IV testing device for perovskite thin film battery piece

Abstract

The utility model belongs to the technical field of perovskite solar cell preparation, and relates to a perovskite thin film cell IV testing device, which comprises a base and a light-transmitting cover, a testing chamber is arranged between the light-transmitting cover and the base, and a support and a plurality of testing clamp assemblies are arranged in the testing chamber. The test fixture assembly comprises an insulation block, a positioning block, a movable block, an elastic probe and a probe base, the positioning block and the movable block are oppositely installed on the insulation block and abut against the four side edges of the perovskite thin film battery piece to be subjected to IV test respectively, the elastic probe is arranged on the probe base, and the probe base is arranged on the movable block. And the elastic probe is in conductive contact with a test part at the bottom of the perovskite thin film battery piece to be subjected to IV test. And a helium hole, an air exhaust hole and a wire passing hole which are communicated with the test chamber are respectively formed in the side surface of the base. According to the utility model, the decomposition of the film layer of the bare chip battery in the test process can be effectively slowed down, and the accuracy of the test result is improved.

Description

Technical Field

[0001] This invention belongs to the field of perovskite solar cell fabrication technology, and specifically relates to an IV testing device for perovskite thin-film solar cells. Background Technology

[0002] In the exploration and research of new processes and materials for perovskite thin-film batteries, IV testing devices are usually used to test the relevant performance parameters of the bare battery cells. Since the bare battery cells have not undergone the encapsulation process, their film materials are directly exposed to the air. Oxygen, moisture and other substances in the air will accelerate the decomposition of the film materials, directly affecting the accuracy of the battery test results.

[0003] The above tests are usually conducted in a glove box in the laboratory. However, the glove box is bulky, and the actual operation involves multiple nitrogen purging and vacuuming operations, which is time-consuming and requires a lot of auxiliary equipment, making it inconvenient for the needs of rapid batch testing. Utility Model Content

[0004] The technical problem to be solved by this utility model is to provide an IV testing device for perovskite thin film solar cells, which can effectively slow down the decomposition of the thin film layer of the bare solar cell during the testing process and improve the accuracy of the test results.

[0005] This invention provides an IV testing device for perovskite thin-film solar cells, comprising a base and a light-transmitting cover that are sealed together. The light-transmitting cover is located on the upper part of the base, and a test chamber is provided between the light-transmitting cover and the base. A support and several test fixture assemblies are arranged in the test chamber. The support is fixed on the base, and the test fixture assemblies are installed in the inner groove of the support. Each test fixture assembly includes an insulating block, a positioning block, a movable block, an elastic probe, and a probe base. The insulating block is installed on the side wall of the inner groove, and the positioning block and the movable block are respectively installed opposite to each other on the insulating block. The positioning block and the movable block abut against the four edges of the perovskite thin-film solar cell to be IV tested. The elastic probe is arranged on the probe base, and the probe base is fixed on the bottom surface of the inner groove. The elastic probe makes conductive contact with the test area at the bottom of the perovskite thin-film solar cell to be IV tested. Helium gas holes and evacuation holes are respectively provided on the side of the base, and the helium gas holes and evacuation holes are respectively connected to the test chamber. A wire passage hole for test leads is also provided on the side of the base.

[0006] Furthermore, multiple vent holes are provided on the bottom wall of the inner groove, with one end of the vent hole connected to the air extraction hole and the other end connected to the test chamber.

[0007] Furthermore, multiple vent holes are provided on the bottom wall of the inner groove, with one end of the vent hole connected to the helium gas port and the other end connected to the test chamber.

[0008] Furthermore, multiple lead holes are provided on the bottom wall of the inner groove, with one end of the lead hole communicating with the wire passage hole and the other end communicating with the test chamber.

[0009] Furthermore, a sealing ring is provided at the junction of the base and the light-transmitting cover.

[0010] Furthermore, the bracket is fixed to the base by adjusting bolts, and the height difference between the bracket and the elastic probe is adjusted by adjusting bolts.

[0011] Furthermore, a heating component is provided within the bracket.

[0012] Furthermore, the light-transmitting cover includes a frame and a top cover that are sealed together. The frame is made of transparent acrylic sheet, and the top cover is made of transparent quartz sheet.

[0013] Furthermore, the insulating block is made of polytetrafluoroethylene or bakelite.

[0014] Compared with the prior art, the perovskite thin-film solar cell IV testing device of this utility model includes a base and a light-transmitting cover arranged vertically. A test chamber is provided between the light-transmitting cover and the base. A support and several test fixture assemblies are arranged in the test chamber. The test fixture assemblies are installed in the inner groove of the support. The test fixture assemblies include an insulating block, a positioning block, a movable block, an elastic probe, and a probe base. The insulating block is installed on the side wall of the inner groove. The positioning block and the movable block are respectively installed on the insulating block opposite to each other. The positioning block and the movable block abut against the four edges of the perovskite thin-film solar cell to be IV tested. The elastic probe is arranged on the probe base and makes conductive contact with the test part at the bottom of the perovskite thin-film solar cell to be IV tested. Helium gas holes and evacuation holes are respectively provided on the side of the base. The helium gas holes and evacuation holes are respectively connected to the test chamber. A wire passage hole for test wires is also provided on the side of the base. This invention can effectively slow down the decomposition of the film layer of bare battery during the test, improve the accuracy of the test results, and its small footprint and convenient and controllable temperature adjustment can be used to perform more types of tests, meeting the test needs under different experimental conditions. Attached Figure Description

[0015] Figure 1 This is a perspective view of a preferred embodiment of the present invention;

[0016] Figure 2 for Figure 1 A cross-sectional schematic diagram of AA in the middle;

[0017] Figure 3 for Figure 1 Exploded view diagram.

[0018] The symbols in the diagram represent: 1. Base; 2. Light-transmitting cover; 3. Test chamber; 4. Support; 5. Test fixture assembly; 6. Inner slot; 7. Insulating block; 8. Positioning block; 9. Movable block; 10. Elastic probe; 11. Probe base; 12. Helium gas port; 13. Evacuation port; 14. Wire passage hole; 15. Exhaust port; 16. Vent hole; 17. Lead wire hole; 18. Frame; 19. Top cover. Detailed Implementation

[0019] To make the technical problems, technical solutions, and beneficial effects of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0020] Please refer to the following at the same time Figures 1 to 3 As shown, a preferred embodiment of the perovskite thin-film solar cell IV testing device of this utility model includes a base 1 and a light-transmitting cover 2 that are sealed together. The light-transmitting cover 2 is disposed on the upper part of the base 1, and a test chamber 3 is provided between the light-transmitting cover 2 and the base 1. A support 4 and several test fixture assemblies 5 are disposed in the test chamber 3. The support 4 is fixed on the base 1, and the test fixture assemblies 5 are installed in the inner groove 6 of the support 1. The perovskite thin-film solar cell to be IV tested is placed on the test fixture assembly 5.

[0021] The test fixture assembly 5 includes an insulating block 7, a positioning block 8, a movable block 9, an elastic probe 10, and a probe base 11. The insulating block 7 is mounted on the side wall of the inner groove 6. The positioning block 8 and the movable block 9 are respectively mounted on the insulating block 7, and abut against the four edges of the perovskite thin-film solar cell to be tested (IV), fixing the perovskite thin-film solar cell in the test position. The elastic probe 10 is disposed on the probe base 11, which is fixed to the bottom surface of the inner groove 6. The elastic probe 10 makes conductive contact with the test area at the bottom of the perovskite thin-film solar cell to be tested (IV).

[0022] Thanks to the use of the elastic probe 10, the probe head can reliably connect the cell lead-out section of the perovskite thin-film solar cell to the external IV test device without damaging the perovskite thin film layer.

[0023] like Figure 3 As shown, four test fixture assemblies 5 are set on the support 4. Each test fixture assembly 5 is equipped with two sets of elastic probes 10 and probe bases 11. Three rows of elastic probes 10 are set on each probe base 11. The number of rows of elastic probes 10 and the number of probes in each row can be set as needed.

[0024] Helium gas inlet 12 and nitrogen extraction port 13 are respectively provided on the side of the base 1, and both inlet 12 and extraction port 13 are connected to the test chamber 3. A wire guide hole 14 for test leads is also provided on the side of the base 1. Helium gas required for heating the test chamber 3 is introduced into the test chamber 3 through the helium gas inlet 12. A vacuum is evacuated from the test chamber 3 through the extraction port 13. The relationship between the vacuum pumping speed and the nitrogen supply is adjusted to ensure a relatively stable nitrogen atmosphere in the test chamber 3. The temperature of the nitrogen gas introduced into the test chamber 3 is regulated by a fluid temperature regulating device to meet the testing requirements of the perovskite thin-film solar cell to be tested under different temperature conditions.

[0025] Multiple exhaust holes 15, vent holes 16, and lead wire holes 17 are respectively provided on the bottom wall of the inner groove 6 of the bracket 4. One end of the exhaust hole 15 is connected to the suction hole 13, and the other end is connected to the test chamber 3. One end of the vent hole 16 is connected to the helium gas hole 12, and the other end is connected to the test chamber 3. One end of the lead wire hole 17 is connected to the wire passage hole 14, and the other end is connected to the test chamber 3.

[0026] like Figure 3 As shown, the base 1 of this utility model is provided with one helium gas hole 12, four exhaust holes 13 and two wire passage holes 14. Correspondingly, four exhaust holes 15 and eight lead wire holes 17 are provided on the bottom wall of the inner groove 6, and multiple ventilation holes 16 are densely distributed.

[0027] A sealing ring (not shown in the figure) is provided at the junction of the base 1 and the light-transmitting cover 2. The sealing ring allows a relatively sealed environment to be formed inside the light-transmitting cover 2 under vacuum conditions.

[0028] The bracket 4 is fixed to the base 1 by adjusting bolts (not shown in the figure), and the height difference between the bracket 4 and the elastic probe 10 is adjusted by adjusting bolts.

[0029] In another embodiment of this invention, a heating component (not shown in the figure) is provided inside the support 4. The heating component is used to adjust the temperature inside the test chamber 3 to meet the IV testing requirements of the perovskite thin-film solar cell at different temperatures.

[0030] The light-transmitting cover 2 includes a frame 18 and a top cover 19 that are sealed together. The frame 18 is made of transparent acrylic sheet, and the top cover 19 is made of transparent quartz sheet. During IV testing, a simulated light source is used to illuminate the solar cells; therefore, the light-transmitting cover 2 needs to have sufficiently high transmittance across the wavelength range of the simulated light source throughout the entire IV testing process. A transparent quartz sheet is used to meet the requirements of high strength, high temperature resistance, and high transmittance. The issues of light transmission and sealing are solved by embedding the quartz sheet into the acrylic frame and filling the gaps with sealant.

[0031] The insulating block 7 is made of polytetrafluoroethylene or bakelite.

[0032] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A perovskite thin-film solar cell IV testing device, comprising a base and a light-transmitting cover sealed together, the light-transmitting cover being disposed on the upper part of the base, and a testing chamber being provided between the light-transmitting cover and the base, characterized in that, A support and several test fixture assemblies are installed inside the test chamber. The support is fixed to the base, and the test fixture assemblies are installed in the inner groove of the support. The test fixture assemblies include an insulating block, a positioning block, a movable block, an elastic probe, and a probe base. The insulating block is installed on the side wall of the inner groove. The positioning block and the movable block are respectively installed on the insulating block opposite to each other. The positioning block and the movable block abut against the four edges of the perovskite thin-film solar cell to be tested by IV. The elastic probe is set on the probe base, and the probe base is fixed to the bottom surface of the inner groove. The elastic probe makes conductive contact with the test part at the bottom of the perovskite thin-film solar cell to be tested by IV. Helium gas holes and evacuation holes are respectively provided on the side of the base. The helium gas holes and evacuation holes are respectively connected to the test chamber. Through holes for test wires are also provided on the side of the base.

2. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, Multiple vent holes are provided on the bottom wall of the inner groove. One end of the vent hole is connected to the air extraction hole, and the other end is connected to the test chamber.

3. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, Multiple vent holes are provided on the bottom wall of the inner groove. One end of each vent hole is connected to a helium gas vent, and the other end is connected to the test chamber.

4. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, Multiple lead holes are provided on the bottom wall of the inner groove. One end of the lead hole is connected to the wire passage hole, and the other end is connected to the test chamber.

5. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, A sealing ring is provided at the junction of the base and the light-transmitting cover.

6. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, The bracket is fixed to the base by adjusting bolts, and the height difference between the bracket and the elastic probe is adjusted by adjusting bolts.

7. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, A heating element is installed inside the bracket.

8. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, The light-transmitting cover includes a frame and a top cover that are sealed together. The frame is made of transparent acrylic sheet, and the top cover is made of transparent quartz sheet.

9. The perovskite thin-film solar cell IV testing apparatus as described in claim 1, characterized in that, The insulating block is made of polytetrafluoroethylene or bakelite.

Images