Profilometer
CN309161799SActive Publication Date: 2025-03-11SHANGHAI YECHI INSTR TECH CO LTD
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Patent Information
- Application Number
- CN202430498283.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-07
- Publication Date
- 2025-03-11
- Estimated Expiration
- 2039-08-07
Smart Images
Figure 000003_ABST
Abstract
1. The name of the product under this design: Contour meter. 2. Purpose of this design product: used to precisely measure the profile roughness and dimensions of the product surface. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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