Novel automatic chip testing machine

Abstract

The utility model relates to the technical field of chip testing machines, and discloses a novel automatic chip testing machine, which comprises a testing machine body, a control button, a flip door and a display screen, through an electric sliding rail, a mounting base drives a clamping plate to move to the position below a feeding disc, a third air cylinder is started, the third air cylinder drives a clamping block to relieve limitation on the feeding disc, the feeding disc falls into the clamping plate from a moving hole, at the moment, the feeding disc is changed into a chip disc, then the mounting base is reset, and after chip testing is completed, the mounting base is reset. An electric sliding rail is started, so that a mounting base drives the chip disc to move to the position below the OK grade disc, a second air cylinder is started, so that the second air cylinder drives the top of the chip disc to penetrate through a moving hole, the top of the chip disc drives a guide block to rotate upwards at the moment, the second air cylinder is reset, the top of the chip disc makes contact with the top of the guide block, and therefore the chip disc is limited; and at the moment, the chip disc is changed into an OK grade disc, so that the tested chips can be conveniently stacked, and workers can conveniently manage the chips.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip testing machine technical field more particularly to novel automatic chip testing machine. BACKGROUND

[0002] Chip testing machine is the important equipment in semiconductor manufacturing process, is used to ensure that the function, performance and reliability of chip meet the design standard, and the chip testing machine is an automatic equipment, detects the logic function, timing, power consumption, signal integrity etc.

[0003] But the existing testing machine moves chip group to the position of detection, usually needs the staff to manually place chip group in the position of detection, when detecting, takes out the chip of testing and stacks, because the mechanism that lacks conveniently removes chip into and removes from the inside of testing machine, leads to the staff to need to walk back and forth and carries chip group, reduces chip detection efficiency. UTILITY MODEL CONTENTS

[0004] In order to overcome above-mentioned defects of prior art, the utility model provides a novel automatic chip testing machine to solve above-mentioned background art in the mechanism that lacks conveniently removes chip into and removes from the inside of testing machine, leads to the staff to need to walk back and forth and carries chip group, reduces chip detection efficiency.

[0005] The utility model provides following technical scheme: a novel automatic chip testing machine, including testing machine body, control button, flip door and display screen, control button is provided with several, and several control buttons are all installed in testing machine body front side, flip door is hinged in testing machine body front side, display screen rotatable installation is in testing machine body right side,

[0006] Still including alarm mechanism, three axis brake mechanism, suction mechanism, take and put material mechanism and moving mechanism, alarm mechanism sets up in testing machine body inner wall, and alarm mechanism is close to flip door, three axis brake mechanism sets up in testing machine body inside rear side, and is used for moving chip on X axis, Y axis and Z axis, suction mechanism sets up on the Z axis of three axis brake mechanism, and is used for adsorbing chip, take and put material mechanism sets up in testing machine body outside one side, and is used for stacking and discharging chip, moving mechanism slidably sets up in take and put material mechanism, and moving mechanism can move from take and put material mechanism to testing machine body.

[0007] Further, the alarm mechanism includes an alarm device and a safety light curtain, the alarm device is arranged on the top of the inner wall of the testing machine body, and the alarm device is arranged near the top of the flip door, the safety light curtain is installed on the bottom of the inner wall of the testing machine body, and the safety light curtain is arranged near the bottom of the flip door.

[0008] Further, the three-axis brake mechanism comprises a first guide rail seat, a first motor, a first screw rod, a first sliding seat, a second guide rail seat, a second motor, a second screw rod and a second sliding seat, the first guide rail seat is mounted on one side of the inside of the test machine body, the first guide rail seat is provided with the first motor on one side, the output shaft end of the first motor penetrates one side of the first guide rail seat, the first screw rod is rotatably connected between the first guide rail seats, the output shaft end of the first motor is fixedly connected with one end of the first screw rod, the first sliding seat is slidably connected on the first guide rail seat, the bottom of the first sliding seat is threadedly connected with the first screw rod, the first sliding seat is fixedly connected with the second guide rail seat on one side, the second guide rail seat is provided with the second motor on one side, the output shaft end of the second motor penetrates one side of the second guide rail seat, the second screw rod is rotatably connected between the second guide rail seats, the output shaft end of the second motor is fixedly connected with one end of the second screw rod, the second sliding seat is slidably connected on the second guide rail seat, and the bottom of the second sliding seat is threadedly connected with the second screw rod.

[0009] Further, the suction mechanism comprises a vacuum pump, a mounting frame, a first cylinder and a suction disc, the vacuum pump is mounted on the top end of the second sliding seat, the mounting frame is fixedly connected on one side of the second sliding seat, a plurality of first cylinders are mounted in the mounting frame, the plurality of first cylinders are linearly arranged at equal distances, the output end of each first cylinder is fixedly connected with a suction disc, and one end of the suction disc penetrates one side of the mounting frame and can move longitudinally.

[0010] Further, the to-be-taken-and-placed material mechanism comprises a hollow frame, a limiting block, a feeding disc, an OK grade disc, a moving hole, a third cylinder, a guide block, a clamping block and a limiting hole, the hollow frame is fixedly connected to one side of the outside of the test machine body, two moving holes are formed in the top end of the hollow frame, two groups of limiting blocks are fixedly connected to the top end of the hollow frame and located outside the two moving holes, a plurality of limiting blocks in each group are arranged in a rectangular array, a feeding disc is placed above one of the moving holes and close to one group of limiting blocks, an OK grade disc is placed above the other moving hole and close to the other group of limiting blocks, a group of third cylinders are mounted on both sides of the top end of the hollow frame and close to the feeding disc, the output shaft end of each third cylinder is provided with a clamping block, a group of limiting holes are formed in the inner wall of each moving hole and close to the bottom end of the OK grade disc, and the limiting holes do not penetrate the top end of the inside of the hollow frame, a guide block is rotatably connected in each limiting hole, and one end of the guide block is located below the OK grade disc.

[0011] Further, the moving mechanism comprises an electric slide rail, a mounting base, a second cylinder, a chip tray and a clamping plate, the electric slide rail is mounted at the bottom end inside the hollow frame, and one end of the electric slide rail is located inside the testing machine body, the mounting base is slidably connected to the electric slide rail, the second cylinder is mounted at the bottom end inside the mounting base, and the clamping plate is fixedly connected to the output end of the second cylinder, and the chip tray is placed inside the clamping plate.

[0012] Further, the testing machine body is fixedly connected with an NG material box at the bottom end right side, is fixedly connected with a material supplementing tray at the bottom end left side, and is fixedly connected with a plurality of test stations at the bottom end middle part, and the plurality of test stations are arranged in a rectangular array.

[0013] The technical effects and advantages of the present application are as follows:

[0014] 1. The electric slide rail drives the mounting base and the clamping plate to move below the feeding tray, the third cylinder is started to drive the clamping block to release the restriction on the feeding tray, the feeding tray falls from the moving hole into the clamping plate, the feeding tray becomes the chip tray, and then the mounting base is reset, the first motor, the second motor and the cylinder are cooperated to conveniently drive the suction cup to put the OK products back to the chip tray, the OK products are put into the chip tray, the electric slide rail is started to drive the mounting base and the chip tray to move below the OK grade tray, the second cylinder is started to drive the chip tray top to pass through the moving hole, the chip tray top drives the guide block to rotate, the second cylinder is reset to make the chip tray top contact with the guide block top, thereby restricting the chip tray, the chip tray becomes the OK grade tray, and the completed chips can be conveniently stacked for the staff to manage. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a structural schematic view of the present application;

[0016] Figure 2 It is a front view of the testing machine body of the present application;

[0017] Figure 3 It is a structural schematic view of the test station of the present application;

[0018] Figure 4 It is a schematic view of the NG material box of the present application;

[0019] Figure 5 It is a schematic view of the hollow frame of the present application.

[0020] The attached diagram is labeled as follows: 1. Test machine body; 2. Control button; 3. Flip-top door; 4. Alarm device; 5. Safety light curtain; 6. Hollow frame; 7. Limit block; 8. Feeding tray; 9. OK grade tray; 10. First guide rail seat; 11. First motor; 12. First screw; 13. First sliding seat; 14. Second guide rail seat; 15. Second motor; 16. Second screw; 17. Vacuum pump; 18. Mounting bracket; 19. First cylinder; 20. Suction cup; 21. Feeding tray; 22. Test station; 23. NG material box; 24. Chip tray; 25. Display screen; 26. Second sliding seat; 27. Electric slide rail; 28. Mounting seat; 29. ​​Second cylinder; 30. Moving hole; 31. Third cylinder; 32. Guide block; 33. Clamping block; 34. Snap-on plate; 35. Limiting hole. Detailed Implementation

[0021] The present invention will be further described below with reference to specific embodiments. However, those skilled in the art should understand that the detailed description given here with reference to the accompanying drawings is for better explanation. The structure of the present invention may exceed the limited embodiments described herein. Some equivalent alternatives or common means will not be described in detail here, but they still fall within the protection scope of this application.

[0022] Appendix Figures 1-5 This is the preferred embodiment of the present invention, which is described below in conjunction with the appendix. Figures 1-5 The present invention will be further described below.

[0023] See attached document Figures 1-5 A novel automated chip testing machine includes a testing machine body 1, control buttons 2, a flip door 3, and a display screen 25. Several control buttons 2 are provided, and all control buttons 2 are installed on the front side of the testing machine body 1. The flip door 3 is hinged to the front side of the testing machine body 1, and the display screen 25 is rotatably installed on the right side of the testing machine body 1.

[0024] It also includes an alarm mechanism, a three-axis braking mechanism, a material suction mechanism, a material handling mechanism, and a moving mechanism. The alarm mechanism is located on the inner wall of the test machine body 1 and is close to the flip door 3. The three-axis braking mechanism is located inside the rear side of the test machine body 1 and is used to move the chip on the X, Y, and Z axes. The material suction mechanism is located on the Z axis of the three-axis braking mechanism and is used to suction the chip. The material handling mechanism is located on the outer side of the test machine body 1 and is used to stack and unload the chip. The moving mechanism is slidably located inside the material handling mechanism and can move from inside the material handling mechanism into the test machine body 1.

[0025] In the embodiment, the to-be-tested chip is moved into the test machine body 1 for testing by the to-be-taken-and-placed mechanism and the moving mechanism, and the OK chip is re-placed and stacked after testing is completed, so as to facilitate the management of the staff, the staff is prompted that the flip door 3 is opened through the alarm mechanism, and the chip is adsorbed and moved on the X-axis, the Y-axis and the Z-axis through the cooperation of the three-axis braking mechanism and the suction mechanism, so as to facilitate the testing operation of the chip

[0026] Specifically, the alarm mechanism includes an alarm device 4 and a safety light curtain 5, the alarm device 4 is arranged on the top of the inner wall of the test machine body 1, and the alarm device 4 is arranged close to the top of the flip door 3, and the safety light curtain 5 is installed on the bottom of the inner wall of the test machine body 1, and the safety light curtain 5 is arranged close to the bottom of the flip door 3.

[0027] In the embodiment, when the staff opens the flip door 3, the alarm device 4 is temporarily sounded and the staff is prompted due to the misalignment of the flip door 3 and the safety light curtain 5.

[0028] Specifically, the three-axis braking mechanism includes a first guide rail seat 10, a first motor 11, a first screw rod 12, a first sliding seat 13, a second guide rail seat 14, a second motor 15, a second screw rod 16 and a second sliding seat 26, the first guide rail seat 10 is installed on one side of the inside of the test machine body 1, the first motor 11 is installed on one side of the first guide rail seat 10, the output shaft end of the first motor 11 penetrates one side of the first guide rail seat 10, the first screw rod 12 is rotatably connected between the first guide rail seats 10, the output shaft end of the first motor 11 is fixedly connected with one end of the first screw rod 12, the first sliding seat 13 is slidably connected on the first guide rail seat 10, the bottom of the first sliding seat 13 is threadedly connected with the first screw rod 12, the first sliding seat 13 is fixedly connected with the second guide rail seat 14 on one side, the second motor 15 is installed on one side of the second guide rail seat 14, the output shaft end of the second motor 15 penetrates one side of the second guide rail seat 14, the second screw rod 16 is rotatably connected between the second guide rail seats 14, the output shaft end of the second motor 15 is fixedly connected with one end of the second screw rod 16, the second sliding seat 26 is slidably connected on the second guide rail seat 14, and the bottom of the second sliding seat 26 is threadedly connected with the second screw rod 16.

[0029] In the embodiment, the first motor 11 is started, so that the first motor 11 drives the first screw rod 12 to rotate, so that the first sliding seat 13 moves on the X-axis, and at the same time, the second motor 15 is started, so that the second motor 15 drives the second sliding seat 26 to move on the Y-axis through the second screw rod 16.

[0030] Specifically, the suction mechanism comprises a vacuum pump 17, a mounting frame 18, first cylinders 19 and suction cups 20. The vacuum pump 17 is mounted at the top end of a second sliding seat 26. The second sliding seat 26 is fixedly connected with the mounting frame 18 on one side. The mounting frame 18 is internally provided with a plurality of first cylinders 19. The first cylinders 19 are linearly arranged at equal intervals. The output ends of the first cylinders 19 are fixedly connected with the suction cups 20. One end of the suction cup 20 penetrates through one side of the mounting frame 18 in a longitudinally movable manner.

[0031] In the embodiment, the first cylinder 19 is started to drive the suction cup 20 to move on the Z-axis, so as to facilitate the movement of the suction cup 20 on the Z-axis, and cooperate with the start of the vacuum pump 17 to facilitate the suction cup 20 to adsorb the chip, thereby moving the chip.

[0032] Specifically, the taking and placing mechanism comprises a hollow frame 6, limiting blocks 7, a feeding disc 8, an OK grade disc 9, moving holes 30, third cylinders 31, guide blocks 32, clamping blocks 33 and limiting holes 35. The hollow frame 6 is fixedly connected to one side of the outside of the testing machine body 1. Two moving holes 30 are formed at the top end of the hollow frame 6. Two groups of limiting blocks 7 are fixedly connected to the outside of the two moving holes 30 at the top end of the hollow frame 6. A plurality of limiting blocks 7 in each group are arranged in a rectangular array. The feeding disc 8 is placed above one of the moving holes 30 and between one group of limiting blocks 7. The OK grade disc 9 is placed above the other moving hole 30 and between the other group of limiting blocks 7. One group of third cylinders 31 is installed on both sides of the feeding disc 8 at the top end of the hollow frame 6. The two groups of third cylinders 31 are symmetrically arranged. The output shaft end of each third cylinder 31 is provided with a clamping block 33. A group of limiting holes 35 are formed in the inner wall of the moving hole 30 and on both sides of the bottom end of the OK grade disc 9. The limiting holes 35 do not penetrate through the top end of the inside of the hollow frame 6. The guide blocks 32 are rotatably connected in the limiting holes 35. One end of the guide block 32 is located below the OK grade disc 9.

[0033] In the embodiment, the bottom end of the guide block 32 is provided with an arc surface protruding towards the top end of the inside of the hollow frame 6.

[0034] Specifically, the moving mechanism comprises an electric sliding rail 27, a mounting seat 28, a second cylinder 29, a chip disc 24 and a clamping plate 34. The electric sliding rail 27 is installed at the bottom end of the inside of the hollow frame 6 and one end of the electric sliding rail 27 is located in the inside of the testing machine body 1. The mounting seat 28 is slidably connected to the electric sliding rail 27. The second cylinder 29 is installed at the bottom end of the inside of the mounting seat 28. The output end of the second cylinder 29 is fixedly connected with the clamping plate 34. The chip disc 24 is placed in the clamping plate 34.

[0035] In the embodiment, the electric slide rail 27 is started to drive the mounting seat 28 to move the chip tray 24 to below the OK grade tray 9, the second cylinder 29 is started to drive the second cylinder 29 to drive the top of the chip tray 24 to pass through the moving hole 30, at this time, the top of the chip tray 24 drives the guide block 32 to rotate upwards, the second cylinder 29 is reset to make the top of the chip tray 24 contact with the top of the guide block 32, thereby limiting the chip tray 24, at this time, the chip tray 24 becomes the OK grade tray 9.

[0036] Specifically, the NG material box 23 is fixedly connected to the right bottom end inside the test machine body 1, the material supplement tray 21 is fixedly connected to the left bottom end inside the test machine body 1, and the plurality of test stations 22 are fixedly connected to the middle bottom end inside the test machine body 1.

[0037] In the embodiment, the suction cup 20 is moved by the first motor 11, the second motor 15 and the first cylinder 19 to make the suction cup 20 put the OK products back to the chip tray 24, and the NG products are respectively placed in the NG material box 23 according to the types of the NG products, and meanwhile, due to the action of the material supplement tray 21, the NG products are discarded, and the chip inside the material supplement tray 21 is grabbed to supplement the material for retesting, and then the OK products are put in the entire chip tray 24.

[0038] The working principle and use process of the utility model are as follows: when in use, first, when the staff opens the flip door 3, the alarm device 4 is temporarily sounded and the staff is prompted due to the misalignment of the flip door 3 and the safety light curtain 5, the mounting seat 28 drives the clamping plate 34 to move below the feeding tray 8 through the electric slide rail 27, the third cylinder 31 is started to drive the clamping block 33 to release the limitation on the feeding tray 8, so that the feeding tray 8 falls from the moving hole 30 to the clamping plate 34, at this time, the feeding tray 8 becomes the chip tray 24, then the mounting seat 28 is reset to move the chip tray 24 to the inside of the test machine body 1.

[0039] Secondly, the first motor 11 starts, so that the first motor 11 drives the first screw rod 12 to rotate, so that the first sliding seat 13 moves on the X axis, at the same time, the second motor 15 starts, so that the second motor 15 drives the second sliding seat 26 to move on the Y axis through the second screw rod 16, and the first air cylinder 19 starts, so that the first air cylinder 19 drives the suction cup 20 to move on the Z axis, so as to facilitate the movement of the suction cup 20 on the X axis Y axis Z axis, and cooperate with the vacuum pump 17 to start, facilitate the suction cup 20 to adsorb the chip, at this time, through a plurality of test stations 22, the chip is tested and the test time can be adjusted through the control button 2, after testing, cooperate with the first motor 11, the second motor 15 and the first air cylinder 19 to move the suction cup 20 again, so that the suction cup 20 puts the OK product back to the chip tray 24, the NG product is placed in the NG product box 23 according to the type of NG, at the same time, due to the action of the replenishment tray 21, the NG product is discarded, and the chip is grabbed on the replenishment tray 21 for replenishment and retesting, and then the OK product is filled in the whole chip tray 24;

[0040] Then, the electric sliding rail 27 is started, so that the mounting seat 28 drives the chip tray 24 to move to the OK product grade tray 9 below, the second air cylinder 29 is started, so that the second air cylinder 29 drives the top of the chip tray 24 to pass through the moving hole 30, at this time, the top of the chip tray 24 drives the guide block 32 to rotate upward, the second air cylinder 29 is reset, so that the top of the chip tray 24 contacts with the top of the guide block 32, so as to limit the chip tray 24, at this time, the chip tray 24 becomes the OK product grade tray 9, so that the finished chip can be conveniently stacked, and the worker can be conveniently managed.

[0041] The above is only a preferred embodiment of the present application, and is not intended to limit the present application in other forms. Any skilled person in the art can modify or change the above disclosed technical content to equivalent embodiments. However, any simple modification, equivalent change and modification of the above embodiments without departing from the technical solution of the present application, according to the technical essence of the present application, still belongs to the protection scope of the technical solution of the present application.

Claims

1. A novel automatic chip testing machine, comprising a testing machine body (1), control buttons (2), a flip door (3) and a display screen (25), the control buttons (2) are provided with several, and the several control buttons (2) are all installed on the front side of the testing machine body (1), the flip door (3) is hinged on the front side of the testing machine body (1), and the display screen (25) is rotatably installed on the right side of the testing machine body (1), characterized in that ； The alarm mechanism, three-axis braking mechanism, suction mechanism, standby taking and placing mechanism and moving mechanism are arranged in the test machine body (1), the alarm mechanism is arranged on the inner wall of the test machine body (1) and is close to the flip door (3), the three-axis braking mechanism is arranged on the inner back side of the test machine body (1) and is used for moving the chip on the X-axis, Y-axis and Z-axis, the suction mechanism is arranged on the Z-axis of the three-axis braking mechanism and is used for adsorbing the chip, the standby taking and placing mechanism is arranged on one side of the outer side of the test machine body (1) and is used for stacking and discharging the chip, and the moving mechanism is slidably arranged in the taking and placing mechanism and can move from the taking and placing mechanism to the test machine body (1).

2. A novel automated chip tester as claimed in claim 1, wherein: The alarm mechanism comprises an alarm device (4) and a safety light curtain (5), the alarm device (4) is arranged on the top of the inner wall of the test machine body (1) and is arranged close to the top of the flip door (3), and the safety light curtain (5) is arranged on the bottom of the inner wall of the test machine body (1) and is arranged close to the bottom of the flip door (3).

3. A novel automated chip tester as claimed in claim 1, wherein: The three-axis braking mechanism comprises a first guide rail seat (10), a first motor (11), a first screw rod (12), a first sliding seat (13), a second guide rail seat (14), a second motor (15), a second screw rod (16) and a second sliding seat (26), the first guide rail seat (10) is arranged on one side of the inner side of the test machine body (1), the first motor (11) is arranged on one side of the first guide rail seat (10), the output shaft end of the first motor (11) penetrates one side of the first guide rail seat (10), the first screw rod (12) is rotatably connected between the first guide rail seats (10), the output shaft end of the first motor (11) is fixedly connected with one end of the first screw rod (12), the first sliding seat (13) is slidably connected on the first guide rail seat (10), the bottom of the first sliding seat (13) is threadedly connected with the first screw rod (12), the first sliding seat (13) is fixedly connected with the second guide rail seat (14) on one side of the first sliding seat (13), the second motor (15) is arranged on one side of the second guide rail seat (14), the output shaft end of the second motor (15) penetrates one side of the second guide rail seat (14), the second screw rod (16) is rotatably connected between the second guide rail seats (14), the output shaft end of the second motor (15) is fixedly connected with one end of the second screw rod (16), and the second sliding seat (26) is slidably connected on the second guide rail seat (14), and the bottom of the second sliding seat (26) is threadedly connected with the second screw rod (16).

4. The testing machine of claim 3, wherein: The suction mechanism comprises a vacuum pump (17), a mounting frame (18), a first cylinder (19) and a suction disc (20), the vacuum pump (17) is installed at the top end of a second sliding seat (26), one side of the second sliding seat (26) is fixedly connected with the mounting frame (18), a plurality of first cylinders (19) are installed in the mounting frame (18), the plurality of first cylinders (19) are linearly arranged at equal intervals, the output ends of the plurality of first cylinders (19) are fixedly connected with the suction disc (20), and one end of the suction disc (20) penetrates through one side of the mounting frame (18) and can move longitudinally.

5. The testing machine of claim 1, wherein: The to-be-taken-and-placed mechanism comprises a hollow frame (6), a limiting block (7), a feeding disc (8), an OK grade disc (9), a moving hole (30), a third cylinder (31), a guide block (32), a clamping block (33) and a limiting hole (35), the hollow frame (6) is fixedly connected to one side of the outside of the testing machine body (1), two moving holes (30) are formed at the top end of the hollow frame (6), two groups of limiting blocks (7) are fixedly connected to the top end of the hollow frame (6) and located on the outer sides of the two moving holes (30) respectively, a plurality of limiting blocks (7) in each group are arranged in a rectangular array, the upper side of one of the moving holes (30) is provided with the feeding disc (8) between one group of limiting blocks (7), the upper side of the other moving hole (30) is provided with the OK grade disc (9) between the other group of limiting blocks (7), one group of third cylinders (31) is installed at the two sides of the feeding disc (8) at the top end of the hollow frame (6), the two groups of third cylinders (31) are symmetrically arranged, and each third cylinder (31) is provided with a clamping block (33) at the output shaft end, a group of limiting holes (35) are formed in the inner walls of the moving holes (30) and located at the two sides of the bottom end of the OK grade disc (9), the limiting holes (35) do not penetrate through the top end of the inside of the hollow frame (6), and the guide blocks (32) are rotatably connected to the limiting holes (35), and one end of each guide block (32) is located below the OK grade disc (9).

6. A novel automated chip tester as claimed in claim 5, wherein: The moving mechanism comprises an electric sliding rail (27), a mounting seat (28), a second cylinder (29), a chip disc (24) and a clamping plate (34), the electric sliding rail (27) is installed at the bottom end of the inside of the hollow frame (6), one end of the electric sliding rail (27) is located in the inside of the testing machine body (1), the mounting seat (28) is slidably connected to the electric sliding rail (27), the second cylinder (29) is installed at the bottom end of the inside of the mounting seat (28), the clamping plate (34) is fixedly connected to the output end of the second cylinder (29), and the chip disc (24) is placed in the clamping plate (34).

7. A new automated chip tester as claimed in claim 1, wherein: An NG product box (23) is fixedly connected to the right side of the bottom end of the inside of the testing machine body (1), a feeding disc (21) is fixedly connected to the left side of the bottom end of the inside of the testing machine body (1), and a plurality of test stations (22) are fixedly connected to the middle of the bottom end of the inside of the testing machine body (1).

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