A high-density microwave insulator batch loading and detecting device
By designing a combination of a screening top plate, a test substrate, and an insulating base, rapid arrangement and testing of microwave insulators were achieved, solving the problems of low loading efficiency and poor testing accuracy in existing technologies, and improving the efficiency and accuracy of insulator testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD
- Filing Date
- 2025-06-25
- Publication Date
- 2026-07-07
AI Technical Summary
Existing insulator arrangement devices suffer from low loading efficiency and poor stability during microscopic inspection and testing, resulting in low testing accuracy.
A high-density microwave insulator batch loading and testing device was designed, including a screening top plate, a test substrate, and an insulating base. The device achieves rapid insulator arrangement and testing through the design of arrayed conical holes and countersunk holes. The test substrate is made of conductive metal and the insulating base is made of polytetrafluoroethylene to ensure that the outer conductor of the insulator is uniformly led out as the negative electrode for testing.
It enables rapid and stable arrangement and testing of insulators, improves testing efficiency and accuracy, simplifies the operation process, and avoids misjudgments caused by inconsistent lead lengths.
Smart Images
Figure CN224471080U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of microwave insulator clamping, testing and screening technology, and in particular relates to a high-density microwave insulator batch loading and testing device. Background Technology
[0002] The existing patent CN 112881803 A describes an insulator arrangement device and testing method that enables rapid arrangement, microscopic inspection, and testing of insulators. This insulator arrangement device includes a test plate, a test screening funnel, a microscopic inspection plate, a test frame, and conductive strips; that is, the microscopic inspection device and the testing device are designed separately. After microscopic inspection, the insulators need to be transferred to the test plate, and then the test plate is installed on the test frame. Furthermore, the bottom of the test frame needs to be fitted with matching conductive strips based on the length of the insulator leads. Deviations in connection and positioning affect the efficiency of insulator arrangement and loading. The test board is designed with insulating materials. The inner conductor of the insulator is uniformly led out as the negative electrode through a conductive strip, and the positive electrode touches the outer conductor of the insulator for testing. Because the conductive strip used to lead out the negative electrode needs to be changed to a matching thickness according to the different lengths of the insulators, and because the lead length of the same model of insulator is not absolutely the same due to manufacturing errors, some insulators will make perfect contact with the conductive strip, while the inner conductor of some insulators will be slightly longer and push the insulator upwards, resulting in the insulators being tilted left and right on the test board. Some insulators have shorter inner conductors, and in each batch of insulators, there will be cases where the inner conductor of the insulator does not make contact with the conductive strip, which may lead to test misjudgment. Utility Model Content
[0003] Purpose of the utility model: In order to solve the problems existing in the prior art, this utility model provides a high-density microwave insulator batch loading and testing device, which can realize the functions of rapid insulator arrangement, microscopic inspection and testing, ensuring stable insulator arrangement and improving testing efficiency and accuracy.
[0004] Technical solution: A high-density microwave insulator batch loading and testing device, comprising a screening top plate, a test substrate and an insulating base, wherein the test substrate is placed on the insulating base and the screening top plate is snapped onto the test substrate;
[0005] The top plate of the screen is provided with an array of conical holes and a bottom groove. The top of the array of conical holes is a large hole and the bottom is a small hole. The diameter of the small hole matches the outer diameter of the outer conductor of the microwave insulator.
[0006] The test substrate is provided with arrayed countersunk holes and countersunk screw holes, and wire interfaces are provided on the side. The countersunk screw holes are located at the four corners of the test substrate.
[0007] The insulating base is provided with an array of through holes and threaded through holes, with the threaded through holes located at the four corners of the insulating base;
[0008] The array of countersunk holes, array of through holes, and array of tapered holes are the same in number and spacing. After installation, the center lines of the array of countersunk holes, array of through holes, and array of tapered holes coincide, and the center lines of the countersunk screw holes and the threaded through holes coincide.
[0009] During electrical performance testing, the wire interface is connected to the tester.
[0010] Furthermore, the upper large hole diameter of the array of countersunk holes matches the outer diameter of the outer conductor of the microwave insulator, while the lower small hole diameter is larger than the diameter of the inner conductor of the microwave insulator.
[0011] Furthermore, the aperture of the array via is larger than the diameter of the inner conductor of the microwave insulator, and the depth of the array via is larger than the length of the inner conductor.
[0012] Furthermore, the test substrate is made of conductive metal, and the insulating base is made of polytetrafluoroethylene.
[0013] Furthermore, during electrical performance testing, the wire interface is connected to the negative terminal of the tester, and the inner conductor of the microwave insulator is connected to the positive terminal of the tester.
[0014] The beneficial effects of this utility model are as follows:
[0015] 1. This utility model has a three-layer structure consisting of a screening top plate, a test substrate, and an insulating base, which enables rapid arrangement, microscopic inspection, and testing of insulators. The structure is simple and easy to operate.
[0016] 2. The array of conical holes on the top plate of this utility model enables the rapid arrangement and loading of insulators onto the test substrate. Moreover, the bottom of the top plate is provided with a groove, the size of which matches the top of the test substrate. In this way, the top plate can be snapped onto the test substrate through the bottom groove, which plays a positioning role and ensures that the center lines of the array of conical holes, array of countersunk holes and array of through holes coincide, which facilitates accurate and efficient arrangement and loading of insulators.
[0017] 3. The screening top plate and the test substrate of this utility model are fastened together by screw holes at the four corners as a test fixture. The test fixture can also be used as a microscopic inspection device, which simplifies the microscopic inspection and testing process and improves efficiency.
[0018] 4. The test substrate of this utility model is designed with metal material, and the insulating base is designed with polytetrafluoroethylene material. The test substrate is conductive to bring out the outer conductor of the insulator as the negative electrode, and the positive electrode is the inner conductor of the insulator for testing.
[0019] 5. This utility model solves the problem of unstable insulator placement and the problem of missed electrical performance testing caused by the short lead wires of the insulator by uniformly leading out the outer conductor of the insulator as the negative pole. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of the structure of this utility model;
[0021] Figure 2 This is a schematic diagram of the structure of a microwave insulator provided in an embodiment of the present utility model;
[0022] Figure 3 This is a schematic diagram of the structure of the screening top plate in this utility model;
[0023] Figure 4 This is a schematic diagram of the installation of the test substrate and the insulating base in this utility model;
[0024] Figure 5 for Figure 4 Top view;
[0025] Figure 6 for Figure 5 AA section view in the middle;
[0026] Figure 7 for Figure 5 BB cross-section diagram in the middle;
[0027] Figure 8 This is a schematic diagram of the microscopic inspection of insulators according to the present invention;
[0028] Figure 9 This is a schematic diagram of the insulator test according to the present invention;
[0029] In the diagram: 1. Screening top plate; 2. Arrayed conical holes; 3. Bottom groove; 4. Test substrate; 5. Arrayed countersunk holes; 6. Countersunk screw holes; 7. Wire interface; 8. Insulating base; 9. Arrayed through holes; 10. Threaded through holes; 11. Inner conductor; 12. Outer conductor. Detailed Implementation
[0030] The technical solution of this utility model will now be described in detail with reference to the accompanying drawings and specific embodiments.
[0031] Example 1
[0032] like Figure 1 As shown, this embodiment provides a high-density microwave insulator batch loading and testing device, including a screening top plate 1, a test substrate 4 and an insulating base 8 arranged sequentially from top to bottom.
[0033] Figure 1 The diagram shows a partial cross-sectional view of the top of the top screening plate 1. Figure 3The diagram shows the structure of the top screening plate 1. The top screening plate 1 has an array of conical holes 2 and a bottom groove 3. The array of conical holes 2 has the following dimensions: a large hole at the top and a small hole at the bottom, forming a funnel shape. The diameter of the small hole matches the diameter of the outer conductor 12 of the microwave insulator. This design allows the microwave insulator to descend through the array of conical holes 2 of the top screening plate 1. During the descent process, the microwave insulator changes from a horizontal to a vertical position and is automatically loaded onto the test substrate 4, saving the time of manual clamping of the microwave insulator. The structure of the microwave insulator is as follows: Figure 2 As shown.
[0034] Furthermore, the shape and size of the bottom groove 3 are designed to match the top of the test substrate 4, so that the screening top plate 1 can be snapped onto the test substrate 4 through the bottom groove 3; at the same time, the screening top plate 1 can be easily removed after the microwave insulator is installed.
[0035] Figure 1 The diagram illustrates a partial cross-sectional structure of the test substrate 4 and the top of the insulating base 8. Figure 4 The diagram shows the installation structure of the test substrate 4 and the insulating base 8. The test substrate 4 is provided with array countersunk holes 5 and countersunk screw holes 6, and wire interface 7 is provided on the side. The insulating base 8 is provided with array through holes 9 and threaded through holes 10.
[0036] Furthermore, the array of countersunk holes 5, array of through holes 9, and array of tapered holes 2 are the same in number and spacing, and the center lines of each hole coincide after installation.
[0037] Preferably, the test substrate 4 is made of conductive metal, and the insulating base 8 is made of polytetrafluoroethylene (PTFE). The test substrate 4 uses a conductive metal material, and the countersunk hole design of the test substrate 4 serves two purposes: firstly, it supports the insulator, and secondly, it allows good contact between the outer conductor side of the insulator and the inner wall of the countersunk hole in the metal material on the bottom surface. Then, wires are connected through the wire interface 7 on the side of the test substrate 4 for power-on testing.
[0038] Figure 5 The diagram illustrates the structure of the test substrate 4 and the insulating base 8 after installation. Figure 6 This diagram illustrates the external dimensions and combination of the array countersunk holes 5 and array through holes 9. The array countersunk holes 5 are used to place the microwave insulator, and the array through holes 9 are used to place the inner conductor 11 of the microwave insulator. The array through holes 9 of the insulating base 8 are designed to accommodate inner conductors of different lengths and also serve to fix and support the insulator.
[0039] Furthermore, the array of countersunk holes 5 is designed with a larger diameter at the top and a smaller diameter at the bottom. The larger diameter at the top of the array of countersunk holes 5 must match the outer conductor 12 of the microwave insulator, while the smaller diameter at the bottom is larger than the diameter of the inner conductor 11 of the microwave insulator. When the microwave insulator is installed in the array of countersunk holes 5, the sidewalls and bottom edge of the outer conductor 12 can fit against the inner wall of the larger diameter at the top of the array of countersunk holes 5, while the inner conductor 11 of the microwave insulator passes through the smaller diameter at the bottom of the array of countersunk holes 5 without contacting its inner metal wall. This design allows the outer conductor 12 of the microwave insulator (as an electrode) to be connected to the test substrate 4 through the array of countersunk holes 5 and then led out through the wire interface 7 for subsequent electrical performance testing. Furthermore, the structural design of the array of countersunk holes 5 also provides good support for the microwave insulator.
[0040] Furthermore, the diameter of the array through-hole 9 should be slightly larger than the diameter of the inner conductor 11 of the microwave insulator. This design ensures that the inner conductor 11 of the microwave insulator passes through the array through-hole 9 and is fixed in the array through-hole 9, keeping the microwave insulator upright and preventing it from tipping over. The depth of the array through-hole 9 should be greater than the length of the inner conductor 11 to ensure that the inner conductor 11 of the microwave insulator passes through it without touching the bottom of the hole.
[0041] like Figure 7 The diagram shows the external dimensions and combination of the countersunk screw hole 6 and the threaded through hole 10. This design allows the test substrate 4 and the insulating base 8 to be fastened together using screws through the countersunk screw hole 6 and the threaded through hole 10. The combined use of the test substrate 4 and the insulating base 8 can also serve as a tray for batch visual inspection of microwave insulators, or as a fixture for batch electrical performance testing (referred to as testing fixture).
[0042] The working process of this utility model for batch loading of high-density microwave insulators is as follows: Figure 1 A batch of insulators is placed on the screening top plate 1. A slight shaking allows the microwave insulators to descend through the array of conical holes 2 on the screening top plate 1. During this descent, the microwave insulators change from a horizontal to a vertical position and are then automatically loaded onto the array of countersunk holes 5 on the test substrate 4. After the microwave insulators are loaded onto the test substrate 4, the detachable screening top plate 1 is removed, and then... Figure 4 The test substrate 4 and the insulating base 8 are fastened together with screws (as a testing fixture), which can be used as a tray for batch visual inspection of microwave insulators, or as a fixture for batch electrical performance testing.
[0043] Therefore, when this utility model is used for microwave insulator testing and screening, multiple microwave insulators can be scattered onto the screening top plate 1, and then the screening top plate 1 can be slightly shaken to load them onto the test substrate 4 in batches. This saves the time of manual clamping of devices. Moreover, the bottom of the screening top plate 1 is provided with a groove, the size of which matches the top of the test substrate 4. In this way, the screening top plate 1 can be snapped onto the test substrate 4 through the bottom groove, which plays a positioning role and ensures that the center lines of the array of conical holes, array of countersunk holes and array of through holes are aligned, which facilitates accurate and efficient arrangement and loading of insulators.
[0044] The process for visual inspection of microwave insulators is as follows: Figure 8 The diagram shown is a schematic of the insulators arranged on the inspection fixture for visual inspection. Two microscopes are needed for this purpose. Figure 4 The testing fixture is shown. When the microwave insulators are loaded onto the first testing fixture, all microwave insulators are placed vertically on the fixture, which facilitates visual inspection of the outer conductor 12, inner conductor 11, and the upper part of the glass insulating medium. After inspecting the appearance of the upper part, the second testing fixture is placed upside down on the test base plate 4 of the first testing fixture. Then, the two fixtures are rotated 180°, at which point the microwave insulators are also rotated 180° and, due to gravity, are all loaded onto the second testing fixture. At this point, visual inspection of the outer conductor 12, inner conductor 11, and the lower part of the glass insulating medium can be performed.
[0045] In addition, the inspection fixture of this utility model can be used as a microscopic inspection device for insulators, and can inspect a certain number of microwave insulators each time. This solves the problem that in the past, when visual inspection was carried out, it was necessary to use tweezers to hold the insulators and only one insulator could be inspected at a time, which was time-consuming and laborious. This reduces the difficulty of visual inspection and improves the efficiency of visual inspection.
[0046] The working process of microwave insulator electrical performance testing is as follows: Figure 9 The diagram shows the test setup with insulators arranged on the testing fixture. After completing the microwave insulator loading and visual inspection, the negative terminal of the insulation resistance tester or dielectric withstand voltage tester can be connected to the test substrate 4 of the testing fixture via the wire interface 7. All microwave insulators loaded onto the test substrate 4 are connected to the test substrate 4 by their outer conductors 12 through the metal inner wall of the array countersunk holes 5, and then connected to the negative terminal of the testing instrument via the wire interface 7. When performing insulation resistance or dielectric withstand voltage tests, it is only necessary to connect the positive terminal of the testing instrument to the inner conductor 11 of each microwave insulator to complete the electrical performance test.
[0047] In summary, the testing fixture of this invention can be used as an insulator testing device. Through the array of countersunk holes in the test substrate 4, the outer conductor shell of each microwave insulator (the electrode) can be connected to the testing instrument via the wire interface 7 on the test substrate for direct electrical performance testing. This reduces the difficulty of electrical performance testing and improves testing efficiency. When used for microwave insulator testing and screening, this invention can count a fixed number of microwave insulators tested in each batch (the number of holes on the testing fixture can be designed according to requirements).
Claims
1. A high-density microwave insulator batch loading and testing device, characterized in that, It includes a screening top plate (1), a test substrate (4) and an insulating base (8), wherein the test substrate (4) is placed on the insulating base (8) and the screening top plate (1) is snapped onto the test substrate (4); The top plate (1) of the screening is provided with an array of conical holes (2) and a bottom groove (3). The top of the array of conical holes (2) is a large hole and the bottom is a small hole. The diameter of the small hole matches the outer diameter of the outer conductor (12) of the microwave insulator. The test substrate (4) is provided with array countersunk holes (5) and countersunk screw holes (6), and a wire interface (7) is provided on the side. The countersunk screw holes (6) are located at the four corners of the test substrate (4). The insulating base (8) is provided with array through holes (9) and threaded through holes (10), and the threaded through holes (10) are located at the four corners of the insulating base (8); The array of countersunk holes (5), array of through holes (9) and array of tapered holes (2) are the same in number and spacing. After installation, the center lines of the array of countersunk holes (5), array of through holes (9) and array of tapered holes (2) coincide, and the center lines of the countersunk screw holes (6) and threaded through holes (10) coincide. During electrical performance testing, the wire interface (7) is connected to the tester.
2. The high-density microwave insulator batch loading and testing device according to claim 1, characterized in that, The upper large hole diameter of the array countersunk hole (5) matches the outer diameter of the outer conductor (12) of the microwave insulator, and the lower small hole diameter is larger than the diameter of the inner conductor (11) of the microwave insulator.
3. The high-density microwave insulator batch loading and testing device according to claim 1, characterized in that, The aperture of the array via (9) is larger than the diameter of the inner conductor (11) of the microwave insulator, and the depth of the array via (9) is larger than the length of the inner conductor (11).
4. The high-density microwave insulator batch loading and testing device according to any one of claims 1-3, characterized in that, The test substrate (4) is made of conductive metal, and the insulating base (8) is made of polytetrafluoroethylene.
5. The high-density microwave insulator batch loading and testing device according to any one of claims 2-3, characterized in that, During electrical performance testing, the wire interface (7) is connected to the negative terminal of the tester, and the inner conductor (11) of the microwave insulator is connected to the positive terminal of the tester.