Multi-size adaptive chip test seat
By designing a multi-size adaptive chip test socket, the problem of customizing traditional test sockets was solved, enabling efficient and accurate testing that adapts to various chip sizes, reducing costs and improving the reliability of test results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-02
- Publication Date
- 2026-04-10
AI Technical Summary
Traditional chip test sockets are customized for specific models, which leads to the need for multiple test sockets, increases hardware costs, reduces testing efficiency, and may introduce operational errors and affect the accuracy of test results.
Design a multi-size adaptive chip test socket, including a housing, a chip holder, and a pad. The chip holder has a chip slot and a metal block that gradually decrease in size. It is equipped with test claws and wires to connect to external circuits. Combined with a pressing component, it ensures chip stability and adapts to various chip sizes.
It reduced hardware costs, improved testing efficiency and accuracy, reduced operational errors, and ensured the reliability and stability of test results.
Smart Images
Figure CN224109507U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip test technical field, concretely relates to a multi -size self -adaptation chip test seat. BACKGROUND
[0002] With the rapid development of the semiconductor industry, various types of integrated circuit chips are widely used in different fields, such as communication, computing, consumer electronics, automobiles, etc. Each chip has a unique physical size according to its function and application. Therefore, when testing the performance of the chip, a specially designed test equipment - test seat is needed to fix the chip and ensure electrical connection with the test instrument.
[0003] However, the traditional test seat is usually customized for a specific model of chip, which means that for chips of different sizes or pin configurations, multiple different test seats need to be prepared. This not only increases hardware costs, but also reduces test efficiency. Especially when dealing with new chips, additional time may be needed for adaptation and adjustment, which poses challenges to the research and development cycle and production efficiency. In addition, frequent replacement of test seats to adapt to different chip specifications can also introduce operational errors, affecting the accuracy and reliability of test results. SUMMARY
[0004] In view of the above technical problems existing in the prior art, the utility model provides a multi -size self -adaptation chip test seat.
[0005] To achieve the above purpose, the utility model provides the following technical scheme:
[0006] A multi -size self -adaptation chip test seat is provided, which comprises a shell, a chip seat and a pad, the top of the shell is provided with an opening, the chip seat and the pad are arranged in the shell; the chip seat comprises a base, the top of the base has a storage block, the storage block is provided with chip grooves arranged linearly from top to bottom and gradually decreasing in size, so as to place chips of different sizes; the storage block is also provided with a metal block penetrating the storage block, which is used for connecting the pins of the chip; the pad is located above the chip seat, and the pad is provided with a through hole for the storage block to pass through; the top of the pad is also provided with a test claw, one end of the test claw is connected with the metal block, and the other end is connected with an external circuit through a wire.
[0007] Preferably, the metal block and the test claw correspond one by one, one metal block corresponds to one test claw, and the other end of each test claw connected with the metal block is connected with a wire.
[0008] Preferably, the side wall of the shell is also provided with a threading hole, and the wire is threaded into the shell through the threading hole.
[0009] Preferably, the shell is further provided with a supporting column for supporting the chip seat, and the top of the supporting column is provided with a threaded hole, and the chip seat is fixed on the supporting column by a bolt.
[0010] Preferably, the top of the shell is further provided with a cover detachably connected with the shell, the cover is used for closing the top of the shell, and the cover is further provided with a through hole for the placement block to pass through, and the through hole on the cover is coaxially arranged with the through hole on the cushion block.
[0011] Preferably, the multi-size self-adaptive chip test seat further comprises a pressing assembly arranged on the top of the cover, the pressing assembly comprises a mounting bracket, a driving rod, a connecting piece, a pressing rod and a pressing piece, the mounting bracket is fixed on the top of the cover, one end of the driving rod is hingedly connected to the top of the mounting bracket, the pressing rod is located below the driving rod and is connected with the driving rod through the connecting piece, and the pressing piece is fixed on the bottom of the pressing rod and is used for pressing the chip placed in the chip groove.
[0012] Preferably, the size of the pressing piece is consistent with the size of the smallest placement block in the chip groove.
[0013] Preferably, the pressing assembly further comprises a guide sleeve fixed on the mounting bracket, and the pressing rod passes through the guide sleeve, and the guide sleeve is used for guiding the straight-line movement of the pressing rod.
[0014] The utility model discloses a beneficial effect:
[0015] The utility model discloses a multi -size self -adaptation chip test seat, including the shell, the chip seat and the cushion block, the top of shell is provided with the opening, and the chip seat and the cushion block all are located in the shell, the chip seat includes the base, and the top of base has the placement block, and the chip groove that gradually becomes smaller is arranged in the placement block from top to bottom in proper order, and the chip groove is gradually smaller in size, and the metal block is further provided in the placement block, and is used for connecting the pin of chip, and the cushion block is located the top of chip seat, and the through -hole for the placement block is provided on the cushion block and is used for passing, and the top of cushion block is further provided with test claw, and one end of test claw is connected with metal block, and the other end of test claw is connected with external circuit through the wire. Through the chip groove that gradually becomes smaller and is arranged in the placement block from top to bottom in proper order, the test seat can adapt to the chip of multiple sizes, and each chip size does not need to be configured separately, so that the cost is reduced, and the practicability of the test seat is improved. ACCURACY OF DRAWINGS
[0016] Figure 1 It is a multi -size self -adaptation chip test seat solid drawing for example.
[0017] Figure 2 It is the chip seat solid drawing for example.
[0018] Figure 3 It is the cushion block solid drawing for example.
[0019] Figure 4 This is an exploded view of the shell and cover in the embodiment.
[0020] Figure 5 This is a perspective view of the pressing component in the embodiment.
[0021] Reference numerals: 1. Housing; 10. Support column; 11. Wiring hole; 2. Cover; 20. Perforation; 3. Chip holder; 30. Base; 31. Storage block; 32. Metal block; 4. Pad; 40. Through hole; 41. Test claw; 5. Pressing assembly; 50. Mounting bracket; 51. Drive rod; 52. Connector; 53. Pressure rod; 54. Pressure plate; 55. Guide sleeve. Detailed Implementation
[0022] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Unless otherwise specified, the following embodiments and features can be combined with each other.
[0023] This embodiment provides a multi-size adaptive chip test socket, such as... Figures 1 to 5 As shown, the device includes a housing 1, a chip holder 3, and a pad 4. The housing 1 has an opening at the top, and the chip holder 3 and the pad 4 are both located inside the housing 1. The chip holder 3 includes a base 30, and a placement block 31 is located on the top of the base 30. The placement block 31 has chip slots. The chip to be tested must first be placed in the chip slot before subsequent testing. The placement block 31 has multiple chip slots arranged linearly from top to bottom along the height direction of the placement block 31, and the size of the chip slots gradually decreases from top to bottom to accommodate chips of different sizes. By setting multiple chip slots of different sizes in the placement block 31, the placement block 31 can flexibly adapt to chips of various sizes. When testing chips of different sizes, there is no need to change the device, improving the flexibility and convenience of operation.
[0024] Further, the cushion block 4 is located above the chip seat 3, and the cushion block 4 is provided with a through hole 40, and the placement block 31 on the chip seat 3 can pass through the through hole 40. The top of the cushion block 4 is also provided with a test claw 41, which can be connected to an external circuit, and the chip placed in the chip groove can be tested. Among them, the placement block 31 is provided with a metal block 32, which penetrates the side wall of the placement block 31, and when the chip to be tested is placed in the chip groove, the pins on the chip can be connected to the metal block 32 in the placement block 31. One end of the test claw 41 is connected with the metal block 32 which penetrates the placement block 31, and the other end of the test claw 41 is connected with the external circuit through the wire, which is used for testing the chip in the chip groove. It should be noted that the metal block 32 and the test claw 41 correspond one by one, one metal block 32 corresponds to one test claw 41, and the other end of each test claw 41 connected with the metal block 32 is connected with a wire, so as to ensure that the electrical signal can be accurately transmitted to the external circuit.
[0025] Further, the side wall of the shell 1 is also provided with a wire hole 11, and the wire connected to the other end of the test claw 41 penetrates into the shell 1 through the wire hole 11. By arranging the wire hole 11, the wire can be arranged along a predetermined path, which simplifies the wiring process and makes it more convenient to replace or maintain later, reduces the maintenance time and improves the work efficiency.
[0026] The shell 1 is also provided with a supporting column 10, which is used to support the chip seat 3, and the top of the supporting column 10 is also provided with a screw hole, and the chip seat 3 is fixed on the supporting column 10 by bolts. By fixing the chip seat 3 on the supporting column 10, the supporting column 10 can provide stable support for the chip seat 3, so as to ensure that the chip seat 3 will not shift or shake during the test process, thereby ensuring the stability of the test process.
[0027] Further, the top of the shell 1 is also provided with a cover 2, which is used to close the opening at the top of the shell 1, and the cover 2 is detachably connected with the shell 1 by bolts. The cover 2 is also provided with a through hole 20, which is coaxially arranged with the through hole 40 on the cushion block 4, and when the cover 2 is closed with the shell 1, the placement block 31 on the top of the chip seat 3 can pass through the through hole 40 on the cushion block 4 and the through hole 20 on the cover 2 and be exposed outside. By closing the opening at the top of the shell 1, the cover 2 can effectively block the external dust and impurities from entering the inside of the shell 1, thereby ensuring the cleanliness of the inside of the shell 1, especially the cleanliness between the test claw 41 and the metal block 32. This design avoids the poor contact between the test claw 41 and the metal block 32 due to dust or impurities, thereby ensuring the accuracy and stability of the test effect.
[0028] Further, the multi-size self-adaptive chip test seat further comprises a pressing assembly 5 arranged on the cover 2 and used for providing pressing force to the chip placed in the chip groove, so as to avoid that the chip cannot contact the metal block 32 due to shaking in the detection process, thereby affecting the test effect. The pressing assembly 5 comprises a mounting bracket 50, a driving rod 51, a connecting piece 52, a pressing rod 53 and a pressing plate 54. The mounting bracket 50 is fixedly arranged on the top of the cover 2. One end of the driving rod 51 is hingedly connected to the top of the mounting bracket 50. The pressing rod 53 is located below the driving rod 51, and the pressing rod 53 is connected to the driving rod 51 through the connecting piece 52, so that the pressing rod 53 can be moved up and down by rotating the driving rod 51. The pressing plate 54 is arranged at the bottom of the pressing rod 53, and the pressing plate 54 can press the chip placed in the chip groove. By arranging the pressing assembly 5, the pressing force can be applied to the chip when the pressing assembly 5 is pressed down, so as to ensure that the chip is stable during the detection process, avoid that the chip is displaced or loosened due to external vibration or equipment operation, and improve the reliability of the test result. The size of the pressing plate 54 is consistent with the size of the smallest placing block 31 in the chip groove. This design can firmly fix the chip with the smallest size, and reduces the influence of poor contact on the test effect.
[0029] The pressing assembly 5 further comprises a guide sleeve 55 fixedly arranged on the mounting bracket 50 and arranged along the height direction of the mounting bracket 50. The pressing rod 53 is arranged in the guide sleeve 55, and the guide sleeve 55 is used for guiding the straight line movement of the pressing rod 53. By arranging the guide sleeve 55, the guide sleeve 55 can prevent the pressing rod 53 from shaking during the lifting process when the pressing rod 53 is lifted by the driving rod 51.
[0030] In the description of the present application, obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings can be arranged and designed in various different configurations.
[0031] Therefore, the above detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
Claims
1. A multi-size adaptive chip test socket comprising a housing (1), a chip seat (3) and a spacer (4), characterized in that, The top of the shell (1) is provided with an opening, and the chip seat (3) and the cushion block (4) are arranged in the shell (1); the chip seat (3) comprises a base (30), and the top of the base (30) is provided with a storage block (31), a plurality of chip grooves which are linearly arranged from top to bottom and gradually decrease in size are arranged in the storage block (31); the storage block (31) is further provided with a metal block (32) penetrating through the storage block (31) and used for connecting the pins of the chip; the cushion block (4) is located above the chip seat (3), and the cushion block (4) is provided with a through hole (40) for the storage block (31) to pass through; the top of the cushion block (4) is further provided with a test claw (41), one end of the test claw (41) is connected with the metal block (32), and the other end of the test claw (41) is connected with an external circuit through a wire.
2. The multi-size self-adapting chip test socket according to claim 1, wherein, The metal block (32) and the test claw (41) correspond to each other, one metal block (32) corresponds to one test claw (41), and the other end of each test claw (41) connected with the metal block (32) is connected with a wire.
3. The multi-size self-adapting chip test socket of claim 2, wherein, The sidewalls on both sides of the shell (1) are further provided with threading holes (11), and the wires pass into the shell (1) through the threading holes (11).
4. The multi-size self-adapting chip test socket of claim 1, wherein, The shell (1) is further provided with a supporting column (10) for supporting the chip seat (3), and the top of the supporting column (10) is further provided with a threaded hole, and the chip seat (3) is fixed on the supporting column (10) through a bolt.
5. The multi-size self-adapting chip test socket of claim 1, wherein, The top of the shell (1) is further provided with a cover (2) which is detachably connected with the shell (1), and the cover (2) is used for closing the top of the shell (1); the cover (2) is further provided with a through hole (20) for the storage block (31) to pass through, and the through hole (20) on the cover (2) is coaxially arranged with the through hole (40) on the cushion block (4).
6. The multi-size self-adapting chip test socket of claim 5, wherein, The multi-size self-adaptive chip test seat further comprises a pressing assembly (5) arranged on the top of the cover (2), the pressing assembly (5) comprises a mounting bracket (50), a driving rod (51), a connecting piece (52), a pressing rod (53) and a pressing piece (54), the mounting bracket (50) is fixedly arranged on the top of the cover (2), one end of the driving rod (51) is hingedly connected to the top of the mounting bracket (50), the pressing rod (53) is located below the driving rod (51) and is connected with the driving rod (51) through the connecting piece (52), and the pressing piece (54) is fixedly arranged on the bottom of the pressing rod (53) and is used for pressing the chip placed in the chip groove.
7. The multi-size self-adapting chip test socket of claim 6, wherein, The size of the pressing piece (54) is consistent with the size of the storage block (31) with the smallest size in the chip groove.
8. The multi-size self-adapting chip test socket of claim 6, wherein, The pressing assembly (5) further comprises a guide sleeve (55) fixedly arranged on the mounting bracket (50), and the pressing rod (53) penetrates through the guide sleeve (55), and the guide sleeve (55) is used for guiding the straight-line movement of the pressing rod (53).