Probe testing device

Abstract

The application relates to the technical field of resistance testing, in particular to a probe testing device which comprises an x-axis movement module, a y-axis movement module and a mounting plate, the y-axis movement module is arranged on the x-axis movement module, and the mounting plate is arranged on the y-axis movement module; a photographing positioning mechanism and a probe testing mechanism are arranged on the mounting plate, the probe testing mechanism comprises a vertical movement module, a horizontal movement module, a rotating platform and a probe testing plate, the vertical movement module is used for driving the probe testing plate to move in the vertical direction, the horizontal movement module is used for driving the probe testing plate to move in the horizontal direction, and the rotating platform is used for adjusting the rotating angle of the probe testing plate. The application can improve the docking accuracy between the probe plate and the resistance when the resistance is tested in batches.

Description

Technical Field

[0001] This application relates to the field of resistance testing technology, and in particular to a probe testing device. Background Technology

[0002] As the integration of electronic products such as smartphones continues to increase, motherboards integrate a large number of electronic components with different functions. Among them, surface mount resistors are one of the most common basic components, and their number often reaches hundreds or even thousands. During the production and assembly process, in order to ensure that the electrical performance of the resistors meets the design requirements, they need to be tested. Due to the large number of resistors, testing them one by one is inefficient. Therefore, the industry generally adopts a batch testing method, which uses several probes on a probe board to simultaneously connect with the pads corresponding to multiple resistors, thereby completing the testing of multiple sets of resistors in a single operation.

[0003] Existing methods for batch resistance testing primarily rely on direct mechanical contact between a probe board and the resistors. Specifically, during testing, a probe board with multiple probes is pressed onto the resistor area on the circuit board, allowing the probes to make electrical contact with the corresponding resistor pads, thus enabling batch resistance testing. However, due to the small size and close spacing of the resistors, and the large number and fine arrangement of probes on the probe board, positional or angular deviations often occur between the probe board and the resistors in practice. This can easily lead to some probes failing to make accurate contact with the resistor pads, resulting in inaccurate testing, test failures, or the need for repeated operations. Utility Model Content

[0004] To improve the accuracy of the mating between the probe plate and resistors during batch resistor testing, this application provides a probe testing device. The technical solution provided in this application is as follows:

[0005] A probe testing device includes an x-axis motion module, a y-axis motion module, and a mounting plate. The y-axis motion module is mounted on the x-axis motion module, and the mounting plate is mounted on the y-axis motion module. The mounting plate is provided with a photographing and positioning mechanism and a probe testing mechanism. The probe testing mechanism includes a vertical motion module, a horizontal motion module, a rotating platform, and a probe testing plate. The vertical motion module is used to drive the probe testing plate to move in the vertical direction, the horizontal motion module is used to drive the probe testing plate to move in the horizontal direction, and the rotating platform is used to adjust the rotation angle of the probe testing plate.

[0006] In one specific implementation, the photo positioning mechanism includes a first camera and a light source, wherein the first camera and the light source are arranged on the same vertical line, and the light source is located directly below the first camera.

[0007] In one specific implementation scheme, the vertical motion module is mounted on the mounting plate, the vertical motion module is provided with a fixing frame, the rotating platform is located at the bottom end of the fixing frame, the horizontal motion module is located at the bottom end of the rotating platform and is connected to a base plate, the base plate is located at the bottom end of the horizontal motion module, and the probe test plate is located at the bottom end of the base plate.

[0008] In one specific implementation, a micrometer adjustment platform is provided on one side of the horizontal motion module.

[0009] In one specific implementation, a second camera and a refractive prism are provided between the horizontal motion module and the base plate. The base plate has a through hole, and the refractive prism is located directly above the through hole. The second camera and the refractive prism are located on the same horizontal line.

[0010] In one specific implementation, the probe test plate is adjustablely disposed at the bottom end of the base plate.

[0011] In summary, the beneficial effects of this application include at least the following:

[0012] 1) By incorporating a camera positioning mechanism within the probe testing device, and combining it with the movement control of the x-axis and y-axis motion modules, the camera can acquire the specific positional information of the resistor under test with the aid of a light source. This provides coordinate information for the precise docking of the probe testing board. This solution effectively avoids the deviations caused by blindly pressing the resistor directly onto the probe board, ensuring that the probe board accurately aligns with the target resistor during initial docking, and significantly improving the docking accuracy and stability during batch resistor testing.

[0013] 2) The probe test plate achieves multi-degree-of-freedom adjustment through a vertical motion module, a horizontal motion module, and a rotating platform. This is supplemented by real-time observation via a refracting prism and a second camera, as well as manual fine-tuning via a micrometer adjustment platform. This allows the probe plate to automatically complete precise corrections of position and angle during the docking process, and also enables secondary calibration by the operator. This structure ensures a more accurate and reliable docking between the probe plate and the resistor, effectively avoiding test failures caused by poor contact, and improving the accuracy of test results and the consistency of product quality.

[0014] The device improves the docking accuracy between the probe plate and the resistor by coordinating a multi-dimensional motion module and a visual positioning mechanism. Specifically, the device includes motion modules positioned along the x and y axes. A mounting plate on these modules simultaneously houses a photographic positioning mechanism and a probe testing mechanism. The photographic positioning mechanism uses a camera and light source to acquire the resistor's precise positional information, providing accurate coordinate references for subsequent docking operations. The probe testing mechanism consists of a vertical motion module, a horizontal motion module, and a rotating platform, capable of adjusting the height, finely leveling, and correcting the angle of the probe testing plate, thus achieving precise adjustment of the docking position in multiple degrees of freedom. Furthermore, with the assistance of a refracting prism and a second camera, and the secondary fine-tuning function of a micrometer adjustment platform, operators can monitor and correct the docking status of the probe and resistor in real time, ensuring docking accuracy. This effectively solves the problem of inaccurate docking of the probe plate and resistor during batch testing due to positional or angular deviations in existing technologies, thereby ensuring the accuracy and reliability of the resistor testing process, avoiding repetitive operations and test failures, and improving overall testing efficiency and product quality.

[0015] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, the preferred embodiments of this application are described in detail below with reference to the accompanying drawings. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the overall structure of the probe testing device in this embodiment.

[0017] Figure 2 yes Figure 1 Enlarged view of part A in the middle.

[0018] Figure 3 This is a schematic diagram of the probe testing mechanism in this embodiment.

[0019] Reference numerals: 1. x-axis motion module; 2. y-axis motion module; 3. mounting plate; 4. image positioning mechanism; 41. first camera; 42. light source; 5. probe testing mechanism; 51. vertical motion module; 52. fixing frame; 53. horizontal motion module; 54. rotating platform; 55. probe testing plate; 56. micrometer adjustment platform; 57. second camera; 58. refractive prism; 59. base plate. Detailed Implementation

[0020] The specific embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are used to illustrate this utility model, but are not intended to limit its scope.

[0021] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of this application. Furthermore, it should be noted that, for ease of description, only the parts relevant to this application are shown in the accompanying drawings, not the entire structure. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without inventive effort are within the scope of protection of this application.

[0022] The terms “comprising” and “having”, and any variations thereof, used in this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the steps or units listed, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such process, method, product, or apparatus.

[0023] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0024] This application discloses a probe testing device.

[0025] Reference Figure 1 The probe testing device includes an x-axis motion module 1, a y-axis motion module 2, and a mounting plate 3. The y-axis motion module 2 is fixedly mounted on the x-axis motion module 1, and the mounting plate 3 is fixedly mounted on the y-axis motion module 2. The mounting plate 3 is equipped with a photographic positioning mechanism 4 and a probe testing mechanism 5, which are arranged adjacent to each other. Figure 2 The image positioning mechanism 4 includes a first camera 41 and a light source 42, which are positioned on the same vertical line, with the light source 42 located directly below the first camera 41. After testing the resistance, the first camera 41 is moved above the resistor under test by controlling the x-axis motion module 1 and the y-axis motion module 2 to take an image under the auxiliary illumination of the light source 42, thus obtaining the resistor's specific position information. Then, the x-axis motion module 1 and the y-axis motion module 2 are controlled again to move the probe testing mechanism 5 above the resistor under test for the next docking operation.

[0026] Reference Figure 1 and Figure 3The probe testing mechanism 5 includes a vertical motion module 51, a horizontal motion module 53, a rotating platform 54, and a probe testing plate 55. The vertical motion module 51 drives the probe testing plate 55 to move vertically, the horizontal motion module 53 drives the probe testing plate 55 to move horizontally, and the rotating platform 54 adjusts the rotation angle of the probe testing plate 55. Specifically, the vertical motion module 51 is mounted on the mounting plate 3 and can move vertically on the mounting plate 3. A fixing frame 52 is provided on the vertical motion module 51, and the bottom end of the fixing frame 52 is connected to the rotating platform 54. The bottom end of the rotating platform 54 is connected to the horizontal motion module 53. A base plate 59 is connected to the bottom end of the horizontal motion module 53, and the bottom end of the base plate 59 is adjustablely connected to the probe testing plate 55. A micrometer adjustment platform 56 is provided on one side of the horizontal motion module 53. A second camera 57 and a refractive prism 58 are provided between the horizontal motion module 53 and the base plate 59. The base plate 59 has a through hole, and the refractive prism 58 is located directly above the through hole. The second camera 57 and the refractive prism 58 are located on the same horizontal line.

[0027] In practice, by controlling the x-axis motion module 1 and the y-axis motion module 2, after the probe testing mechanism 5 is positioned above the resistor to be tested, the vertical motion module 51, the horizontal motion module 53, and the rotating platform 54 can be precisely controlled using the specific position information of the resistor obtained by the first camera 41, so that the probe testing plate 55 can be docked with the resistor as accurately as possible. Furthermore, preferably, the operator can observe the docking operation through the through-hole using a refracting prism 58 and a second camera 57, and further adjust the position of the probe testing plate 55 using a micrometer adjusting platform 56, thereby further improving the accuracy of the docking.

[0028] In summary, the docking accuracy between the probe plate and the resistor is improved through the coordinated operation of a multi-dimensional motion module and a visual positioning mechanism. Specifically, the device includes motion modules arranged along the x-axis and y-axis. A mounting plate 3 on these modules simultaneously houses a photographic positioning mechanism 4 and a probe testing mechanism 5. The photographic positioning mechanism 4 uses a camera and a light source 42 to acquire the specific position information of the resistor, providing precise coordinate references for subsequent docking operations. The probe testing mechanism 5 consists of a vertical motion module 51, a horizontal motion module 53, and a rotating platform 54, capable of adjusting the height, finely adjusting the horizontal position, and correcting the angle of the probe testing plate 55, thereby achieving fine adjustment of the docking position in multiple degrees of freedom. Furthermore, with the auxiliary observation of a refracting prism 58 and a second camera 57, and the secondary fine-tuning function of a micrometer adjustment platform 56, operators can monitor and correct the docking status of the probe and resistor in real time, ensuring docking accuracy. This effectively solves the problem of misalignment between the probe plate and the resistor during batch testing due to positional or angular deviations in existing technologies, thereby ensuring the accuracy and reliability of the resistance testing process, avoiding repeated operations and test failures, and improving overall testing efficiency and product quality.

[0029] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A probe testing device, characterized in that, The device includes an x-axis motion module, a y-axis motion module, and a mounting plate. The y-axis motion module is mounted on the x-axis motion module, and the mounting plate is mounted on the y-axis motion module. The mounting plate is equipped with a photographing and positioning mechanism and a probe testing mechanism. The probe testing mechanism includes a vertical motion module, a horizontal motion module, a rotating platform, and a probe testing plate. The vertical motion module drives the probe testing plate to move vertically, the horizontal motion module drives the probe testing plate to move horizontally, and the rotating platform is used to adjust the rotation angle of the probe testing plate.

2. The probe testing device according to claim 1, characterized in that, The photo positioning mechanism includes a first camera and a light source, the first camera and the light source are arranged on the same vertical line, and the light source is located directly below the first camera.

3. The probe testing device according to claim 1, characterized in that, The vertical motion module is mounted on the mounting plate, and a fixed frame is provided on the vertical motion module. The rotating platform is located at the bottom end of the fixed frame. The horizontal motion module is located at the bottom end of the rotating platform and is connected to a base plate. The base plate is located at the bottom end of the horizontal motion module, and the probe test plate is located at the bottom end of the base plate.

4. The probe testing device according to claim 3, characterized in that, The horizontal motion module is equipped with a micrometer adjustment platform on one side.

5. The probe testing device according to claim 3, characterized in that, A second camera and a refractive prism are provided between the horizontal motion module and the base plate. The base plate has a through hole, and the refractive prism is located directly above the through hole. The second camera and the refractive prism are located on the same horizontal line.

6. The probe testing apparatus according to claim 3, characterized in that, The probe test plate is adjustable and set at the bottom end of the base plate.

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