Automatic testing device for electrical parameters of batch components

Abstract

The utility model discloses a batch component electrical parameter automatic test device, comprising a test tool (1), an input terminal of a multichannel relay (3) is connected with the test tool (1) through a concentrator (2), a communication terminal of the multichannel relay (3) is connected with a computer (4), an output terminal of the multichannel relay (3) is connected with a digital bridge (5) and a leakage current tester (6), and the digital bridge (5) and the leakage current tester (6) are connected with the concentrator (2). And the computer (4) is connected with communication interfaces of the digital bridge (5) and the leakage current tester (6).

Description

TECHNICAL FIELD

[0001] The utility model belongs to electronic component testing technical field, especially relate to a batch electronic component electric parameter automatic testing device. BACKGROUND

[0002] With the transformation of modern war mode to informationization, the performance and reliability of military electronic components are increasingly required. Manual testing is difficult to meet the testing requirements of large scale, high efficiency and high precision. Automatic testing can significantly reduce labor costs, improve testing efficiency and accuracy, and is conducive to speeding up the development and production progress of weapons and equipment. The development of electronic component automatic testing equipment and the integration of artificial intelligence, big data and other technologies make the testing of military electronic components more intelligent and automated.

[0003] In the field of electronic component reliability inspection and testing, some testing institutions have introduced electronic component automatic testing equipment to realize automatic testing of electronic components. However, most automatic testing equipment adopts a turret structure, which is limited by the number of test instrument channels. Only single cycle testing of the device to be tested can be performed, and only one parameter can be tested at a time, so batch testing of multiple parameters of the device cannot be realized.

[0004] CN 214150913U discloses an efficient electronic component automatic testing device, which can perform full-automatic detection and realize high-precision positioning of the device testing position, but cannot perform batch testing of the device to be tested, and has great limitations for different types of devices.

[0005] CN 217478277U discloses an electronic component turret type automatic testing and packaging integrated machine, which includes a feeding mechanism, a testing mechanism and a packaging testing mechanism. The testing mechanism includes a turntable mechanism and a first testing unit, which can realize automatic testing and packaging of electronic components. However, it is limited to single-channel testing, and each additional testing parameter requires an additional testing station, which is complex in structure and not easy to maintain. UTILITY MODEL CONTENT

[0006] The utility model solves the technical problem: provide a batch electronic component electric parameter automatic testing device to solve the problem that the traditional electronic component automatic testing device can only realize single parameter testing of single device.

[0007] The technical scheme of the utility model is:

[0008] A batch electronic component electric parameter automatic testing device, the device includes a testing fixture, a multi-channel relay input end is connected with the testing fixture through a concentrator, a multi-channel relay communication end is connected with a computer, a multi-channel relay output end is connected with a digital bridge and a leakage current tester, and a communication interface of the computer is connected with the digital bridge and the leakage current tester.

[0009] The test fixture comprises a multi-core plug, a floating plate, a test seat and a circuit board; the floating plate is located above the test seat; the floating plate is provided with nine workstations, and the test seat is provided with spring probes at positions corresponding to the workstations, and the spring probes are fixedly connected with the circuit board.

[0010] Four spring probes are arranged in each workstation of the test seat, and the four spring probes are arranged in two groups on two sides of the workstation, one group is a positive electrode, and the other group is a negative electrode.

[0011] The multi-core plug comprises 19 plug cores, the No. 1-9 plug cores correspond to the positive electrode probes in the nine workstations, the No. 11-19 plug cores correspond to the negative electrode probes in the nine workstations, and the No. 1-9 plug cores are internally connected and short-circuited with the No. 10 plug core.

[0012] The multi-channel relay comprises No. 1-28 connectors, wherein the No. 1-9 connectors are connected with the No. 19-11 plug cores of the multi-core plug one by one, the No. 13 and 14 connectors are connected with the No. 10 plug core of the multi-core plug after being short-circuited, and the No. 20-28 connectors are short-circuited in pairs. The No. 27 connector is connected with the positive electrode of the test end of the leakage current tester, the No. 28 connector is connected with the positive electrode of the test end of the digital bridge, the No. 15 connector is connected with the negative electrode of the test end of the digital bridge, and the No. 16 connector is connected with the negative electrode of the test end of the leakage current tester.

[0013] The utility model discloses the beneficial effects of the following:

[0014] Compared with the traditional electronic component automatic test equipment, the utility model discloses can realize the batch testing of device without purchasing the expensive multi-channel test instrument, and has strong expandability, satisfies the automatic test of various types of devices. The multi-station test fixture and the multi-channel relay are matched to scan and test the device to be tested in the test fixture. At the same time, the multi-channel relay is used to realize the automatic selection of test parameters, solve the problems that the traditional electronic component automatic test device cannot realize batch, multi-parameter automatic test, and cannot adapt to the industry characteristics of multi-batch and small batch of component inspection and detection industry. Small batch devices of different types can be automatically tested automatically, and the operation is simple and easy to maintain, and the detection efficiency is further improved.

[0015] Efficiency: the multi-channel design enables the test device to automatically test multiple devices and multiple parameters at a time, saving the cost of purchasing a multi-channel test instrument and greatly improving the detection efficiency.

[0016] Stability: the advanced control system and stable circuit structure ensure the stability and reliability of the test device during long-time operation.

[0017] Maintainability: The device has a simple structure and is easy to maintain. It can achieve compatibility with different types of devices simply by changing the test fixture, which reduces maintenance costs.

[0018] This solves the problem that traditional automatic testing devices for electronic components can only perform single-parameter testing on a single component. Attached Figure Description

[0019] Fig. 1 This is a schematic diagram of the overall structure of this utility model;

[0020] Fig. 2 This is a schematic diagram of the test fixture structure of this utility model;

[0021] Fig. 3 This is a wiring diagram of the various components of this utility model.

[0022] The markings in the diagram are: 1. Test fixture, 2. Hub, 3. Multi-channel relay, 4. Computer, 5. Digital bridge, 6. Leakage current tester, 11. Multi-pin plug, 12. Floating plate, 13. Test socket, 14. Circuit board, 51. Digital bridge test terminal, 52. Positive terminal of digital bridge test terminal, 53. Negative terminal of digital bridge test terminal, 61. Leakage current tester test terminal, 62. Positive terminal of leakage current tester test terminal, 63. Negative terminal of leakage current tester test terminal. Detailed Implementation

[0023] like Figs. 1-3 As shown, an automatic testing device for electrical parameters of mass-produced electronic components includes a test fixture 1, a hub 2, a multi-channel relay 3, a computer 4, a digital bridge 5, and a leakage current tester 6. The input terminal of the multi-channel relay 3 is connected to the test fixture 1 through the hub 2, the communication terminal of the multi-channel relay 3 is connected to the computer 4, the output terminal of the multi-channel relay 3 is connected to the digital bridge 5 and the leakage current tester 6, and the computer 4 is connected to the communication interface of the digital bridge 5 and the leakage current tester 6.

[0024] The test fixture 1 includes a multi-pin plug 11, a float plate 12, a test base 13, and a circuit board 14. The float plate 12 is located on the test base 13 and has nine stations. Spring probes are installed at corresponding positions on the test base 13, with their ends fixedly connected to the circuit board 14 to perform scanning tests on the nine devices under test. Each station on the test base 13 has four spring probes installed, arranged in pairs on both sides of the station, with one pair being the positive terminal and the other the negative terminal. The terminals of the circuit board 14 are connected to the multi-pin plug 11. The multi-pin plug 11 includes 19 pins. Pins 1-9 correspond to the positive probes in the nine stations, and pins 11-19 correspond to the negative probes in the nine stations. Pins 1-9 are internally connected and short-circuited with pin 10.

[0025] The multi-channel relay 3 includes connectors 1-28. Connectors 1-9 are connected one-to-one with pins 19-11 of the multi-core plug 11. Pins 13 and 14 are shorted and then connected to pin 10 of the multi-core plug 11. Connectors 20-28 are shorted in pairs. Connector 27 is connected to the positive terminal 62 of the leakage current tester 61. Connector 28 is connected to the positive terminal 52 of the digital bridge tester 51. Connector 15 is connected to the negative terminal 53 of the digital bridge tester 51. Connector 16 is connected to the negative terminal 63 of the leakage current tester 61.

[0026] Once the test fixture 1 is filled with devices, the computer 4 first controls the opening and closing of channels 14-15 and 13-16 of the multi-channel relay (3) to select the test instrument. Secondly, the computer 4 controls the opening and closing of the remaining channels of the multi-channel relay 3 to perform scanning tests on the devices in the test fixture 1.

[0027] The hub 2 is used to convert the test lines of each station on the test fixture 1 to the input cables of the multi-channel relay 3, so as to ensure that the stations of the test fixture 1 correspond one-to-one with the channels of the multi-channel relay 3.

[0028] The multi-channel relay 3, digital bridge 5, and leakage current tester 6 are all connected to the computer 4 through a communication interface, thereby realizing automatic channel switching and automatic data acquisition.

[0029] Computer 4 is equipped with host computer software, which can automatically adjust the opening and closing of each channel of multi-channel relay 3 according to the number of devices placed in the test fixture. At the same time, the host computer software is also responsible for switching test instruments through multi-channel relay 3, and finally automatically collecting test data from digital bridge 5 and leakage current tester 6.

[0030] This invention arranges the nine stations of the test fixture with the components, and then uses a computer to control the opening and closing of the corresponding channels of a multi-channel relay. This firstly achieves automatic selection of the test instrument, i.e., automatic selection of the test parameters, and secondly, automatic selection of the nine stations of the test fixture. Finally, it uses a single-channel test instrument to achieve automatic multi-parameter testing of a batch of components, which greatly improves the efficiency of component testing and reduces testing costs.

Claims

1. A batch automatic testing device for electrical parameters of components, characterized in that: The device comprises a test fixture (1), a multi-channel relay (3) input end is connected with the test fixture (1) through a hub (2), a multi-channel relay (3) communication end is connected with a computer (4), a multi-channel relay (3) output end is connected with a digital bridge (5) and a leakage current tester (6), and the computer (4) is connected with a communication interface of the digital bridge (5) and the leakage current tester (6).

2. The automatic testing device for electric parameters of batched components according to claim 1, characterized in that: The test fixture (1) comprises a multi-core plug (11), a floating plate (12), a test seat (13) and a circuit board (14); the floating plate (12) is located above the test seat; the floating plate (12) is provided with nine working positions, the test seat (13) is provided with spring probes at corresponding positions of the working positions, and the spring probes are fixedly connected with the circuit board (14).

3. The automatic testing device for electrical parameters of mass-produced components according to claim 2, characterized in that: Four spring probes are installed in each working position on the test seat (13), and the four spring probes are arranged in two groups on both sides of the working position, one group is a positive electrode, and the other group is a negative electrode.

4. The automatic testing device for electrical parameters of mass-produced components according to claim 2, characterized in that: The multi-core plug (11) comprises 19 plug cores, the first to ninth plug cores correspond to the positive electrode probes in the nine working positions, the eleventh to nineteenth plug cores correspond to the negative electrode probes in the nine working positions, and the first to ninth plug cores are internally connected and short-circuited with the tenth plug core.

5. The automatic testing device for electrical parameters of mass-produced components according to claim 1, characterized in that: The multi-channel relay (3) comprises first to twenty-eighth connectors, wherein the first to ninth connectors are connected with the nineteenth to eleventh plug cores of the multi-core plug (11) in a one-to-one manner, the thirteenth and fourteenth connectors are connected with the tenth plug core of the multi-core plug (11) after being short-circuited, the twentieth to twenty-eighth connectors are short-circuited in pairs, The twenty-seventh connector is connected with a positive electrode (62) of a leakage current tester test end (61), the twenty-eighth connector is connected with a positive electrode (52) of a digital bridge test end (51), the fifteenth connector is connected with a negative electrode (53) of the digital bridge test end (51), and the sixteenth connector is connected with a negative electrode (63) of the leakage current tester test end (61).

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