Semiconductor device testing, marking and taping machine (gravity type)
CN309131168SActive Publication Date: 2025-02-21FUZHOU PALIDE ELECTRONICS TECH
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Patent Information
- Application Number
- CN202430421552.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-06
- Publication Date
- 2025-02-21
- Estimated Expiration
- 2039-07-06
Smart Images
Figure 000006_ABST
Abstract
1. The name of the product of this design: Semiconductor device testing, marking and taping machine (gravity type). 2. Purpose of this design product: used for testing, marking and taping of semiconductor devices. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. The bottom surface of this design product is a part that is not easily visible or cannot be seen when in use, so the top view is omitted.
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