Multifunctional electric appliance aging measurement and control instrument circuit

Abstract

The utility model relates to the technical field of electric appliance testing, and particularly discloses a multifunctional electric appliance aging measurement and control instrument circuit which comprises a power supply circuit, a key setting circuit, a main control chip circuit, a display screen circuit, an alarm prompt circuit, a 485 communication circuit, a storage circuit, a voltage detection circuit and a current detection circuit. The power supply circuit, the key setting circuit, the display screen circuit, the alarm prompt circuit, the 485 communication circuit, the storage circuit, the voltage detection circuit and the current detection circuit are electrically connected with the main control chip circuit. According to the utility model, the output voltage and the input current can be monitored through the voltage detection circuit and the current detection circuit, the test requirements of electrical products produced at the present stage are met, various test scenes can be flexibly set for different electrical products, the adaptation of the electrical products to aging strength is enhanced, and the evaluation reliability of the electrical products is improved.

Description

Technical Field

[0001] This utility model relates to the field of electrical testing technology, and in particular to a circuit for a multifunctional electrical aging test and control instrument. Background Technology

[0002] Aging testing refers to the process of conducting enhanced experiments to simulate the effects of various factors on product aging under real-world usage conditions. In modern workshops producing electrical products, aging testing typically utilizes tooling fixtures for verification. After inputting the rated voltage, it's crucial to constantly monitor the output for normalcy and pinpoint the point of failure. Key monitored parameters include voltage, current, temperature, and critical waveforms. While monitoring critical technical parameters often requires manual measurement, some systems employ intelligent integrated testing cabinets. For example, Chinese utility model patent application CN202420056985.9 discloses an aging testing device, relating to the field of aging testing technology. The aging test device includes a main control module, several communication modules, a relay control module, a host computer, a first RS485 module, and a second RS485 module. The communication modules are electrically connected to the main control module, and each communication module has multiple communication channels. Each communication module connects to a corresponding BMS protection board through each communication channel. The relay control module is electrically connected to both the main control module and the communication modules. The relay control module includes multiple relays, and the main control module can control the opening and closing of the corresponding communication channel through each relay. The host computer is electrically connected to the main control module through the first RS485 module and also to the communication modules through the second RS485 module. According to this invention, the aging test device can simultaneously test multiple BMS protection boards, thereby improving the efficiency of the aging test.

[0003] For example, Chinese utility model patent application CN202420043170.7 discloses an aging test device, including a support frame with a support plate. The support plate has a first power supply interface, each electrically connected to a power source. An aging tray is detachably placed on the support plate. The aging tray has multiple placement seats. The aging tray has a second power supply interface, with each fan under test electrically connected to the second power supply interface, which is also electrically connected to the first power supply interface. A relay is connected to the power control. The aging test time for each fan under test is set via the relay. Multiple fans are assembled onto their respective placement seats, and then the aging tray is placed on the support plate. Power is simultaneously transmitted to each fan under test via the power source, activating each fan and enabling aging testing. This improves the efficiency of aging tests on a large number of fans.

[0004] Existing electrical appliance aging test equipment is not only bulky and expensive, but its testing functions cannot be specifically adjusted and optimized for different electrical products, making it unable to flexibly adapt to multiple similar but inconsistent electrical products. Utility Model Content

[0005] The technical problem to be solved by this utility model is to provide a multifunctional electrical appliance aging test and control instrument circuit that addresses the above-mentioned deficiencies of the prior art. By setting up voltage detection circuit and current detection circuit, it can monitor output voltage and input current, meet the testing needs of electrical products currently in production, and can also flexibly set up various test scenarios for different electrical products, enhance the adaptability of electrical products to aging intensity, and improve the reliability of electrical product evaluation.

[0006] To solve the above-mentioned technical problems, the technical solution of this utility model is as follows:

[0007] A multifunctional electrical appliance aging test and control instrument circuit includes a power supply circuit, a button setting circuit, a main control chip circuit, a display screen circuit, an alarm indication circuit, a 485 communication circuit, a storage circuit, a voltage detection circuit, and a current detection circuit. The power supply circuit, button setting circuit, display screen circuit, alarm indication circuit, 485 communication circuit, storage circuit, voltage detection circuit, and current detection circuit are all electrically connected to the main control chip circuit.

[0008] Preferably, the main control chip circuit includes a main control chip U103, a crystal oscillator Y100, a crystal oscillator Y101, an interface P100, and an interface P102, wherein the crystal oscillator Y100, the crystal oscillator Y101, the interface P100, and the interface P102 are all connected to the main control chip U103.

[0009] Preferably, the power supply circuit includes a power input interface P1, a power management chip U3, a rectifier bridge D13, and a voltage regulator chip U2. The power management chip U3 is connected to the power input interface P1 and the rectifier bridge D13, respectively, and the main control chip U103 and the rectifier bridge D13 are connected to the voltage regulator chip U2.

[0010] Preferably, the button setting circuit includes buttons SW100, SW101, SW102 and SW103, all of which are connected to the main control chip U103.

[0011] Preferably, the display circuit includes a display interface L102, an LCD display, and a display driver chip U105. The display interface L102 is connected to the LCD display and the display driver chip U105, and the display driver chip U105 is connected to the main control chip U103.

[0012] Preferably, the alarm indication circuit includes status indicator lights D105, D106, D107, operational amplifier U106, and buzzer BZ100, all of which are connected to the main control chip U103.

[0013] Preferably, the 485 communication circuit includes a 485 communication chip U107 and a 485 communication chip U100, both of which are connected to the main control chip U103.

[0014] Preferably, the storage circuit includes a storage chip U101, resistors R104, R105 and R106, wherein resistors R104, R105 and R106 are respectively connected to the storage chip U101 and the main control chip U103.

[0015] Preferably, the voltage detection circuit includes a DC voltage input interface P9, a DC voltage input interface P2, a DC voltage input interface P8, a DC voltage input interface P4, an ADC-to-PWM chip U1, an ADC-to-PWM chip U4, an ADC-to-PWM chip U5, an ADC-to-PWM chip U6, an optocoupler U7, an optocoupler U8, an optocoupler U9, and an optocoupler U10. The ADC-to-PWM chip U6 is connected to the DC voltage input interface P9 and the optocoupler U10. The ADC-to-PWM chip U1 is connected to the DC voltage input interface P2 and the optocoupler U7. The ADC-to-PWM chip U5 is connected to the DC voltage input interface P8 and the optocoupler U9. The ADC-to-PWM chip U4 is connected to the DC voltage input interface P4 and the optocoupler U8. The optocouplers U7, U8, U9, and U10 are all connected to the main control chip U103.

[0016] Preferably, the current detection circuit includes a current input interface P3, a current input interface P5, a current input interface P6, a current input interface P7, an AC transformer K1, an AC transformer K2, an AC transformer K3, an AC transformer K4, an output port L2, an output port L3, an output port L4, and an output port L5. The AC transformer K1 is connected to the current input interface P3, the output port L2, and the main control chip U103. The AC transformer K2 is connected to the current input interface P5, the output port L3, and the main control chip U103. The AC transformer K3 is connected to the current input interface P6, the output port L4, and the main control chip U103. The AC transformer K4 is connected to the current input interface P7, the output port L5, and the main control chip U103.

[0017] The multifunctional electrical appliance aging test and control instrument circuit provided by this utility model, using the above technical solution, has the following beneficial effects: The power supply circuit, button setting circuit, display screen circuit, alarm prompting circuit, 485 communication circuit, storage circuit, voltage detection circuit, and current detection circuit in this test and control instrument circuit are all electrically connected to the main control chip circuit. By setting the voltage detection circuit and current detection circuit, the output voltage and input current can be monitored, meeting the testing needs of electrical products currently in production. Furthermore, the button setting circuit allows for flexible setting of various test scenarios according to different electrical products, enhancing the adaptability of electrical products to aging intensity and improving the reliability of electrical product evaluation. By setting the 485 communication circuit to extend to the network port, remote real-time monitoring of all test data recording can be achieved through the network. The main control chip circuit detects and analyzes the test data and then performs logic control on each circuit. The display screen circuit displays each test data. When there is a fault or the required technical requirements are not met, the alarm prompting circuit provides an alarm, realizing flexible and varied aging tests. Aging scenarios can be set for specific single points to meet production testing needs. Attached Figure Description

[0018] Figure 1 This is a circuit diagram of the button setting circuit, main control chip circuit, display screen circuit, alarm prompt circuit, 485 communication circuit, and storage circuit in this utility model.

[0019] Figure 2 This is a circuit diagram of the power supply circuit, voltage detection circuit, and current detection circuit in this utility model. Detailed Implementation

[0020] The specific embodiments of this utility model will be further described below with reference to the accompanying drawings. It should be noted that these descriptions are for the purpose of aiding understanding of this utility model, but do not constitute a limitation thereof. Furthermore, the technical features involved in the various embodiments of this utility model described below can be combined with each other as long as they do not conflict with each other.

[0021] like Figure 1-2As shown, the circuit of this multifunctional electrical appliance aging tester includes a power supply circuit, a button setting circuit, a main control chip circuit, a display screen circuit, an alarm indication circuit, a 485 communication circuit, a storage circuit, a voltage detection circuit, and a current detection circuit. The power supply circuit, button setting circuit, display screen circuit, alarm indication circuit, 485 communication circuit, storage circuit, voltage detection circuit, and current detection circuit are all electrically connected to the main control chip circuit. Understandably, in practical applications, the power supply circuit, voltage detection circuit, and current detection circuit can be integrated onto a single PCB board as the driver board of the tester, while the button setting circuit, main control chip circuit, display screen circuit, alarm indication circuit, 485 communication circuit, and storage circuit can be integrated onto another PCB board as the display board of the tester.

[0022] Specifically, the main control chip circuit includes a main control chip U103, crystal oscillators Y100 and Y101, interface P100, and interface P102. Crystal oscillators Y100, Y101, interface P100, and interface P102 are all connected to the main control chip U103. The main control chip U103 can be an STM32 or 80C51 microcontroller chip, etc. The power supply circuit includes a power input interface P1, a power management chip U3, a rectifier bridge D13, and a voltage regulator chip U2. The power management chip U3 is connected to both the power input interface P1 and the rectifier bridge D13. The rectifier bridge D13 and rectifier chip U103 are connected to the voltage regulator chip U2. The power management chip U3 can be a TPS650861 chip, etc., and the voltage regulator chip U2 can be an LM317 chip, etc. The button setting circuit includes buttons SW100, SW101, SW102, and SW103, all of which are connected to the main control chip U103. The display circuit includes a display interface L102, an LCD display, and a display driver chip U105. The display interface L102 is respectively... The LCD display screen and display driver chip U105 are connected to the main control chip U103. The display driver chip U105 can be an ILI9341 chip, etc. The alarm circuit includes status indicator lights D105, D106, and D107, operational amplifier U106, and buzzer BZ100. All three status indicator lights D105, D106, and D107, operational amplifier U106, and buzzer BZ100 are connected to the main control chip U103. The 485 communication... The communication circuit includes a 485 communication chip U107 and a 485 communication chip U100, both of which are connected to the main control chip U103. The storage circuit includes a storage chip U101, resistors R104, R105, and R106, which are respectively connected to the storage chip U101 and the main control chip U103. The 485 communication chip U107 can be a MAX485 chip, etc., and the 485 communication chip U100 can be an ADM2483 chip, etc.The voltage detection circuit includes a DC voltage input interface P9, a DC voltage input interface P2, a DC voltage input interface P8, a DC voltage input interface P4, an ADC-to-PWM chip U1, an ADC-to-PWM chip U4, an ADC-to-PWM chip U5, an ADC-to-PWM chip U6, an optocoupler U7, an optocoupler U8, an optocoupler U9, and an optocoupler U10. The ADC-to-PWM chip U6 is connected to both the DC voltage input interface P9 and the optocoupler U10. The ADC-to-PWM chip U1 is connected to both the DC voltage input interface P2 and the optocoupler U7. The ADC-to-PWM chip U5 is connected to both the DC voltage input interface P8 and the optocoupler U9. The ADC-to-PWM chip U4 is connected to both the DC voltage input interface P4 and the optocoupler U8. Optical couplers U7, U8, U9, and U10 are all connected to the main control chip U103. The ADC-to-PWM chip U1, U8, U9, and U10 are all connected to the main control chip U103. PWM chip U4, ADC-to-PWM chip U5, and ADC-to-PWM chip U6 can all be MCP4922-PWM chips, etc.; the current detection circuit includes current input interfaces P3, P5, P6, and P7, AC transformers K1, K2, K3, and K4, output ports L2, L3, L4, and L5. AC transformer K1 is connected to current input interface P3, output port L2, and main control chip U103; AC transformer K2 is connected to current input interface P5, output port L3, and main control chip U103; AC transformer K3 is connected to current input interface P6, output port L4, and main control chip U103; and AC transformer K4 is connected to current input interface P7, output port L5, and main control chip U103.

[0023] Understandably, this multi-functional electrical appliance aging tester circuit, in addition to meeting the needs of existing intelligent integrated test cabinets, addresses the specific aging test requirements of electrical products manufactured in-house. One tester can connect to four products for aging testing, allowing for flexible deployment of multiple units based on testing site, production scale, and production tasks. Unlike intelligent test cabinets, it avoids the waste caused by their inability to adapt to changing testing tasks. In terms of control, it can perform programmed switching tests on products, including impact tests and over 5000 fault-free switching cycles. Secondly, when monitoring electrical product parameters, it can record the performance of the products to be aged, including the trend of current and voltage changes at each moment, and record problems that arise during the aging process, facilitating tracking and timely feedback. In the future, the functionality of this tester can be further expanded to include more monitoring methods, effectively testing key technical points, achieving multi-functionality, unattended operation without human intervention, and realizing a fully automatic tracking tester.

[0024] Understandably, this utility model includes a power supply section, a button setting section, a display screen section, an alarm prompt section, a 485 communication section, a storage section, and a voltage and current detection section. The power supply uses an integrated modular design. Input current monitoring utilizes an AC transformer to convert the AC input current into an ADC voltage value that the MCU can recognize for measurement and monitoring. Output voltage monitoring employs an isolated power supply, and a dedicated ADC-to-PWM chip provides optocoupler-isolated transmission of the DC voltage. The MCU detects and analyzes the output voltage before performing logic control. A buzzer sounds an alarm when a fault occurs or the required technical requirements are not met. Various scenarios can be flexibly set for different products, such as subjecting the product to a 1-hour power-on / off shock (controlling the on / off action within a certain time), followed by 2 hours of aging, and then 2000 power-on / off shocks, etc., enhancing the product's adaptability to aging intensity and improving product evaluation reliability. This process requires no human intervention or observation. A built-in 485 communication circuit can be extended to a network port, enabling remote real-time display and recording of all test data. Each monitored product has a complete aging test record, and the entire testing process can be traced using a dedicated product code.

[0025] This utility model features a reasonable design and unique structure. By incorporating voltage and current detection circuits, it can monitor output voltage and input current, meeting the testing needs of current electrical products. Furthermore, the button-setting circuit allows for flexible configuration of various test scenarios for different electrical products, enhancing their adaptability to aging intensity and improving the reliability of product evaluation. An 485 communication circuit extended to the network port enables remote real-time monitoring and recording of all test data. The main control chip circuit analyzes the test data and then performs logic control on each circuit. The display screen circuit shows the test data. An alarm circuit provides alerts when faults occur or required technical specifications are not met, enabling flexible and varied aging tests. Aging scenarios can be set for specific points to meet production testing needs.

[0026] The embodiments of this utility model have been described in detail above with reference to the accompanying drawings, but this utility model is not limited to the described embodiments. For those skilled in the art, various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of this utility model, and these variations still fall within the protection scope of this utility model.

Claims

1. A circuit for a multifunctional electrical appliance aging test and control instrument, characterized in that: The power supply circuit, the key setting circuit, the display screen circuit, the alarm prompt circuit, the 485 communication circuit, the storage circuit, the voltage detection circuit and the current detection circuit are electrically connected with the main control chip circuit.

2. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 1, characterized in that: The main control chip circuit comprises a main control chip U103, a crystal oscillator Y100, a crystal oscillator Y101, an interface P100 and an interface P102, and the crystal oscillator Y100, the crystal oscillator Y101, the interface P100 and the interface P102 are connected with the main control chip U103.

3. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The power supply circuit comprises a power input interface P1, a power management chip U3, a rectifier bridge D13 and a voltage stabilizing chip U2, the power management chip U3 is connected with the power input interface P1 and the rectifier bridge D13 respectively, and the main control chip U103 and the rectifier bridge D13 are connected with the voltage stabilizing chip U2.

4. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The key setting circuit comprises keys SW100, SW101, SW102 and SW103, and the keys SW100, SW101, SW102 and SW103 are connected with the main control chip U103.

5. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The display screen circuit comprises a display screen interface L102, an LCD display screen and a display screen driving chip U105, the display screen interface L102 is connected with the LCD display screen and the display screen driving chip U105 respectively, and the display screen driving chip U105 is connected with the main control chip U103.

6. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The alarm prompt circuit comprises state indicator lamps D105, D106 and D107, an operational amplifier U106 and a buzzer BZ100, and the state indicator lamps D105, D106 and D107, the operational amplifier U106 and the buzzer BZ100 are connected with the main control chip U103.

7. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The 485 communication circuit comprises 485 communication chips U107 and U100, and the 485 communication chips U107 and U100 are connected with the main control chip U103.

8. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The storage circuit comprises a storage chip U101, resistors R104, R105 and R106, and the resistors R104, R105 and R106 are connected with the storage chip U101 and the main control chip U103 respectively.

9. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The voltage detection circuit comprises a direct current voltage input interface P9, a direct current voltage input interface P2, a direct current voltage input interface P8, a direct current voltage input interface P4, an ADC-to-PWM chip U1, an ADC-to-PWM chip U4, an ADC-to-PWM chip U5, an ADC-to-PWM chip U6, an optocoupler U7, an optocoupler U8, an optocoupler U9 and an optocoupler U10, the ADC-to-PWM chip U6 is connected with the direct current voltage input interface P9 and the optocoupler U10 respectively, the ADC-to-PWM chip U1 is connected with the direct current voltage input interface P2 and the optocoupler U7 respectively, the ADC-to-PWM chip U5 is connected with the direct current voltage input interface P8 and the optocoupler U9 respectively, the ADC-to-PWM chip U4 is connected with the direct current voltage input interface P4 and the optocoupler U8 respectively, and the optocouplers U7, U8, U9 and U10 are connected with the main control chip U103.

10. The multi-functional electric appliance aging measurement and control instrument circuit according to claim 2, characterized in that: The current detection circuit comprises a current input interface P3, a current input interface P5, a current input interface P6, a current input interface P7, an alternating current transformer K1, an alternating current transformer K2, an alternating current transformer K3, an alternating current transformer K4, an output port L2, an output port L3, an output port L4 and an output port L5, the alternating current transformer K1 is connected with the current input interface P3, the output port L2 and the main control chip U103 respectively, the alternating current transformer K2 is connected with the current input interface P5, the output port L3 and the main control chip U103 respectively, the alternating current transformer K3 is connected with the current input interface P6, the output port L4 and the main control chip U103 respectively, and the alternating current transformer K4 is connected with the current input interface P7, the output port L5 and the main control chip U103 respectively.

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