IGBT (Insulated Gate Bipolar Translator) driver test connection clamp

Abstract

The utility model provides an IGBT driver test connection clamp, and relates to the technical field of IGBT driver test. The IGBT driver test connection clamp comprises a plurality of connecting pieces and a plurality of clamping assemblies, the connecting pieces are hinged to at least one connecting piece, the connecting pieces correspond to the clamping assemblies in a one-to-one mode, the clamping assemblies are connected with the connecting pieces corresponding to the clamping assemblies in a sliding mode, and the clamping assemblies are connected with the connecting pieces corresponding to the clamping assemblies in a sliding mode. And the clamping assembly is used for clamping a pin of the IGBT driver. According to the utility model, the problems that a plurality of pins need to be clamped in sequence in one test, but the clamps are mostly arranged singly, so that the sequence of the clamps is easy to be disordered, and the test data is wrong can be solved.

Description

Technical Field

[0001] This application relates to the field of IGBT driver testing technology, and in particular to an IGBT driver testing connection fixture. Background Technology

[0002] IGBT (Insulated-Gate Bipolar Transistor) drivers are widely used in motor drives, inverters, and high-voltage DC transmission. IGBT drivers can control and drive the switching states of IGBTs in various applications to improve switching speed, efficiency, and system performance. IGBT drivers typically integrate multiple functions, such as overvoltage, overcurrent, and temperature protection, as well as signal feedback mechanisms.

[0003] As a key power electronic device, IGBT drivers are widely used in motor drives, inverters, and high-voltage DC transmission. To ensure efficient IGBT operation, a dedicated driver is typically required to control its switching state. Multifunctional IGBT drivers not only improve switching speed and system efficiency but also integrate overvoltage, overcurrent, and temperature protection functions to ensure system stability and reliability. Furthermore, drivers usually include a signal feedback mechanism for real-time monitoring and adjustment of the IGBT's operating status.

[0004] The IGBT driver test fixture is a specially designed device for convenient performance testing of IGBT drivers. In current operations, the IGBT driver to be tested is first installed into the fixture, ensuring a good connection. Then, the fixture is connected to testing equipment such as an oscilloscope and multimeter according to the testing requirements. After setting the relevant parameters, the device is powered on for testing, and the performance data is recorded and analyzed to verify whether the IGBT driver meets the specifications.

[0005] The fixtures are individually configured to hold pins at different locations. However, in a single test, multiple pins need to be clamped sequentially. When there are many pins, operators may confuse the pins corresponding to each fixture, failing to operate in the correct pin order, resulting in a disordered fixture sequence. IGBT driver pins typically have specific functions and test sequence requirements. If the fixture sequence is disordered, the connection order between the test equipment and the pins will not conform to the IGBT driver's own design and test specifications, leading to incorrect data acquisition by the test equipment. Utility Model Content

[0006] In view of this, this application provides an IGBT driver test connection fixture to solve the problem that in a single test, multiple pins need to be clamped in sequence, and the fixture is usually set up individually, which can easily lead to a disordered clamping sequence and cause incorrect test data.

[0007] This application provides an IGBT driver test connection fixture, which includes multiple connectors and multiple clamping components. The connectors are hinged to at least one of the connectors, and the multiple connectors correspond one-to-one with the multiple clamping components. The clamping components are slidably connected to the connectors corresponding to the clamping components, and the clamping components are used to clamp the pins of the IGBT driver.

[0008] Preferably, the connector has a sliding groove that extends in a predetermined direction, and a portion of the clamping assembly is located within the sliding groove and is capable of sliding within the sliding groove.

[0009] Preferably, the IGBT driver test connection fixture further includes a connector, through which the two sliding grooves of the two hinged connectors pass, so that the two connectors can rotate relative to the connector.

[0010] Preferably, the IGBT driver test connection fixture further includes multiple support components, each of which corresponds to one of the multiple connectors. Each support component includes a support rod and a suction cup. One end of the support rod is connected to the connector corresponding to the support component, and the other end of the support rod is connected to the suction cup. The suction cup is used to contact the bearing surface.

[0011] Preferably, the clamping assembly includes a clamping body and a conductive mechanism. A portion of the clamping body is located within the sliding groove. The conductive mechanism includes a connecting wire and two conductive elements. Both conductive elements are disposed on the clamping body and are connected to the connecting wire.

[0012] Preferably, the clamping body includes a mounting component, an abutment component, and a sliding component. One end of the sliding component is connected to the mounting component, and the other end of the sliding component is connected to the abutment component. Both conductive components are disposed on the mounting component. A portion of the sliding component is located within the sliding groove. The abutment component abuts against the side of the connecting component opposite to the mounting component.

[0013] Preferably, the clamping assembly further includes two first elastic elements and two clamping elements. The two clamping elements are respectively connected to the clamping body through the two first elastic elements, and the two conductive elements are respectively fixed on the two clamping elements, with the two conductive elements facing each other.

[0014] Preferably, the clamping member includes a clamping plate and two extension plates, the two extension plates being connected to opposite sides of the clamping plate, the conductive element being fixed to the clamping plate, and the first elastic element being connected to the side of the clamping plate opposite to the conductive element.

[0015] Preferably, two of the extension plates in one clamping member correspond to two of the extension plates in another clamping member, and the conductive mechanism further includes a second elastic member disposed between the corresponding two extension plates.

[0016] Preferably, the extension plate is provided with an anti-wear layer, and the anti-wear layers on two corresponding extension plates face each other.

[0017] When using the IGBT driver test connection fixture of this application, the connectors are rotated, and the positions of the clamping components corresponding to each connector are adjusted so that the different clamping components are in the required positions to clamp and fix the corresponding pins. Since the positions of the clamping components are relatively fixed and cannot be interchanged, the IGBT driver test connection fixture of this application can ensure that the clamping components are arranged in sequence, avoiding disordered clamping order. This prevents the connection sequence between the test equipment and the pins from not conforming to the design and test specifications of the IGBT driver itself, thereby ensuring the accuracy of the data acquired by the test equipment. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This diagram shows the structure of the IGBT driver test connection fixture.

[0020] Figure 2 A diagram showing the relative positions of multiple connectors is provided.

[0021] Figure 3 A schematic diagram of the connecting component is shown;

[0022] Figure 4 A schematic diagram of the clamping assembly is shown;

[0023] Figure 5 A diagram showing the relative positions of the clamping body and the clamping components is provided.

[0024] Figure 6 A schematic diagram of the clamping component is shown;

[0025] Figure 7 A schematic diagram of the conductive mechanism is shown.

[0026] Icons: 1-Connector; 11-Sliding groove; 2-Clamping assembly; 21-Clamping body; 211-Mounting component; 2111-First mounting part; 2112-Second mounting part; 212-Abutting component; 213-Sliding component; 214-Through hole; 22-Conductive mechanism; 221-Conductive component; 222-Connecting wire; 223-Adapter wire; 23-First elastic component; 24-Clamping component; 241-Clamping plate; 242-Extension plate; 25-Second elastic component; 26-Anti-wear layer; 3-Connector; 31-First limiting part; 32-Second limiting part; 33-Connector; 4-Support assembly; 41-Support rod; 42-Suction cup; 5-Extension rod. Detailed Implementation

[0027] The following detailed embodiments are provided to help the reader gain a comprehensive understanding of the methods, apparatus, and / or systems described herein. However, various changes, modifications, and equivalents of the methods, apparatus, and / or systems described herein will be apparent after understanding the disclosure of this application. For example, the order of operations described herein is merely illustrative and is not limited to the order set forth herein; changes that will be apparent after understanding the disclosure of this application are possible, except for operations that must occur in a specific order. Furthermore, for clarity and brevity, descriptions of features known in the art may be omitted.

[0028] The features described herein may be implemented in different forms and should not be construed as being limited to the examples described herein. Rather, the examples described herein have been provided merely to illustrate some of the many feasible ways of implementing the methods, apparatus, and / or systems described herein that will be apparent upon understanding the disclosure of this application.

[0029] Throughout the specification, when an element (such as a layer, region, or substrate) is described as being "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, it may be directly "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, or there may be one or more other elements in between. In contrast, when an element is described as being "directly on" another element, "directly connected to" another element, "directly bonded to" another element, "directly on" another element, or "directly covering" another element, there may be no other elements in between.

[0030] As used herein, the term “and / or” includes any one of the relevant items listed and any combination of any two or more items.

[0031] Although terms such as “first,” “second,” and “third” may be used herein to describe individual components, assemblies, regions, layers, or parts, these components, assemblies, regions, layers, or parts are not limited by these terms. Rather, these terms are used only to distinguish one component, assembly, region, layer, or part from another. Therefore, without departing from the teachings of the examples described herein, the first component, assembly, region, layer, or part referred to as the second component, assembly, region, layer, or part may also be referred to as the second component, assembly, region, layer, or part.

[0032] For ease of description, spatial relation terms such as “above,” “upper,” “below,” and “lower” are used herein to describe the relationship between one element and another, as shown in the accompanying drawings. Such spatial relation terms are intended to include not only the orientation depicted in the drawings but also different orientations of the device during use or operation. For example, if the device in the drawings is flipped, an element described as being “above” or “upper” relative to another element will subsequently be “below” or “lower” relative to that other element. Therefore, the term “above” includes both “above” and “below” orientations depending on the spatial orientation of the device. The device may also be positioned in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relation terms used herein will be interpreted accordingly.

[0033] The terminology used herein is for the purpose of describing various examples only and is not intended to limit this disclosure. Unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. The terms “comprising,” “including,” and “having” enumerate the stated features, quantities, operations, components, elements, and / or combinations thereof, but do not exclude the presence or addition of one or more other features, quantities, operations, components, elements, and / or combinations thereof.

[0034] Variations in the shapes shown in the accompanying drawings may occur due to manufacturing techniques and / or tolerances. Therefore, the examples described herein are not limited to the specific shapes shown in the accompanying drawings, but include changes in shape that may occur during manufacturing.

[0035] The features of the examples described herein can be combined in various ways that will be apparent upon understanding the disclosure of this application. Furthermore, although the examples described herein have a wide variety of constructions, other constructions are possible, as will be apparent upon understanding the disclosure of this application.

[0036] This application provides an IGBT driver test connection fixture, such as Figure 1 As shown, the IGBT driver test connection fixture includes multiple connectors 1 and multiple clamping components 2. The connectors 1 are hinged to at least one connector 1, and the multiple connectors 1 correspond one-to-one with the multiple clamping components 2. The clamping components 2 are slidably connected to the connectors 1 corresponding to the clamping components 2. The clamping components 2 are used to clamp the pins of the IGBT driver.

[0037] When using the IGBT driver test connection fixture of this application, the connector 1 is rotated, and the position of the clamping component 2 corresponding to each connector 1 is adjusted, so that the different clamping components 2 are in the required positions to clamp and fix the corresponding pins. Since the positions of the clamping components 2 are relatively fixed and cannot be interchanged, the IGBT driver test connection fixture of this application can arrange the clamping components 2 in sequence, avoiding disorder of the clamping components 2, thereby preventing the connection sequence between the test equipment and the pins from not conforming to the design and test specifications of the IGBT driver itself, thus ensuring the accuracy of the data collected by the test equipment.

[0038] In the embodiments of this application, such as Figure 1 As shown, the connector 1 is flat and has a sliding groove 11. The sliding groove 11 extends in a predetermined direction. Part of the clamping component 2 is located in the sliding groove 11 and can slide in the sliding groove 11, so that the clamping component 2 can move relative to the connector 1, thereby realizing the adjustment of the position of the clamping component 2 on the connector 1.

[0039] Furthermore, the IGBT driver test connection fixture also includes a connector 3, through which the two sliding grooves 11 of the two hinged connectors 1 pass, so that the two connectors 1 can rotate relative to the connector 3.

[0040] Preferably, such as Figure 2 and Figure 3 As shown, the connector 3 includes a first limiting part 31, a second limiting part 32, and a connecting part 33. The connecting part 33 passes through the two sliding grooves 11 of the two connectors 1. The first limiting part 31 and the second limiting part 32 respectively abut against the two connectors 1, thereby allowing the two connectors 1 to rotate relative to each other. The first limiting part 31 and the connecting part 33 can be integrally formed. The connecting part 33 can have threads, and the second limiting part 32 has a hole with threads on the hole wall. The connecting part 33 and the second limiting part 32 are threadedly connected to facilitate the installation and disassembly of the connector 3.

[0041] In addition, the connecting piece 3 can also move within the sliding groove 11, thereby adjusting the cross position of the two hinged connecting pieces 1.

[0042] like Figure 1 andFigure 2 As shown, the IGBT driver test connection fixture also includes multiple support components 4, each corresponding to a single connector 1. Each support component 4 includes a support rod 41 and a suction cup 42. One end of the support rod 41 is connected to the connector 1 corresponding to the support component 4, and the other end is connected to the suction cup 42. The suction cup 42 is used to contact the bearing surface, thereby fixing the entire IGBT driver test connection fixture. By setting the suction cup 42, the stability of the support component 4's support for the connector 1 can be ensured, thus enabling the clamping component 2 to stably clamp the pins.

[0043] Optionally, the number of connectors can be selected based on testing requirements; for example, the number of connectors can be two, three, four, or more.

[0044] Preferably, there are three connectors 1 and three support components 4. One connector 1 is connected to the support rod 41 via an extension rod 5. This connector 1 is hinged to the other two connectors 1 via two connecting pieces 3. The first connector 1 connected to the extension rod 5 is hinged to the second connector 1 and the third connector 1, respectively. The second connector 1 is hinged only to the first connector 1, and the third connector 1 is hinged only to the first connector 1.

[0045] In the embodiments of this application, such as Figure 1 , Figure 4 and Figure 7 As shown, the clamping assembly 2 includes a clamping body 21 and a conductive mechanism 22. A portion of the clamping body 21 is located within the sliding groove 11. The conductive mechanism 22 includes a connecting wire 222 and two conductive elements 221. Each conductive element 221 can be an arc-shaped piece. Both conductive elements 221 are mounted on the clamping body 21 and are connected to the connecting wire 222. When the IGBT driver test connection fixture is used, the two conductive elements 221 clamp the pins, and the connector 1 is connected to the required test equipment, thereby allowing the IGBT driver to be tested through the pins.

[0046] Optionally, the conductive mechanism 22 includes two adapter wires 223, and the two conductive elements 221 are connected to the connecting wire 222 through the two adapter wires 223.

[0047] like Figure 4 and Figure 5As shown, the clamping body 21 includes a mounting member 211, an abutment member 212, and a sliding member 213. The mounting member 211 includes a first mounting portion 2111 and two second mounting portions 2112, both of which are connected to the first mounting portion 2111, thus making the entire mounting member 211 shaped like a "┌┐". One end of the sliding member 213 is connected to the mounting member 211, and the other end is connected to the abutment member 212. Two conductive members 221 are both disposed on the mounting member 211. A portion of the sliding member 213 is located within the sliding groove 11, and the abutment member 212 abuts against the side of the connecting member 1 opposite to the mounting member 211. Thus, by sliding the sliding member 213 within the sliding groove 11, the position of the entire clamping assembly 2 can be adjusted.

[0048] In addition, the clamping body 21 has a through hole 214 through which the first mounting part 2111, the abutment 212 and the sliding part 213 pass. The connecting wire 222 enters the through hole 214 from the mounting space and exits from the through hole 214.

[0049] Optionally, the mounting component 211 and the sliding component 213 can be integrally formed. The sliding component 213 and the abutment component 212 can be fixed by means of bonding, bolting or other methods, so as to assemble the clamping component 2 onto the connector 1.

[0050] In the embodiments of this application, such as Figure 4 and Figure 5 As shown, the clamping assembly 2 also includes two first elastic members 23 and two clamping members 24. The two clamping members 24 are respectively connected to two second mounting portions 2112 through the two first elastic members 23. Two conductive members 221 are respectively fixed on the two clamping members 24. The two conductive members 221 face each other. The two first elastic members 23 can apply a force to the two clamping members 24 to bring them closer together, so that the two conductive members 221 can tightly clamp the pins.

[0051] like Figure 6 As shown, the clamping member 24 includes a clamping plate 241 and two extension plates 242. The clamping plate 241 can be an arc-shaped plate. The two extension plates 242 are respectively connected to the opposite sides of the clamping plate 241. The conductive element 221 is fixed on the clamping plate 241, and the first elastic element 23 is connected to the side of the clamping plate 241 opposite to the conductive element 221. By providing the extension plates 242, it is convenient to lead the pin between the two conductive elements 221.

[0052] Optionally, two extension plates 242 in one clamping member 24 correspond to two extension plates 242 in another clamping member 24, and the conductive mechanism 22 further includes a second elastic member 25 disposed between the corresponding two extension plates 242. When clamping the pin, the second elastic member 25 can be extended by applying force to at least one clamping member 24, thereby allowing the pin to extend between the two conductive members 221 via the extension plates 242.

[0053] Preferably, both the first elastic element 23 and the second elastic element 25 are springs.

[0054] In addition, an anti-wear layer 26 is provided on the extension plate 242, with the anti-wear layers 26 on the two corresponding extension plates 242 facing each other. By providing the anti-wear layer 26, wear on the pins can be avoided. Optionally, the anti-wear layer 26 can be a polytetrafluoroethylene layer, a polyurethane rubber layer, etc.

[0055] Taking an example where there are three connectors 1 and three support components 4, with the first connector 1 connected to the support rod 41 via an extension rod 5, and the first connector 1 hinged to the second and third connectors 1 via two connecting parts 3, the working principle of this IGBT driver test connection fixture is as follows: First, rotate or slide the three connectors 1 at different angles and intersecting positions to position all three clamping components 2 as required. Next, extend the first connector 1 via the extension rod 5 and attach it to the table using suction cups 42 to fix it in place. Then, attach and fix the other two suction cups 42 to fix the second and third connectors 1. This fixes the positions of the three connectors 1, thus maintaining the relative positions of the three clamping components 2 and preventing them from becoming disordered. Next, slide the clamping components 2 inside the sliding groove 11 to ensure the pins are between the extension plates 242. The operator applies force to the extension plates 242, causing the second elastic element 25 to extend, allowing the pins to enter the middle of the clamping plate 241. Finally, the operator releases the extension plate 242, the second elastic element 25 shortens, and under the action of the first elastic element 23, the two conductive elements 221 can fit tightly with the pins. The conductive elements 221 form an electrical transmission with the connecting line 222 through the adapter line 223. The connecting line 222 is then connected to the required test equipment, which facilitates the testing of the IGBT driver through the pins.

[0056] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. An IGBT driver test connection fixture, characterized in that, The IGBT driver test connection fixture includes multiple connectors and multiple clamping assemblies. The connectors are hinged to at least one of the connectors. Each of the multiple connectors corresponds to one of the multiple clamping assemblies. Each clamping assembly is slidably connected to the connector corresponding to the clamping assembly. The clamping assembly is used to clamp the pins of the IGBT driver.

2. The IGBT driver test connection fixture according to claim 1, characterized in that, The connector has a sliding groove that extends in a predetermined direction. A portion of the clamping assembly is located within the sliding groove and is able to slide within it.

3. The IGBT driver test connection fixture according to claim 2, characterized in that, The IGBT driver test connection fixture also includes a connector, through which the two sliding grooves of the two hinged connectors pass, so that the two connectors can rotate relative to the connector.

4. The IGBT driver test connection fixture according to claim 1, characterized in that, The IGBT driver test connection fixture also includes multiple support components, each corresponding to one of the multiple connectors. Each support component includes a support rod and a suction cup. One end of the support rod is connected to the connector corresponding to the support component, and the other end of the support rod is connected to the suction cup. The suction cup is used to contact the bearing surface.

5. The IGBT driver test connection fixture according to claim 2, characterized in that, The clamping assembly includes a clamping body and a conductive mechanism. A portion of the clamping body is located within the sliding groove. The conductive mechanism includes a connecting wire and two conductive elements. Both conductive elements are disposed on the clamping body and are connected to the connecting wire.

6. The IGBT driver test connection fixture according to claim 5, characterized in that, The clamping body includes a mounting component, an abutment component, and a sliding component. One end of the sliding component is connected to the mounting component, and the other end of the sliding component is connected to the abutment component. Both conductive components are disposed on the mounting component. A portion of the sliding component is located within the sliding groove. The abutment component abuts against the side of the connecting component opposite to the mounting component.

7. The IGBT driver test connection fixture according to claim 5, characterized in that, The clamping assembly further includes two first elastic elements and two clamping elements. The two clamping elements are respectively connected to the clamping body through the two first elastic elements. The two conductive elements are respectively fixed on the two clamping elements and face each other.

8. The IGBT driver test connection fixture according to claim 7, characterized in that, The clamping member includes a clamping plate and two extension plates. The two extension plates are respectively connected to the two opposite sides of the clamping plate. The conductive element is fixed on the clamping plate. The first elastic element is connected to the side of the clamping plate opposite to the conductive element.

9. The IGBT driver test connection fixture according to claim 8, characterized in that, Two of the extension plates in one clamping member correspond to two of the extension plates in another clamping member, and the conductive mechanism further includes a second elastic member disposed between the corresponding two extension plates.

10. The IGBT driver test connection fixture according to claim 9, characterized in that, The extension plate is provided with a wear-resistant layer, and the wear-resistant layers on the two corresponding extension plates face each other.

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