Wafer Inspection Probe Card
CN309113258SActive Publication Date: 2025-02-14ONE-TECH (WUXI) CO LTD
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Patent Information
- Application Number
- CN202430432247.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-11
- Publication Date
- 2025-02-14
- Estimated Expiration
- 2039-07-11
Smart Images
Figure 000001_ABST
Abstract
1. The name of the product of this design: wafer inspection probe card. 2. The purpose of this design product: to realize signal transmission between test equipment and wafer. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the key points of the design: main view. 5. This design product is a thin product, and other views are omitted.
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