Semiconductor refrigeration sensitive component detection equipment

Abstract

The utility model discloses semiconductor refrigeration sensitive component detection equipment which comprises a bottom plate, an adjusting plate with the same length is arranged in the middle of the upper surface of the bottom plate, a placement groove penetrates through the side face of the adjusting plate, a flow dividing device is arranged in the placement groove, a plurality of clamping grooves are formed in the upper surface of the adjusting plate, and a conveying belt is arranged on the side face of the adjusting plate. A collecting groove is formed in one side of the upper surface of the bottom plate, a control panel is arranged on one side of the bottom plate, two connecting blocks are symmetrically arranged on the side, away from the control panel, of the bottom plate, an electromagnetic sliding rail is arranged above the two connecting blocks, a first connecting column is arranged at one end of the electromagnetic sliding rail, and a second connecting column is arranged on the side, close to the adjusting plate, of the first connecting column. A first electric telescopic rod is arranged below the end, close to the control panel, of the second connecting column, measuring equipment is arranged below the first electric telescopic rod, and a positioning emitter is arranged below the end, away from the measuring equipment, of the second connecting column. When the device is used, the refrigeration sheet can be accurately shunted.

Description

Technical Field

[0001] This utility model belongs to the technical field of production equipment for cold-sensitive components, and in particular to a testing device for semiconductor cold-sensitive components. Background Technology

[0002] Semiconductor cooling sensitive components include temperature sensors, pressure sensors, humidity sensors, and cooling chips. During the production of cooling chips, they need to be tested using testing equipment.

[0003] Traditional testing equipment requires workers to sort out the defective thermoelectric coolers before testing the others. This process can lead to workers picking out qualified products while missing defective ones, severely impacting the efficiency of thermoelectric cooler testing and wasting resources. Utility Model Content

[0004] The purpose of this invention is to provide a semiconductor cooling sensitive component testing device to solve the problems that workers easily pick out qualified products and miss unqualified products during the sorting process.

[0005] This utility model achieves the above-mentioned objectives through the following technical solution: It includes a base plate, an adjusting plate of equal length located at the center of the upper surface of the base plate, a placement groove extending through the side of the adjusting plate, a diversion device inside the placement groove, several slots arranged on the upper surface of the adjusting plate, a conveyor belt on the side of the adjusting plate, a collection groove on one side of the upper surface of the base plate, a control panel on one side of the base plate, two connecting blocks symmetrically arranged on the side of the base plate away from the control panel, an electromagnetic slide rail above the two connecting blocks, a first connecting post at one end of the electromagnetic slide rail, a second connecting post near the adjusting plate on the side of the first connecting post, a first electric telescopic rod below the end of the second connecting post near the control panel, a measuring device below the first electric telescopic rod, a positioning transmitter below the end of the second connecting post away from the measuring device, several receivers arranged on the upper surface of the base plate away from the collection groove, and several second electric telescopic rods arranged on the upper surface of the adjusting plate away from the control panel, each of the second electric telescopic rods having a second push plate on its side.

[0006] Furthermore, the diversion device includes a partition plate, with a plurality of moving slots arranged through the top of the partition plate. A third electric telescopic rod is provided below each of the moving slots, a third push plate is provided above each of the third electric telescopic rods, a fourth push plate is provided on the side of each of the moving slots, and a fourth electric telescopic rod is provided on the side of each of the fourth push plates.

[0007] Furthermore, the partition is fixed in the middle of the placement slot and the two are the same size, the movable slot is located directly below the card slot and the two are the same in number, shape and size, and the third push plate is movably connected inside the card slot and the two are the same in size and shape.

[0008] Furthermore, the fourth electric telescopic rod is located on the side of the moving slot away from the control panel, the fourth electric telescopic rod is fixedly connected to the partition, the fourth push plate is movably connected to the upper surface of the partition, and the third electric telescopic rod is fixed to the bottom of the placement slot.

[0009] Furthermore, the second push plate is movably connected to the upper surface of the adjustment plate, and the second push plate is located on the side of the slot away from the control panel.

[0010] Furthermore, the upper surface of the conveyor belt is flush with the upper surface of the adjustment plate, the conveyor belt is located on the side of the adjustment plate near the control panel, and the conveyor belt is connected to the base plate.

[0011] Furthermore, the collection slot is located below the conveyor belt, the output end of the electromagnetic slide rail is fixedly connected to the first connecting column, the position to be detected by the slot and the measuring device are both on the same horizontal line, and the positioning transmitter is located in the center of the side of the measuring device.

[0012] Furthermore, the receiver is located in the middle of the side of the card slot away from the control panel, the number of receivers is the same as the number of card slots, and the receivers and the positioning transmitter are on the same horizontal line.

[0013] Beneficial effects: This utility model is reasonably designed and has the following beneficial effects:

[0014] 1. This utility model has high sorting efficiency. The semiconductor cooling sensitive component testing equipment, through the cooperation of components such as electromagnetic slide rails and electric telescopic rods, can quickly test cooling sensitive components and transport qualified and unqualified products to the conveyor belt and collection tank respectively, realizing rapid product diversion, effectively improving sorting efficiency and sorting accuracy. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of this utility model;

[0016] Figure 2 This is a schematic diagram of the structure of this utility model from another perspective;

[0017] Figure 3 This is a right view of the present invention;

[0018] Figure 4This is a schematic diagram of part of the structure of this utility model;

[0019] Figure 5 This is a schematic diagram of the diversion device of this utility model.

[0020] In the diagram: 1-base plate, 2-adjusting plate, 3-placement slot, 4-diversion device, 5-card slot, 6-transfer belt, 7-collection slot, 8-control panel, 9-electromagnetic slide rail, 10-connecting block, 11-first connecting column, 12-second connecting column, 13-first electric telescopic rod, 14-measuring equipment, 15-positioning transmitter, 16-receiver, 17-second electric telescopic rod, 18-second push plate;

[0021] 41-Partition plate, 42-Moving groove, 43-Third electric telescopic rod, 44-Third push plate, 45-Fourth push plate, 46-Fourth electric telescopic rod. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0023] Combination Figures 1 to 5 The semiconductor cooling sensitive component testing equipment shown includes a base plate 1. An adjusting plate 2 of the same length is positioned at the center of the upper surface of the base plate 1. A placement groove 3 extends through the side of the adjusting plate 2, and a flow diversion device 4 is installed inside the placement groove 3. Several slots 5 are arranged on the upper surface of the adjusting plate 2. A conveyor belt 6 is installed on the side of the adjusting plate 2. A collection groove 7 is located on one side of the upper surface of the base plate 1. A control panel 8 is located on one side of the base plate 1. Two connecting blocks 10 are symmetrically arranged on the side of the base plate 1 away from the control panel 8. An electromagnetic slide rail 9 is located above the two connecting blocks 10. A first connecting post 11 is located at one end of the electromagnetic slide rail 9. A second connecting post 12 is located near the adjusting plate 2 on the side of the first connecting post 11. A section is located below the end of the second connecting post 12 near the control panel 8. A first electric telescopic rod 13 is provided, with a measuring device 14 below it. A positioning transmitter 15 is provided below the end of the second connecting column 12 away from the measuring device 14. Several receivers 16 are arranged on the upper surface of the base plate 1 away from the collecting groove 7. Several second electric telescopic rods 17 are arranged on the upper surface of the adjusting plate 2 away from the control panel 8. Each of the second electric telescopic rods 17 has a second push plate 18 on its side. In this utility model, the electric telescopic rod, the electromagnetic slide rail, the measuring device, the positioning transmitter, the receivers, and the control panel are existing technologies and are not described in detail. The control connection method between the electric telescopic rod, the electromagnetic slide rail, and the controller in this utility model is existing technology and is not described in detail.

[0024] The diversion device 4 includes a partition plate 41, with several moving slots 42 arranged and passing through the top of the partition plate 41. Each moving slot 42 is provided with a third electric telescopic rod 43 below it. Each third electric telescopic rod 43 is provided with a third push plate 44 above it. Each moving slot 42 is provided with a fourth push plate 45 on its side. Each fourth push plate 45 is provided with a fourth electric telescopic rod 46 on its side.

[0025] The partition 41 is fixed in the middle of the placement slot 3 and the two are the same size. The movable slot 42 is located directly below the card slot 5 and the two are the same in number, shape and size. The third push plate 44 is movably connected inside the card slot 5 and the two are the same in size and shape.

[0026] The fourth electric telescopic rod 46 is located on the side of the moving slot 42 away from the control panel 8. The fourth electric telescopic rod 46 is fixedly connected to the partition 41. The fourth push plate 45 is movably connected to the upper surface of the partition 41. The third electric telescopic rod 43 is fixed to the bottom of the placement slot 3.

[0027] The second push plate 18 is movably connected to the upper surface of the adjustment plate 2. The second push plate 18 is located on the side of the slot 5 away from the control panel 8.

[0028] The upper surface of the conveyor belt 6 is flush with the upper surface of the adjustment plate 2. The conveyor belt 6 is located on the side of the adjustment plate 2 near the control panel 8. The conveyor belt 6 is connected to the base plate 1. The control panel 8 is also equipped with a signal processor for processing the signals received by the receiver.

[0029] The collection slot 7 is located below the conveyor belt 6. The output end of the electromagnetic slide rail 9 is fixedly connected to the first connecting post 11. The position to be detected in the slot 5 and the measuring device 14 are on the same horizontal line. The positioning transmitter 15 is located in the middle of the side of the measuring device 14.

[0030] The receiver 16 is located in the middle of the side of the card slot 5 away from the control panel 8. The number of receivers 16 is the same as the number of card slots 5. The receivers 16 and the positioning transmitter 15 are on the same horizontal line. The positioning transmitter of this utility model adopts a laser positioning transmitter and receiver 16 working together. After receiving the signal, the receiver will transmit it to the signal processor in the control panel for calculation, so that the measuring device can accurately position itself directly above each card slot 5.

[0031] Working Principle: In use, the cooling-sensitive components are first placed into the slot 5, positioning them on the surface of the third push plate 44. Then, the electromagnetic slide rail is moved via the control panel 8. The cooperation between the first connecting column 11 and the second connecting column 12 moves the first electric telescopic rod and the measuring device 14. When the positioning transmitter 15 below the second moving column moves directly above the receiver 16, the electromagnetic slide rail stops moving via the control panel and signal processor. Then, the first electric telescopic rod 13 is activated, lowering the measuring device to below the cooling-sensitive components, bringing them into contact for testing. If the test is successful, the measuring device rises, positioning it above the fourth push plate. Then, the third electric telescopic rod 43 is activated, raising the third push plate so that its surface is aligned with the sensor. The surface of the section plate 2 is flush with the surface of the conveyor belt 6. The second electric telescopic rod 17 drives the second push plate 18 to move towards the conveyor belt 6, so that the cooling sensitive component moves onto the conveyor belt 6 and is transported away by the conveyor belt. When the product is found to be defective, the third lead screw 43 drives the third push plate 44 to move down, so that the surface of the third push plate 43 is flush with the moving groove 42. Then, the fourth electric telescopic rod 46 drives the fourth push plate 45 to move towards the collection groove 7, so that the defective product enters the collection groove and waits for subsequent cleaning. At this time, the measuring device moves to the next slot 5 for testing. Then, a new cooling sensitive component is placed into the previous slot 5. After testing, the above steps are repeated to move qualified and unqualified products to different positions, so that the products can be accurately diverted to the appropriate positions, improving sorting efficiency and sorting accuracy.

[0032] This invention is not limited to the details of the exemplary embodiments described above, and can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0033] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A testing device for semiconductor cooling-sensitive components, characterized in that: Includes a base plate (1), an adjusting plate (2) of the same length is provided at the middle position of the upper surface of the base plate (1), a placement groove (3) is provided through the side of the adjusting plate (2), a diversion device (4) is provided inside the placement groove (3), a number of slots (5) are arranged on the upper surface of the adjusting plate (2), a conveyor belt (6) is provided on the side of the adjusting plate (2), a collection groove (7) is provided on one side of the upper surface of the base plate (1), a control panel (8) is provided on one side of the base plate (1), two connecting blocks (10) are symmetrically provided on the side of the base plate (1) away from the control panel (8), an electromagnetic slide rail (9) is provided above the two connecting blocks (10), a first connecting post (11) is provided at one end of the electromagnetic slide rail (9), and the first connecting post (11) is provided at one end of the electromagnetic slide rail (9). A second connecting column (12) is provided on the side of a connecting column (11) near the adjusting plate (2). A first electric telescopic rod (13) is provided below the end of the second connecting column (12) near the control panel (8). A measuring device (14) is provided below the first electric telescopic rod (13). A positioning transmitter (15) is provided below the end of the second connecting column (12) away from the measuring device (14). A plurality of receivers (16) are arranged on the upper surface of the base plate (1) away from the collecting groove (7). A plurality of second electric telescopic rods (17) are arranged on the upper surface of the adjusting plate (2) away from the control panel (8). A second push plate (18) is provided on the side of each of the second electric telescopic rods (17).

2. The semiconductor cooling-sensitive component testing equipment according to claim 1, characterized in that: The diversion device (4) includes a partition (41), and a plurality of moving slots (42) are arranged through the partition (41). A third electric telescopic rod (43) is provided below each of the moving slots (42), and a third push plate (44) is provided above each of the third electric telescopic rods (43). A fourth push plate (45) is provided on the side of each moving slot (42), and a fourth electric telescopic rod (46) is provided on the side of each fourth push plate (45).

3. The semiconductor cooling sensitive component testing equipment according to claim 2, characterized in that: The partition (41) is fixed in the middle of the placement slot (3) and the two are the same size. The moving slot (42) is located directly below the card slot (5) and the two are the same in number, shape and size. The third push plate (44) is movably connected inside the card slot (5) and the two are the same in size and shape.

4. The semiconductor cooling-sensitive component testing equipment according to claim 2, characterized in that: The fourth electric telescopic rod (46) is located on the side of the moving slot (42) away from the control panel (8). The fourth electric telescopic rod (46) is fixedly connected to the partition (41). The fourth push plate (45) is movably connected to the upper surface of the partition (41). The third electric telescopic rod (43) is fixed to the bottom of the placement slot (3).

5. The semiconductor cooling-sensitive component testing equipment according to claim 1, characterized in that: The second push plate (18) is movably connected to the upper surface of the adjustment plate (2). The second push plate (18) is located on the side of the slot (5) away from the control panel (8).

6. The semiconductor cooling-sensitive component testing equipment according to claim 1, characterized in that: The upper surface of the conveyor belt (6) is flush with the upper surface of the adjustment plate (2). The conveyor belt (6) is located on the side of the adjustment plate (2) near the control panel (8). The conveyor belt (6) is connected to the base plate (1).

7. The semiconductor cooling sensitive component testing equipment according to claim 1, characterized in that: The collection slot (7) is located below the conveyor belt (6), the output end of the electromagnetic slide rail (9) is fixedly connected to the first connecting column (11), the position to be detected by the slot (5) and the measuring device (14) are on the same horizontal line, and the positioning transmitter (15) is located in the middle of the side of the measuring device (14).

8. The semiconductor cooling-sensitive component testing equipment according to claim 1, characterized in that: The receiver (16) is located in the middle of the card slot (5) on the side away from the control panel (8). The number of receivers (16) is the same as the number of card slots (5). The receivers (16) and the positioning transmitter (15) are located on the same horizontal line.

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