Position limiting jig and testing device
By using the ring positioning element and guide flaring structure of the limiting fixture, the problems of pin collision and probe displacement in semiconductor product testing are solved, reducing product scrap rate and production cost.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JIGUANG SEMICON (SHAOXING) CO LTD
- Filing Date
- 2025-08-18
- Publication Date
- 2026-07-28
AI Technical Summary
In existing technologies, during the semiconductor product testing process, the test pins are easily damaged by collisions and the test probes are easily displaced, resulting in a high product scrap rate and increased production costs.
A limiting fixture is provided, including an annular positioning element. The design of the positioning part and the mounting part ensures the relative position of the test probe and the pin to be tested. The flange structure is used to axially limit the test probe, and the position of the pin to be tested is corrected by the guide flaring structure to prevent collision and displacement.
It effectively blocks the path of the tested pin into the gap, reduces the risk of collision damage, reduces product scrap rate, and reduces production costs.
Smart Images
Figure CN224569200U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of semiconductor product testing, specifically to a limiting fixture and testing device. Background Technology
[0002] Test probes are essential tools for testing semiconductor products, capable of detecting various parameters such as electrical signals, power, and temperature. By contacting the pins on the product under test, test probes can quickly and accurately acquire data, thereby evaluating the product's quality and performance. The use of test probes significantly improves the efficiency and accuracy of product testing, which is of great importance to semiconductor manufacturing.
[0003] like Figure 1 As shown, in the prior art, a fixture is needed to limit the position of the pin 2 under test to ensure the relative position of the test probe 1 and the pin 2 under test. This fixture has a positioning structure 3 on the outside of the test probe 1, which limits the front-back, left-right, and right-side positions of the pin 2 under test. Currently, the positioning structure 3 does not cover the test probe 1, leaving a gap between them. Theoretically, the pin 2 under test should not be allowed to enter the outside of the test probe 1 through this gap.
[0004] However, in actual use, the pin 2 being tested can easily enter the gap area between the test probe 1 and the positioning structure 3, causing... Figure 2 and Figure 3 The problem is as shown. Specifically, when the tested pin 2 deviates in position, it will collide with the positioning structure 3 and the test probe 1 (see...). Figure 2 (Part a surrounded by dotted lines) causes severe scratches and copper leakage; after the tested pin 2 enters the gap area, it will also knock the test probe 1 askew, affecting the test; after long-term use, the test probe 1 is also prone to tilting, increasing the gap and making it easier for the tested pin 2 to insert into the gap area, causing severe scratches (see...). Figure 3 (Part b, enclosed by the dashed line). These problems significantly increase product scrap rates and product manufacturing costs. Utility Model Content
[0005] The purpose of this application is to provide a limiting fixture and a testing device to solve the problems of easy collision damage to the test pins and easy displacement of the test probes during the testing process of semiconductor products.
[0006] To achieve the above objectives, based on one aspect of this application, a limiting fixture is provided, which includes an annular positioning element; the positioning element includes a positioning part and a mounting part arranged along its own axial direction; the opening of the positioning part is provided with a test hole and a positioning hole along the axial direction; the test hole accommodates the pin to be tested; the positioning hole accommodates the test probe; a flange is formed at the connection between the test hole and the positioning hole; the axial end face of the flange abuts against the top edge of the test probe.
[0007] In some embodiments, the circumferential wall of the test hole starts from its connection with the positioning hole and gradually expands radially away from the positioning hole to form a guide flare structure.
[0008] In some embodiments, the circumferential wall of the test hole starts from its connection with the positioning hole and extends in an involute, parabola, or arc in a direction away from the positioning hole to form the guide flare structure.
[0009] In some embodiments, the positioning part is detachably connected to the mounting part.
[0010] In some embodiments, the positioning part is made of plastic, or the surface of the positioning part is covered with plastic.
[0011] In some embodiments, the plastic is Teflon.
[0012] In some embodiments, a gap is provided between the circumferential wall of the positioning hole and the test probe.
[0013] In some embodiments, the positioning element is a circumferentially closed ring structure, and / or the limiting fixture includes one or more of the positioning portions.
[0014] To achieve the above objectives, based on another aspect of this application, a testing apparatus is also provided, which is provided with any of the limiting fixtures described in any one of the claims.
[0015] In some embodiments, the testing apparatus further includes a circuit board, on which the test probe and the mounting portion are both disposed, and one or more of the limiting fixtures are disposed on the circuit board.
[0016] As described above, this application provides a limiting fixture, which includes an annular positioning element; the positioning element includes a positioning part and a mounting part arranged along its own axial direction; the opening of the positioning part is provided with a test hole and a positioning hole along the axial direction; the test hole accommodates the pin to be tested; the positioning hole accommodates the test probe; a flange is formed at the connection between the test hole and the positioning hole; the axial end face of the flange abuts against the axial end face of the test probe.
[0017] This configuration serves two purposes: firstly, by using positioning elements to form a physical barrier against the test probe, effectively blocking the path of the tested pin entering the gap and colliding; secondly, by using positioning elements to axially limit the test probe, reducing the risk of test probe displacement. Ultimately, this reduces the risk of collision damage to the tested pin, thereby reducing product scrap rate and manufacturing costs.
[0018] Furthermore, the circumferential wall of the test hole begins at its connection with the positioning hole and gradually expands radially away from the positioning hole, forming a guide flare structure. This design, through the guide flare structure, corrects the position of the pin being tested, ensuring that the pin accurately enters the test hole and further reducing the risk of pin collision.
[0019] Since the testing device provided in this application and the limiting fixture provided in this application belong to the same inventive concept, the testing device provided in this application has at least all the advantages of the limiting fixture provided in this application, and will not be repeated here. Attached Figure Description
[0020] Those skilled in the art will understand that the accompanying drawings are provided to better understand this application and do not constitute any limitation on the scope of this application.
[0021] Figure 1 This is a schematic diagram of an application scenario in existing technology where the test probe contacts the pin being tested.
[0022] Figure 2 This is a diagram illustrating the usage state of the tested pin in the existing technology, where the pin's position deviates and it collides with the test probe, causing severe scratches.
[0023] Figure 3 This is a diagram showing the usage state of existing technology where the test probe becomes misaligned after prolonged use, causing severe abrasion in the insertion gap area of the tested pin;
[0024] Figure 4 This is a schematic diagram of the axial cross-sectional structure of the limiting fixture provided according to the embodiments of this application;
[0025] Figure 5 This is a usage diagram of the limiting fixture provided according to the embodiments of this application.
[0026] Explanation of reference numerals in the attached figures:
[0027] 1-Test probe, 2-Pin under test, 3-Positioning structure, 10-Positioning element, 110-Positioning part, 111-Test hole, 112-Positioning hole, 113-Flange, 130-Mounting part, 20-Circuit board. Detailed Implementation
[0028] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that the illustrations provided in this embodiment are only schematic representations of the basic concept of this application. Therefore, the drawings only show components related to this application and are not drawn according to the actual number, shape, and size of components in the implementation. In actual implementation, the type, quantity, and proportion of each component can be arbitrarily changed, and the component layout may also be more complex.
[0029] Furthermore, while each embodiment described below possesses one or more technical features, this does not imply that users of this application must simultaneously implement all technical features in any embodiment, or can only separately implement some or all technical features in different embodiments. In other words, where implementation is possible, those skilled in the art can selectively implement some or all of the technical features in any embodiment, or selectively implement a combination of some or all of the technical features in multiple embodiments, based on the disclosure of this application and depending on design specifications or implementation requirements, thereby increasing the flexibility in implementing this application.
[0030] As used herein, the singular forms “a,” “an,” and “the” include plural objects, and the plural form “multiple” includes two or more objects, unless otherwise expressly indicated. As used herein, the term “or” is generally used to include the meaning of “and / or,” unless otherwise expressly indicated, and the terms “installed,” “connected,” and “linked” should be interpreted broadly, for example, as a fixed connection, a detachable connection, or an integral connection. Connections can be mechanical or electrical. Connections can be direct or indirect through an intermediate medium, and can represent internal communication between two elements or an interaction between two elements. Relational terms such as “first,” “second,” and “third,” etc., are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations, nor do they indicate relative importance or implicitly specify the number of indicated technical features. Those skilled in the art will understand the specific meaning of the above terms in this application according to the specific circumstances. In this article, the term "radial" refers to the direction of a part / component perpendicular to its own central axis, "axial" refers to the direction of a part / component parallel to its own central axis, and "circumferential" refers to the direction of a part / component around its own central axis.
[0031] To make the objectives, advantages, and features of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings. It should be noted that the drawings are all in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of this application.
[0032] The purpose of this application is to provide a limiting fixture and a testing device to solve the problems of easy collision damage to the test pins and easy displacement of the test probes during the testing process of semiconductor products.
[0033] It should be clarified that the testing device provided in this application can test any type of semiconductor product, such as but not limited to semiconductor plastic-encapsulated products, especially applicable to all plastic-encapsulated products, and suitable for various types of testing, such as module testing, aging testing, etc.
[0034] As an example, the test apparatus provided in this application is a power module test board for testing power modules. Of course, it is not limited to this in practice.
[0035] Figure 4 This is a schematic diagram of the axial cross-sectional structure of the limiting fixture provided according to the embodiments of this application. Figure 5 This is a diagram illustrating the usage state of the limiting fixture provided according to an embodiment of this application. For example... Figures 4-5 As shown, this application embodiment provides a limiting fixture, including: an annular positioning element 10. Since the positioning element 10 is annular, it defines an axially penetrating opening.
[0036] Furthermore, the positioning element 10 includes a positioning part 110 and a mounting part 130 arranged along its own axial direction. The positioning element 10 needs to be fixed to the circuit board 20 via the mounting part 130, and the circuit board 20 is the test board. The positioning element 10 also ensures the relative position of the test probe 1 and the tested pin 2 through the positioning part 110.
[0037] Unlike existing technologies, in various embodiments of this application, the opening of the positioning part 110 is provided with a test hole 111 and a positioning hole 112 along the axial direction, and the test hole 111 and the positioning hole 112 are usually arranged coaxially. The size of the test hole 111 can be set according to the size of the pin 2 being tested. Preferably, the size of the test hole 111 can be compatible with different sizes of pins 2 being tested. The size of the positioning hole 112 is determined according to the size of the test probe 1. Preferably, the size of the positioning hole 112 is adapted to different sizes of test probes 1.
[0038] like Figure 5As shown, in use, the test hole 111 accommodates and limits the pin 2 under test, while the positioning hole 112 accommodates and limits the test probe 1. Thus, the positional accuracy of the pin 2 under test is ensured by the test hole 111, and the positional accuracy of the test probe 1 is ensured by the positioning hole 112.
[0039] Meanwhile, the radial depth of the positioning hole 112 at the connection is greater than the radial depth of the test hole 111 at the connection, thereby forming a flange 113 at the connection between the test hole 111 and the positioning hole 112, and the axial end face of the flange 113 is the stepped surface.
[0040] refer to Figure 5 After the test probe 1 is fixed on the circuit board 20, the flange 113 can axially limit the test probe 1, preventing it from shifting left, right, forward, or backward. Specifically, the axial end face of the flange 113 is abutted against the top edge of the test probe 1, so that the top of the test probe 1 directly abuts against the flange 113, directly correcting and limiting the position of the test probe 1, effectively suppressing the shift of the test probe 1 and its tilting after long-term use. Furthermore, since the flange 113 completely covers the test probe 1 (see...), Figure 5 The dotted line surrounding section d blocks the path between the tested pin 2 and the positioning part 110 and the test probe 1, thereby avoiding the risk of collision during entry. Thus, this application reduces the risk of collision damage to the tested pin 2, thereby reducing product scrap rate and manufacturing costs.
[0041] In actual use, the axial contact accuracy (e.g., flatness) and preload of the flange 113 and the top surface of the test probe 1 need to be set according to the requirements of the test probe 1's load and lifespan, for example, flatness ≤ 0.02 mm, preload 0.2~0.5 N. Furthermore, this application does not limit the specific type or size of the tested pin 2 and the test probe 1.
[0042] Furthermore, this application embodiment also provides a testing device, which is equipped with the limiting fixture provided in this application embodiment. The testing device may have one or more limiting fixtures, and the multiple limiting fixtures are independently configured.
[0043] The testing apparatus in this embodiment further includes a circuit board 20, and both the test probe 1 and the positioning element 10 are disposed on the circuit board 20. Specifically, the bottom of the test probe 1 is disposed on the circuit board 20, and the end of the mounting portion 130 of the positioning element 10 away from the positioning portion 110 is disposed on the circuit board 20. One or more limiting fixtures may be disposed on the circuit board 20. Since this application does not involve structural improvements to the circuit board 20, those skilled in the art can understand the structure and function of the circuit board 20 by referring to the prior art.
[0044] like Figures 1 to 3 As shown, in the prior art, the positioning structure 3 is a right-angle structure near the inner surface of the pin 2 being tested. Collisions can easily cause severe scratches, leading to copper leakage and scrapping of the pin 2 being tested.
[0045] To address this technical problem, in some embodiments of this application, the test hole 111 is constructed as a flared opening. Specifically, the circumferential wall of the test hole 111 begins at its connection with the positioning hole 112 and gradually expands radially away from the positioning hole 112, forming a guide flared structure, i.e., a flared design. This guide flared structure can correct the position of the tested pin 2, guiding the tested pin 2 to accurately enter the test hole 111, thereby reducing the risk of collision of the tested pin 2. Even if the tested pin 2 collides with the test hole 111, it will not cause serious scratches.
[0046] In some embodiments, the circumferential wall of the test hole 111 extends from its connection with the positioning hole 112 in an involute, parabola, or arc direction away from the positioning hole 112 to form the guide flare structure.
[0047] Specifically, in this embodiment, the circumferential wall of the test hole 111 extends in an arc from its connection with the positioning hole 112, away from the positioning hole 112, to form the guide flare structure. This structure is simple and easy to manufacture. When the circumferential wall of the test hole 111 is an arc-shaped structure or a circular arc structure, its radius of curvature and angle can be adjusted and configured as needed, and this application is not limited in this regard.
[0048] To improve operability, in some embodiments, the positioning part 110 and the mounting part 130 are detachably connected. Thus, the positioning part 110 and the mounting part 110 adopt a separate design, but are assembled into a whole through a suitable method. This arrangement allows the positioning part 110 to be disassembled and installed separately, facilitating both the limiting of the test probe 1 to ensure fitting accuracy and easy replacement of the positioning part 110. The positioning part 110 can be one or more specifications; different specifications of the positioning part 110 are suitable for different products, increasing the versatility of the limiting fixture and significantly reducing testing costs.
[0049] The material of the positioning part 110 is not limited, such as, but not limited to, plastic. Further, the positioning part 110 is made of a plastic that is anti-static, wear-resistant, insulating, and neither too soft nor too hard.
[0050] In one example, the positioning part 110 is entirely made of plastic. In other examples, the surface of the positioning part 110 is covered with plastic. Preferably, the plastic is Teflon, i.e., polytetrafluoroethylene.
[0051] Furthermore, since the test probe 1 often needs to be floating during operation, in some embodiments, a radial clearance is provided between the circumferential wall of the positioning hole 112 and the test probe 1. This clearance allows the test probe 1 to move radially slightly, ensuring its adaptive positioning. The size of this clearance is adjustable according to the test accuracy and test environment, for example, ±0.2 mm.
[0052] Furthermore, the positioning element 10 is preferably a circumferentially closed annular structure, which can fully surround the measured pin 2, providing a good limiting effect. However, the shape of the positioning element 10 can be a ring shape or other shapes. In short, the shape of the positioning element 10 is adjusted according to the shape of the workpiece.
[0053] In summary, this application provides a limiting fixture and a testing device, which have at least the following beneficial effects:
[0054] First, by having the top of the test probe 1 abut against the flange 113 of the positioning part 110, the test probe 1 is effectively limited, preventing the test probe 1 from moving or shaking.
[0055] Second, the flange 113 of the positioning part 110 covers the test probe 1, avoiding gaps between the positioning part 110 and the test probe 1, thereby avoiding the risk of the tested pin 2 entering the gap area and causing collision due to design tolerances, the tested pin 2 or the offset of the test probe 1.
[0056] Third, the position of the test pin 2 is corrected by the flared design of the test hole 111, which ensures that the test pin 2 can accurately enter the test hole 111, thereby reducing the risk of collision and indirectly reducing the risk of collision scratches.
[0057] It is worth noting that existing technologies can control the relative position of the tested pin 2 and the test probe 1 by improving the precision of the fixture, thereby reducing the risk of collision. However, after long-term use, wear at the positioning position can still cause collision scratches. In contrast, the embodiment of this application achieves a long-term solution to this problem by using a positioning element to cover and limit the test probe 1, thus demonstrating good practical results.
[0058] It should be understood that the above embodiments specifically disclose the features of the preferred embodiments of this application, enabling those skilled in the art to better understand this application. Those skilled in the art should understand that, based on the disclosure of this application, appropriate modifications can be easily made to this application to achieve the same purpose and / or the same advantages as the embodiments disclosed in this application. Those skilled in the art should also recognize that such similar structures do not depart from the scope of this application, and that they can be changed, substituted, and modified in various ways without departing from the scope of this application.
Claims
1. A limiting fixture, characterized in that, The device includes an annular positioning element; the positioning element includes a positioning part and a mounting part arranged along its own axial direction; the opening of the positioning part is provided with a test hole and a positioning hole along the axial direction; the test hole accommodates the pin to be tested; the positioning hole accommodates the test probe; a flange is formed at the connection between the test hole and the positioning hole; the axial end face of the flange abuts against the top edge of the test probe.
2. The limiting fixture according to claim 1, characterized in that, The circumferential wall of the test hole starts from its connection with the positioning hole and gradually expands radially away from the positioning hole to form a guide flared structure.
3. The limiting fixture according to claim 2, characterized in that, The circumferential wall of the test hole starts from its connection with the positioning hole and extends in an involute, parabola, or arc in a direction away from the positioning hole to form the guide flare structure.
4. The limiting fixture according to claim 1 or 2, characterized in that, The positioning part is detachably connected to the mounting part.
5. The limiting fixture according to claim 4, characterized in that, The positioning part is made of plastic, or the surface of the positioning part is covered with plastic.
6. The limiting fixture according to claim 5, characterized in that, The plastic is Teflon.
7. The limiting fixture according to claim 1 or 2, characterized in that, A gap is provided between the circumferential hole wall of the positioning hole and the test probe.
8. The limiting fixture according to claim 1 or 2, characterized in that, The positioning element is a circumferentially closed ring structure, and / or the limiting fixture includes one or more of the positioning parts of the same specification.
9. A testing device, characterized in that, The device is provided with a limiting fixture as described in any one of claims 1-8.
10. The testing apparatus according to claim 9, characterized in that, It also includes a circuit board, on which the test probe and the mounting part are both disposed, and one or more of the limiting fixtures are disposed on the circuit board.