Test device and test system applicable thereto

Abstract

The application provides a test device and a test system suitable for the test device. The test device comprises: a current probe sequence comprising a plurality of current probe rows extending along a first direction and sequentially and spacedly distributed along a second direction; and a voltage probe sequence comprising at least two voltage probe rows extending along the first direction and spacedly distributed along the second direction. The voltage probe sequence comprises a first voltage probe row, and the current probe sequence comprises a first current probe row and a second current probe row located on both sides of the first voltage probe row and closest to the first voltage probe row. The first current probe row and the first voltage probe row have a first spacing, and the second current probe row and the first voltage probe row have a second spacing. The ratio of the first spacing to the second spacing is not greater than 1 / 2. The test device can avoid the problem of a false high fill factor test result.

Description

Technical Field

[0001] This application mainly relates to the field of photovoltaic cell performance testing, and in particular to a testing device and its applicable testing system. Background Technology

[0002] In photovoltaic (PV) cell manufacturing, specific testing equipment is required to test the electrical performance of PV cells. Existing testing equipment generally uses probes to perform electrical performance tests on PV cells. PV cells employing OBB (Zero Busbar) technology for electrode design, also known as 0BB cells, eliminate traditional busbar lines, thereby reducing shading area and improving the cell's photoelectric conversion efficiency. However, 0BB cells place higher demands on probe positioning and arrangement during electrical performance testing. Specifically, traditional probe arrangement methods applied to 0BB cells may lead to problems such as poor contact, increased resistance, or cell damage.

[0003] Therefore, there are currently two types of probe arrays used for testing 0BB solar cells on production lines: silver arrays and gold wire arrays. However, both existing testing methods suffer from the problem of artificially inflated fill factor, leading to inaccurate test results. Utility Model Content

[0004] The technical problem to be solved by this application is to provide a testing device and a suitable testing system for accurately measuring the electrical performance parameters of photovoltaic cells.

[0005] To address the aforementioned technical problems, this application provides a testing device suitable for testing photovoltaic cells. The photovoltaic cell has multiple main grid regions extending along a first direction and distributed at equal intervals along a second direction. The testing device includes: a current probe sequence comprising multiple current probe rows extending along the first direction and distributed at intervals along the second direction, each current probe row corresponding to a main grid region; and a voltage probe sequence comprising at least two voltage probe rows extending along the first direction and distributed at intervals along the second direction, each voltage probe row corresponding to a main grid region. The voltage probe sequence includes a first voltage probe row, and the current probe sequence includes a first current probe row and a second current probe row located on both sides of the first voltage probe row and closest to the first voltage probe row on both sides. The first current probe row and the first voltage probe row have a first spacing, and the second current probe row and the first voltage probe row have a second spacing. The ratio of the first spacing and the second spacing is not greater than 1 / 2.

[0006] Optionally, the ratio of the first spacing to the second spacing is not less than 1 / 6.

[0007] Optionally, in the current probe sequence, there is a third spacing between each adjacent current probe row, and the corresponding third spacing between adjacent first and second current probe rows is the maximum value among all third spacings.

[0008] Optionally, the corresponding third spacings between at least some of the sequentially adjacent current probe rows are equal.

[0009] Optionally, the current probe sequence includes a first current probe array and a last current probe array located near two opposite edges of the photovoltaic cell during testing. Each current probe array is symmetrically distributed along an axis of symmetry, which is the axis containing the midpoint between the first and last current probe arrays and extends along a first direction.

[0010] Optionally, the third spacing is further configured such that, among two adjacent third spacings, the third spacing closer to the axis of symmetry is not greater than the third spacing farther from the axis of symmetry.

[0011] Optionally, the first current probe array includes a head current probe array or a tail current probe array near the edge of the photovoltaic cell when testing the photovoltaic cell. The head current probe array is the first current probe array in the current probe sequence, and the tail current probe array is the last current probe array in the current probe sequence.

[0012] Optionally, the first current probe array and the last current probe array correspond to the main grid regions of the two opposite edges closest to the photovoltaic cell, respectively.

[0013] Optionally, in the second direction, the total number of current probes between the two voltage probes is not less than 2.

[0014] Optionally, the current probe array includes gold or silver wires, and / or the voltage probe array includes gold or silver wires.

[0015] Optionally, the testing apparatus is adapted to test the fill factor of photovoltaic cells.

[0016] Optionally, the photovoltaic cells include busbarless photovoltaic cells.

[0017] Optionally, the testing apparatus further includes: a first fixing bracket for fixing one end of each current probe array and each voltage probe array; and a second fixing bracket for fixing the other end of each current probe array and each voltage probe array.

[0018] To address the aforementioned technical problems, this application provides a testing system suitable for testing photovoltaic cells. The photovoltaic cell has multiple main grid regions extending along a first direction and distributed at equal intervals along a second direction. The testing system includes: the aforementioned testing device; and a main control device, which is communicatively connected to the testing device. The main control device is used to acquire test data from the testing device and obtain test results for the photovoltaic cell based on the test data.

[0019] Compared with the prior art, this application has the following advantages: the test device can accurately measure the fill factor of photovoltaic cells by setting the ratio of the first spacing and the second spacing between the voltage probe array and the two adjacent current probe arrays to be not less than 1 / 2, thus solving the problem of falsely high fill factor during the test process; by limiting the ratio of the first spacing and the second spacing to be not greater than 1 / 6, the voltage probe array and the current probe array have an appropriate spacing, avoiding mutual contact and test errors. Attached Figure Description

[0020] The accompanying drawings are included to provide a further understanding of this application; they are incorporated into and constitute a part of this application. The drawings illustrate embodiments of this application and, together with this specification, serve to explain the principles of this application. In the drawings:

[0021] Figure 1 This is a schematic diagram of the structure of a test system according to an embodiment of this application;

[0022] Figure 2 This is a schematic diagram of the structure of a photovoltaic cell according to an embodiment of this application;

[0023] Figure 3 This is a schematic diagram of the structure of a test apparatus according to an embodiment of this application;

[0024] Figure 4 This is a schematic diagram showing the positional relationship of the first voltage probe array, the second current probe array, and the first current probe array in a test apparatus according to an embodiment of this application.

[0025] Figure 5 This is a schematic diagram showing the positional relationship between the front current probe array and the rear current probe array and the main grid region of the photovoltaic cell in a test apparatus according to an embodiment of this application.

[0026] Figure 6 This is a schematic diagram showing the positional relationship between the current probe array and the voltage probe array in a test apparatus according to an embodiment of this application;

[0027] Figures 7 to 13 This is a schematic diagram of the arrangement of current probe arrays and voltage probe arrays in a test apparatus according to different embodiments of this application.

[0028] Figure label:

[0029] Test system 100, test device 10, current probe sequence 11, current probe row 111, first current probe row 112, second current probe row 113, head current probe row 114, tail current probe 115, voltage probe sequence 12, voltage probe row 121, first voltage probe row 122, first fixed bracket 13, second fixed bracket 14, main control device 20, photovoltaic cell 200, main grid area 21, fine grid 22. Detailed Implementation

[0030] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are merely some examples or embodiments of this application. For those skilled in the art, these drawings can be applied to other similar scenarios without creative effort. Unless obvious from the context or otherwise specified, the same reference numerals in the drawings represent the same structures or operations.

[0031] As indicated in this application and claims, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" are not specifically singular and may include plural forms. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0032] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps described in these embodiments do not limit the scope of this application. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items; therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.

[0033] In the description of this application, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0034] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0035] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, these terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application. In addition, although the terminology used in this application is selected from commonly known and used terms, some terms mentioned in this application's specification may have been chosen by the applicant according to his or her judgment, and their detailed meanings are explained in the relevant sections of this description. Moreover, this application should be understood not only through the actual terms used, but also through the meaning implied by each term.

[0036] It should be understood that when a component is referred to as "on another component," "connected to another component," "coupled to another component," or "in contact with another component," it can be directly on, connected to, coupled to, or in contact with that other component, or there may be an intervening component. In contrast, when a component is referred to as "directly on another component," "directly connected to," "directly coupled to," or "directly in contact with" another component, there is no intervening component. Similarly, when a first component is referred to as "electrically contacting" or "electrically coupled to" a second component, there is an electrical path between the first and second components that allows current to flow. This electrical path may include capacitors, coupled inductors, and / or other components that allow current to flow, even if there is no direct contact between the conductive components.

[0037] Example 1

[0038] First refer to Figure 1 One embodiment of this application proposes a testing system 100 suitable for testing photovoltaic cells. The testing system 100 includes a testing device 10 and a main control device 20. In this embodiment, the testing device 10 is suitable for testing the electrical performance parameters of photovoltaic cells, such as the fill factor. The main control device 20 is communicatively connected to the testing device 10, and is used to acquire the test data from the testing device 10 and obtain the test results of the photovoltaic cells based on the test data. In this embodiment, the main control device 20 is exemplarily a 10AHTGC01AA model device manufactured by Suzhou Maiwei Technology Co., Ltd. It should be noted that this application does not limit the specific model of the main control device 20. Further reference... Figure 2 The photovoltaic cell 200 tested by the testing system 100 has multiple main grid regions 21 extending along a first direction A-A' and distributed at equal intervals along a second direction B-B'. In this embodiment, the photovoltaic cell also includes multiple fine grids 22 extending along the second direction B-B' and distributed at equal intervals along the first direction A-A'. It should be noted that when the photovoltaic cell 200 is a non-OBB cell, the main grid region 21 is the region where the main grid lines of the photovoltaic cell 200 are located; when the photovoltaic cell 200 is an OBB cell, the main grid region 21 is the region corresponding to the pre-defined main grid lines on the OBB cell. Although this is the case, it does not mean that the main grid region 21 of an OBB cell necessarily forms main grid lines during fabrication. Furthermore, Figure 2 Multiple main gate regions 21 are shown only as examples, and this application does not limit the number of main gate regions 21.

[0039] Reference Figure 3 The testing device 10 includes a current probe sequence 11, a voltage probe sequence 12, a first fixed bracket 13, and a second fixed bracket 14. Further integration... Figure 2The current probe sequence 11 includes multiple current probe rows 111 extending along a first direction A-A' and spaced apart along a second direction B-B', each current probe row 111 corresponding to a main gate region 21. The voltage probe sequence 12 includes at least two voltage probe rows 121 extending along the first direction A-A' and spaced apart along the second direction B-B', each voltage probe row 121 corresponding to a main gate region 21. In this embodiment, the total number of current probe rows 111 between two voltage probe rows 121 in the second direction B-B' is not less than 2. In this embodiment, the current probe rows 111 and voltage probe rows 121 include gold or silver wires, and the voltage probe rows 121 include gold or silver wires. In other embodiments of this application, the types of current probe rows 111 and voltage probe rows 121 may be selected from only one or both of the types listed above, and this application does not limit this. It should be noted that during the testing of the photovoltaic cell 200, when the voltage probe array 121 or the current probe array 111 corresponds to the main grid region 21, the voltage probe array 121 or the current probe array 111 is in contact with the surface of the photovoltaic cell in the corresponding main grid region 21. The first fixing bracket 13 is used to fix one end of each current probe array 111 and each voltage probe array 121. The second fixing bracket 14 is used to fix the other end of each current probe array 111 and each voltage probe array 121. In this embodiment, the first fixing bracket 13 and the second fixing bracket 14 fix the current probe array 111 and the voltage probe array 121 by bolt fastening.

[0040] Further reference Figure 4 The voltage probe sequence 12 includes a first voltage probe array 122, and the current probe sequence 11 includes a first current probe array 112 and a second current probe array 113 located on both sides of the first voltage probe array 122 and closest to it. A first spacing d1 exists between the first current probe array 112 and the first voltage probe array 122, and a second spacing d2 exists between the second current probe array 113 and the first voltage probe array 122. The ratio of the first spacing d1 to the second spacing d2 is not greater than 1 / 2. Preferably, in this embodiment, the ratio of the first spacing d1 to the second spacing d2 is not less than 1 / 6, thereby ensuring a suitable interval between the first voltage probe array 122 and the first current probe array 112, avoiding contact due to excessive proximity, and achieving better fill factor detection results. Further reference... Figure 5In this preferred embodiment, the first current probe array 112 includes a first current probe array 114 or a last current probe array 115 located near the edge of the photovoltaic cell 200 during testing. The first current probe array 114 is the first current probe array 111 in the current probe sequence 11, and the last current probe array 115 is the last current probe array 111 in the current probe sequence 11. Preferably, the first current probe array 114 and the last current probe array 115 correspond to the main grid regions 21 of the two opposite edges closest to the photovoltaic cell, respectively. It is understood that in this embodiment, the first voltage probe array 122 is selected from all voltage probe arrays 121 in the voltage probe sequence 12, and the first current probe array 112 and the second current probe array 113 are both current probe arrays 111 corresponding to the current probe array 111 in the current probe sequence 11. Furthermore, since the voltage probe array 121 and the current probe array 111 are respectively set to correspond to the main grid regions 21, the spacing between adjacent probe arrays is an integer multiple of the minimum spacing, and this minimum spacing is the spacing between adjacent main grid regions 21.

[0041] Continue to refer to Figure 3 and Figure 4 In this embodiment, preferably, in the current probe sequence 11, each adjacent current probe row 111 has a third spacing d3, and the third spacing d3 corresponding to the adjacent first current probe row 112 and second current probe row 113 is the maximum value among all third spacings d3, that is, any third spacing d3 is not greater than the sum of the first spacing d1 and the second spacing d2. At least some of the sequentially adjacent current probe rows 111 have equal corresponding third spacings. Preferably, at least some of the sequentially adjacent current probe rows 111 have equal corresponding third spacings d3. For example, when three current probe rows 111 are sequentially adjacent, the two third spacings d3 formed by the three current probe rows 111 can be equal. Further refer to... Figure 6 In this preferred embodiment, the current probe sequence 11 includes a head current probe row 114 and a tail current probe row 115 located near two opposite edges of the photovoltaic cell 200 (i.e., the left and right edges opposite each other in the second direction B-B') during testing. Each current probe row 111 is symmetrically distributed along the axis of symmetry CC, which is the axis containing the midpoint between the head current probe row 114 and the tail current probe row 115, and extends along the first direction A-A'. Preferably, the third spacing d3 is configured such that, among two adjacent third spacings d3, the third spacing d3 closer to the axis of symmetry CC is not greater than the third spacing d3 farther from the axis of symmetry CC. For example... Figure 6In this embodiment, the three third spacings d3 from left to right are denoted as d3a, d3b, and d3c, respectively. Specifically, the third spacing d3 between the first current probe array 114 and its adjacent current probe array 111 is denoted as d3a; the third spacing d3 between two adjacent current probe arrays 111 is denoted as d3b; and the third spacing d3 between the tail current probe array 115 and its adjacent current probe array 111 is denoted as d3c. Therefore, d3a:d3b:d3c = 3:2:3, meaning that d3b, which is closest to the axis of symmetry CC, is less than d3a and d3c. It should be noted that in this embodiment, both the first current probe array 114 and the tail current probe array 115 are first voltage probe arrays 122. However, in other embodiments of this application, the first current probe array 114 or the tail current probe array 115 may not be a first voltage probe array 122.

[0042] The preceding text has already combined Figures 2-6 The setup of current probe sequence 11 and voltage probe sequence 12 has been explained as necessary. Further details are provided below. Figures 7-13 The deployment of the current probe sequence 11 and the voltage probe sequence 12 is illustrated in more detail through Examples 2-8.

[0043] Example 2

[0044] Reference Figure 3 and Figure 7 For a photovoltaic cell 200 with 18 main grid regions 21, when the ratio of the first spacing d1 to the second spacing d2 is equal to 1 / 2, and the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the testing device 10 is equipped with two voltage probe rows 121 and eight current probe rows 111, and d31:d32:d33:d34:d35:d36:d37 = 3:3:2:1:2:3:3, where d31, d32, d33, d34, d35, d36, and d37 are the third spacing d3 of each adjacent current probe row 111. It should be noted that... Figure 7 Both voltage probe arrays 121 are the first voltage probe arrays. Figure 7 The leftmost and rightmost current probe arrays 111 are both first current probe arrays, and Figure 7 The second and seventh current probe arrays from left to right in the middle are both the second current probe array. (Continued...) Figures 8-13 In the corresponding embodiments, the configurations of the first voltage probe array, the first current probe array, and the second current probe array are all the same as... Figure 7 The corresponding implementation methods are the same and will not be repeated hereafter. Furthermore, Figure 7 Two voltage probe rows 121 and eight current probe rows 111 respectively block the corresponding main gate region 21, therefore Figure 7Only eight main gate regions 21 (i.e., dashed rectangles) are visible in the design, but this application does not limit the current probe array 111 and voltage probe array 121 to blocking the main gate regions 21. That is, in other embodiments of this application, the current probe array 111 and voltage probe array 121 can partially block the main gate regions 21. (Subsequent...) Figures 8-13 In the corresponding embodiment, the blocking method of the voltage probe array 121 and the current probe array 111 on the main gate region 21 is the same as... Figure 7 The corresponding implementation methods are the same and will not be repeated hereafter.

[0045] Example 3

[0046] Reference Figure 3 and Figure 8 For a photovoltaic cell 200 with 20 main grid regions 21, when the ratio of the first spacing d1 and the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the test device 10 is provided with 2 voltage probe rows 121 and 8 current probe rows 111, and d31:d32:d33:d34:d35:d36:d37=3:3:3:1:3:3:3, where d31, d32, d33, d34, d35, d36 and d37 are the third spacing d3 of each adjacent current probe row 111.

[0047] Example 4

[0048] Reference Figure 3 and Figure 9 For a photovoltaic cell 200 with 22 main grid regions 21, when the ratio of the first spacing d1 and the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the test device 10 is provided with 2 voltage probe rows 121 and 8 current probe rows 111, and d31:d32:d33:d34:d35:d36:d37=3:3:3:3:3:3:3, where d31, d32, d33, d34, d35, d36 and d37 are the third spacing d3 of each adjacent current probe row 111.

[0049] Example 5

[0050] Reference Figure 3 and Figure 10For a photovoltaic cell 200 with 13 main grid regions 21, when the ratio of the first spacing d1 and the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the test device 10 is provided with 2 voltage probe rows 121 and 5 current probe rows 111, and d31:d32:d33:d34=3:3:3:3, where d31, d32, d33 and d34 are the third spacing d3 of each adjacent current probe row 111.

[0051] Example 6

[0052] Reference Figure 3 and Figure 11 For a photovoltaic cell 200 with 15 main grid regions 21, when the ratio of the first spacing d1 and the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the test device 10 is provided with 2 voltage probe rows 121 and 6 current probe rows 111, and d31:d32:d33:d34:d35=3:3:2:3:3, where d31, d32, d33, d34 and d35 are the third spacing d3 of each adjacent current probe row 111.

[0053] Example 7

[0054] Reference Figure 3 and Figure 12 For a photovoltaic cell 200 with 17 main grid regions 21, when the ratio of the first spacing d1 and the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrical and equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC among two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, the test device 10 is provided with 2 voltage probe rows 121 and 7 current probe rows 111, and d31:d32:d33:d34:d35:d36=3:3:2:2:3:3, where d31, d32, d33, d34, d35 and d36 are the third spacing d3 of each adjacent current probe row 111.

[0055] The above Figures 7-12 In the embodiments 1-5 shown, the first current probe array corresponds to the leftmost or rightmost main gate region 21 in the figure. The following is in conjunction with Figure 13 Example 8 illustrates the case where the first current probe is located in the main gate region 21 that is neither the leftmost nor the rightmost.

[0056] Example 8

[0057] Reference Figure 3 and Figure 13 For a photovoltaic cell 200 with 18 main grid regions 21, when the ratio of the first spacing d1 to the second spacing d2 is equal to 1 / 2, the third spacing d3 is symmetrically equal along the axis of symmetry CC, and the third spacing d3 closer to the axis of symmetry CC in two adjacent third spacings d3 is not greater than the third spacing d3 farther from the axis of symmetry CC, and the first current probe array corresponds to... Figure 13 When the second main gate region 21 and the 17th main gate region 21 from left to right are in the middle, the test device 10 is provided with 2 voltage probe rows 121 and 6 current probe rows 111, and d31:d32:d33:d34:d35=3:3:3:3:3, where d31, d32, d33, d34 and d35 are the third spacing d3 of each adjacent current probe row 111.

[0058] The arrangement of the current probe array 111 and voltage probe array 121 in the test apparatus 10 has been illustrated above through embodiments 1-6. The following compares the test data obtained from fill factor tests using existing technical solutions and test schemes 1-4 of the test apparatus 10 according to this application. Specifically, in existing technical solutions, multiple current probe arrays and two voltage probe arrays are distributed sequentially at equal intervals. One voltage probe array is located between the first and second current probe arrays, and the other voltage probe array is located between the second-to-last and last current probe arrays. The first and last current probe arrays correspond to the first and last main gate regions in the sequentially arranged main gate regions, respectively. In test scheme 1, multiple current probe arrays and two voltage probe arrays are distributed sequentially at equal intervals. One voltage probe array is located between the first and second current probe arrays, and the other voltage probe array is located between the second-to-last and last current probe arrays. The first and last current probe arrays correspond to the first and last main gate regions in the sequentially arranged main gate regions, respectively, and the ratio of the first spacing d1 to the second spacing d2 is 1 / 2. In test scheme 2, multiple current probe rows and two voltage probe rows are distributed sequentially at equal intervals. One voltage probe row is located between the first and second current probe rows, and the other voltage probe row is located between the second-to-last and last current probe rows. The first and last current probe rows correspond to the second and second-to-last main gate regions in the sequentially arranged main gate regions, respectively, and the ratio of the first spacing d1 to the second spacing d2 is 1 / 2. In test scheme 3, multiple current probe rows and two voltage probe rows are distributed sequentially at equal intervals. One voltage probe row is located between the first and second current probe rows, and the other voltage probe row is located between the second-to-last and last current probe rows, respectively. The first and last current probe rows correspond to the first and last main gate regions in the sequentially arranged main gate regions, respectively, and the ratio of the first spacing d1 to the second spacing d2 is 1 / 3. In test scheme 4, multiple current probe rows and two voltage probe rows are distributed at equal intervals. One voltage probe row is located between the first and second current probe rows, and the other voltage probe row is located between the second-to-last and last current probe rows. The first and last current probe rows correspond to the first and last main gate regions arranged sequentially, respectively, and the ratio of the first spacing d1 to the second spacing d2 is 1 / 4. The fill factor test data corresponding to the above-mentioned prior art scheme and test schemes 1-4 are shown in the table below.

[0059]

[0060] The first column of the table above represents the various schemes, the second column represents the theoretical levels corresponding to the actual test values ​​of the fill factor obtained from each scheme, and the third column represents the actual test values ​​of the fill factor obtained from each scheme. For example, the cell in the second row and third column indicates that the actual test value of the fill factor corresponding to the theoretically higher fill factor of the prior art scheme is 84.17. As can be seen from the table above, the two actual test values ​​obtained in the prior art scheme are opposite to the theoretical levels, which obviously indicates that the prior art scheme has a fill factor detection error and cannot accurately detect the fill factor. Correspondingly, the actual test values ​​of the fill factor obtained by test schemes 1-4 of the testing device 10 all conform to the corresponding theoretical levels, that is, the testing device 10 can obtain more accurate fill factor measurement results compared to the prior art scheme.

[0061] The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore remain within the spirit and scope of the exemplary embodiments of this application.

[0062] Furthermore, this application uses specific terms to describe embodiments of the application. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic related to at least one embodiment of the application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this specification do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0063] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the present application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0064] Although this application has been described with reference to specific embodiments, those skilled in the art should recognize that the above embodiments are only used to illustrate this application, and various equivalent changes or substitutions can be made without departing from the spirit of this application. Therefore, any changes or modifications to the above embodiments within the essential spirit of this application will fall within the scope of the claims of this application.

Claims

1. A test device, characterized by Suitable for testing photovoltaic cells, the photovoltaic cells having multiple main grid regions extending along a first direction and distributed at equal intervals along a second direction, the testing apparatus includes: A current probe sequence includes multiple rows of current probes extending along a first direction and spaced apart sequentially along a second direction, each row of current probes corresponding to one of the main gate regions; and The voltage probe sequence includes at least two rows of voltage probes extending along the first direction and spaced apart along the second direction, each row of voltage probes corresponding to one of the main gate regions. The voltage probe sequence includes a first voltage probe array, and the current probe sequence includes a first current probe array and a second current probe array located on both sides of the first voltage probe array and closest to the first voltage probe array on both sides. The first current probe array and the first voltage probe array have a first spacing, and the second current probe array and the first voltage probe array have a second spacing. The ratio of the first spacing to the second spacing is not greater than 1 / 2.

2. The test device of claim 1, wherein, The ratio of the first spacing to the second spacing is not less than 1 / 6.

3. The test device of claim 1, wherein, In the current probe sequence, there is a third spacing between each adjacent current probe row, and the third spacing between adjacent first current probe rows and second current probe rows is the maximum value among all the third spacings.

4. The testing apparatus as described in claim 3, characterized in that, In the current probe sequence, the third spacings between at least some of the sequentially adjacent current probe rows are equal.

5. The testing apparatus as described in claim 4, characterized in that, The current probe sequence includes a front current probe array and a rear current probe array located near two opposite edges of the photovoltaic cell during testing. Each of the current probe arrays is symmetrically distributed along an axis of symmetry, wherein the axis of symmetry is the axis containing the midpoint between the front current probe array and the rear current probe array, and the axis extends along the first direction.

6. The testing apparatus as described in claim 5, characterized in that, The third spacing is configured such that, in two adjacent third spacings, the third spacing closer to the axis of symmetry is not greater than the third spacing farther from the axis of symmetry.

7. The testing apparatus as described in claim 1, characterized in that, The first current probe array includes a first current probe array or a last current probe array near the edge of the photovoltaic cell when testing the photovoltaic cell. The first current probe array is the first current probe array in the current probe sequence, and the last current probe array is the last current probe array in the current probe sequence.

8. The testing apparatus as described in claim 7, characterized in that, The head current probe array and the tail current probe array correspond to the main grid regions of the two opposite edges closest to the photovoltaic cell, respectively.

9. The testing apparatus as described in claim 1, characterized in that, In the second direction, the total number of current probe rows between the two voltage probe rows is not less than 2.

10. The testing apparatus as described in claim 1, characterized in that, The current probe array includes gold or silver wires, and / or the voltage probe array includes gold or silver wires.

11. The testing apparatus as described in claim 1, characterized in that, The testing apparatus is suitable for testing the fill factor of the photovoltaic cell.

12. The testing apparatus as described in claim 1, characterized in that, The photovoltaic cells include gridless photovoltaic cells.

13. The testing apparatus as described in claim 1, characterized in that, The testing apparatus also includes: A first fixing bracket is used to fix one end of each of the current probe arrays and each of the voltage probe arrays; and The second fixing bracket is used to fix the other end of each of the current probe arrays and each of the voltage probe arrays.

14. A testing system, characterized in that, Suitable for testing photovoltaic cells, the photovoltaic cells having multiple main grid regions extending along a first direction and distributed at equal intervals along a second direction, the testing system includes: The test apparatus as described in any one of claims 1-13; and The main control device is communicatively connected to the testing device. The main control device is used to acquire the test data of the testing device and obtain the test results of the photovoltaic cell based on the test data.

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