A crash test needle PCBA test rack

Abstract

The utility model is suitable for PCBA test technical field provides a kind of anti-collision test needle PCBA test frame, including bottom plate, the frame body of being arranged in the bottom plate one side, the testing device of being arranged on the frame body, with the upper test needle module of testing device connection, the position corresponding with the upper test needle module of the bottom plate is equipped with test slot, the upper test needle module is connected with the frame body by at least two guide columns, the downside of the upper test needle module is equipped with at least one buffer. The above-mentioned anti-collision test needle PCBA test frame, by setting buffer on the downside of the upper test needle module, when the upper test needle module moves downward, a buffer force is provided for the upper test needle module, to avoid the lower end of the upper test needle module and the lower test needle contact, and further avoid the upper test needle in the upper test needle module from colliding.

Description

Technical Field

[0001] This utility model belongs to the field of PCBA testing technology, and in particular relates to a PCBA test fixture with anti-collision test probes. Background Technology

[0002] PCBA is an abbreviation for Printed Circuit Board Assembly, a core component of the electronics manufacturing industry. It refers to the automated or manual soldering and mounting of various electronic components (such as resistors, capacitors, chips, connectors, etc.) onto a printed circuit board (PCB) to create a functional module that can be directly used in electronic products.

[0003] In the existing technology, PCBA products all use test fixtures for testing. The test fixture includes a frame, test devices, and an upper test probe module connected to the test devices. The lower end of the frame is provided with a test slot corresponding to the upper test probe module. The test probe moves up and down above the test slot through guide posts. Because the upper test probe module is not fixed, it may be damaged by collisions during transportation and use. Utility Model Content

[0004] The purpose of this utility model embodiment is to provide an anti-collision test pin PCBA test fixture, which aims to solve the problem that the upper test pin module in the existing test fixture is easily damaged by collision.

[0005] This utility model embodiment is implemented as follows: a collision-resistant test probe PCBA test frame includes a base plate, a frame body disposed on one side of the base plate, a test device disposed on the frame body, and an upper test probe module connected to the test device. The base plate is provided with test slots at positions corresponding to the upper test probe module. The upper test probe module is connected to the frame body through at least two guide posts. At least one buffer is provided on the lower side of the upper test probe module.

[0006] Furthermore, the buffer is a spring, and the buffer is fitted onto each of the guide posts.

[0007] Furthermore, it also includes an operating component connected to the upper test probe module. The operating component includes a connecting rod connected to the upper test probe module, two movable connecting plates rotatably connected to the upper end of the connecting rod, an operating handle rotatably connected to the upper end of the two movable connecting plates, and a fixed guide plate connected to the frame. One side of the fixed guide plate is fixedly connected to the frame, and the upper end of the fixed guide plate gradually extends to the middle of the two movable connecting plates and is rotatably connected to the operating handle.

[0008] Furthermore, the operating handle includes an assembly part and an operating part connected to the assembly part. The operating part and the assembly part are vertically connected. The fixed guide plate is connected to the lower end of the assembly part, and the movable connecting plate is connected to the connection between the operating part and the assembly part.

[0009] Furthermore, the fixed guide plate is provided with a vertical guide groove at the position corresponding to the connecting rod, and the connecting rod is provided with a guide block at the position corresponding to the guide groove.

[0010] Furthermore, the fixed guide plate is connected to the lower end of the connecting rod via a guide tube.

[0011] Furthermore, the upper test probe module includes a mounting plate movably connected to the two guide posts and multiple upper test probes located at the lower end of the mounting plate.

[0012] Furthermore, the mounting plate is connected to the guide post via a connecting pipe.

[0013] Furthermore, the buffer is a spring sheet, which is located on one side of the test slot, and the upper end of the spring sheet corresponds to the side edge of the upper test needle module.

[0014] The beneficial effects of this utility model are: the above-mentioned anti-collision test probe PCBA test frame, by setting a buffer on the lower side of the upper test probe module, provides a buffer force for the upper test probe module when it moves downward, avoiding the lower end of the upper test probe module from contacting the lower test probe, thereby avoiding collision of the upper test probe in the upper test probe module. Attached Figure Description

[0015] Figure 1 This is a three-dimensional structural diagram of the anti-collision test probe PCBA test frame provided in this embodiment of the utility model; Figure 2 This is an enlarged structural schematic diagram of the operating handle in the anti-collision test probe PCBA test frame provided in this embodiment of the utility model; Figure 3 This is an enlarged structural schematic diagram of the fixed guide plate in the anti-collision test probe PCBA test frame provided in this embodiment of the utility model. Detailed Implementation

[0016] To facilitate understanding of this utility model, a more comprehensive description will be given below with reference to the accompanying drawings. Several embodiments of this utility model are shown in the drawings. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this utility model will be more thorough and complete.

[0017] It should be noted that when a component is said to be "fixed to" another component, it can be directly on the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0018] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0019] Without a buffer mechanism added to the guide column of the test fixture, the upper test probe module often falls off automatically, causing the upper and lower test probes to collide and be damaged, resulting in misjudgments during electrical testing. To solve the above problems, this utility model provides the following embodiments.

[0020] Please see Figure 1 This utility model provides a PCBA test frame with anti-collision test probes, including a base plate 10, a frame 20 disposed on one side of the base plate 10, a test device (not shown) disposed on the frame 20, and an upper test probe module 30 connected to the test device. The base plate 10 has test slots 11 at positions corresponding to the upper test probe module 30, and multiple lower test probes 12 are disposed within the test slots 11. The upper test probe module 30 is connected to the frame 20 via two guide posts 40, and two buffers 50 are provided on the lower side of the upper test probe module 30. Specifically, the buffers 50 are springs, and each guide post 40 is fitted with a buffer 50.

[0021] The aforementioned anti-collision test pin PCBA test fixture provides a buffer 50 on the guide post 40 on the lower side of the upper test pin module 30. When the upper test pin module 30 moves downward, it provides a buffer force to prevent the lower end of the upper test pin module 30 from contacting the lower test pin 32, thereby preventing the upper test pins inside the upper test pin module 30 from colliding.

[0022] It should be noted that in other embodiments of this utility model, multiple guide posts 40 can be provided, and correspondingly, the same number of buffer members 50 as the guide posts 40 can be provided. At least one buffer member 50 can also be provided and installed directly without cooperating with the guide posts 40. The buffer member 50 can be installed on one side of the guide post 40 by setting a separate mounting structure, which can play a buffering role.

[0023] In one embodiment of this utility model, the anti-collision test probe PCBA test frame further includes an operation component 60 connected to the upper test probe module 30. The operation component 60 includes a connecting rod 61 connected to the upper test probe module 30, two movable connecting plates 62 rotatably connected to the upper end of the connecting rod 61, an operation handle 63 rotatably connected to the upper end of the two movable connecting plates 62, and a fixed guide plate 64 connected to the frame 20. One side of the fixed guide plate 64 is fixedly connected to the frame 20, and the upper end of the fixed guide plate 64 gradually extends to the middle of the two movable connecting plates 62 and is rotatably connected to the operation handle 63.

[0024] In one embodiment of this utility model, please refer to [the relevant documentation]. Figure 2 The operating handle 63 includes an assembly part 631 and an operating part 632 connected to the assembly part 631. The operating part 632 and the assembly part 631 are vertically connected. A fixed guide plate 64 is connected to the lower end of the assembly part 631. A movable connecting plate 62 is connected to the connection between the operating part 632 and the assembly part 631. In use, pulling down the operating part 632 will move the movable connecting plate 62 upward, which in turn will move the connecting rod 61 upward, ultimately lifting the upper test probe module 30. When the operating part is lifted, the movable connecting plate 62 will move downward, which in turn will move the connecting rod 61 downward, ultimately pressing down the upper test probe module 30 to align the upper test probe module 30 with the test points of the PCBA.

[0025] In one embodiment of this utility model, a guide groove (not shown in the figure) is vertically provided at the position corresponding to the fixed guide plate 64 and the connecting rod 61, and a guide block (not shown in the figure) is provided at the position corresponding to the connecting rod 61 and the guide groove, so that the connecting rod 61 can move up and down stably, thereby improving the lifting stability of the upper test needle module 30.

[0026] In one embodiment of this utility model, the fixed guide plate 64 and the lower end of the connecting rod 64 are connected by a guide tube 65. Through the above-mentioned guide structure, the connecting rod 61 can move up and down stably, which improves the lifting stability of the upper test needle module 30.

[0027] In one embodiment of the present invention, the upper test probe module 30 includes a mounting plate 31 movably connected to the two guide posts 40 and multiple upper test probes 32 disposed at the lower end of the mounting plate 31, wherein the mounting plate 31 is used to mount the multiple upper test probes 32, and the multiple upper test probes 32 are used to test multiple points of the PCBA.

[0028] In one embodiment of this utility model, the mounting plate 31 and the guide post 40 are connected by a connecting pipe 70, so as to achieve the guiding function through the connecting pipe 70, thereby improving the stability of the mounting plate 31 moving up and down.

[0029] In one embodiment of this utility model, the buffer 50 is a spring sheet, which is disposed on one side of the test slot 11, with its upper end corresponding to the side edge of the upper test probe module 30. This provides a buffering force when the upper test probe module 30 approaches the test slot 11, preventing the upper test probe 32 from colliding with the lower test probe 12. The edge of the mounting plate 31 is provided with multiple limiting posts at intervals.

[0030] The beneficial effects of this utility model are: the above-mentioned anti-collision test pin PCBA test frame, by setting a buffer 50 on the lower side of the upper test pin module 30, provides a buffer force for the upper test pin module 30 when the upper test pin module 30 moves downward, avoiding contact between the upper test pin 32 and the lower test pin 12, thereby avoiding collision between the upper test pin 32 and the lower test pin 12.

[0031] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A PCBA test fixture for anti-collision test probes, characterized in that, The device includes a base plate, a frame disposed on one side of the base plate, a test device disposed on the frame, and an upper test probe module connected to the test device. The base plate has a test slot at the position corresponding to the upper test probe module. The upper test probe module is connected to the frame through at least two guide posts. At least one buffer is provided on the lower side of the upper test probe module.

2. The anti-collision test probe PCBA test fixture according to claim 1, characterized in that, The buffer is a spring, and each of the guide posts is fitted with the buffer.

3. The anti-collision test probe PCBA test fixture according to claim 1, characterized in that, It also includes an operating component connected to the upper test probe module. The operating component includes a connecting rod connected to the upper test probe module, two movable connecting plates rotatably connected to the upper end of the connecting rod, an operating handle rotatably connected to the upper end of the two movable connecting plates, and a fixed guide plate connected to the frame. One side of the fixed guide plate is fixedly connected to the frame, and the upper end of the fixed guide plate gradually extends to the middle of the two movable connecting plates and is rotatably connected to the operating handle.

4. The anti-collision test probe PCBA test fixture according to claim 3, characterized in that, The operating handle includes an assembly part and an operating part connected to the assembly part. The operating part and the assembly part are vertically connected. The fixed guide plate is connected to the lower end of the assembly part. The movable connecting plate is connected to the connection between the operating part and the assembly part.

5. The anti-collision test probe PCBA test fixture according to claim 3, characterized in that, The fixed guide plate is provided with a vertical guide groove at the position corresponding to the connecting rod, and the connecting rod is provided with a guide block at the position corresponding to the guide groove.

6. The anti-collision test probe PCBA test fixture according to claim 3, characterized in that, The fixed guide plate is connected to the lower end of the connecting rod via a guide tube.

7. The anti-collision test probe PCBA test fixture according to claim 1, characterized in that, The upper test probe module includes a mounting plate movably connected to the two guide posts and multiple upper test probes located at the lower end of the mounting plate.

8. The anti-collision test probe PCBA test fixture according to claim 7, characterized in that, The mounting plate and the guide post are connected by a connecting pipe.

9. The anti-collision test probe PCBA test fixture according to claim 1, characterized in that, The buffer is a spring sheet, which is located on one side of the test slot, and the upper end of the spring sheet corresponds to the side edge of the upper test needle module.

10. The anti-collision test pin PCBA test fixture according to claim 7, characterized in that, The mounting plate has multiple limiting posts spaced apart along its edge.

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