Aging test device for main board of collateral dredging instrument

Abstract

The utility model discloses an aging test device for a main board of a collateral dredging instrument, which comprises a test cabinet, a plurality of layers of test racks are arranged in the middle of the test cabinet, corresponding indicator lamp arrays are arranged above the test racks, a plurality of main board test fixtures are arranged on the test racks, and the test fixtures are arranged on the test racks. Each mainboard test fixture corresponds to one indicator lamp array; the mainboard test fixture comprises a fixture installation base, a test fixture probe and a mainboard test fixture upper cover plate, the fixture installation base is divided into an upper layer and a lower layer, the upper layer and the lower layer are installed in a separated mode through a connecting column, one part of the test fixture probe penetrates through the upper layer, and the other part of the test fixture probe penetrates through the lower layer. And the mainboard test fixture upper cover plate is mounted on the side surface of the upper layer through a hinge. The mainboard hardware detection equipment can monitor the temperature function, voltage and pulse output key parameters of hardware in real time, and can help to find potential hardware faults.

Description

Technical Field

[0001] This utility model relates to testing devices, specifically to a motherboard aging testing device for the Shuluo instrument. Background Technology

[0002] To improve the quality of the Shuluoyi product, detect functional defects and test battery performance, the testing equipment must be highly accurate and repeatable, able to maintain consistent results across multiple measurements, reduce human error, and ensure product quality stability.

[0003] A motherboard aging test device for Shuluo Instrument is proposed to quickly identify unqualified products, improve production efficiency, and reduce the number of defective products. Utility Model Content

[0004] In view of the above-mentioned defects or deficiencies in the prior art, it is desirable to provide a Shuluoyi motherboard aging test device.

[0005] According to the technical solution provided in the embodiments of this application, the Shuluoyi motherboard aging test device includes a test cabinet, a number of test racks are provided in the middle of the test cabinet, a corresponding indicator light array is provided above the test racks, and a number of motherboard test fixtures are installed on the test racks, each of the motherboard test fixtures corresponding to one of the indicator light arrays.

[0006] The motherboard test fixture includes a fixture mounting base, test fixture probes, and a motherboard test fixture top cover. The fixture mounting base is divided into an upper layer and a lower layer, which are separated by a connecting post. A portion of the test fixture probes passes through the upper layer, and another portion passes through the lower layer. The motherboard test fixture top cover is mounted on the side of the upper layer via a hinge.

[0007] In this invention, the upper layer is provided with a groove.

[0008] In this invention, an opening is provided on one side of the cover plate of the motherboard test fixture, and a buckle is provided at the opening.

[0009] In this invention, the test cabinet includes a cabinet body, a touch display, an industrial computer, several control switches, and a heat sink.

[0010] In summary, the beneficial effects of this application are as follows:

[0011] Motherboard hardware testing equipment can monitor key parameters of hardware such as temperature, voltage, and pulse output in real time, which can help detect potential hardware failures. Attached Figure Description

[0012] Other features, objects, and advantages of this application will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0013] Figure 1 This is a schematic diagram of the structure of this utility model;

[0014] Figure 2 This is a schematic diagram of the motherboard test fixture of this utility model.

[0015] Numbering on the map:

[0016] Test cabinet-1; Test rack-2; Indicator light array-3; Motherboard test fixture-4; Mounting base-5; Test fixture probe-6; Motherboard test fixture top cover-7; Buckle plate-8; Motherboard under test-9; Upper layer-5.1; Lower layer-5.2; Cabinet body-1.1; Touch display-1.2; Industrial computer-1.3; Control switch-1.4; Heat sink-1.5. Detailed Implementation

[0017] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the relevant utility model and not intended to limit the scope of the utility model. Furthermore, it should be noted that, for ease of description, only the parts relevant to the utility model are shown in the accompanying drawings.

[0018] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0019] The specific work process of this plan is as follows:

[0020] like Figure 1 and Figure 2 As shown, a motherboard aging test device for a shuluo instrument has the following specific working process:

[0021] Step 1: Start the test cabinet 1 by controlling switch 1.4, then place all the motherboards under test 9 on the upper layer 5.1 of the motherboard test fixture 4, and connect them to the pins of the motherboards under test 9 through the test fixture probes 6.

[0022] The second step involves activating the industrial computer 1.3 via control switch 1.4. The industrial computer 1.3 then wakes up the power supply module and the current detection module. At this time, the connectivity status of various circuits, including the motherboard test fixture 4 on the test rack 2, will be displayed on the indicator light array 3. A green light will illuminate if there is a normal connection, and a red light will illuminate if there is no connection. Simultaneously, the control module powers on and initializes, acquiring the initial value of the current sensor and saving and recording it.

[0023] The third step involves inputting current to the motherboard under test via the input probe of test fixture probe 6 and receiving the returned current via the return probe. This initiates a sequential scan and sampling of multiple current values. The sampled values ​​are compared with the initial values ​​to determine if a test circuit is connected, thus identifying whether power-on was successful. If power-on was successful, the corresponding indicator light remains constantly illuminated.

[0024] The fourth step involves time-division and interval sampling of the collected current values. Existing analysis methods are used to analyze the fluctuations in the interval current to determine if the aging test is normal. If any abnormalities occur during the aging test, such as the current value exceeding a preset threshold or excessive current fluctuations, it is determined to be an aging failure. In this case, the corresponding LED indicator flashes, and information such as the aging test duration for the motherboard is recorded. This information is then fed back to the industrial control computer 1.3 and displayed on the touch screen display 1.2.

[0025] During the entire operation of the test cabinet 1, a large amount of heat will be generated. In order to prevent the components from burning out, the heat sink 1.5 needs to be turned on for heat dissipation throughout the operation. The heat sink 1.5 is mainly composed of a motor and fan blades.

[0026] In this solution, the clip plate 8 is mainly used to clamp the motherboard 9 under test downwards, so that the motherboard 9 under test is in a relatively stable environment.

[0027] The above description is merely a preferred embodiment of this application and an explanation of the technical principles and solutions employed. Furthermore, the scope of the utility model involved in this application is not limited to the specific combination of the above-described technical features, but should also cover other technical solutions formed by any combination of the above-described technical features or their equivalents without departing from the inventive concept. For example, technical solutions formed by substituting the above features with (but not limited to) technical features with similar functions disclosed in this application.

Claims

1. A motherboard aging test device for Shuluo Instrument, including a test cabinet (1), characterized in that: Several test racks (2) are provided in the middle of the test cabinet (1). A corresponding indicator light array (3) is provided above the test rack (2). Several motherboard test fixtures (4) are installed on the test rack (2). Each motherboard test fixture (4) corresponds to one indicator light array (3). The motherboard test fixture (4) includes a fixture mounting base (5), a test fixture probe (6), and a motherboard test fixture top cover (7). The fixture mounting base (5) is divided into an upper layer (5.1) and a lower layer (5.2). The upper layer (5.1) and the lower layer (5.2) are separated by a connecting post. A part of the test fixture probe (6) passes through the upper layer (5.1) and another part passes through the lower layer (5.2). The motherboard test fixture top cover (7) is mounted on the side of the upper layer (5.1) by a hinge.

2. The aging test device for the motherboard of the Shuluo instrument according to claim 1, characterized in that: The upper layer (5.1) is provided with a groove.

3. The aging test device for the motherboard of the Shuluo instrument according to claim 1, characterized in that: An opening is provided on one side of the cover plate (7) of the motherboard test fixture, and a buckle plate (8) is provided at the opening.

4. The aging test device for the motherboard of the Shuluo instrument according to claim 1, characterized in that: The test cabinet (1) includes a cabinet body (1.1), a touch display (1.2), an industrial computer (1.3), several control switches (1.4), and a heat sink (1.5).

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