Charging management chip test experiment device

By designing a charging management chip testing experimental device that includes multiple circuits and relay switching, the problem that traditional testing methods can only test one type of chip at a time is solved. This enables rapid and accurate testing of DC-DC and linear charging chips, improving testing efficiency and reducing costs.

CN224081764UActive Publication Date: 2026-04-03BEIJING HERRENKNECHT TECH DEV CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-04-17
Publication Date
2026-04-03

AI Technical Summary

Technical Problem

Traditional charging management chip testing methods can only test one type of chip at a time, and cannot test multiple different types of chips simultaneously, resulting in low testing efficiency and high costs.

Method used

A charging management chip testing experimental device was designed, which includes various circuits and relay switching circuits. It can simultaneously test DC-DC charging chips and linear charging chips. The device achieves automatic switching and parameter setting through an LCD control unit, and supports rapid testing of various chips.

Benefits of technology

It enables rapid and accurate testing of charging management chips of different models and specifications, improves testing efficiency, simplifies operation procedures, and ensures the accuracy and flexibility of test results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a test experiment device for a charging management chip, and relates to the test experiment field of the charging management chip. Comprising a first digital source meter input circuit, a first relay switching circuit, a DCDC charging chip circuit, a linear charging chip circuit, a second relay switching circuit, a charging protection chip circuit, a second digital source meter input circuit, a signal switching circuit and a liquid crystal control unit. The test experiment device for the charging management chip is simple and convenient to operate, a user only needs to set test parameters and start a test process through the control module, the test on the charging management chip can be completed, and tedious manual operation is not needed; according to the charging management chip testing device, the testing efficiency is high, the parameters and the connection mode of the testing interface are automatically adjusted through the self-adaptive adjusting device, rapid testing of charging management chips of different models and specifications can be achieved, the testing efficiency is improved, the accuracy is high, and the testing module can simulate different charging environments and charging states.
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