A PPG test module
By designing a PPG test module and utilizing the reflection of light waves from the upper and lower molds and the white card, the problems of inconvenience and low accuracy in existing PPG wearable devices are solved, achieving fast and efficient testing results.
CN224307327UActive Publication Date: 2026-06-02SUZHOU JINGCHUANG MEASUREMENT & CONTROL TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU JINGCHUANG MEASUREMENT & CONTROL TECH CO LTD
- Filing Date
- 2025-07-01
- Publication Date
- 2026-06-02
AI Technical Summary
Technical Problem
Existing PPG wearable device testing modules are inconvenient and have low accuracy, lacking simple and convenient testing methods.
Method used
Design a PPG test module, including an upper module and a lower module. Through the light transmission path of the transmitter and receiver, the upper and lower white cards reflect light waves, and the test equipment is used to perform automated testing to determine the quality of the device under test.
Benefits of technology
It enables rapid and efficient testing of PPG wearable devices, improving the accuracy and efficiency of testing.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN224307327U_ABST
Abstract
The utility model discloses a PPG test module, including upper die and with the lower die of upper die, the upper die is opened with upper die through -hole, the lower die is opened with lower die through -hole, is provided with the measured device mounting block for installing measured device on the lower die through -hole department of lower die, is connected with upper die connecting block in upper die through -hole department, is connected with lower die connecting block in lower die department, upper die connecting block starts with upper die hole and light hole, lower die connecting block starts with lower die hole, the surface fixed connection of upper white card of upper die connecting block is away from upper die through -hole, the surface fixed connection of lower white card of lower die connecting block is away from lower die through -hole. The light that the application is emitted through the emission end is in turn through the lower die, lower die connecting block and lower white card after emission is received by upper white card, continues to emit and is received by receiving end, judges the good and bad of measured device through the test data received by receiving end, thereby carries out the test through the automatic mode, can fast and efficiently test measured device.
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