Electronic component testing jig with probes

Abstract

This utility model relates to an electronic component testing fixture with probes, belonging to the technical field of electronic component testing fixtures. It includes a base and a cover plate hinged to the top of the base. A support plate is fixedly connected to the back of the top of the cover plate. The front of the support plate has a snap-fit ​​fixing structure for easy probe replacement. The snap-fit ​​fixing structure includes a mounting seat on the front of the support plate. This electronic component testing fixture with probes allows for the installation of probe holders via the mounting seat. Furthermore, by incorporating a movable rod, a baffle, and a return spring, when the movable rod is pulled outwards, the baffle compresses the return spring, causing the movable rod to elastically displace and separate from the probe holder. This allows for the replacement and disassembly of the probe holder. Simultaneously, the operator only needs to insert the probe holder from the bottom of the mounting seat into it, at which point the movable rod snaps it in place, achieving a quick assembly and disassembly effect.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing fixture technology, specifically to an electronic component testing fixture with probes. Background Technology

[0002] Electronic components are the foundation of electronic products. Commonly used electronic components include resistors, capacitors, inductors, potentiometers, transformers, and so on. After electronic components are manufactured, they must be tested and certified as qualified before they can be used. Electronic component testing fixtures are specialized equipment used to test the electrical performance and functional integrity of electronic components, and are widely used in consumer electronics, automotive electronics, semiconductor manufacturing, and other fields.

[0003] Chinese utility model patent CN219512273U discloses an electronic component testing fixture with probes. It includes a first platform and a second platform for placing electronic components. The first and second platforms are joined to form a groove structure. Supports are provided on both side walls of the first platform, with the interior of each support forming a convex groove. T-shaped brackets are provided on both side walls of the second platform, slidingly disposed within the supports. The head end of the T-shaped bracket is connected to the inner side wall of the outlet end of the support via a spring, which restricts the sliding of the T-shaped rod within the support. A lifting mechanism is provided on the other side of the first platform, connected to a probe plate. The probe plate is positioned above the first and second platforms and contains probes. This utility model proposes an electronic component testing fixture with probes, enabling the testing of various types of electronic components.

[0004] However, this utility model does not have a structure for replacing or disassembling the probe during use. As a result, the probe will be damaged to varying degrees after long-term use, which will directly affect the testing effect of electronic components and fail to meet production requirements. Therefore, an electronic component testing fixture with probes is proposed to solve the problems mentioned above. Utility Model Content

[0005] To address the shortcomings of existing technologies, this utility model provides an electronic component testing fixture with probes, which has the advantage of easy probe replacement. This solves the problem that existing testing fixtures do not have a structure for replacing and disassembling probes, which leads to varying degrees of damage to probes after long-term use, thus directly affecting the testing results of electronic components.

[0006] To achieve the above objectives, the present invention provides the following technical solution: an electronic component testing fixture with probes, comprising a base and a cover plate hinged to the top of the base, wherein a support plate is fixedly connected to the back of the top of the cover plate, and the front of the support plate is provided with a snap-fit ​​fixing structure for easy replacement of the probes.

[0007] The snap-fit ​​fixing structure includes a mounting base disposed on the front side of the support plate, a probe seat extending to its bottom is slidably connected inside the mounting base, a movable rod extending into the probe seat is slidably connected inside the mounting base, a baffle is fixedly connected to the outside of the movable rod, and a return spring is fixedly connected between the baffle and the mounting base.

[0008] Furthermore, the reset spring is slidably connected to the outside of the movable rod, and the end of the movable rod away from the probe seat extends to the outside of the mounting base.

[0009] Furthermore, a support base is fixedly connected to the front of the support plate, a connector is fixedly connected to the front of the support base, a handle extending to the front of the connector is rotatably connected inside the connector, a hinge is rotatably connected to the outside of the handle near the connector, and a pressure rod extending to the bottom of the hinge is hinged inside the hinge.

[0010] Furthermore, a limiting sleeve is fixedly connected to the bottom of the front side of the connector, the limiting sleeve is slidably connected to the outside of the pressure rod, and the bottom end of the pressure rod is fixedly connected to the mounting base.

[0011] Furthermore, a mounting block is fixedly connected to the front of the support plate, and a positioning guide rod is fixedly connected between the cover plate and the mounting block. The positioning guide rod is slidably connected to the mounting base.

[0012] Furthermore, a placement platform is provided between the cover plate and the mounting base, a support frame is fixedly connected to the bottom of the cover plate, and a support rod passing through the support frame is fixedly connected to the bottom of the placement platform.

[0013] Furthermore, the support rod is externally fixedly connected to a fixing plate located inside the support frame, and a buffer spring is fixedly connected between the fixing plate and the support frame. The support rod and the cover plate are connected by a sliding connection.

[0014] Furthermore, a locking structure is fixedly connected to the same side of both the base and the cover plate. There are two locking structures, which are symmetrically distributed on the left and right sides of the base.

[0015] Compared with the prior art, this utility model provides an electronic component testing fixture with probes, which has the following beneficial effects:

[0016] 1. This electronic component testing fixture with probes can install probe holders by setting a mounting base. By setting a movable rod, a baffle and a return spring, when the movable rod is pulled outward, the baffle will squeeze the return spring, so that the movable rod can elastically displace, thereby separating the movable rod from the probe holder, so that the probe holder can be replaced and disassembled. At the same time, the operator only needs to insert the probe holder into the mounting base from the bottom, and the movable rod can lock and fix it, achieving the effect of quick assembly and disassembly.

[0017] 2. This electronic component testing fixture with probes, by setting up a support rod, allows the placement stage to move up and down. By setting up a fixing plate and a buffer spring, it can provide a certain buffering effect when testing electronic components on the placement stage, avoiding damage to electronic components due to excessive downward pressure. This solves the problem that existing testing fixtures do not have a structure for replacing and disassembling probes, so that probes will be damaged to varying degrees after long-term use, which directly affects the testing effect of electronic components. Attached Figure Description

[0018] Figure 1 This is a three-dimensional view of the structure of this utility model;

[0019] Figure 2 This is a cross-sectional view of the structure of this utility model;

[0020] Figure 3 This utility model Figure 2 A magnified structural diagram of structure A is shown below;

[0021] Figure 4 This is a schematic diagram of the structure of the connector of this utility model;

[0022] Figure 5 This utility model Figure 2 A magnified structural diagram of B is shown.

[0023] In the diagram: 1. Base; 2. Cover plate; 3. Support plate; 4. Mounting seat; 5. Probe seat; 6. Movable rod; 7. Baffle; 8. Return spring; 9. Support seat; 10. Connector; 11. Handle; 12. Hinge; 13. Limit sleeve; 14. Pressing rod; 15. Positioning guide rod; 16. Placement platform; 17. Support frame; 18. Support rod; 19. Fixing plate; 20. Buffer spring; 21. Locking structure. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Please see Figures 1 to 3 This embodiment of an electronic component testing fixture with probes includes a base 1 and a cover plate 2 hinged to the top of the base 1. A support plate 3 is fixedly connected to the back of the top of the cover plate 2. A snap-fit ​​fixing structure for easy replacement of probes is provided on the front of the support plate 3. The snap-fit ​​fixing structure includes a mounting seat 4 provided on the front of the support plate 3. A probe seat 5 extending to its bottom is slidably connected inside the mounting seat 4. A movable rod 6 extending into the probe seat 5 is slidably connected inside the mounting seat 4. A baffle 7 is fixedly connected to the outside of the movable rod 6. A return spring 8 is fixedly connected between the baffle 7 and the mounting seat 4.

[0026] Specifically, the reset spring 8 is slidably connected to the outside of the movable rod 6, and the end of the movable rod 6 away from the probe seat 5 extends to the outside of the mounting base 4.

[0027] It should be noted that there are two movable rods 6, which are symmetrically distributed on the left and right sides of the mounting base 4. One side of the probe base 5 is provided with a slot that matches the movable rod 6.

[0028] Please see Figure 1 and Figure 4 In this embodiment, a support base 9 is fixedly connected to the front of the support plate 3, and a connector 10 is fixedly connected to the front of the support base 9. A handle 11 extending to the front of the connector 10 is rotatably connected inside the connector 10. A hinge 12 is rotatably connected to the outside of the handle 11 near the connector 10. A pressing rod 14 extending to the bottom of the hinge 12 is hinged inside the hinge 12. A limiting sleeve 13 is fixedly connected to the bottom of the front of the connector 10. The limiting sleeve 13 is slidably connected to the outside of the pressing rod 14. The bottom end of the pressing rod 14 is fixedly connected to the mounting base 4.

[0029] Specifically, a mounting block is fixedly connected to the front of the support plate 3, and a positioning guide rod 15 is fixedly connected between the cover plate 2 and the mounting block. The positioning guide rod 15 is connected to the mounting base 4 by a sliding connection.

[0030] Please see Figure 1 , Figure 2 and Figure 5In this embodiment, a placement platform 16 is provided between the cover plate 2 and the mounting base 4. A support frame 17 is fixedly connected to the bottom of the cover plate 2. A support rod 18 that passes through the support frame 17 is fixedly connected to the bottom of the placement platform 16. A fixing plate 19 located inside the support frame 17 is fixedly connected to the outside of the support rod 18. A buffer spring 20 is fixedly connected between the fixing plate 19 and the support frame 17. The support rod 18 and the cover plate 2 are connected by a sliding connection.

[0031] Specifically, the base 1 and the cover plate 2 are both fixedly connected to the same side with a locking structure 21. There are two locking structures 21, which are symmetrically distributed on the left and right sides of the base 1.

[0032] It should be noted that by setting the locking structure 21, the cover plate 2 can be fixed, and at the same time, it is convenient to open the cover plate 2 to maintain the electronic components inside the base 1.

[0033] The working principle of the above embodiments is as follows:

[0034] First, the staff places the device on the table and then connects the power supply. The staff then installs the probe holder 5 from the bottom of the mounting base 4 upwards into the mounting base 4. After that, the probes on the probe holder 5 are connected using wires. Then, the electronic component to be tested is placed on the placement stage 16. The staff then pulls the handle 11 downwards. At this time, the mounting base 4 and the probe holder 5 move downwards at the same time. At this time, the probes on the probe holder 5 come into contact with the electronic component, and at the same time, the placement stage 16 is pressed down. At this time, the testing device can be started to perform the test.

[0035] The installation, connection, or setting methods disclosed in this embodiment are all common mechanical connection methods, and any method that achieves the desired beneficial effect can be implemented. Furthermore, all electrical components in this embodiment are electrically connected to the main controller and power supply. The main controller can be a conventional, known device such as a computer that performs control functions. Those skilled in the art can control the electrical components through simple programming, and the existing disclosed power connection technologies are common knowledge in the field. Therefore, this embodiment will not elaborate further on their specific structural composition and working principles.

[0036] It should be noted that the orientations or positional relationships indicated herein are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the purpose of facilitating the description of this application and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0037] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0038] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An electronic component testing fixture with probes, comprising a base (1) and a cover plate (2) hinged to the top of the base (1), characterized in that: A support plate (3) is fixedly connected to the back of the top of the cover plate (2), and the front of the support plate (3) is provided with a snap-fit ​​fixing structure to facilitate the replacement of the probe. The snap-fit ​​fixing structure includes a mounting base (4) disposed on the front of the support plate (3), a probe seat (5) extending to its bottom is slidably connected inside the mounting base (4), a movable rod (6) extending into the probe seat (5) is slidably connected inside the mounting base (4), a baffle (7) is fixedly connected to the outside of the movable rod (6), and a return spring (8) is fixedly connected between the baffle (7) and the mounting base (4).

2. The electronic component testing fixture with probes according to claim 1, characterized in that: The reset spring (8) is slidably connected to the outside of the movable rod (6), and the end of the movable rod (6) away from the probe seat (5) extends to the outside of the mounting base (4).

3. The electronic component testing fixture with probes according to claim 1, characterized in that: The support plate (3) is fixedly connected to a support base (9) on the front side, and a connector (10) is fixedly connected to the front side of the support base (9). The connector (10) is rotatably connected to a handle (11) extending to its front side. The handle (11) is rotatably connected to a hinge (12) on the side of its exterior near the connector (10). The hinge (12) is hinged to a lower pressure rod (14) extending to its bottom.

4. The electronic component testing fixture with probes according to claim 3, characterized in that: The bottom of the front of the connector (10) is fixedly connected to a limiting sleeve (13), which is slidably connected to the outside of the pressure rod (14). The bottom end of the pressure rod (14) is fixedly connected to the mounting base (4).

5. The electronic component testing fixture with probes according to claim 1, characterized in that: The support plate (3) is fixedly connected to the front of the mounting block, and the cover plate (2) is fixedly connected to the mounting block with a positioning guide rod (15). The positioning guide rod (15) and the mounting base (4) are connected by a sliding connection.

6. The electronic component testing fixture with probes according to claim 1, characterized in that: A placement platform (16) is provided between the cover plate (2) and the mounting base (4). A support frame (17) is fixedly connected to the bottom of the cover plate (2), and a support rod (18) that passes through the support frame (17) is fixedly connected to the bottom of the placement platform (16).

7. The electronic component testing fixture with probes according to claim 6, characterized in that: The support rod (18) is externally fixedly connected to a fixing plate (19) located inside the support frame (17). A buffer spring (20) is fixedly connected between the fixing plate (19) and the support frame (17). The support rod (18) and the cover plate (2) are connected by a sliding connection.

8. The electronic component testing fixture with probes according to claim 1, characterized in that: The base (1) and the cover plate (2) are both fixedly connected to a locking structure (21) on the same side. There are two locking structures (21), and the two locking structures (21) are symmetrically distributed on the left and right sides of the base (1).

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