A TFT display screen photoelectric parameter comprehensive detection device

Abstract

The utility model relates to TFT display screen production field, the utility model discloses a kind of TFT display screen photoelectric parameter comprehensive detection device, comprising: base, test system, test table, light blocking frame body, lifting device, optical sensor and jig assembly, test system is set in the inside of base, jig assembly is set on the upper surface of base, jig assembly includes main jig and vice jig, main jig is set on the upper surface of base, vice jig is set in the inside of main jig, test table is set on the upper surface of jig assembly by lifting device, light blocking frame body is set in the lower surface of test table, optical sensor is set in the inside of light blocking frame body.This scheme can detect Gamma, Flicker, luminance, color temperature, color coordinate, gamut, contrast, uniformity, crosstalk of TFT display screen, low in cost, all through the software of test system inside preset automatically complete detection work, convenient operation, and the efficiency of production detection is high.

Description

Technical Field

[0001] This utility model relates to the field of TFT display screen production, and in particular to a comprehensive detection device for photoelectric parameters of TFT display screens. Background Technology

[0002] Photoelectric parameter testing of the display screen is a crucial step in ensuring the quality of the display screen.

[0003] During the production process, the display screen needs to undergo a series of photoelectric parameter tests to ensure that its key parameters such as color, brightness, contrast, and uniformity meet the design requirements, so as to prevent defective products from flowing into the end market. Some high-quality customers even require that flicker and gamma be calibrated together, which puts high demands on the testing equipment.

[0004] The current industry solution is to use a mechanical platform to move the color analyzer to collect optical data from different points on the screen in order to calculate different optical parameters. This method has two drawbacks: first, it is expensive; second, adjusting the height of the color analyzer requires repeatedly disassembling and fixing the mechanical platform, resulting in low detection efficiency.

[0005] Considering production capacity, manually testing the photoelectric parameters of each screen using a mobile color analyzer on a mechanical platform is too inefficient. To improve testing speed, an automated testing platform is needed to facilitate workstation replication during production.

[0006] Therefore, the present invention aims to develop a low-cost, high-speed, and reliable photoelectric parameter detection device for TFT displays, so as to realize the testing of displays at different heights of the optical acquisition lens and the rapid switching between different workstations. Utility Model Content

[0007] To achieve the above objectives, this utility model adopts the following technical solution: a comprehensive detection device for photoelectric parameters of a TFT display screen, comprising:

[0008] Base;

[0009] A testing system, wherein the testing system is installed inside the base, and the testing system is equipped with a MIPI output interface;

[0010] A fixture assembly is disposed on the upper surface of a base. The fixture assembly includes a main fixture and a secondary fixture. The main fixture is disposed on the upper surface of the base and has a fixture positioning groove. The secondary fixture is detachably disposed inside the fixture positioning groove and has a product positioning groove in the middle. The MIPI output interface passes through the upper surface of the base and is disposed inside the fixture positioning groove.

[0011] A test stand, which is slidably positioned directly above the fixture assembly;

[0012] A lifting device is provided at one end of the base, and the lifting device drives the test bench to switch between the first test station and the second test station.

[0013] A light-blocking frame is disposed on the lower surface of the test bench;

[0014] An optical sensor is disposed on the lower surface of the test stage and is distributed inside the light-blocking frame.

[0015] Preferably, the lifting device includes a support frame, a guide rail, a return spring, and a quick clamp. The support frame is disposed at one end of the base, the quick clamp is disposed at the upper end of the support frame, and the movable end of the quick clamp is connected to the upper surface of the test platform. The guide rail is disposed at both ends of the support frame, and the test platform is slidably connected to the guide rail. The return spring is sleeved on the guide rail, and both ends of the return spring abut against the lower surface of the test platform and the lower end of the support frame, respectively. The quick clamp drives the test platform to switch between the first test station and the second test station.

[0016] Preferably, the testing system includes: a host computer, a USB-to-serial converter board, a test board, and an RGB-to-MIPI converter board. The host computer, the USB-to-serial converter board, the test board, and the RGB-to-MIPI converter board are connected in sequence. The MIPI output interface is located on the RGB-to-MIPI converter board. The test board and the RGB-to-MIPI converter board are connected via SPI serial communication. The test board and the optical sensor are connected via IIC bus communication.

[0017] Preferably, the test board includes a power conversion module, a controller, an FPGA module, an RGB to MIPI converter board, and a 5V power supply interface. The 5V power supply interface, the power conversion module, and the controller are connected in series. The FPGA module is serially connected to the controller and is also serially connected to the RGB to MIPI converter board. The screen refresh control pin of the controller is connected to the FPGA module. The controller is serially connected to the RGB to MIPI converter board via an SPI serial port. The controller is also serially connected to the optical sensor via an IIC bus.

[0018] Preferably, the testing system further includes a barcode scanner, which is connected to the host computer via USB communication.

[0019] Preferably, the testing system further includes an RGB to LVDS converter board, the FPGA module is communicatively connected to the RGB to LVDS converter board, the RGB to LVDS converter board is provided with an LVDS output interface, the LVDS output interface passes through the upper surface of the base and is located inside the fixture positioning groove.

[0020] Preferably, one end of the auxiliary fixture has an insertion hole, and the other end of the auxiliary fixture has a first through hole and a second through hole. The fixture positioning groove is provided with a pin, and the pin and the insertion hole are arranged in a one-to-one correspondence and the pin passes through the insertion hole. The MIPI output interface and the LVDS output interface pass through the first through hole and the second through hole, respectively.

[0021] Preferably, the TFT display screen is connected to the MIPI output interface via a MIPI cable, and the TFT display screen is connected to the LVDS output interface via an LVDS cable. The upper surface of the auxiliary fixture is provided with a first groove and a second groove, and the MIPI cable and the LVDS cable are respectively disposed inside the first groove and the second groove.

[0022] Preferably, the USB to serial converter board is model FT232RL, and the USB to serial converter board is connected to the host computer via UART serial port communication.

[0023] Preferably, the controller is an STM32F429IGT6.

[0024] The beneficial effects of this invention are as follows: The lifting device drives the test platform to move up and down. When the test platform rises to the first test station, the optical sensor performs the first test on the display screen in a bright environment. When the test platform descends to the second test station, the light-blocking frame will block the product positioning slot on the auxiliary fixture. At this time, the optical sensor performs the second test on the display screen in a dark environment. The two test stations and two test environments can be quickly switched and are easy to operate, improving testing efficiency.

[0025] This solution can replace existing expensive optical equipment. It can test the Gamma, Flicker, brightness, color temperature, color coordinates, color gamut, contrast, uniformity, and crosstalk of TFT displays. It is low-cost and the testing is automatically completed by the preset software inside the testing system. It is easy to operate and has high production testing efficiency. Attached Figure Description

[0026] The accompanying drawings further illustrate the present invention, but the embodiments in the drawings do not constitute any limitation on the present invention.

[0027] Figure 1 This is a schematic diagram of the structure of a TFT display screen photoelectric parameter comprehensive detection device provided in an embodiment of the present invention;

[0028] Figure 2 A system block diagram of a testing system provided in an embodiment of this utility model;

[0029] Reference numerals in the attached diagram: 1: base; 2: support frame; 3: quick clamp; 4: test table; 5: light-blocking frame; 6: main fixture; 7: auxiliary fixture; 8: guide rail; 9: light-blocking plate; 10: MIPI output interface; 11: LVDS output interface. Detailed Implementation

[0030] The specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the scope of this utility model.

[0031] It should be noted that, in this utility model, unless otherwise stated, when an element is referred to as "connected to" or "set on" another element, it can be directly on the other element or an intervening element may coexist. When two elements are referred to as "communicationally connected," they are directly connected or wirelessly connected through corresponding communication interfaces or communication cables. The directional terms used, such as "upper," "lower," etc., generally refer to... Figure 1 The top and bottom are shown. "Inner" and "outer" refer to the inner and outer parts of the specific outline.

[0032] like Figures 1-2 As shown in the figure, an embodiment of the present invention provides a comprehensive detection device for photoelectric parameters of a TFT display screen, comprising:

[0033] Base 1;

[0034] A testing system is installed inside the base 1, and the testing system is equipped with a MIPI output interface;

[0035] A fixture assembly is disposed on the upper surface of the base 1. The fixture assembly includes a main fixture 6 and a secondary fixture 7. The main fixture 6 is disposed on the upper surface of the base 1 and has a fixture positioning groove. The secondary fixture 7 is detachably disposed inside the fixture positioning groove and has a product positioning groove in the middle. The MIPI output interface passes through the upper surface of the base 1 and is disposed inside the fixture positioning groove.

[0036] Test platform 4, which is slidably disposed directly above the fixture assembly;

[0037] A lifting device is provided at one end of the base 1, and the lifting device drives the test bench 4 to switch between the first test station and the second test station.

[0038] Light-blocking frame 5, which is disposed on the lower surface of the test bench 4;

[0039] An optical sensor is disposed on the lower surface of the test platform 4 and is evenly distributed inside the light-blocking frame 5. The test platform 4 has mounting holes for mounting the optical sensors. The upper end of the optical sensor is detachably disposed in the mounting hole, and the lower end of the optical sensor is disposed inside the light-blocking frame 5. A light-blocking plate 9 is embedded on the upper surface of the test platform 4, and the upper end of each optical sensor abuts against the lower surface of the light-blocking plate 9.

[0040] The lifting device includes a support frame 2, a guide rail 8, a return spring, and a quick clamp 3. The support frame 2 is located at one end of the base 1, and the quick clamp 3 is located at the upper end of the support frame 2. The movable end of the quick clamp 3 is connected to the upper surface of the test bench 4. The guide rail 8 is located at both ends of the support frame 2, and the test bench 4 is slidably connected to the guide rail 8. The return spring is sleeved on the guide rail 8, and both ends of the return spring abut against the lower surface of the test bench and the lower end of the support frame 2, respectively. The quick clamp 3 drives the test bench 4 to switch between the first test station and the second test station.

[0041] The testing system includes: a host computer, a USB-to-serial converter board, a test board, and an RGB-to-MIPI converter board. The host computer, the USB-to-serial converter board, the test board, and the RGB-to-MIPI converter board are connected in sequence. The MIPI output interface is located on the RGB-to-MIPI converter board. The test board and the RGB-to-MIPI converter board are connected via SPI serial communication. The test board and the optical sensor are connected via IIC bus communication.

[0042] The test board includes: a power conversion module, a controller, an FPGA module, an RGB-to-MIPI converter board, a 5V power supply interface, a barcode scanner, and LED indicators for indicating working status. The controller is an STM32F429IGT6. The 5V power supply interface, the power conversion module, and the controller's power supply pins are connected in series. The FPGA module is serially connected to the controller. The FPGA module is also connected to the RGB-to-MIPI converter board via RGB signals. The controller's screen refresh control pin is connected to the FPGA module. The controller is also connected to the RGB-to-MIPI converter board via an SPI serial port and to an optical sensor via an IIC bus. The USB-to-serial converter board is an FT232RL. It is UART-based and connected to a host computer. The barcode scanner is connected to the host computer via USB, and the LED indicators are connected to the controller.

[0043] The auxiliary fixture 7 has an insertion hole at one end and a first through hole and a second through hole at the other end. The fixture positioning groove is provided with a pin. The pin and the insertion hole are arranged in a one-to-one correspondence and the pin passes through the insertion hole. The MIPI output interface and the LVDS output interface pass through the first through hole and the second through hole, respectively.

[0044] The TFT display screen is connected to the MIPI output interface via a MIPI cable, and the TFT display screen is connected to the LVDS output interface via an LVDS cable. The upper surface of the auxiliary fixture 7 is provided with a first groove and a second groove, and the MIPI cable and the LVDS cable are respectively disposed inside the first groove and the second groove.

[0045] In one embodiment, the testing system includes: a power conversion module, a controller, an FPGA module, an RGB-to-MIPI converter board, an RGB-to-LVDS converter board, a 5V power supply interface, a barcode scanner, and LED indicators for indicating the working status. The USB-to-serial converter board is model FT232RL, and the controller is model STM32F429IGT6. The FPGA module and the RGB-to-LVDS converter board are connected via RGB signal communication. The RGB-to-LVDS converter board has an LVDS output interface that penetrates the upper surface of the base 1 and is located inside the fixture positioning slot. The TFT display screen and the controller are connected via SPI serial communication.

[0046] The technical features of the embodiments described above can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of this utility model, and these should all be considered to be within the scope of this specification.

Claims

1. A comprehensive detection device for photoelectric parameters of a TFT display screen, characterized in that: include: Base; A testing system, wherein the testing system is installed inside the base, and the testing system is equipped with a MIPI output interface; A fixture assembly is disposed on the upper surface of a base. The fixture assembly includes a main fixture and a secondary fixture. The main fixture is disposed on the upper surface of the base and has a fixture positioning groove. The secondary fixture is detachably disposed inside the fixture positioning groove and has a product positioning groove in the middle. The MIPI output interface passes through the upper surface of the base and is disposed inside the fixture positioning groove. A test stand, which is slidably positioned directly above the fixture assembly; A lifting device is provided at one end of the base, and the lifting device drives the test bench to switch between the first test station and the second test station. A light-blocking frame is disposed on the lower surface of the test bench; An optical sensor is disposed on the lower surface of the test stage and is distributed inside the light-blocking frame.

2. The TFT display screen photoelectric parameter comprehensive detection device according to claim 1, characterized in that: The lifting device includes a support frame, a guide rail, a return spring, and a quick clamp. The support frame is located at one end of the base, and the quick clamp is located at the upper end of the support frame. The movable end of the quick clamp is connected to the upper surface of the test platform. The guide rail is located at both ends of the support frame, and the test platform is slidably connected to the guide rail. The return spring is sleeved on the guide rail, and its two ends respectively abut against the lower surface of the test platform and the lower end of the support frame. The quick clamp drives the test platform to switch between the first test station and the second test station.

3. The TFT display screen photoelectric parameter comprehensive detection device according to claim 1, characterized in that: The testing system includes: a host computer, a USB-to-serial converter board, a test board, and an RGB-to-MIPI converter board. The host computer, the USB-to-serial converter board, the test board, and the RGB-to-MIPI converter board are connected in sequence. The MIPI output interface is located on the RGB-to-MIPI converter board. The test board and the RGB-to-MIPI converter board are connected via SPI serial communication. The test board and the optical sensor are connected via IIC bus communication.

4. The TFT display screen photoelectric parameter comprehensive detection device according to claim 3, characterized in that: The test board includes a power conversion module, a controller, an FPGA module, an RGB to MIPI converter board, and a 5V power supply interface. The 5V power supply interface, the power conversion module, and the controller are connected in series. The FPGA module is serially connected to the controller and is also connected to the RGB to MIPI converter board. The screen refresh control pin of the controller is connected to the FPGA module. The controller is serially connected to the RGB to MIPI converter board via SPI and is connected to the optical sensor via IIC bus.

5. The TFT display screen photoelectric parameter comprehensive detection device according to claim 3, characterized in that: The testing system also includes a barcode scanner, which is connected to the host computer via USB communication.

6. The TFT display screen photoelectric parameter comprehensive detection device according to claim 4, characterized in that: The testing system also includes an RGB to LVDS converter board. The FPGA module is communicatively connected to the RGB to LVDS converter board. The RGB to LVDS converter board is provided with an LVDS output interface, which passes through the upper surface of the base and is located inside the fixture positioning slot.

7. The TFT display screen photoelectric parameter comprehensive detection device according to claim 1, characterized in that: One end of the auxiliary fixture has an insertion hole, and the other end of the auxiliary fixture has a first through hole and a second through hole. The fixture positioning groove is provided with a pin. The pin and the insertion hole are arranged in a one-to-one correspondence and the pin passes through the insertion hole. The MIPI output interface and the LVDS output interface pass through the first through hole and the second through hole, respectively.

8. The TFT display screen photoelectric parameter comprehensive detection device according to claim 7, characterized in that: The TFT display screen is connected to the MIPI output interface via a MIPI cable, and the TFT display screen is connected to the LVDS output interface via an LVDS cable. The upper surface of the auxiliary fixture is provided with a first groove and a second groove, and the MIPI cable and the LVDS cable are respectively disposed inside the first groove and the second groove.

9. The TFT display screen photoelectric parameter comprehensive detection device according to claim 3, characterized in that: The USB to serial converter board is model FT232RL, and it is connected to the host computer via UART serial port communication.

10. The TFT display screen photoelectric parameter comprehensive detection device according to claim 4, characterized in that: The controller model is STM32F429IGT6.

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