Crimping device and testing system

Abstract

This utility model relates to a crimping device and a testing system. The crimping device is used to crimp copper busbars onto the terminals of a module under test. It includes: a substrate capable of moving up and down relative to the module under test; and multiple crimping components disposed on the substrate and arranged corresponding to the terminals of the module under test. Each crimping component includes a crimping member and a first elastic member. The crimping member is located at the bottom of the substrate and is capable of moving up and down relative to the substrate. The two ends of the first elastic member abut against the substrate and the corresponding crimping member, respectively. The crimping member can crimp the copper busbars onto the corresponding terminals of the module under test, enabling simultaneous testing of multiple terminals of the module under test. The first elastic member can absorb planar errors and act as a buffer, solving the problem of poor contact between the crimping member, the copper busbar, and the terminals. This ensures that the copper busbars are crimped smoothly and firmly onto each terminal, avoiding safety hazards such as localized high temperatures, oxidation, or even melting. This improves the compatibility and testing stability of the crimping device.

Description

Technical Field

[0001] This utility model relates to the field of high-power testing device technology, and in particular to a crimping device and testing system. Background Technology

[0002] Power semiconductor modules typically require quality and performance testing during manufacturing. This testing process involves crimping the copper busbars of the test system onto the terminals of the module under test.

[0003] Existing testing systems have problems such as the inability to test multiple terminals simultaneously and the insecure crimping of copper busbars, resulting in low testing efficiency. Furthermore, under high voltage and high current conditions, insecure crimping or poor contact can easily lead to safety hazards such as local high temperature, oxidation, or even melting, which can cause system failure. Utility Model Content

[0004] Therefore, it is necessary to provide a crimping device and testing system to address the above problems, so as to achieve simultaneous testing of multiple terminals and ensure stable and secure crimping.

[0005] This utility model first provides a crimping device for crimping copper busbars onto the terminals of a module under test, comprising: a substrate capable of being raised and lowered relative to the module under test; and a plurality of crimping components disposed on the substrate and arranged corresponding to the terminals of the module under test, each crimping component comprising a crimping member and a first elastic member, the crimping member being disposed at the bottom of the substrate and capable of being raised and lowered relative to the substrate, and the two ends of the first elastic member respectively abutting against the substrate and the corresponding crimping member.

[0006] In the aforementioned crimping device, when the substrate descends relative to the module under test, it can drive each crimping component to descend synchronously. The crimping component can crimp the copper busbar onto the corresponding terminal of the module under test, thereby enabling simultaneous testing of multiple terminals of the module under test. The first elastic element can absorb the plane error and play a buffering role to solve the problem of poor contact between the crimping component, the copper busbar and the terminal, so that the copper busbar can be stably and firmly crimped onto each terminal, avoiding safety hazards such as local high temperature, oxidation or even melting, thereby improving the compatibility and testing stability of the crimping device.

[0007] In one embodiment, the first elastic element is a spring.

[0008] With this design, the spring responds quickly when compressed, and the structure is simple, the cost is low, and the service life is long.

[0009] In one embodiment, the substrate is provided with a first guide hole, and the pressing member includes a first guide portion and a pressing portion disposed at the bottom end of the first guide portion. The first guide portion is vertically and vertically inserted into the first guide hole. The first elastic member is sleeved on the first guide portion, and the two ends of the first elastic member abut against the substrate and the bottom end of the first guide portion, respectively, or the two ends of the first elastic member abut against the substrate and the pressing portion, respectively.

[0010] This configuration ensures that the crimping member can always reciprocate along a straight line, guaranteeing that the crimping part can stably and reliably crimp the copper busbar to the corresponding terminal of the module under test; the first elastic member sleeved on the first guide part can prevent the first elastic member from falling off and can also limit the deformation direction of the first elastic member.

[0011] In one embodiment, the crimping device further includes a plurality of clamping components, which are disposed on the substrate and arranged one-to-one with the threaded holes of the module under test. The clamping components are used to clamp and fix the module under test at the threaded holes of the module under test.

[0012] With this setup, the clamping assembly can simulate a fastener fixing the module under test at the threaded hole, ensuring the stability of the module under test during the test and preventing the module under test from shifting, which would affect the contact effect between the crimping component, copper busbar and terminals and the test results.

[0013] In one embodiment, each of the clamping components includes a clamping member and a second elastic member. The clamping member is disposed at the bottom of the substrate and is capable of moving up and down relative to the substrate. The two ends of the second elastic member abut against the substrate and the corresponding clamping member, respectively.

[0014] With this configuration, the second elastic element can absorb the plane error and act as a buffer, so that each clamping element can be pressed smoothly and firmly onto the module under test. At the same time, it can also reduce the impact of the clamping elements on the module under test and avoid damage to the module under test.

[0015] In one embodiment, the pressing device further includes a driving member connected to the substrate and capable of driving the substrate to move up and down.

[0016] This setup enables automated crimping, improves crimping efficiency and operational safety, and ensures balanced pressure at each clamping and crimping point, thereby enhancing the crimping effect.

[0017] In one embodiment, the driving element is a cylinder.

[0018] With this configuration, the cylinder has a lower cost, a longer service life, and the cylinder intake pressure can be adjusted to control the pressure of the clamping and pressing parts.

[0019] This utility model also provides a testing system, including: a support device for supporting the module under test; a power device including a copper busbar; and a crimping device as described above.

[0020] In one embodiment, the power device further includes a capacitor, and the copper busbar includes positive and negative copper busbars electrically connected to the capacitor and a three-phase copper busbar for electrical connection to the load; a portion of the crimping member is capable of crimping the positive and negative copper busbars to the positive and negative terminals of the module under test, and the remaining portion of the crimping member is capable of crimping the three-phase copper busbars to the three-phase terminals of the module under test.

[0021] This setup enables simultaneous testing of the positive and negative terminals and three-phase terminals of the module under test. By ensuring good contact between the positive and negative copper busbars, the module under test, and the three-phase copper busbars, a complete test circuit is formed, thus successfully completing the test.

[0022] In one embodiment, the positive and negative copper busbars and the three-phase copper busbars are disposed opposite to each other on both sides of the substrate and are capable of being raised and lowered relative to the support device.

[0023] With this setup, the positive and negative copper busbars and the three-phase copper busbars do not interfere with each other, and will not affect the user's installation and removal of the module under test. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a three-dimensional structural diagram of a testing system according to one embodiment of the present invention.

[0026] Figure 2 Provided by this utility model Figure 1 Enlarged structural diagram at point A;

[0027] Figure 3 Provided by this utility model Figure 1 A partial structural schematic diagram of the intermediate pressure connection device from another perspective;

[0028] Figure 4 Provided by this utility model Figure 3 Cross-section of the crimping device Figure 1 ;

[0029] Figure 5 Provided by this utility model Figure 3 Cross-section of the crimping device Figure 2 ;

[0030] Figure 6 Provided by this utility model Figure 1 A schematic diagram of the structure of the load-bearing device and the module under test from a top-down perspective.

[0031] Reference numerals: 100, crimping device; 1, substrate; 11, first guide hole; 12, second guide hole; 2, crimping assembly; 21, crimping member; 211, first guide section; 2111, first limiting section; 212, crimping part; 213, first limiting section; 22, first elastic member; 3, clamping assembly; 31, clamping member; 311, second guide section; 3111, second limiting section; 312, clamping part; 32, second elastic member; 4, driving member; 200, bearing device; 300, power device; 301, capacitor; 302, positive and negative copper busbars; 303, three-phase copper busbars; 400, module under test; 401, positive and negative terminals; 402, three-phase terminals; 403, threaded hole. Detailed Implementation

[0032] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0033] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.

[0034] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0035] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0036] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used in this application includes any and all combinations of one or more of the associated listed items.

[0037] Power semiconductor modules typically require quality and performance testing during manufacturing. This testing process involves crimping the copper busbars of the test system onto the terminals of the module under test. Existing test systems suffer from limitations such as the inability to simultaneously test multiple terminals and insecure copper busbar crimping, resulting in low testing efficiency. Furthermore, under high voltage and high current conditions, insecure crimping or poor contact can easily lead to safety hazards such as localized high temperatures, oxidation, or even melting, ultimately causing system failure.

[0038] To solve the above problems, such as Figures 1 to 6 As shown, this utility model provides a crimping device 100 and a testing system to achieve simultaneous testing of multiple terminals and ensure stable and secure crimping.

[0039] like Figure 1 , Figure 2 and Figure 4 As shown, specifically, the crimping device 100 is used to crimp copper busbars onto the terminals of the module under test 400. The crimping device 100 includes a substrate 1 and multiple crimping components 2, wherein: the substrate 1 is capable of moving up and down relative to the module under test 400; multiple crimping components 2 are disposed on the substrate 1 and arranged one-to-one with the terminals of the module under test 400, each crimping component 2 includes a crimping member 21 and a first elastic member 22. The crimping member 21 is disposed at the bottom of the substrate 1 and is capable of moving up and down relative to the substrate 1, and the two ends of the first elastic member 22 respectively abut against the substrate 1 and the corresponding crimping member 21. The up and down movement of the substrate 1 and the crimping member 21 is a reciprocating movement along the Z-axis direction shown in the figure.

[0040] In the crimping device 100 provided in this embodiment of the present invention, when the substrate 1 descends relative to the module under test 400, it can drive each crimping component 2 to descend synchronously. The crimping member 21 can crimp the copper busbar onto the corresponding terminal of the module under test 400, so as to realize the synchronous testing of multiple terminals of the module under test 400. The first elastic member 22 can absorb the error of the plane and play a buffering role to solve the problem of poor contact between the crimping member 21, the copper busbar and the terminal, so that the copper busbar can be crimped steadily and firmly onto each terminal, avoiding safety hazards such as local high temperature, oxidation or even melting, thereby improving the compatibility and testing stability of the crimping device 100.

[0041] like Figure 4 As shown, in one embodiment, the first elastic element 22 is a spring. Springs respond quickly when compressed and have a simple structure, low cost, and long service life. Of course, in other embodiments, the first elastic element 22 can also be other elastic components such as silicone rubber.

[0042] like Figures 3 to 4 As shown, in one embodiment, the substrate 1 is provided with a first guide hole 11, and the pressing member 21 includes a first guide portion 211 and a pressing portion 212 disposed at the bottom end of the first guide portion 211. The first guide portion 211 is vertically and flexibly inserted into the first guide hole 11. A first elastic member 22 is sleeved on the first guide portion 211, and both ends of the first elastic member 22 abut against the substrate 1 and the bottom end of the first guide portion 211, respectively. Alternatively, both ends of the first elastic member 22 may abut against the substrate 1 and the pressing portion 212, respectively. Through the cooperation of the first guide hole 11 and the first guide portion 211, the pressing member 21 can always reciprocate along the Z-axis direction, ensuring that the pressing portion 212 can stably and reliably press the copper busbar onto the corresponding terminal of the module under test 400. Furthermore, the first elastic member 22 sleeved on the first guide portion 211 can prevent the first elastic member 22 from falling off, and can also limit the deformation direction of the first elastic member 22.

[0043] In the illustrated embodiment, the first guide portion 211 is further provided with a first limiting section 2111 protruding circumferentially, and the two ends of the first elastic member 22 abut against the substrate 1 and the first limiting section 2111, respectively. Furthermore, the pressing member 21 also includes a first limiting portion 213 disposed at the top of the first guide portion 211. The first limiting portion 213 can be a screw as shown in the illustration, to facilitate the installation and removal of the pressing member 21, or the first limiting portion 213 can be any other structure with a cross-sectional dimension larger than that of the first guide hole 11, so that the first limiting portion 213 can abut against the top surface of the substrate 1. The first limiting section 2111 and the first limiting portion 213 can limit the lifting range of the pressing member 21, preventing the pressing member 21 from completely detaching from the substrate 1.

[0044] The bottom end of the first guide portion 211 can be fixedly connected to the crimping portion 212 by screwing, which ensures the stability and reliability of the connection between the two and facilitates the disassembly and assembly of the crimping portion 21. Alternatively, the first guide portion 211 and the crimping portion 212 can also be fixedly connected by other methods such as plugging, snapping, or gluing, as long as the stability and reliability of the connection between the two can be ensured. This embodiment of the present invention does not impose specific limitations.

[0045] Of course, in other embodiments, the crimping member 21 may only include the crimping portion 212, and the two ends of the first elastic member 22 are respectively connected to the crimping portion 212 and the substrate 1.

[0046] like Figure 2 and Figure 6 As shown, in actual use, the module under test 400 is generally fixed to external equipment by fasteners such as screws and bolts through threaded engagement with the threaded holes 403. Therefore, the crimping device 100 also includes multiple clamping components 3. The clamping components 3 are disposed on the base plate 1 and are arranged one-to-one with the threaded holes 403 of the module under test 400. The clamping components 3 are used to clamp and fix the module under test 400 at the threaded holes 403. When the base plate 1 descends relative to the module under test 400, it can drive each clamping component 3 to descend synchronously. The clamping components 3 can simulate the fasteners fixing the module under test 400 at the threaded holes 403, ensuring the stability of the module under test 400 during the test and preventing the module under test 400 from shifting, which would affect the contact effect and test results between the crimping component 21, the copper busbar, and the terminals. The number of threaded holes 403 can be 2, 3, 4, 5, 6, 7, 8 or more. Multiple threaded holes 403 are arranged at intervals along the circumference of the module under test 400 to ensure the stability and reliability of the connection between the module under test 400 and external equipment. The number and arrangement of the clamping components 3 can be adjusted according to the number of threaded holes 403 to improve the compatibility of the crimping device 100.

[0047] like Figure 3 and Figure 5As shown, each clamping assembly 3 includes a clamping member 31 and a second elastic member 32. The clamping member 31 is located at the bottom of the substrate 1 and can move up and down relative to the substrate 1. The two ends of the second elastic member 32 abut against the substrate 1 and the corresponding clamping member 31, respectively. The second elastic member 32 can absorb plane errors and act as a buffer, so that each clamping member 31 can be pressed smoothly and firmly onto the module under test 400. At the same time, it can also reduce the impact of the clamping member 31 on the module under test 400, avoiding damage to the module under test 400. The diameter of the clamping member 31 is slightly larger than the inner diameter of the threaded hole 403, thereby ensuring the crimping effect while reducing the contact area between the clamping member 31 and the module under test 400, ensuring that the clamping member 31 will not leave indentations on the surface of the module under test 400, and avoiding damage to the module under test 400.

[0048] like Figure 5 As shown, in one embodiment, the second elastic element 32 is a spring. Springs respond quickly when compressed and have a simple structure, low cost, and long service life. Of course, in other embodiments, the second elastic element 32 can also be other elastic components such as silicone rubber.

[0049] like Figure 3 and Figure 5 As shown, in one embodiment, the substrate 1 is provided with a second guide hole 12, and the clamping member 31 includes a second guide portion 311 and a clamping portion 312 disposed at the bottom end of the second guide portion 311. The second guide portion 311 is vertically and flexibly inserted into the second guide hole 12. A second elastic member 32 is sleeved on the second guide portion 311, and both ends of the second elastic member 32 abut against the substrate 1 and the bottom end of the second guide portion 311, respectively. Alternatively, both ends of the second elastic member 32 may also abut against the substrate 1 and the clamping portion 312, respectively. Through the cooperation of the second guide hole 12 and the second guide portion 311, the clamping member 31 can always reciprocate along the Z-axis direction, ensuring that the clamping portion 312 can stably and reliably clamp and fix the module under test 400. Furthermore, the second elastic member 32 sleeved on the second guide portion 311 can prevent the second elastic member 32 from falling off, and can also limit the deformation direction of the second elastic member 32.

[0050] In the illustrated embodiment, the second guide portion 311 is further provided with a second limiting section 3111 protruding circumferentially, and the two ends of the second elastic member 32 abut against the substrate 1 and the second limiting section 3111, respectively. The second limiting section 3111 is vertically and vertically disposed within the second guide hole 12 and can abut against the inner top wall or inner bottom wall of the second guide hole 12 to limit the vertical movement range of the clamping member 31 and prevent the clamping member 31 from being completely dislodged from the substrate 1.

[0051] The bottom end of the second guide portion 311 can be fixedly connected to the clamping portion 312 by screwing, which ensures the stability and reliability of the connection between the two and facilitates the disassembly and assembly of the clamping portion 31. Alternatively, the second guide portion 311 and the clamping portion 312 can also be fixedly connected by other methods such as plugging, snapping, or gluing, as long as the stability and reliability of the connection between the two can be ensured. This embodiment of the present invention does not impose specific limitations.

[0052] Of course, in other embodiments, the clamping member 31 may only include the clamping part 312, and the two ends of the second elastic member 32 are respectively connected to the clamping part 312 and the base plate 1.

[0053] like Figure 1 As shown, the crimping device 100 also includes a driving member 4, which is connected to the substrate 1 and can drive the substrate 1 to move up and down. The output of the driving member 4 is connected to the substrate 1. When the driving member 4 drives the substrate 1 to descend, each clamping member 31 clamps and fixes the module under test 400, and each crimping member 21 crimps the copper busbar onto the corresponding terminal of the module under test 400. When the driving member 4 drives the substrate 1 to rise, both the clamping members 31 and the crimping members 21 separate from the module under test 400. The use of the driving member 4 to drive the substrate 1 achieves automated crimping, improves crimping efficiency and operational safety, and also ensures pressure balance at each clamping member 31 and each crimping member 21, thereby improving the crimping effect.

[0054] In one embodiment, the driving component 4 is a cylinder. Cylinders are low in cost and have a long service life. Furthermore, a pressure gauge can be installed on the cylinder to adjust the cylinder's inlet pressure according to different tested modules 400, thereby controlling the pressure of the clamping component 31 and the pressing component 21. Of course, in other embodiments, the driving component 4 can also be a hydraulic cylinder, a linear motor, or other driving elements capable of driving the base plate 1 to rise and fall; this embodiment of the present invention does not impose specific limitations here. Alternatively, the rise and fall of the base plate 1 can also be manually controlled.

[0055] like Figure 1 As shown, this utility model also provides a testing system, including a support device 200, a power device 300, and the aforementioned crimping device 100. The support device 200 is used to support the module under test 400, and the power device 300 includes a copper busbar. The driving component 4 can drive the substrate 1, the crimping component 2, and the clamping component 3 to move up and down relative to the support device 200 and the module under test 400 supported on the support device 200. When descending, the clamping component 31 of the clamping component 3 can clamp and fix the module under test 400 to the support device 200, and the crimping component 21 of the crimping component 2 can crimp the copper busbar of the power device 300 to the corresponding terminal of the module under test 400 to test the module under test 400. The module under test 400 can be a power semiconductor such as an IGBT module.

[0056] like Figures 1 to 3 As shown, the power device 300 also includes a capacitor 301, and copper busbars including positive and negative copper busbars 302 electrically connected to the capacitor 301 and three-phase copper busbars 303 electrically connected to the load. Partial crimping members 21 can crimp the positive and negative copper busbars 302 onto the positive and negative terminals 401 of the module under test 400, while the remaining crimping members 21 can crimp the three-phase copper busbars 303 onto the three-phase terminals 402 of the module under test 400. This ensures that the positive and negative copper busbars 302 are stably and securely crimped onto the positive and negative terminals 401, and simultaneously, the three-phase copper busbars 303 are stably and securely crimped onto the three-phase terminals 402, enabling simultaneous testing of the positive and negative terminals 401 and the three-phase terminals 402 of the module under test 400. By ensuring good contact between the positive and negative copper busbars 302, the module under test 400, and the three-phase copper busbars 303, a complete test circuit is formed, thus successfully completing the test.

[0057] like Figure 2 As shown, in one embodiment, the positive and negative copper busbars 302 and the three-phase copper busbars 303 are disposed opposite each other on both sides of the substrate 1. This ensures that the positive and negative copper busbars 302 and the three-phase copper busbars 303 do not interfere with each other. Specifically, the module under test 400 includes positive and negative terminals 401 and three-phase terminals 402 disposed opposite each other on both sides of the module under test 400. There are six positive and negative terminals 401, namely a U-direction positive terminal, a V-direction positive terminal, a W-direction positive terminal, a U-direction negative terminal, a V-direction negative terminal, and a W-direction negative terminal. There are three three-phase terminals 402. The positive and negative copper busbars 302 have six pins corresponding to the six positive and negative terminals 401, namely a U-direction positive pin, a V-direction positive pin, a W-direction positive pin, a U-direction negative pin, a V-direction negative pin, and a W-direction negative pin. The three-phase copper busbars 303 have three pins corresponding to the three three-phase terminals 402. Of course, in other embodiments, the number and arrangement of the positive and negative copper busbars 302 and the three-phase copper busbars 303 can also be adjusted according to different modules under test 400. The number and arrangement of the crimping components 2 and the clamping components 3 on the substrate 1 can also be adjusted synchronously to improve the compatibility of the test system.

[0058] like Figure 1As shown, in one embodiment, the positive and negative copper busbars 302 and the three-phase copper busbars 303 can be raised and lowered relative to the support device 200. When assembling or disassembling the module under test 400, the positive and negative copper busbars 302 and the three-phase copper busbars 303 can rise relative to the support device 200 to prevent them from interfering with the user's assembly or disassembly of the module under test 400. The positive and negative copper busbars 302 and the three-phase copper busbars 303 can be raised and lowered together with the substrate 1, in which case the lower end face of the pressing member 21 can always contact the upper surface of the pins of the positive and negative copper busbars 302 and the three-phase copper busbars 303. Alternatively, the positive and negative copper busbars 302 and the three-phase copper busbars 303 can also be configured to be raised and lowered independently relative to the support device 200. Of course, in other embodiments, while ensuring that the module under test 400 can be assembled and disassembled normally, the positive and negative copper busbars 302 and the three-phase copper busbars 303 can also be fixed relative to the support device 200.

[0059] Of course, the crimping device 100 can also be used in other power equipment that requires crimping of copper busbars, and this embodiment of the present invention does not impose specific limitations.

[0060] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0061] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.

Claims

1. A crimping device for crimping a copper bar to a terminal of a device under test (400), characterized in that, include: The substrate (1) is capable of being raised and lowered relative to the module under test (400); as well as, Multiple crimping components (2) are disposed on the substrate (1) and arranged one by one with the terminals of the module under test (400). Each crimping component (2) includes a crimping member (21) and a first elastic member (22). The crimping member (21) is disposed at the bottom of the substrate (1) and can be raised and lowered relative to the substrate (1). The two ends of the first elastic member (22) abut against the substrate (1) and the corresponding crimping member (21) respectively.

2. The crimping device of claim 1, wherein The first elastic element (22) is a spring.

3. The crimping device of claim 1, wherein The substrate (1) is provided with a first guide hole (11), and the crimping member (21) includes a first guide portion (211) and a crimping portion (212) disposed at the bottom end of the first guide portion (211). The first guide portion (211) is vertically and vertically inserted into the first guide hole (11). The first elastic member (22) is sleeved on the first guide portion (211). The two ends of the first elastic member (22) abut against the substrate (1) and the bottom end of the first guide portion (211), respectively. Alternatively, the two ends of the first elastic member (22) abut against the substrate (1) and the pressing portion (212), respectively.

4. The crimping device of claim 1, wherein The crimping device further includes multiple pressing components (3). The pressing components (3) are disposed on the substrate (1) and are arranged one-to-one with the threaded holes (403) of the module under test (400). The pressing components (3) are used to press and fix the module under test (400) at the threaded holes (403) of the module under test (400).

5. The crimping device of claim 4, wherein, Each of the clamping components (3) includes a clamping member (31) and a second elastic member (32). The clamping member (31) is located at the bottom of the substrate (1) and can be raised and lowered relative to the substrate (1). The two ends of the second elastic member (32) abut against the substrate (1) and the corresponding clamping member (31) respectively.

6. The crimping device of claim 1, wherein The pressing device also includes a driving component (4), which is connected to the substrate (1) and can drive the substrate (1) to move up and down.

7. The crimping device of claim 6, wherein The driving component (4) is a cylinder.

8. A testing system, characterized in that, include: A support device (200) is used to support the module under test (400). Electrical installation (300), including copper busbars; and, The crimping device as described in any one of claims 1-7.

9. The test system of claim 8, wherein, The power device (300) also includes a capacitor (301), and the copper busbar includes a positive and negative copper busbar (302) electrically connected to the capacitor (301) and a three-phase copper busbar (303) for electrical connection to the load. Some of the crimping members (21) can crimp the positive and negative copper busbars (302) onto the positive and negative terminals (401) of the module under test (400), while the remaining crimping members (21) can crimp the three-phase copper busbars (303) onto the three-phase terminals (402) of the module under test (400).

10. The test system of claim 9, wherein, The positive and negative copper busbars (302) and the three-phase copper busbars (303) are arranged opposite to each other on both sides of the substrate (1) and can be raised and lowered relative to the support device (200).

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