Cleaning structure of chip detection equipment

Abstract

The utility model discloses a kind of cleaning structure of chip detection equipment, including microscope body, the top of microscope body is fixedly connected with workbench, the top of workbench is equipped with placing groove, the bottom of workbench is provided with cleaning structure, the cleaning structure includes motor, the front of workbench is located motor, the output of motor is fixedly connected with reciprocating screw rod, the surface of reciprocating screw rod is threadedly connected with screw sleeve, the bottom of screw sleeve is fixedly connected with connecting block, the other end of connecting block is fixedly connected with cleaning block, the shape of cleaning block is trapezoidal block, cleaning block is located at the top of workbench, the both sides of workbench bottom are provided with collection structure, the utility model is equipped with the setting of cleaning structure, can be cleaned by using user to workbench surface drop by cleaning structure to start the material on the top of workbench to clean, it is convenient for user to clean quickly.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a cleaning structure for a chip testing device. Background Technology

[0002] The main purpose of chip testing is to discover potential defects in chips during production and use, ensuring that the chip's function, performance, and reliability meet design requirements. Through testing, problems can be identified and repaired in a timely manner, improving chip yield and product quality. II. Testing Methods Chip testing methods are diverse. Based on the different testing content and objectives, they can be categorized as follows: Visual Inspection: This mainly targets the physical form and appearance defects of the chip, including visual inspection, microscopic inspection, and magnified inspection. By observing the chip's surface, packaging, pins, etc., it checks for scratches, deformation, damage, and other problems. Microscopes are also a type of chip testing device.

[0003] A search revealed Chinese patent application number 202223335677.X, which discloses a protective structure for a microscope lens. This utility model relates to the field of protective structure technology, and particularly to a protective structure for a microscope lens. It solves the problem that in existing technologies, dust covers primarily rely on interference fits for positioning. After repeated pressing and unpressing, the positioning effect between the microscope lens and the dust cover deteriorates, making the dust cover prone to falling off and rendering it ineffective. The protective structure for the microscope lens includes a microscope body and a lens microscope body mounted on the microscope body. The lens microscope body has a clamp, and three bolts are threaded onto the side wall of the clamp. Anti-slip pads are fixedly connected to the inner ends of the bolts. The side wall of the clamp has protective components and elastic components for protecting the lens microscope body. This utility model utilizes the elasticity of a spring to position the protective sleeve between the protective sleeve and the lens microscope body, preventing loosening after repeated use. Furthermore, the spring is easy to replace and maintains stable elasticity, ensuring stable protection.

[0004] The existing technical solutions have the following drawbacks: the existing microscopes are manually cleaned during the process, which requires operators to do it themselves. This process is not only time-consuming, but also affects the speed of subsequent chip inspection. Utility Model Content

[0005] To address the problems mentioned in the background art, the purpose of this utility model is to provide a cleaning structure for a chip inspection device, which has the advantage of being easy to clean. This solves the problem that existing microscopes require manual cleaning during the inspection process, which requires operators to do it themselves. This process is not only time-consuming, but also affects the speed of subsequent chip inspection.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a cleaning structure for a chip inspection device, comprising a microscope body, a worktable fixedly connected to the top of the microscope body, a placement slot provided on the top of the worktable, a cleaning structure provided at the bottom of the worktable, the cleaning structure comprising a motor located on the front of the worktable, a reciprocating screw fixedly connected to the output end of the motor, a threaded sleeve connected to the surface of the reciprocating screw, a connecting block fixedly connected to the bottom of the threaded sleeve, a cleaning block fixedly connected to the other end of the connecting block, the cleaning block being trapezoidal in shape, the cleaning block being located on the top of the worktable, and collection structures provided on both sides of the bottom of the worktable.

[0007] As a preferred embodiment of this utility model, the collection structure includes a collection box located on both sides of the bottom of the worktable. A T-shaped block is fixedly connected to the bottom of the collection box, and a support block is slidably connected to the surface of the T-shaped block. The inner side of the support block is fixedly connected to the inner side of the microscope body.

[0008] As a preferred embodiment of this utility model, a sliding groove is provided on the outer side of the workbench, and a slider is slidably connected inside the sliding groove. The outer side of the slider is fixedly connected to the inner side of the connecting block.

[0009] As a preferred embodiment of this invention, a fixing block is fixedly connected to the bottom of the motor, and the back of the fixing block is fixedly connected to the front of the microscope body.

[0010] As a preferred embodiment of this utility model, a handle is fixedly connected to the outside of the collection box, and mounting ears are fixedly connected to the top and bottom of the inside of the support block.

[0011] As a preferred embodiment of this invention, a bearing base is movably sleeved on the surface of the reciprocating lead screw, and the bottom of the bearing base is fixedly connected to the top of the microscope body.

[0012] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0013] 1. This utility model, through the design of the cleaning structure, enables users to clean the material on the top of the workbench by dripping it onto the workbench surface, thus facilitating quick cleaning for the user.

[0014] 2. This utility model, through the design of the collection structure, can collect the cleaned material or debris in conjunction with the cleaning block. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of this utility model;

[0016] Figure 2This is a schematic diagram of the workbench of this utility model;

[0017] Figure 3 This is a schematic diagram of the cleaning structure of this utility model;

[0018] Figure 4 This is a schematic diagram of the collection box of this utility model.

[0019] In the diagram: 1. Microscope body; 2. Worktable; 3. Placement slot; 4. Cleaning structure; 41. Motor; 42. Reciprocating lead screw; 43. Screw sleeve; 44. Connecting block; 45. Cleaning block; 5. Collection structure; 51. Collection box; 52. T-block; 53. Support block; 6. Slide groove; 7. Sliding block; 8. Fixing block; 9. Handle; 10. Mounting ear; 11. Bearing base. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] like Figures 1 to 4 As shown, the present invention provides a cleaning structure for a chip testing device, including a microscope body 1, a worktable 2 fixedly connected to the top of the microscope body 1, a placement groove 3 on the top of the worktable 2, and a cleaning structure 4 at the bottom of the worktable 2. The cleaning structure 4 includes a motor 41 located on the front of the worktable 2. A reciprocating screw 42 is fixedly connected to the output end of the motor 41. A threaded sleeve 43 is threaded onto the surface of the reciprocating screw 42. A connecting block 44 is fixedly connected to the bottom of the threaded sleeve 43. A cleaning block 45 is fixedly connected to the other end of the connecting block 44. The cleaning block 45 is trapezoidal in shape and located on the top of the worktable 2. Collection structures 5 are provided on both sides of the bottom of the worktable 2.

[0022] refer to Figure 4 The collection structure 5 includes a collection box 51, which is located on both sides of the bottom of the worktable 2. A T-shaped block 52 is fixedly connected to the bottom of the collection box 51, and a support block 53 is slidably connected to the surface of the T-shaped block 52. The inner side of the support block 53 is fixedly connected to the inner side of the microscope body 1.

[0023] As a technical optimization of this utility model, the collection structure 5 can be used in conjunction with the cleaning block 45 to collect the cleaned material or debris.

[0024] refer to Figure 2A slide groove 6 is provided on the outer side of the workbench 2. A slider 7 is slidably connected inside the slide groove 6. The outer side of the slider 7 is fixedly connected to the inner side of the connecting block 44.

[0025] As a technical optimization of this utility model, the sliding groove 6 and the slider 7 can limit the connection block 44 and prevent the connection block 44 from shaking.

[0026] refer to Figure 2 A fixing block 8 is fixedly connected to the bottom of the motor 41, and the back of the fixing block 8 is fixedly connected to the front of the microscope body 1.

[0027] As a technical optimization of this utility model, by setting the fixing block 8, the motor 41 can be fixed by the fixing block 8, so as to prevent the motor 41 from shaking during use.

[0028] refer to Figure 2 A handle 9 is fixedly connected to the outside of the collection box 51, and mounting ears 10 are fixedly connected to the top and bottom of the inside of the support block 53.

[0029] As a technical optimization of this utility model, the handle 9 makes it easy to remove the collection box 51, and the mounting ear 10 makes it easy for the user to install or remove the support block 53.

[0030] refer to Figure 3 A bearing base 11 is movably sleeved on the surface of the reciprocating lead screw 42, and the bottom of the bearing base 11 is fixedly connected to the top of the microscope body 1.

[0031] As a technical optimization of this utility model, the bearing base 11 can support the reciprocating screw 42 and prevent the reciprocating screw 42 from shaking during operation.

[0032] The working principle and usage process of this utility model are as follows: First, carefully place the chip to be tested on top of the placement slot 3 of the testing equipment. Then, start the microscope body 1 of the testing equipment and use advanced testing technology to perform a comprehensive and accurate test on the chip. After the test is completed, start the motor 41. The output end of the motor 41 starts to rotate, driving the reciprocating screw 42 connected to it to rotate synchronously. The rotation of the reciprocating screw 42 further drives the screw sleeve 43 to move linearly on the predetermined track. The movement of the screw sleeve 43 is transmitted to the cleaning block 45 through the connecting block 44, so that the cleaning block 45 can move along the surface of the worktable 2. The cleaning block 45 conforms to the shape of the worktable 2, ensuring that it can effectively and thoroughly clean the debris, dust or other substances on the surface of the worktable 2. As the cleaning block 45 moves, these debris are gradually guided into the interior of the collection box 51. When the cleaning work is completed, the user can easily remove the collection box 51 from the equipment by operating the handle 9.

[0033] In summary, the cleaning structure of this chip inspection device allows users to quickly clean the material on the top of the worktable by applying a drop of cleaning solution to the worktable surface. This solves the problem of manual cleaning of existing microscopes, which requires operators to do it manually, a process that is time-consuming and affects the speed of subsequent chip inspection.

[0034] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0035] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A cleaning structure of a chip detection device, comprising a microscope body (1), a workbench (2) is fixedly connected to the top of the microscope body (1), characterized in that: The top of the workbench (2) is provided with a placing groove (3), and the bottom of the workbench (2) is provided with a cleaning structure (4), the cleaning structure (4) comprises a motor (41), the motor (41) is located on the front of the workbench (2), the output end of the motor (41) is fixedly connected with a reciprocating lead screw (42), the surface of the reciprocating lead screw (42) is screw connected with a sleeve (43), the bottom of the sleeve (43) is fixedly connected with a connecting block (44), the other end of the connecting block (44) is fixedly connected with a cleaning block (45), the cleaning block (45) is shaped as a trapezoidal block, the cleaning block (45) is located on the top of the workbench (2), and the two sides of the bottom of the workbench (2) are provided with a collecting structure (5).

2. The cleaning structure of a chip inspection apparatus according to claim 1, characterized by: The collecting structure (5) comprises a collecting box (51), the collecting box (51) is located on the two sides of the bottom of the workbench (2), the bottom of the collecting box (51) is fixedly connected with a T-shaped block (52), the surface of the T-shaped block (52) is slidably connected with a supporting block (53), and the inner side of the supporting block (53) is fixedly connected with the inner side of the microscope body (1).

3. The cleaning structure of a chip inspection apparatus according to claim 1, characterized by: The outer side of the workbench (2) is provided with a chute (6), the inner side of the chute (6) is slidably connected with a sliding block (7), and the outer side of the sliding block (7) is fixedly connected with the inner side of the connecting block (44).

4. The cleaning structure of a chip inspection apparatus according to claim 1, characterized by: The bottom of the motor (41) is fixedly connected with a fixed block (8), and the back of the fixed block (8) is fixedly connected with the front of the microscope body (1).

5. The cleaning structure of a chip inspection apparatus according to claim 2, characterized by: The outer side of the collecting box (51) is fixedly connected with a handle (9), and the top and bottom of the inner side of the supporting block (53) are fixedly connected with mounting ears (10).

6. The cleaning structure of a chip inspection apparatus according to claim 1, characterized by: The surface of the reciprocating lead screw (42) is movably sleeved with a bearing base (11), and the bottom of the bearing base (11) is fixedly connected with the top of the microscope body (1).

Images