Connector for facilitating testing, electronic device and detection system of electronic device

Abstract

The utility model relates to a connector convenient for testing, electronic device and detection system of electronic device. The connector contains the shell and a plurality of pins. The shell has detection surface, these pins are arranged in the shell and respectively along the first direction extension, and these pins are along the second direction interval setting different from the first direction. The detection surface of shell has a plurality of detection holes, these detection holes are along the second direction interval setting and respectively expose these pins.

Description

[0001] This application claims priority to Chinese Patent Application No. 202411422466.0, filed on October 11, 2024, entitled "Connector, Electronic Device, Detection System and Detection Method for Easy Testing", the entire contents of which are incorporated herein by reference. Technical Field

[0002] This utility model relates to a connector that is easy to test, an electronic device including the aforementioned connector, and a testing system for the aforementioned electronic device. Background Technology

[0003] Currently, the main methods for testing the electrical connection between connectors and electronic components are either pre-installing test points on the circuit board or manually plugging and unplugging flexible wires. However, with the increasing miniaturization of electronic devices and the limited area of ​​circuit boards, setting up test points has become more difficult. Furthermore, signal attenuation can occur when running wires from the connector connection point to the test point, leading to inaccurate testing. In addition, manually plugging and unplugging flexible wires can damage the connector and reduce testing efficiency. Utility Model Content

[0004] At least one embodiment of this utility model provides a connector that is easy to test, which can improve the accuracy and efficiency of testing.

[0005] At least one other embodiment of the present invention provides an electronic device including the aforementioned connector, a detection system for the aforementioned electronic device, and a detection method thereof, which can improve the accuracy and efficiency of detection.

[0006] The connector for easy testing, as proposed in at least one embodiment of this utility model, includes a housing and a plurality of pins. The housing has a detection surface, and the pins are disposed within the housing and each extends along a first direction, and the pins are spaced apart along a second direction different from the first direction. The detection surface has a plurality of detection holes, which are spaced apart along the second direction and expose the pins respectively.

[0007] In at least one embodiment of the present invention, the plurality of detection holes include a plurality of first row detection holes arranged in a row along a second direction and a plurality of second row detection holes arranged in a row along a second direction, wherein the first row detection holes and the second row detection holes are arranged at intervals along a first direction.

[0008] In at least one embodiment of the present invention, there is an arrangement spacing between two adjacent first row detection holes and between two adjacent second row detection holes along the second direction, and there is a set spacing between two adjacent pins along the second direction, and the arrangement spacing is twice the set spacing.

[0009] In at least one embodiment of the present invention, each pin has a first width, and each detection hole has a diameter, the diameter of which is greater than the first width.

[0010] In at least one embodiment of the present invention, the connector further includes a plurality of detection parts, which are respectively disposed in a plurality of detection holes and electrically connected to a plurality of pins.

[0011] In at least one embodiment of the present invention, each detection part has a second width, and the second width is greater than the first width.

[0012] In at least one embodiment of the present invention, each detection part extends from the pin to the detection surface.

[0013] The electronic device proposed in at least another embodiment of the present invention includes the aforementioned connector for easy testing and electronic components electrically connected to the aforementioned connector for easy testing.

[0014] The electronic device testing system according to at least another embodiment of this utility model includes a stage and a probe module. The stage is used to place the electronic device and move it along a transport direction. The probe module is disposed on one side of the stage, with multiple test holes of the aforementioned connector facing the probe module. The probe module moves along the testing direction to electrically connect to multiple pins of the connector.

[0015] In at least another embodiment of this invention, the detection direction is perpendicular to the transport direction.

[0016] In at least another embodiment of the present invention, the detection system for the electronic device further includes a sensor for sensing the detection position of the electronic device.

[0017] In at least another embodiment of the present invention, the probe module is further used to detect electrical signals of electronic devices.

[0018] In at least another embodiment of the present invention, the detection system for electronic devices further includes a sorting module, which, based on the detection results of each electronic device, distinguishes each electronic device into a good product or a defective product.

[0019] The method for detecting electronic devices according to at least another embodiment of this utility model includes the following steps: placing the electronic device on a platform; moving the electronic device along the transport direction; stopping the platform after the sensor detects that the electronic device has reached the detection position, and stopping the electronic device at the detection position; moving the probe module along the detection direction and electrically connecting it to multiple pins through multiple detection holes of the connector; generating detection results for the electronic device; and classifying each electronic device into a good product or a defective product based on the detection results of each electronic device.

[0020] In at least another embodiment of this invention, the detection direction is perpendicular to the transport direction.

[0021] In at least another embodiment of this invention, the detection result is the detection electrical signal obtained by the probe module.

[0022] In at least another embodiment of this invention, the electronic device is a lamp board, and the detection result is the light emission result obtained by the charge-coupled device detecting the lamp board.

[0023] In the connector and electronic device including the connector proposed in at least one embodiment of this utility model, the connector housing has a plurality of spaced-apart test holes on its test surface. The connector pins extend along a first direction and are exposed on the connector housing, while the probe can extend into the test holes from the outside along a test direction different from the first direction to complete the test operation. In this way, not only can the cost of conventionally additional testing of flat cables be saved, but the conventional testing process of flat cables and pin insertion / removal can also be eliminated, thereby achieving the effect of simplifying the testing process.

[0024] Furthermore, the electronic device testing system and method proposed in at least another embodiment of this utility model can be used to test electronic devices, such as light boards, that include the aforementioned easy-to-test connectors. When these light boards are applied to the production line of the testing system and method, since the pin extension direction of the connector of the aforementioned electronic device is different from the probe detection direction, multiple electronic devices to be tested can directly complete the electrical connection between the probe and the connector pins in one station on the production line, without having to move or flip the electronic devices to be tested in other stations, thereby improving the testing efficiency. Attached Figure Description

[0025] To make the above and other objects, features, advantages and embodiments of this utility model more readily understood, the accompanying drawings are now described as follows.

[0026] Figure 1A This is a top view schematic diagram of a connector according to an embodiment of the present invention.

[0027] Figure 1B yes Figure 1A A schematic cross-sectional view along line A-A'.

[0028] Figure 2A This is a top view schematic diagram of a connector according to another embodiment of the present invention.

[0029] Figure 2B yes Figure 2A A schematic cross-sectional view along line B-B'.

[0030] Figure 3 This is a schematic diagram of an electronic device according to another embodiment of the present invention.

[0031] Figure 4 This is a schematic diagram of the detection system of an electronic device according to another embodiment of the present invention.

[0032] Figure 5 This is a flowchart of a detection method for an electronic device according to another embodiment of the present invention. Detailed Implementation

[0033] In the following description, to clearly present the technical features of this utility model, the dimensions (e.g., length, width, thickness, and depth) of the elements (e.g., layers, films, substrates, and regions) in the accompanying drawings will be enlarged proportionally, and the number of some elements may be reduced. Therefore, the description and explanation of the embodiments below are not limited to the number of elements in the drawings or the size and shape of the elements, but should cover the size, shape, and deviations from both caused by actual manufacturing processes and / or tolerances. For example, a flat surface shown in the drawings may have rough and / or non-linear characteristics, and an acute angle shown in the drawings may be rounded. Therefore, the elements presented in the accompanying drawings of this utility model are mainly for illustration and are not intended to accurately depict the actual shape of the elements, nor are they intended to limit the scope of the patent application of this utility model.

[0034] Secondly, the terms "approximately," "approximately," or "substantially" used in this invention not only cover explicitly stated numerical values ​​and ranges, but also the permissible deviation range understood by those skilled in the art to which this invention pertains. This deviation range can be determined by errors generated during measurement, which may arise from limitations of the measurement system or process conditions, for example. For instance, two objects (e.g., planes or traces of a substrate) are "substantially parallel" or "substantially perpendicular," where "substantially parallel" and "substantially perpendicular" respectively represent that the parallelism and perpendicularity between the two objects can include non-parallelism and non-perpendicularity caused by permissible deviation ranges.

[0035] The spatial relative terms used in this invention, such as "below," "under," "above," and "above," are intended to facilitate the description of the relative relationship between one element or feature and another, as illustrated in the figures. The true meaning of these spatial relative terms includes other orientations. For example, when the illustration is rotated 180 degrees vertically, the relationship between one element and another may change from "below" or "under" to "above" or "above." Furthermore, the spatial relative descriptions used in this invention should be interpreted in the same way.

[0036] It should be understood that although the present invention may use terms such as "first," "second," and "third" to describe various elements or features, these elements or features should not be limited by these terms. These terms are primarily used to distinguish one element from another, or one feature from another. Furthermore, the term "or" as used in the present invention may, as appropriate, include any combination of one or more of the associated listed items.

[0037] Although this invention uses a series of operations or steps to illustrate the detection method, the order in which these operations or steps are shown should not be construed as a limitation of this invention. For example, some operations or steps may be performed in a different order and / or simultaneously with other steps. Furthermore, each operation or step described herein may include several sub-steps or sub-actions.

[0038] Furthermore, this utility model can be implemented or applied through other different specific embodiments, and various details of this utility model can also be combined, modified and changed based on different viewpoints and applications without departing from the concept of this utility model.

[0039] Please see Figure 1A The connector 100 includes a housing 102 and a plurality of pins 104. The housing 102 has a detection surface DS, and the pins 104 are disposed in the housing 102 and each extends along a first direction D1, and the pins 104 are spaced apart along a second direction D2 different from the first direction D1. The detection surface DS has a plurality of detection holes O, which are spaced apart along the second direction D2 and expose the pins 104 respectively.

[0040] Since the detection surface DS of the housing 102 of the connector 100 has detection holes O, and the pins 104 extend along the first direction D1 and are exposed to the housing 102 of the connector 100 through these detection holes O, during testing, the detection holes O face the probe module. The probe module can then be electrically connected to the pins 104 through the detection holes O along a detection direction different from the first direction D1 to generate test results. Therefore, there is no need to reserve test points on the circuit board or manually insert and remove flexible wires for conventional testing procedures, thereby simplifying the testing process and improving the accuracy and efficiency of testing. In addition, by setting the detection holes O, the probe detection range can be limited, which helps the probe alignment and improves the accuracy of testing.

[0041] In some embodiments, the second direction D2 is substantially perpendicular to the first direction D1, and the third direction D3 is substantially perpendicular to both the first direction D1 and the second direction D2. The detection hole O overlaps with the pin 104 on the third direction D3 to expose the pin 104.

[0042] like Figure 1AAs shown, the plurality of detection holes O includes a plurality of first row detection holes O1 arranged in a row along the second direction D2 and a plurality of second row detection holes O2 arranged in a row along the second direction D2, with the first row detection holes O1 and the second row detection holes O2 spaced apart along the first direction D1. This design allows for an appropriate spacing between the first row detection holes O1 and the second row detection holes O2. On the one hand, it avoids situations where the detection holes are too densely packed, causing difficulties in probe alignment or short circuits, thereby improving detection accuracy. On the other hand, it avoids the problem of insufficient structural strength of the outer shell between the first row detection holes O1 and the second row detection holes O2.

[0043] There is an arrangement spacing P1 between two adjacent first row detection holes O1 along the second direction D2, an arrangement spacing P2 between two adjacent second row detection holes O2 along the second direction D2, and a setting spacing P3 between two adjacent pins 104 along the second direction D2. Both arrangement spacings P1 and P2 are twice the setting spacing P3. This design, based on the aforementioned relationship between arrangement spacings P1, P2, and setting spacing P3, helps ensure sufficient detection space for probes to perform detection operations. It effectively avoids situations where detection holes are too densely packed, causing difficulty in probe alignment or short circuits, thereby improving detection accuracy.

[0044] Please continue reading. Figure 1A The housing 102 has a first connection side E1 and a second connection side E2 opposite to each other along a first direction D1. The first connection side E1 is located at one end of the opposite ends of the detection surface DS along the first direction D1. The connector 100 can electrically connect electronic components on the first connection side E1 and electrically connect flexible wires on the second connection side E2. For example, the pin 104 extends out of the first connection side E1 to electrically connect electronic components. The cover 102C is located on the second connection side E2 of the housing 102. The cover 102C can be lifted in a third direction D3 to insert flexible wires before closing.

[0045] Please see Figure 1B The pin 104 has a first width W1 in the second direction D2, and the detection hole O has a diameter R in the second direction D2, with the diameter R being greater than the first width W1. By designing the relationship between the diameter R of the detection hole O and the first width W1 of the pin 104, the probe can be guided through the detection hole O with the larger diameter R before being aligned with the pin 104, thereby improving the accuracy of the detection.

[0046] Please see Figure 2A , Figure 2A Implementation examples and Figure 1A The embodiments have the same structure and relative positional relationship of elements with the same reference numerals, so they will not be described again here. The difference between the two embodiments is that... Figure 2AThe connector 100A further includes a plurality of detection parts 106, which are respectively disposed in the detection holes O and electrically connected to the pins 104. In some embodiments, the materials of the pins 104 and the detection parts 106 may both be metals, such as copper, to ensure that the detection process is not affected by differences in material resistance, thereby improving the accuracy of the detection.

[0047] Please see Figure 2B The detection section 106 has a second width W2 in the second direction D2, and the second width W2 is greater than the first width W1 of the pin 104. By providing the detection section 106, the probe can perform detection after directly contacting the detection section 106, which has a larger width and is electrically connected to the pin 104, thereby reducing the alignment accuracy requirements between the probe and the pin 104 and improving the accuracy and efficiency of detection.

[0048] In some embodiments, the detection section 106 may fill the detection hole O, meaning that the second width W2 of the detection section 106 is substantially equal to the aperture R of the detection hole O. In other embodiments, the detection section 106 may not fill the detection hole O, meaning that the second width W2 of the detection section 106 is smaller than the aperture R of the detection hole O.

[0049] Furthermore, the detection section 106 can extend from the pin 104 to the detection surface DS, that is, the detection section 106 extends from the pin 104 along the third direction D3 to the detection surface DS. With the aforementioned extension design, the pin 104 extends from inside the housing 102 toward the first connection side E1 and is exposed outside the housing 102, allowing the probe to directly contact the detection section 106 on the detection surface DS to make an electrical connection with the pin 104 and then perform detection, thereby improving the accuracy and efficiency of detection. It can also allow the probe to perform detection operations from different surfaces of the connector 100.

[0050] like Figure 2B As shown, the thickness of the detection section 106 in the third direction D3 is substantially equal to the depth of the detection hole O in the third direction D3, but this invention is not limited thereto. In other embodiments, the thickness of the detection section 106 in the third direction D3 may be less than or greater than the depth of the detection hole O in the third direction D3.

[0051] Please see Figure 3 The electronic device 10 includes at least one of the connectors 100 and 100A, and an electronic component 200 electrically connected to at least one of the connectors 100 and 100A. In some embodiments, the electronic device 10 may be a lamp panel, such as a lamp panel used in a vehicle, but the present invention is not limited thereto. For example, the electronic component 200 includes multiple LEDs.

[0052] Please see Figure 4The detection system 1 for the electronic device 10 includes a stage 20 and a probe module 40. The stage 20 is used to place the electronic device 10 and move the electronic device 10 along the transport direction TD. The probe module 40 is disposed on one side of the stage 20, with the detection hole O of at least one of the connectors 100 and 100A facing the probe module 40. The probe module 40 moves along the detection direction DD to electrically connect to the pin 104 of at least one of the connectors 100 and 100A.

[0053] Since at least one of the detection holes O of connectors 100 and 100A faces the probe module 40 of the detection system 1, the probe module 40 can be electrically connected to the pin 104 through the detection hole O to generate a detection result. For example, the probe module 40 can directly contact the pin 104 exposed through the detection hole O of connector 100 to generate a detection result, or the probe module 40 can directly contact the detection part 106 electrically connected to the pin 104 in the detection hole O of connector 100A to generate a detection result. Therefore, there is no need to reserve test points on the circuit board or manually insert and remove flexible wires for testing, thereby improving the accuracy and efficiency of the detection system 1.

[0054] like Figure 4 As shown, the detection direction DD is substantially perpendicular to the transport direction TD. That is, after the electronic device 10 moves to the detection position along the transport direction TD, it can directly accept the detection of the probe module 40 without any further turning action, which can effectively improve the efficiency of the detection system 1. In some embodiments, the detection direction DD is opposite to the direction in which the detection part 106 of the connector 100A extends from the pin 104 to the detection surface DS, that is, the detection direction DD is opposite to the third direction D3.

[0055] For example, the detection system 1 of the present invention for electronic device 10 can be used to detect electronic devices 10 including at least one of connectors 100 and 100A, such as light boards. When these light boards are applied to the production line of the above-mentioned detection method, since the extension direction (such as the first direction D1) of the pins 104 of connectors 100 and 100A is different from the probe detection direction DD, multiple electronic devices 10 to be tested can directly complete the electrical connection between the probe module 40 and the pins 104 of connectors 100 and 100A in one station on the production line, without having to move or flip the electronic devices 10 to be tested in other stations, thereby improving the detection efficiency.

[0056] The detection system 1 further includes a sensor 30, which is used to sense the detection position of the electronic device 10. This eliminates the need for manual identification of the detection position, allowing automated equipment to sense the detection position and thus improving the accuracy and efficiency of the detection system 1. In some embodiments, the sensor 30 may include at least one of an image sensor 31 and an interruption sensor 32. For example, the image sensor 31 can determine whether the electronic device 10 has reached the detection position by capturing an image of the electronic device 10, while the interruption sensor 32 can determine whether the electronic device 10 has reached the detection position by using an interruption signal. This then drives the probe module 40 to detect the connectors 100 and 100A, thereby ensuring smooth operation of the entire production line.

[0057] The detection system 1 further includes a sorting module 50, which classifies each electronic device 10 into good or defective products based on the detection results. This eliminates the need for manual identification of the detection results, as automated equipment classifies them according to the detection results, thereby improving the accuracy and efficiency of the detection system 1. In some embodiments, the sorting module 50 may include at least one of an electrical signal judgment module 51 and a brightness judgment module 52.

[0058] For example, the electrical signal judgment module 51 can use the detection electrical signal of the electronic device 10 obtained by the probe module 40 as the detection result to determine whether the electronic device 10 meets the specifications and classify the electronic device 10 as a good or defective product. For example, after the probe of the probe module 40 is electrically connected to the pin 104 of the connector 100, 100A, it can be directly determined whether a normal electrical signal circuit has been formed. The brightness judgment module 52 may include a charge-coupled device 60, which determines whether the electronic device 10 meets the specifications and classifies the electronic device 10 as a good or defective product by detecting the light emission result of the electronic device 10 as a lamp board.

[0059] Please see Figure 4 and Figure 5 The detection method for electronic device 10 includes the following steps S1 to S6. Step S1: Place electronic device 10 on stage 20. Step S2: Move electronic device 10 along the transport direction TD. Step S3: After sensor 30 detects that electronic device 10 has reached the detection position, stop stage 20, stopping electronic device 10 at the detection position. Step S4: Move probe module 40 along detection direction DD and electrically connect it to pin 104 through the detection hole O of at least one of connectors 100 and 100A. Step S5: Electronic device 10 generates a detection result. Step S6: Based on the detection results of each electronic device 10, sorting module 50 classifies each electronic device 10 into good or defective products.

[0060] The above-described detection method utilizes the detection hole O of at least one of the connectors 100 and 100A to face the probe module 40 of the detection system 1, enabling the probe module 40 to be electrically connected to the pin 104 through the detection hole O to generate detection results. Therefore, there is no need to reserve test points on the circuit board or manually insert and remove flexible wires for detection, thereby improving detection accuracy and efficiency.

[0061] In summary, in the connector of at least one embodiment of the present invention, the detection surface of its housing has a plurality of spaced detection holes, which allow a probe to be inserted into the detection holes from the outside along a detection direction different from the extension direction of the pins to complete the detection operation. This not only saves the cost of conventionally additional testing of flat cables, but also eliminates the conventional detection process of flat cables and pin insertion / removal, thereby achieving the effect of simplifying the detection process.

[0062] Furthermore, the electronic device detection system and method according to at least another embodiment of the present invention can be used to detect electronic devices including the aforementioned connectors, such as light boards. When these light boards are applied to the production line of the aforementioned detection system and method, since the pin extension direction of the connector of the aforementioned electronic device is different from the probe detection direction, multiple electronic devices to be tested can directly complete the electrical connection between the probe and the connector pin in one station on the production line, without having to move or flip the electronic devices to be tested in other stations, thereby improving the detection efficiency.

[0063] Therefore, the connectors on existing electronic devices do not require modification of the PCB layout. Only a test hole needs to be opened on the surface of the connector housing facing the test direction. This can achieve the design of this utility model with minimal modification to the original design, thereby saving modification costs, and at the same time achieve the purpose of automated electrical testing. Since the probe and the test hole are easy to align, the testing process can be simplified.

[0064] Although the present invention has been disclosed above with various embodiments, it is not intended to limit the present invention. Anyone skilled in the art should be able to make some modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope defined in the appended claims.

[0065] [List of Labels in the Attached Image] 1: Detection System 10: Electronic devices 20: Platform 30: Sensors 31: Image Sensor 32: Interruption sensor 40: Probe Module 50: Select Module 51: Signal Detection Module 52: Brightness Judgment Module 60: Charge-coupled device 100, 100A: Connectors 102: Shell 102C: Flip-top 104: Foot Connection 106: Testing Department 200: Electronic Components D1: First Direction D2: Second Direction D3: Third direction DD: Detection direction DS: Detection surface E1: First connecting side E2: Second connection side O: Detection hole O1: First row of detection holes O2: Second row of detection holes P1, P2: Spacing P3: Set Spacing R: Aperture S1, S2, S3, S4, S5, S6: Steps TD: Transportation Direction W1: First width W2: Second width.

Claims

1. A connector that is easy to test, characterized in that, include: The housing has a detection surface; as well as Multiple pins are disposed within the housing and each extends along a first direction, and the multiple pins are spaced apart along a second direction different from the first direction. The detection surface has multiple detection holes, which are spaced apart along the second direction and expose the multiple pins respectively.

2. The connector for easy testing according to claim 1, characterized in that, The plurality of detection holes include a plurality of first row detection holes arranged in a row along the second direction and a plurality of second row detection holes arranged in a row along the second direction, wherein the first row detection holes and the second row detection holes are arranged at intervals along the first direction.

3. The connector for easy testing according to claim 2, characterized in that, There is an arrangement spacing between two adjacent first row detection holes and between two adjacent second row detection holes along the second direction, and there is a setting spacing between two adjacent pins along the second direction, and the arrangement spacing is twice the setting spacing.

4. The connector for easy testing according to claim 1, characterized in that, Each of the aforementioned pins has a first width, and each of the aforementioned detection holes has a diameter, wherein the diameter is greater than the first width.

5. The connector for easy testing according to claim 4, characterized in that, Including: Multiple detection units are respectively disposed in the multiple detection holes and electrically connected to the multiple pins.

6. The connector for easy testing according to claim 5, characterized in that, Each of the detection units has a second width, and the second width is greater than the first width.

7. The connector for easy testing according to claim 5, characterized in that, Each of the aforementioned detection units extends from the pin to the detection surface.

8. An electronic device, characterized in that, include: A connector that is easy to test according to any one of claims 1 to 7; as well as Electronic components, which are electrically connected to the connectors that facilitate testing.

9. A detection system for an electronic device, characterized in that, include: A platform for placing the electronic device according to claim 8 and moving the electronic device in the transport direction; as well as A probe module is disposed on one side of the stage, the plurality of test holes of the easy-to-test connector face the probe module, and the probe module moves along the test direction to electrically connect to the plurality of pins of the easy-to-test connector.

10. The detection system for an electronic device according to claim 9, characterized in that, The detection direction is perpendicular to the transportation direction.

11. The detection system for an electronic device according to claim 9, characterized in that, It also includes sensors used to sense the detection location of the electronic device.

12. The detection system for an electronic device according to claim 9, characterized in that, The probe module is further used to detect the electrical signals of the electronic device.

13. The detection system for an electronic device according to claim 9, characterized in that, It also includes a sorting module, which, based on the test results of each electronic device, distinguishes each electronic device as good or defective.

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