Automatic calibration device for solar cell film thickness detection
The automatic calibration device enables efficient calibration of solar cell film thickness detection, solving the problems of low efficiency and inaccurate accuracy in existing technologies. By using a moving component and a white polytetrafluoroethylene (PTFE) calibration plate, automatic calibration without stopping the machine is achieved, improving detection accuracy and efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- WUXI YANPU INTELLIGENT TECH CO LTD
- Filing Date
- 2025-06-05
- Publication Date
- 2026-04-24
AI Technical Summary
Existing solar cell film thickness testing equipment has low calibration efficiency, and the manual calibration process is cumbersome, affecting the testing accuracy.
An automatic calibration device is designed, which drives a calibration plate to move within the testing equipment via a moving component to achieve automatic calibration. The calibration plate is a white polytetrafluoroethylene plate with a reflectance spectrum curve that matches the solar panel. It is integrated into the equipment and requires no downtime operation.
It improves calibration efficiency, ensures testing accuracy, simplifies the calibration process, and avoids tedious manual operations and equipment downtime.
Smart Images

Figure CN224163153U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to a solar cell testing device, and more particularly to an automatic calibration device for testing the film thickness of solar cells. Background Technology
[0002] In photovoltaic cell film thickness testing, the light source of the testing equipment will decay and age over time, and the probe installation position and optical fiber may come into contact with the cells picked up by production personnel, causing changes in the reflectance spectrum curve measured by the film thickness equipment. These errors will affect the accuracy of the film thickness data.
[0003] In the existing technology, film thickness calibration is mainly done manually. During calibration, the machine casing needs to be opened, and then a standard sheet needs to be manually removed and placed on the equipment. After calibration, the standard sheet is retrieved. This method is inefficient. Utility Model Content
[0004] To address the aforementioned problems, this utility model provides an automatic calibration device for detecting the thickness of solar cell films. The specific technical solution is as follows:
[0005] An automatic calibration device for detecting the thickness of solar cell films includes: a calibration base plate slidably disposed below a detection base plate and having a plurality of calibration holes and a detection hole disposed on one side of the calibration holes; a calibration plate disposed on the calibration holes; and a moving component disposed on the detection base plate and connected to the calibration base plate; wherein, during normal detection, the detection holes are positioned opposite to a camera to allow the camera to take pictures for detection; during calibration, the moving component drives the calibration base plate to move the calibration plate so that the calibration plate moves below the camera for calibration.
[0006] Preferably, the calibration plate is a white polytetrafluoroethylene plate.
[0007] Preferably, mounting grooves are provided on both sides of the calibration hole, and mounting plates are provided on both sides of the calibration plate, with the mounting plates disposed in the mounting grooves.
[0008] Preferably, the calibration hole communicates with the detection hole.
[0009] Preferably, the moving component includes: a driving unit disposed on the detection base plate; and a connecting block connected to the driving unit and the calibration base plate respectively.
[0010] Furthermore, the drive unit includes an electromagnet or a cylinder.
[0011] Preferably, it also includes a linear guide pair, which is connected to the calibration base plate and the detection base plate respectively.
[0012] Compared with the prior art, the present invention has the following beneficial effects:
[0013] The present invention provides an automatic calibration device for detecting the thickness of solar cell films. The device uses a moving component to move the calibration plate to the bottom of the camera for automatic calibration. After calibration, the calibration plate automatically leaves the camera, allowing the camera to work normally without opening the casing or stopping the machine, which greatly improves the calibration efficiency. Attached Figure Description
[0014] Figure 1 This is a schematic diagram of the structure of this application;
[0015] Figure 2 This is a top view of this application;
[0016] Figure 3 This is a bottom view of this application;
[0017] Figure 4 This is a side view of this application;
[0018] Figure 5 This is an assembly diagram of the moving components, calibration base plate, and calibration plate;
[0019] Figure 6 This is a schematic diagram of the calibration base plate;
[0020] Figure 7 This is a schematic diagram of the calibration plate. Detailed Implementation
[0021] The present invention will now be further described with reference to the accompanying drawings.
[0022] like Figures 1 to 7 As shown, an automatic calibration device for detecting the thickness of solar cell films includes a calibration base plate 4, a calibration plate 6, and a moving component 2. The calibration base plate 4 is slidably mounted below a detection base plate 1. The calibration base plate 4 has a plurality of calibration holes 41 and detection holes 42, with the detection holes 42 located on one side of the calibration holes 41 and corresponding one-to-one. The calibration plate 6 is mounted on the calibration holes 41. The moving component 2 is mounted on the detection base plate 1 and connected to the calibration base plate 4, and is used to drive the calibration base plate 4 to move. During normal detection, the detection holes 42 are positioned opposite to the camera so that the camera can take pictures for detection. During calibration, the moving component 2 drives the calibration base plate 4 to move the calibration plate 6 so that the calibration plate 6 is moved below the camera for calibration.
[0023] The camera is installed in the fixing hole 11 of the detection base plate 1, and the fixing hole 11 is set opposite to the detection hole 42 and the calibration hole 41.
[0024] The calibration plate 6 is a white polytetrafluoroethylene plate, but other materials proportional to the reflectivity of the silicon wafer can also be used.
[0025] The reflectance spectrum curve of calibration plate 6 is the same as that of the solar panel, and calibration plate 6 serves as a standard solar cell for calibration testing. The calibration base plate 4 and the moving component 2 move calibration plate 6 between two stations: testing and normal testing. This integrates the calibration device into the equipment, eliminating the need to open the casing and stop the machine for calibration, thus greatly improving calibration efficiency.
[0026] A standard solar cell, i.e., a silicon wafer, is placed below the camera. The range of the reflectance spectrum curve is set, and then calibration plate 6, i.e., a polytetrafluoroethylene (PTFE) white board, is placed below the camera. The reflectance spectrum curve of calibration plate 6 is obtained. If the reflectance spectrum curve of calibration plate 6 is within the same range as that of the solar cell, then calibration plate 6 meets the requirements. In subsequent calibrations, calibration plate 6 can be moved below the camera to complete the calibration without opening the camera housing. Calibration plate 6 has high strength, solving the problem of poor strength and fragility of solar cells, ensuring reliability and stability in use.
[0027] To facilitate the installation of the calibration plate 6, mounting slots 411 are provided on both sides of the calibration hole 41, and mounting plates 61 are provided on both sides of the calibration plate 6. The mounting plates 61 are fixed in the mounting slots 411 by screws.
[0028] To facilitate the machining of calibration hole 41 and detection hole 42, calibration hole 41 and detection hole 42 are connected to form a large hole.
[0029] The moving component 2 includes a drive unit 21 and a connecting block 22. The drive unit 21 is fixed on the detection base plate 1 and connected to the calibration base plate 4 via the connecting block 22. The detection base plate 1 has a drive groove, and the connecting block 22 is movably inserted into the drive groove. To simplify the structure and facilitate control, the drive unit 21 may include an electromagnet or a cylinder. Using an electromagnet greatly simplifies the structure and control, significantly reducing costs and providing convenient control.
[0030] To facilitate the movement of the calibration base plate 4, a linear guide pair 5 is also included, which is connected to both the calibration base plate 4 and the detection base plate 1. The slider 51 of the linear guide pair 5 is fixed on the calibration base plate 4, and the linear guide 52 of the linear guide pair 5 is installed at the bottom of the detection base plate 1.
[0031] The camera is equipped with a light source that illuminates the calibration plate 6 and the solar panel.
[0032] The technical principles of this utility model have been described above with reference to specific embodiments. These descriptions are merely for explaining the principles of this utility model and should not be construed as limiting the scope of protection of this utility model in any way. Based on this explanation, those skilled in the art can readily conceive of other specific embodiments of this utility model without inventive effort, and these embodiments will all fall within the protection scope of the claims of this utility model.
Claims
1. An automatic calibration device for detecting the thickness of solar cell films, characterized in that, include: The calibration base plate (4) is slidably disposed below the detection base plate (1) and is provided with a plurality of calibration holes (41) and a detection hole (42) disposed on one side of the calibration holes (41). A calibration plate (6) is disposed on the calibration hole (41); as well as The moving component (2) is disposed on the detection base plate (1) and connected to the calibration base plate (4); During normal testing, the detection hole (42) is positioned opposite to the camera so that the camera can take pictures for testing; during calibration, the moving component (2) drives the calibration base plate (4) to move the calibration plate (6) so that the calibration plate (6) moves to the bottom of the camera for calibration.
2. The automatic calibration device for detecting the thickness of solar cell films according to claim 1, characterized in that, The calibration plate (6) is a white polytetrafluoroethylene plate.
3. The automatic calibration device for detecting the thickness of solar cell films according to claim 1, characterized in that, The calibration hole (41) has mounting grooves (411) on both sides, and the calibration plate (6) has mounting plates (61) on both sides, and the mounting plates (61) are located in the mounting grooves (411).
4. The automatic calibration device for detecting the thickness of solar cell films according to claim 1, characterized in that, The calibration hole (41) is connected to the detection hole (42).
5. An automatic calibration device for detecting the thickness of solar cell films according to claim 1, characterized in that, The moving component (2) includes: The drive unit (21) is disposed on the detection base plate (1); and The connecting block (22) is connected to the driving unit (21) and the calibration base plate (4) respectively.
6. An automatic calibration device for detecting the thickness of solar cell films according to claim 5, characterized in that, The drive unit (21) includes an electromagnet or a cylinder.
7. An automatic calibration device for detecting the thickness of solar cell films according to claim 1, characterized in that, It also includes a linear guide pair (5), which is connected to the calibration base plate (4) and the detection base plate (1) respectively.