Protection plate test tool and probe structure adaptive to different protection plates

Abstract

The utility model discloses a protection plate test tool adapted to different protection plates, a probe structure, comprising a detection base plate and a probe detection mechanism, the probe detection mechanism comprises a probe elevating structure, a probe installation plate and a probe structure, the probe elevating structure is installed on the detection base plate, an elevating part of the probe elevating structure is connected with the probe installation plate, and the probe installation plate is connected with the probe structure. A probe mounting hole is formed in the probe mounting plate, and the probe structure is mounted at the probe mounting hole; the probe structure comprises a probe, a probe mounting sleeve, a probe movement limiting piece and a spring; the probe mounting sleeve is detachably fixed at the probe mounting hole, and the probe passes through the probe mounting sleeve and reciprocates relative to the probe mounting sleeve; the top, exposed out of the probe mounting sleeve, of the probe is provided with a probe movement limiting piece, and the spring is located between the detection conical head of the probe and the probe mounting sleeve. According to the utility model, the movable probe is used as a leading-out point of a test signal of the protection plate, the device can be applied to both the protection plate with an acquisition line and a contact type protection plate, the installation position of the probe can be replaced according to a detection point of the protection plate, and the detection bottom plate is provided with the fixed elastic sheet capable of adjusting a fixed angle, so that the detection precision is improved. Therefore, protection plates with different sizes can be adapted.

Description

Technical Field

[0001] This utility model belongs to the field of lithium battery technology, specifically relating to a protection board testing fixture and probe structure adapted to different protection boards. Background Technology

[0002] Currently, protection board testing is divided into two types: those with acquisition lines and those with contact points. When testing a protection board with acquisition lines, the acquisition lines need to be connected to the testing equipment for each test. For protection boards with contact points, different tooling is required for each test, resulting in high manufacturing costs and significant waste. Utility Model Content

[0003] This invention provides a protection board testing fixture and probe structure that are compatible with different protection boards, thereby addressing the shortcomings described in the prior art.

[0004] The technical solution adopted in this utility model is as follows:

[0005] A protection board testing fixture adaptable to different protection boards includes a testing base plate and a probe testing mechanism. The probe testing mechanism includes a probe lifting structure, a probe mounting plate, and a probe structure. The probe lifting structure is mounted on the testing base plate, and the lifting part of the probe lifting structure is connected to the probe mounting plate. The probe mounting plate is provided with a plurality of probe mounting holes, and the probe structure is installed at any one of the probe mounting holes. The probe structure includes a probe, a probe mounting sleeve, a probe movement limiting component, and a spring. The probe mounting sleeve is detachably fixed at the probe mounting hole, and the probe passes through the probe mounting sleeve and moves back and forth relative to the probe mounting sleeve. A probe movement limiting component is provided on the top of the probe protruding from the probe mounting sleeve, and a spring is sleeved on the lower part of the probe, with the spring located between the probe's testing cone and the probe mounting sleeve. The probe structure can be installed in a different position according to the size of the protection board, and the probe's detection head is set as a cone to reduce the contact point, which is convenient for testing protection boards with small monitoring points. The spring setting can relieve the force on the probe lifting structure and avoid damage to the protection board caused by excessive cylinder force. The area between the probe and the probe movement limit component serves as the assembly area for the detection signal lead-out line. It is suitable for both linear and contact protection boards, using the probe as the lead-out point for the detection signal.

[0006] In a preferred embodiment of this invention, the probe has an external thread at its top, and the probe movement limiting component is a probe fixing nut. The probe fixing nut is located above the probe mounting sleeve. In the non-working state, the probe movement limiting nut is in contact with the top of the probe mounting sleeve. When detection is required, under the action of the probe lifting structure, the probe's detection cone contacts the detection position of the protective plate and is pressed down by the probe protective plate. The spring is compressed, and the probe moves upward relative to the probe mounting sleeve. After detection is completed, the probe lifting structure no longer applies pressure to the probe protective plate, and the probe protective plate moves upward under the restoring force of the spring, which is equivalent to the probe moving downward along the probe mounting sleeve to achieve reset. The detection length and relative movement stroke of the probe can be adjusted by changing the position of the probe movement limiting component.

[0007] In a preferred embodiment of this invention, the probe mounting sleeve has an extension portion that extends beyond the probe mounting hole, confining the probe mounting sleeve at the probe mounting hole. The outer wall surface of the probe mounting sleeve below the extension portion has external threads. A mounting sleeve fixing nut is threadedly connected to the probe mounting sleeve, and the mounting sleeve fixing nut is located below the probe mounting plate. A spring is disposed between the mounting sleeve fixing nut and the detection cone. The mounting sleeve fixing nut fixes the position of the probe mounting sleeve.

[0008] In a preferred embodiment of this utility model, a plurality of protective plate fixing structures are provided on the detection base plate. Each protective plate fixing structure includes a fixing spring, one end of which is adjustablely mounted on the detection base plate. The free ends of each fixing spring form a fixing area for the protective plate. The fixing springs can be fixed using bolts and nuts, or pins, as long as the orientation of the free ends of the fixing springs can be adjusted to achieve the fixing of the protective plates.

[0009] As a preferred embodiment of this utility model, the free end of the fixing spring is provided with an upwardly convex bending portion, which provides deformation space for the fixing spring.

[0010] This invention also provides a probe structure, including a probe, a probe mounting sleeve, a probe movement limiting component, and a spring. The probe passes through the probe mounting sleeve and reciprocates relative to it. A probe movement limiting component is located on the top of the probe protruding from the probe mounting sleeve, and a spring is fitted onto the lower part of the probe, positioned between the probe's detection cone and the probe mounting sleeve. The probe structure is assembled onto a protection board testing device as a test signal output point, and a signal transmission line is pressed between the probe and the probe movement limiting component to transmit the probe's test signal.

[0011] As a preferred embodiment of this utility model, the top of the probe is provided with an external thread, and the probe movement limiting component is a probe fixing nut.

[0012] As a preferred embodiment of this utility model, the probe mounting sleeve has an extension portion, and the outer wall surface of the probe mounting sleeve located below the extension portion has an external thread. The mounting sleeve fixing nut is threadedly connected to the probe mounting sleeve, and the spring is disposed between the mounting sleeve fixing nut and the detection cone.

[0013] This invention uses a movable probe as the lead-out point for the test signal of the protection board. It is applicable to both protection boards with acquisition lines and contact-type protection boards. Moreover, the installation position of the probe can be changed according to the detection point of the protection board. Furthermore, the detection base plate is equipped with a fixing spring that can be adjusted to a fixed angle to accommodate protection boards of different sizes. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a schematic diagram of the structure of this utility model.

[0016] Figure 2 This is a schematic diagram of the probe structure of this utility model. Detailed Implementation

[0017] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0018] Example 1:

[0019] A protection board testing fixture that adapts to different protection boards, such as Figure 1As shown, the system includes a detection base plate 1 and a probe detection mechanism. The detection base plate 1 has several protective plate fixing structures; this embodiment uses four as an example. Each protective plate fixing structure includes a fixing spring 8, one end of which is adjustablely mounted on the detection base plate 1. In this embodiment, fixing holes are provided in both the detection base plate and the fixing spring 8, and bolts and nuts are used to fix the fixing spring 8 to the detection base plate. The free ends of each fixing spring 8 form a fixing area for the protective plate. The fixing spring 8 can be fixed using bolts and nuts or pins, as long as the orientation of the free end of the fixing spring 8 can be changed by loosening or tightening it to fix the protective plate. When it is necessary to adjust the orientation of the fixing spring 8, loosen the bolts and nuts to adjust the direction, and then tighten them again.

[0020] Furthermore, the free end of the fixed spring 8 is provided with an upwardly convex bending portion 81, which provides deformation space for the fixed spring.

[0021] The probe detection mechanism includes a probe lifting structure, a probe mounting plate 2, and a probe structure. The probe lifting structure 9 uses a lifting cylinder and is mounted on the detection base plate 1 via a cylinder mounting plate 10. The lifting part of the probe lifting structure is connected to the probe mounting plate 2. The probe mounting plate 2 is provided with a plurality of probe mounting holes 21. This embodiment is shown as an example with all probe mounting holes. The probe structure is installed at any one of the probe mounting holes. The position of the installed probe mounting hole is changed according to the detection position of the protection plate.

[0022] like Figure 2 As shown, the probe structure includes a probe 3, a probe mounting sleeve 4, a probe movement limiting component 5, and a spring 7. The probe mounting sleeve 4 is detachably fixed to the probe mounting hole. In this embodiment, the probe mounting sleeve 4 has an extension portion 41 that extends beyond the probe mounting hole, limiting the probe mounting sleeve to the probe mounting hole. The outer wall surface of the probe mounting sleeve 4 below the extension portion has external threads. The probe mounting sleeve passes downward from the probe mounting plate through the probe mounting hole, with the extension portion above the probe mounting hole. The outer circumferential surface of the probe mounting sleeve below the probe mounting hole has external threads. A mounting sleeve fixing nut 6 is threadedly connected to the probe mounting sleeve. The mounting sleeve fixing nut is located below the probe mounting plate, fixing the probe mounting sleeve to the probe mounting hole of the probe mounting plate. Of course, other existing fixing methods can also be used for the probe mounting sleeve, as long as the probe mounting sleeve can be fixed to the probe mounting hole and can be removed.

[0023] The probe 3 passes through the probe mounting sleeve 4 and reciprocates relative to the probe mounting sleeve. A probe movement limiting member 5 is located on the top of the probe 3 protruding from the probe mounting sleeve 4. In this embodiment, the top of the probe 3 has an external thread, and the probe movement limiting member 5 is a probe fixing nut. A spring 7 is fitted onto the lower part of the probe 3, and the spring 7 is located between the detection cone 31 of the probe 3 and the mounting sleeve fixing nut 6.

[0024] The probe structure can be installed in a different position according to the size of the protection board, and the probe's detection head is set as a cone to reduce the contact point, which is convenient for testing protection boards with small monitoring points. The spring setting can relieve the force on the probe lifting structure and avoid damage to the protection board caused by excessive cylinder force. The area between the probe and the probe movement limit component serves as the assembly area for the detection signal lead-out line. It is suitable for both linear and contact protection boards, using the probe as the lead-out point for the detection signal.

[0025] In the non-working state, the probe movement limiter is in contact with the top of the probe mounting sleeve. When detection is required, under the action of the probe lifting structure, the probe's detection cone contacts the detection position of the protective plate and is pressed down by the probe protective plate. The spring is compressed, and the probe moves upward relative to the probe mounting sleeve 4. After detection is completed, the probe lifting structure no longer applies pressure to the probe protective plate, and the probe protective plate moves upward under the restoring force of the spring, which is equivalent to the probe moving downward along the probe mounting sleeve to achieve reset. The detection length and relative movement stroke of the probe can be adjusted by changing the position of the probe movement limiter.

[0026] The probe serves as the test signal output point for the protection board. The signal output wire is pressed between the probe and the probe movement limiter. In actual use, the probe is made of copper for its low internal resistance. The probe mounting sleeve can be made of any material, but carbon steel is preferred due to its sufficient strength and long service life. The spring is made of stainless steel. All other components can be made of plastic insulation.

[0027] Example 2:

[0028] A probe structure, such as Figure 2As shown, the device includes a probe 3, a probe mounting sleeve 4, a probe movement limiting member 5, a mounting sleeve fixing nut 6, and a spring 7. In this embodiment, the probe mounting sleeve 4 has an extension 41 that extends beyond the probe mounting hole, limiting the probe mounting sleeve to its mounting position. The outer wall surface of the probe mounting sleeve 4 below the extension has external threads, and the mounting sleeve fixing nut 6 is threadedly connected to the probe mounting sleeve to fix it in its mounting position. The probe 3 passes through the probe mounting sleeve 4 and reciprocates relative to it. The probe 3 has a probe movement limiting member 5 protruding from the top of the probe mounting sleeve 4. In this embodiment, the probe 3 has external threads on its top, and the probe movement limiting member 5 is a probe fixing nut. A spring 7 is fitted onto the lower part of the probe 3, and the spring 7 is located between the detection cone 31 of the probe 3 and the mounting sleeve fixing nut 6.

[0029] In this specification, the terms "an embodiment," "example," "specific example," etc., refer to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0030] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A protection board testing fixture adaptable to different protection boards, comprising a testing base plate (1) and a probe testing mechanism, characterized in that: The probe detection mechanism includes a probe lifting structure, a probe mounting plate (2), and a probe structure. The probe lifting structure is installed on the detection base plate (1). The lifting part of the probe lifting structure is connected to the probe mounting plate (2). The probe mounting plate (2) is provided with a plurality of probe mounting holes (21). The probe structure is installed at any one of the probe mounting holes. The probe structure includes a probe (3), a probe mounting sleeve (4), a probe movement limiting component (5), and a spring (7). The probe mounting sleeve (4) is detachably fixed at the probe mounting hole. The probe (3) passes through the probe mounting sleeve (4) and moves back and forth relative to it. The probe (3) is provided with a probe movement limiting component (5) at the top of the probe mounting sleeve (4). The lower part of the probe (3) is fitted with a spring (7). The spring (7) is located between the detection cone (31) of the probe (3) and the probe mounting sleeve (4).

2. The protection board testing fixture adapted to different protection boards according to claim 1, characterized in that: The probe (3) has an external thread at its top, and the probe movement limiting component (5) is a probe fixing nut.

3. The protection board testing fixture adapted to different protection boards according to claim 1 or 2, characterized in that: The probe mounting sleeve (4) has an extension portion. The outer wall surface of the probe mounting sleeve (4) below the extension portion has an external thread. The mounting sleeve fixing nut (6) is threadedly connected to the probe mounting sleeve, and the mounting sleeve fixing nut is located below the probe mounting plate. The spring (7) is set between the mounting sleeve fixing nut (6) and the detection cone (31).

4. The protection board testing fixture adapted to different protection boards according to claim 3, characterized in that: The detection base plate (1) is provided with several protective plate fixing structures, the protective plate fixing structures include fixing springs (8), one end of the fixing springs (8) is adjustable and installed on the detection base plate (1); the free ends of each fixing spring (8) surround the fixing area of ​​the protective plate.

5. The protection board testing fixture adapted to different protection boards according to claim 4, characterized in that: The free end of the fixed spring (8) is provided with an upwardly convex bending part (81).

6. A probe structure, characterized in that: It includes a probe (3), a probe mounting sleeve (4), a probe movement limiting component (5), and a spring (7); the probe (3) passes through the probe mounting sleeve (4) and moves back and forth relative to the probe mounting sleeve; the probe (3) is exposed at the top of the probe mounting sleeve (4) and is provided with a probe movement limiting component (5); the lower part of the probe (3) is fitted with a spring (7), and the spring (7) is located between the detection cone (31) of the probe (3) and the probe mounting sleeve (4).

7. The probe structure according to claim 6, characterized in that: The probe (3) has an external thread at its top, and the probe movement limiting component (5) is a probe fixing nut.

8. The probe structure according to claim 7, characterized in that: The probe mounting sleeve (4) has an extension portion. The outer wall surface of the probe mounting sleeve (4) below the extension portion has an external thread. The mounting sleeve fixing nut (6) is threadedly connected to the probe mounting sleeve. The spring (7) is located between the mounting sleeve fixing nut (6) and the detection cone (31).

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