Test integrated device
By using the integrated output terminal panel and switching switch of the test integration device, the problem of frequent wiring damage in transformer voltage ratio and DC resistance tests was solved, enabling rapid switching and efficient testing, and improving testing efficiency and range.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-08
- Publication Date
- 2026-04-07
AI Technical Summary
When conducting voltage ratio and DC resistance tests on transformers, existing technologies require frequent plugging and unplugging of test leads, which can damage the terminals, result in substandard test results, low efficiency, and a high risk of misjudgment or damage to the instrument.
Design an integrated testing device that enables rapid switching between turns ratio testing and DC resistance testing via an integrated output terminal panel and a switching switch, simplifying the wiring process and reducing the risk of damage to test leads and instrument terminals.
It improves testing efficiency, reduces wiring time and number of times, lowers the risk of damage to test leads and instrument terminals, and expands the testing range, enabling testing of single-phase transformation ratio, three-phase transformation ratio, single-phase resistance, and two-phase line resistance.
Smart Images
Figure CN224095923U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of testing instrument technology, specifically to an integrated testing device. Background Technology
[0002] When performing voltage ratio and DC resistance tests on transformers, although both high-voltage and low-voltage terminals are involved, their wiring methods differ. Therefore, these tests require repeatedly plugging and unplugging test leads between two instruments. This is not only time-consuming and labor-intensive, but also prone to damage to the test lead terminals and instrument mounting terminals due to excessive plugging and unplugging, leading to substandard test results and necessitating fault location and troubleshooting. Furthermore, it can prevent timely detection of transformer problems, potentially resulting in misdiagnosis. Additionally, problems with the test lead ends require repair and repeated testing, which is inefficient and carries risks of electric shock or instrument damage due to incorrect wiring. Therefore, this integrated testing device was designed, enabling the testing of multiple transformer parameters with a single wiring operation. Utility Model Content
[0003] The purpose of this utility model is to provide a test integrated device that, through a one-time wiring, can switch between voltage ratio testing and DC resistance testing simply by changing the connection mode of the test integrated device. This is very convenient and can also detect single-phase transformation ratio, three-phase transformation ratio, single-phase resistance and two-phase line resistance.
[0004] This utility model provides the following technical solution: a test integrated device, comprising a turns ratio test unit, a DC resistance test unit, and an integrated device output terminal panel, characterized in that: a turns ratio tester output terminal panel is installed on the turns ratio test unit, and a DC resistance tester output terminal panel is installed on the DC resistance test unit; both the turns ratio tester output terminal panel and the DC resistance tester output terminal panel are connected to a transformer via the integrated device output terminal panel; an integrated device switching switch is connected to one side of the integrated device output terminal panel; the integrated device output terminal panel is simultaneously connected to both the turns ratio tester output terminal panel and the DC resistance tester output terminal panel; the connection between the turns ratio tester output terminal panel or the DC resistance tester output terminal panel and the integrated device output terminal panel is controlled by the integrated device switching switch, switching between turns ratio testing and DC resistance testing; the turns ratio tester output terminal panel includes a three-phase high-voltage interface, a high-voltage neutral interface, a three-phase low-voltage interface, and a low-voltage neutral interface; the integrated device switching switch controls the switching between single-phase turns ratio testing and three-phase turns ratio testing by adjusting the connection between the turns ratio tester output terminal panel and the integrated device output terminal panel.
[0005] In one embodiment, the integrated device switch is provided with a three-phase turns ratio test option, a single-phase turns ratio test option, and a phase sequence option for DC resistance test when switching between turns ratio test and DC resistance test. By selecting different options, the wiring method can be easily changed to complete the turns ratio or DC resistance test.
[0006] In one embodiment, the output terminal panel of the transformer ratio tester includes three-phase high-voltage interfaces A, B, and C, a high-voltage neutral interface O, three-phase low-voltage interfaces a, b, and c, and a low-voltage neutral interface o. The output terminal panel of the integrated device includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, and VC, high-voltage side neutral current and voltage IO and VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, and Vc, and low-voltage side neutral current and voltage Io and Vo. The corresponding current I interface is connected to the corresponding numbered interface of the transformer ratio test unit. The switching switch of the integrated device can control the on / off state of the corresponding I interface and the corresponding numbered interface.
[0007] In one embodiment, the three phases A, B, and C on the high-voltage side and the three phases a, b, and c on the low-voltage side are closed, while the high-voltage O and low-voltage O are opened, and the three-phase transformation ratio is tested.
[0008] In one embodiment, high voltage A and low voltage a are closed, high voltage O and low voltage o are closed, and the other two phases are open for single-phase transformation ratio testing.
[0009] In one embodiment, the DC resistance tester output terminal panel includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, VC, high-voltage side neutral current and voltage interfaces IO, VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, Vc. The interfaces on the DC resistance tester output terminal panel are connected to the corresponding interfaces on the integrated device output terminal panel.
[0010] In one embodiment, for single-phase phase resistance testing, the voltage and current terminals of any phase on the high-voltage side are closed, the corresponding neutral voltage and current terminals on the high-voltage side are closed, and the other terminals are open.
[0011] In one embodiment, when testing the resistance of a two-phase line, the current and voltage terminals of any two phases on the low-voltage side are closed, while the current and voltage terminals of the remaining phase and all voltage and current terminals on the high-voltage side are open.
[0012] In order to connect the transformer to the output terminal panel of the integrated device, the transformer includes 8 interfaces: A, B, C, O, a, b, c, and o. The three-phase current and voltage interfaces on the high-voltage side or low-voltage side of the output terminal panel of the integrated device are connected to the corresponding interfaces on the transformer. The IO and VO interfaces are connected to the O interface, and the Io and Vo interfaces are connected to the o interface.
[0013] Compared with the prior art, the beneficial effects achieved by this utility model are:
[0014] (1) By setting up the output terminal panel of the integrated device, the transformer is connected to the output terminal panel of the integrated device. When conducting voltage ratio and DC resistance tests, the connection method of the integrated device can be easily switched between voltage ratio test and DC resistance test by simply switching the connection method of the integrated device. This is very convenient and greatly reduces the loss of test leads and damage to the terminals, as well as the risk of damage to the fixed terminals on the instrument. It also reduces the test wiring time and number of times, and greatly improves the efficiency of the test.
[0015] (2) By switching the connection mode, it is possible to test the single-phase transformation ratio, three-phase transformation ratio, single-phase phase resistance and line resistance of different phases, thus improving the test range. Attached Figure Description
[0016] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:
[0017] Figure 1 This is a schematic diagram of the modules of this utility model;
[0018] Figure 2 This is a circuit diagram of the present invention;
[0019] In the diagram: 1. Turns ratio test unit; 11. Turns ratio tester output terminal panel; 2. DC resistance test unit; 21. DC resistance tester output terminal panel; 3. Integrated device switch; 4. Integrated device output terminal panel; 5. Transformer. Detailed Implementation
[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0021] Please see Figure 1and Figure 2 This utility model provides a technical solution: a test integrated device, including a turns ratio testing unit 1, a DC resistance testing unit 2, and an integrated device output terminal panel 4. The turns ratio testing unit 1 is equipped with a turns ratio tester output terminal panel 11, and the DC resistance testing unit 2 is equipped with a DC resistance tester output terminal panel 21. Both the turns ratio tester output terminal panel 11 and the DC resistance tester output terminal panel 21 are connected to a transformer 5 via the integrated device output terminal panel 4. An integrated device switching switch 3 is connected to one side of the integrated device output terminal panel 4. The integrated device output terminal panel 4 is simultaneously connected to both the turns ratio tester output terminal panel 11 and the DC resistance tester output terminal panel 21. The panel 21 is wired, and the connection between the output terminal panel 11 of the ratio tester or the output terminal panel 21 of the DC resistance tester and the output terminal panel 4 of the integrated device is controlled by the switch 3 of the integrated device. This switches between ratio testing and DC resistance testing. During ratio testing, all switches for DC resistance testing are in the open state; during DC resistance testing, all switches for ratio testing are in the open state. The output terminal panel 11 of the ratio tester includes three-phase high-voltage interfaces A, B, and C, a high-voltage neutral interface O, three-phase low-voltage interfaces a, b, and c, and a low-voltage neutral interface O. The switch 3 of the integrated device adjusts the output terminal panels 11 and 4 of the ratio tester. The control switches between single-phase and three-phase turns ratio tests. During the three-phase turns ratio test, terminals A, B, and C on the high-voltage side are closed with terminals a, b, and c on the low-voltage side, while terminals O on the high-voltage side are open. After the test result is displayed, the transformer tap position is changed and the above steps are repeated. During the single-phase turns ratio test, the high-voltage side and the corresponding low-voltage side of any phase are closed, such as terminals A and O on the high-voltage side being closed with terminals a and o on the low-voltage side, while terminals B and C on the high-voltage side are open with terminals b and c on the low-voltage side. After the test result is displayed, the transformer tap position is changed and the above steps are repeated. The integrated device switch 3 not only switches between turns ratio testing and DC resistance testing but also controls the connection between the turns ratio tester output terminal panel 11 and the integrated device output terminal panel 4. The control of the connection lines enables the integrated device to switch between single-phase and three-phase turns ratio tests of the transformer. In summary, the transformer 5 and the output terminal panel 4 of the integrated device can be connected through the aforementioned integrated device switch 3. By changing the wiring method using the integrated device switch 3, turns ratio and DC resistance can be tested. With a one-time wiring, the voltage ratio and DC resistance tests can be performed separately by simply switching the connection method of the test integrated device. This is very convenient and greatly reduces the loss of test leads and damage to the terminals, as well as the risk of damage to the fixed terminals on the instrument. It also reduces the wiring time and number of tests, and greatly improves the efficiency of the test.
[0022] The interface of the integrated device switch 3 has options for three-phase turns ratio test, single-phase turns ratio test, and phase sequence of DC resistance test. It automatically switches between different modes according to the test type to complete the corresponding wiring method. It can switch between turns ratio test and DC resistance test. In turns ratio test, it can switch between three-phase turns ratio test and single-phase turns ratio test. In DC resistance test, it can switch between single-phase phase resistance test and two-phase line resistance test.
[0023] The output terminal panel 11 of the transformer ratio tester includes three-phase high-voltage interfaces A, B, and C, a high-voltage neutral interface O, three-phase low-voltage interfaces a, b, and c, and a low-voltage neutral interface o. The output terminal panel 4 of the integrated device includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, and VC, high-voltage side neutral current and voltage IO and VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, and Vc, and low-voltage side neutral current and voltage Io and Vo. The corresponding I interface is connected to the corresponding numbered interface of the output terminal panel 11 of the transformer ratio tester. The integrated device switch 3 can control the on / off state of the corresponding I interface and the corresponding numbered interface.
[0024] The DC resistance tester output terminal panel 21 includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, VC, high-voltage side neutral current and voltage interfaces IO, VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, Vc. The interfaces on the DC resistance tester output terminal panel 21 are connected to the corresponding interfaces on the integrated device output terminal panel 4.
[0025] For single-phase phase resistance testing, the voltage and current terminals of any phase on the high-voltage side are closed, and the corresponding neutral voltage and current terminals on the high-voltage side are closed, while the other terminals are open. The specific tests are as follows: When testing the phase resistance of phase A on the high-voltage side, terminals IA, IO, VA, and VO are closed, and terminals IB, IC, VB, and VC are open; when testing the phase resistance of phase B on the high-voltage side, terminals IB, IO, VB, and VO are closed, and terminals IA, IC, VA, and VC are open; when testing the phase resistance of phase C on the high-voltage side, terminals IC, IO, VC, and VO are closed, and terminals IA, IB, VA, and VB are open.
[0026] When testing the resistance of a two-phase line, the current and voltage terminals of any two phases on the low-voltage side are closed, while the current and voltage terminals of the remaining phase and all voltage and current terminals on the high-voltage side are open. Specifically, the tests are as follows: When testing the resistance of the high-voltage AB phase line, terminals Ia, Ib, Va, and Vb are closed, and terminals Ic, Io, Vc, and Vo are open; when testing the resistance of the high-voltage BC phase line, terminals Ib, Ic, Vb, and Vc are closed, and terminals Ia, Io, Va, and Vo are open; when testing the resistance of the high-voltage CA phase line, terminals Ic, Ia, Vc, and Va are closed, and terminals Ib, Io, Vb, and Vo are open.
[0027] Transformer 5 includes 8 interfaces: A, B, C, O, a, b, c, and o. The three-phase current and voltage interfaces on the high-voltage or low-voltage side of the integrated device output terminal panel 4 are connected to the corresponding interfaces on transformer 5. IA and VA are connected to interface A, IB and VB are connected to interface B, IC and VC are connected to interface C, Ia and Va are connected to interface a, Ib and Vb are connected to interface b, Ic and Vc are connected to interface c, IO and VO are connected to interface O, and Io and Vo are connected to interface o.
[0028] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.
Claims
1. A test integrated device, comprising a turns ratio test unit, a DC resistance test unit, and an integrated device output terminal panel, characterized in that: The turns ratio test unit is equipped with a turns ratio tester output terminal panel, and the DC resistance test unit is equipped with a DC resistance tester output terminal panel. Both the turns ratio tester output terminal panel and the DC resistance tester output terminal panel are connected to the transformer via an integrated device output terminal panel. An integrated device switch is connected to one side of the integrated device output terminal panel. The integrated device output terminal panel is connected to both the turns ratio tester output terminal panel and the DC resistance tester output terminal panel. The connection between the turns ratio tester output terminal panel or the DC resistance tester output terminal panel and the integrated device output terminal panel is controlled by the integrated device switch, switching between turns ratio testing and DC resistance testing. The turns ratio tester output terminal panel includes a three-phase high-voltage interface, a high-voltage neutral interface, a three-phase low-voltage interface, and a low-voltage neutral interface. The integrated device switch controls the switching between single-phase turns ratio testing and three-phase turns ratio testing by adjusting the connection between the turns ratio tester output terminal panel and the integrated device output terminal panel.
2. The integrated testing device according to claim 1, characterized in that: The integrated device has a switching switch with options for three-phase turns ratio testing, single-phase turns ratio testing, and phase sequence testing of DC resistance.
3. The integrated testing device according to claim 1, characterized in that: The output terminal panel of the transformer ratio tester includes three-phase high-voltage interfaces A, B, and C, a high-voltage neutral interface O, three-phase low-voltage interfaces a, b, and c, and a low-voltage neutral interface o. The output terminal panel of the integrated device includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, and VC, high-voltage side neutral current and voltage IO and VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, and Vc, and low-voltage side neutral current and voltage Io and Vo. The corresponding current I interface is connected to the corresponding numbered interface of the transformer ratio test unit. The integrated device switch can control the on / off state of the corresponding I interface and the corresponding numbered interface.
4. The integrated testing device according to claim 3, characterized in that: During the three-phase transformation ratio test, the three phases A, B, and C on the high-voltage side and the three phases a, b, and c on the low-voltage side are closed, while the high-voltage O and low-voltage O are open.
5. The integrated testing device according to claim 3, characterized in that: During the single-phase transformation ratio test, high-voltage A and low-voltage a are closed, high-voltage O and low-voltage o are closed, and the other two phases are open.
6. The integrated testing device according to claim 3, characterized in that: The DC resistance tester output terminal panel includes three-phase high-voltage side current and voltage interfaces IA, VA, IB, VB, IC, VC, high-voltage side neutral current and voltage interfaces IO, VO, and three-phase low-voltage side current and voltage interfaces Ia, Va, Ib, Vb, Ic, Vc. The interfaces on the DC resistance tester output terminal panel are connected to the corresponding interfaces on the integrated device output terminal panel.
7. The integrated testing device according to claim 6, characterized in that: For single-phase phase resistance testing, the voltage and current terminals of any phase on the high-voltage side are closed, the corresponding neutral voltage and current terminals on the high-voltage side are closed, and the other terminals are open.
8. The integrated testing device according to claim 6, characterized in that: When testing the resistance of a two-phase line, the current and voltage terminals of any two phases on the low-voltage side are closed, while the current and voltage terminals of the remaining phase and all voltage and current terminals on the high-voltage side are open.
9. The integrated testing device according to claim 1, characterized in that: The transformer includes eight interfaces: A, B, C, O, a, b, c, and o. The three-phase current and voltage interfaces on the high-voltage side or low-voltage side of the output terminal panel of the integrated device are connected to the corresponding interfaces on the transformer. The IO and VO interfaces are connected to the O interface, and the Io and Vo interfaces are connected to the o interface.