A semiconductor probe that is easy to install

Abstract

The utility model relates to the technical field of semiconductor probe, and disclose a kind of semiconductor probe of being convenient for installation, including mounting seat, the top of mounting seat is equipped with top cover, the inner chamber of mounting seat is movably sleeved with probe body, the outer wall of probe body is equipped with locking slot, the outer wall of probe body is fixedly equipped with fixed plate, the bottom of mounting seat is fixedly equipped with limit post.This semiconductor probe of being convenient for installation, by the limit rod and locking block being set in the inner chamber of mounting seat, under the action of drive spring, the drive of locking block can be realized, so that when installing probe body, it can enter into mounting seat, so that locking block enters into locking slot, so as to realize the locking of probe body, realize the installation of probe body, and when needing to disassemble probe body, only need to push drive plate, realize the drive of fixed rod and locking block, release the locking of probe body.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor probe technology, specifically to a semiconductor probe that is easy to install. Background Technology

[0002] Semiconductor probes are core contact elements in the research, development, production, and testing of semiconductor chips. Their main function is to achieve precise electrical connections between external testing equipment and the internal circuits / pins of the chip. They are used to transmit electrical signals, detect electrical performance, or complete interconnections in wafer-level packaging. They are key components for ensuring chip yield and performance reliability.

[0003] Traditional semiconductor probes require multiple micro-screws to secure them during installation and removal, which makes installation and removal inconvenient and prevents convenient and flexible installation and removal. Utility Model Content

[0004] To address the shortcomings of existing technologies, this invention provides a semiconductor probe that is easy to install and convenient to use, thus solving the problems mentioned in the background section.

[0005] This utility model provides the following technical solution: a semiconductor probe that is easy to install, including a mounting base, a top cover mounted on the top of the mounting base, a probe body movably sleeved in the inner cavity of the mounting base, a locking groove formed on the outer wall of the probe body, a fixing plate fixedly mounted on the outer wall of the probe body, a limiting post fixedly mounted on the bottom of the mounting base, a limiting rod fixedly mounted on the inner wall of the mounting base, a driving spring movably sleeved on the outer wall of the limiting rod, a locking block movably sleeved on the outer wall of the limiting rod, a fixing rod fixedly mounted on the top of the locking block, a rotating plate rotatably connected to the outer wall of the fixing rod, a driving plate movably sleeved on the top of the mounting base, a rotating box rotatably connected to the outer wall of the mounting base, an L-shaped plate movably sleeved in the inner cavity of the rotating box, a guide rod fixedly mounted on the outer wall of the rotating box, and a tension spring movably sleeved on the outer wall of the guide rod.

[0006] As a preferred technical solution of this utility model: the inner wall shape of the locking groove matches the outer wall shape of the locking block, and the limiting post passes through the inner cavity of the fixing plate.

[0007] As a preferred technical solution of this utility model: the two ends of the outer wall of the drive spring are in contact with the outer wall of the locking block and the inner wall of the mounting base, respectively, and the drive spring is made of high carbon steel.

[0008] As a preferred technical solution of this utility model: there are two locking blocks, and the two locking blocks are respectively movably sleeved on both sides of the inner cavity of the mounting base.

[0009] As a preferred technical solution of this utility model: the two ends of the outer wall of the tension spring are respectively connected to the outer wall of the L-shaped plate and the outer wall of the guide rod, and the tension spring is made of high carbon steel.

[0010] As a preferred technical solution of this utility model: the L-shaped plate is movably sleeved on the outer wall of the limiting post, and the shape of the outer wall of the L-shaped plate matches the shape of the inner wall of the rotating box.

[0011] Compared with the prior art, the present invention has the following beneficial effects: 1. This easy-to-install semiconductor probe, through the limiting rod and locking block set in the inner cavity of the mounting base, can realize the driving of the locking block under the action of the drive spring, so that when installing the probe body, it can enter into the mounting base, thereby allowing the locking block to enter the locking groove, thus locking the probe body and realizing the installation of the probe body. When it is necessary to remove the probe body, it is only necessary to push the drive plate to drive the fixing rod and locking block, thereby releasing the locking of the probe body.

[0012] 2. This easy-to-install semiconductor probe, through the setting of a rotating box and an L-shaped plate, by fitting the L-shaped plate onto the outer wall of the limiting post, thereby restricting the fixing plate under the action of the L-shaped plate, so that the probe body can be locked and restricted by the limiting block and the fixing plate, thereby improving the convenience of installing and disassembling the probe body. Attached Figure Description

[0013] Figure 1 This is a three-dimensional structural diagram of the present invention; Figure 2 This is a schematic diagram of the mounting base structure of this utility model; Figure 3 This is a schematic diagram of the cross-sectional structure of the mounting base of this utility model; Figure 4 This is a schematic diagram of the probe body structure of this utility model; Figure 5 This is a schematic diagram of the rotating box structure of this utility model; Figure 6 This is a schematic diagram of the L-shaped plate structure of this utility model.

[0014] In the diagram: 1. Mounting base; 2. Top cover; 3. Probe body; 4. Locking groove; 5. Fixing plate; 6. Limiting post; 7. Limiting rod; 8. Drive spring; 9. Locking block; 10. Fixing rod; 11. Rotating plate; 12. Drive plate; 13. Rotating box; 14. L-shaped plate; 15. Guide rod; 16. Tension spring. Detailed Implementation

[0015] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0016] Please see Figure 1 - Figure 6 A semiconductor probe that is easy to install includes a mounting base 1, a top cover 2 mounted on the top of the mounting base 1, a probe body 3 movably sleeved in the inner cavity of the mounting base 1, a locking groove 4 opened on the outer wall of the probe body 3, a fixing plate 5 fixedly mounted on the outer wall of the probe body 3, a limiting post 6 fixedly mounted on the bottom of the mounting base 1, a limiting rod 7 fixedly mounted on the inner wall of the mounting base 1, a driving spring 8 movably sleeved on the outer wall of the limiting rod 7, a locking block 9 movably sleeved on the outer wall of the limiting rod 7, a fixing rod 10 fixedly mounted on the top of the locking block 9, a rotating plate 11 rotatably connected to the outer wall of the fixing rod 10, a driving plate 12 movably sleeved on the top of the mounting base 1, a rotating box 13 rotatably connected to the outer wall of the mounting base 1, an L-shaped plate 14 movably sleeved in the inner cavity of the rotating box 13, a guide rod 15 fixedly mounted on the outer wall of the rotating box 13, and a tension spring 16 movably sleeved on the outer wall of the guide rod 15. In the above structure, the locking block 9 provided in the inner cavity of the mounting base 1 can be pushed by the driving spring 8, so that the locking block 9 can enter the inner cavity of the locking groove 4. Then, the locking block 9 restricts the probe body 3 under the action of the locking block 9, so as to achieve the effect of pre-fixing the probe body 3 and ensure the fixation effect of the probe body 3.

[0017] In a preferred embodiment: the inner wall shape of the locking groove 4 matches the outer wall shape of the locking block 9, and the limiting post 6 passes through the inner cavity of the fixing plate 5; In the above structure, the driving spring 8 provided on the outer wall of the limiting rod 7 can drive the locking block 9 under the action of the driving spring 8, so that the locking block 9 enters the inner cavity of the locking groove 4, thereby restricting and locking the probe body 3 under the action of the locking block 9, so that the probe body 3 is locked and installed in the inner cavity of the mounting base 1.

[0018] In a preferred embodiment: the two ends of the outer wall of the drive spring 8 are in contact with the outer wall of the locking block 9 and the inner wall of the mounting base 1, respectively, and the drive spring 8 is made of high carbon steel; In the above structure, by setting locking blocks 9 on both sides of the inner cavity of the mounting base 1, when the probe body 3 is installed, the locking blocks 9 are pushed into the inner cavity of the mounting base 1 by the action of the top of the probe body 3, so that the probe body 3 can smoothly enter the inner cavity of the mounting base 1. The probe body 3 is continuously pushed until the locking blocks 9 enter the inner cavity of the locking groove 4, thereby locking the probe body 3 under the action of the locking blocks 9.

[0019] In a preferred embodiment, there are two locking blocks 9, and the two locking blocks 9 are respectively movably sleeved on both sides of the inner cavity of the mounting base 1; In the above structure, by setting locking blocks 9 on both sides of the inner cavity of the mounting base 1, when the probe body 3 is pushed to move, the locking blocks 9 on both sides can enter the inner cavity of the locking groove 4 respectively, thereby locking the probe body 3 from both sides, ensuring the locking installation of the probe body 3, and making the installation operation of the probe body 3 convenient.

[0020] In a preferred embodiment: the two ends of the outer wall of the tension spring 16 are respectively connected to the outer wall of the L-shaped plate 14 and the outer wall of the guide rod 15, and the tension spring 16 is made of high carbon steel; In the above structure, by setting an L-shaped plate 14 in the inner cavity of the rotating box 13, the L-shaped plate 14 is sleeved on the outer wall of the limiting post 6, thereby limiting the fixing plate 5 under the action of the L-shaped plate 14, so that the probe body 3 and the fixing plate 5 can be installed more stably at the bottom of the mounting base 1, and the probe body 3 can be locked more stably.

[0021] In a preferred embodiment: the L-shaped plate 14 is movably sleeved on the outer wall of the limiting post 6, and the shape of the outer wall of the L-shaped plate 14 matches the shape of the inner wall of the rotating box 13. In the above structure, by using the rotating box 13 and the L-shaped plate 14, when it is necessary to disassemble the probe body 3, the L-shaped plate 14 is pulled down to disengage from the outer wall of the limiting post 6. After the L-shaped plate 14 is disengaged, the L-shaped plate 14 and the rotating box 13 can be rotated to release the lock on the fixing plate 5, so that the probe body 3 can be installed and disassembled.

[0022] Working principle: During the use of the above equipment, when it is necessary to install or remove the probe body 3, the probe body 3 is pushed upwards, causing it to enter the inner cavity of the mounting base 1. As the probe body 3 moves upwards, its outer wall pushes the locking block 9, causing it to move along the outer wall of the limiting rod 7. This causes the locking block 9 to retract into the inner cavity of the mounting base 1, compressing the drive spring 8 and continuously pushing the probe body 3 until the locking block 9 enters the inner cavity of the locking groove 4. At this point, the locking block 9 locks and restricts the probe body 3. Then, by pulling the L-shaped plate 14 and rotating the rotating box 13, The L-shaped plate 14 is positioned so that it corresponds to the position of the limiting post 6. Then, the L-shaped plate 14 is released so that its outer wall fits against the outer wall of the fixing plate 5, thereby installing the probe body 3. Similarly, when the probe body 3 needs to be disassembled, the L-shaped plate 14 is pulled and the rotating box 13 is rotated so that the L-shaped plate 14 is disengaged from the outer wall of the limiting post 6. Then, the drive plate 12 is pushed so that it moves along the top of the mounting base 1, thereby driving the rotating plate 11 to rotate and drive the fixing rod 10. This causes the fixing rod 10 to disengage from the inner cavity of the locking groove 4, releasing the locking of the probe body 3 and thus enabling the disassembly of the probe body 3.

[0023] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A semiconductor probe that is easy to install, comprising a mounting base (1), characterized in that: A top cover (2) is installed on the top of the mounting base (1). A probe body (3) is movably sleeved in the inner cavity of the mounting base (1). A locking groove (4) is opened on the outer wall of the probe body (3). A fixing plate (5) is fixedly installed on the outer wall of the probe body (3). A limit post (6) is fixedly installed at the bottom of the mounting base (1). A limit rod (7) is fixedly installed on the inner wall of the mounting base (1). A drive spring (8) is movably sleeved on the outer wall of the limit rod (7). A lock is movably sleeved on the outer wall of the limit rod (7). The top of the locking block (9) is fixedly fitted with a fixing rod (10), the outer wall of the fixing rod (10) is rotatably connected with a rotating plate (11), the top of the mounting base (1) is movably sleeved with a driving plate (12), the outer wall of the mounting base (1) is rotatably connected with a rotating box (13), the inner cavity of the rotating box (13) is movably sleeved with an L-shaped plate (14), the outer wall of the rotating box (13) is fixedly fitted with a guide rod (15), and the outer wall of the guide rod (15) is movably sleeved with a tension spring (16).

2. The semiconductor probe for easy installation according to claim 1, characterized in that: The inner wall shape of the locking groove (4) matches the outer wall shape of the locking block (9), and the limiting post (6) passes through the inner cavity of the fixing plate (5).

3. The semiconductor probe for easy installation according to claim 1, characterized in that: The two ends of the outer wall of the drive spring (8) are in contact with the outer wall of the locking block (9) and the inner wall of the mounting base (1), respectively, and the drive spring (8) is made of high carbon steel.

4. A semiconductor probe that is easy to install according to claim 1, characterized in that: There are two locking blocks (9), and the two locking blocks (9) are respectively movably sleeved on both sides of the inner cavity of the mounting base (1).

5. A semiconductor probe for easy installation according to claim 1, characterized in that: The two ends of the outer wall of the tension spring (16) are connected to the outer wall of the L-shaped plate (14) and the outer wall of the guide rod (15), respectively, and the tension spring (16) is made of high carbon steel.

6. A semiconductor probe for easy installation according to claim 1, characterized in that: The L-shaped plate (14) is movably sleeved on the outer wall of the limiting post (6), and the outer wall shape of the L-shaped plate (14) matches the inner wall shape of the rotating box (13).

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