconductor device passes the test and meets the Class I standard, the first motor 18 is operated to rotate in the reverse direction, causing the movable arm 22 to move away from one side of the conveyor slide 23, allowing the conveyor body 1 to continue transporting the semiconductor device. The second motor 26 drives the second worm 27 to rotate, which in turn drives the second worm wheel 28 to rotate. The second worm wheel 28 drives the rotating shaft 29 to rotate, which in turn drives the baffle 30 to rotate to one side of the second conveyor channel 5, facilitating the transport of the semiconductor device through the first conveyor channel 4 to the next process. When the semiconductor device passes the test and meets the Class II standard, the connecting box 25 is operated to rotate in the reverse direction, causing the rotating shaft 29 to drive the baffle 30 to rotate to one side of the first conveyor channel 4, facilitating the transport of the semiconductor device through the second conveyor channel 5 to the next process, thus completing the use of the conveyor table.

[0030] The above description is merely a preferred embodiment of the present utility model and is not intended to limit the present utility model in any way. Although the present utility model has been disclosed above with reference to a preferred embodiment, it is not intended to limit the present utility model. Any person skilled in the art can make some modifications or alterations to the above-disclosed technical content to create equivalent embodiments without departing from the scope of the present utility model. Any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present utility model without departing from the scope of the present utility model shall still fall within the scope of the present utility model.

Claims

1. A conveying table with sorting function for testing semiconductor devices, comprising a conveyor body (1) and a first support frame (2), characterized in that: The outer wall of the conveyor body (1) is provided with a first support frame (2), the outer wall of the first support frame (2) is provided with a test device body (3), one end of the outer wall of the conveyor body (1) away from the first support frame (2) is provided with a first conveying channel (4), one side of the first conveying channel (4) is provided with a second conveying channel (5), the bottom end of the conveyor body (1) is movably provided with an electric push rod (6), the output end of the electric push rod (6) is provided with a connecting block (7), one side of the electric push rod (6) is provided with a support rod (8), the surface of the support rod (8) is provided with a connecting arm (9), one end of the connecting arm (9) close to the connecting block (7) is provided with a connecting shaft (10), and the connecting arm (9) is movably connected with the connecting block (7) through the connecting shaft (10), the outer wall of the conveyor body (1) on one side of the support rod (8) is symmetrically provided with a support seat (11), the inside of the support seat (11) is movably provided with a connecting rod (12), and the connecting rod (12) extends to the outside of the support seat (11), the surface of the connecting rod (12) above the support seat (11) is provided with a straightening frame (16), and both ends of the support rod (8) are provided with a connecting sleeve (14).

2. The conveying table having a sorting function for testing a semiconductor device according to claim 1, wherein: The bottom end of the connecting rod (12) on one side of the connecting sleeve (14) is provided with a rocker arm (13), one end of the rocker arm (13) close to the connecting sleeve (14) is provided with a movable shaft (15), and the rocker arm (13) is movably connected with the connecting sleeve (14) through the movable shaft (15).

3. The delivery table with sorting function for testing a semiconductor device according to claim 1, wherein: The outer wall of the conveyor body (1) on one side of the first support frame (2) is provided with a support box (17), the outer wall of the support box (17) is provided with a first motor (18), the inside of the support box (17) on one side of the first motor (18) is provided with a first worm (19), and the output end of the first motor (18) is connected with the first worm (19).

4. The delivery table with a sorting function for testing a semiconductor device according to claim 3, wherein: The inside of the support box (17) on one side of the first worm (19) is movably provided with a support shaft (21), and the support shaft (21) extends to the outside of the support box (17), and the top end of the support shaft (21) is provided with a movable arm (22).

5. The delivery table with sorting function for testing a semiconductor device according to claim 4, wherein: The surface of the support shaft (21) in the support box (17) is provided with a first worm wheel (20), and the first worm (19) and the first worm wheel (20) are meshed with each other, and the outer wall of the conveyor body (1) away from the support box (17) is provided with a conveying chute (23).

6. The delivery table with a sorting function for testing a semiconductor device according to claim 5, wherein: The outer wall of the conveyor body (1) on one side of the support box (17) is provided with a second support frame (24), the top end of the second support frame (24) is provided with a connecting box (25), the inside of the connecting box (25) is provided with a second motor (26), the inside of the connecting box (25) on one side of the second motor (26) is movably provided with a rotating shaft (29), and the rotating shaft (29) extends to the outside of the connecting box (25), and the surface of the rotating shaft (29) outside the connecting box (25) is provided with a baffle (30).

7. The delivery table with sorting function for testing semiconductor devices according to claim 6, characterized in that: The output end of the second motor (26) is provided with a second worm (27), the surface of the rotating shaft (29) of one side of the second worm (27) is provided with a second worm wheel (28), and the second worm (27) and the second worm wheel (28) are in meshing engagement.

8. The delivery table with a sorting function for testing a semiconductor device according to claim 7, wherein: The outer wall of the conveyor body (1) is provided with a control panel (31), and the output end of the control panel (31) is electrically connected with the input ends of the conveyor body (1), the test device body (3), the electric push rod (6), the first motor (18) and the second motor (26).

Images