Photovoltaic wafer defect online detector
CN309267855SActive Publication Date: 2025-05-02HUNAN KELUODE TECH CO LTD
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Patent Information
- Application Number
- CN202430489409.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-02
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2039-08-02
Smart Images
Figure 000007_ABST
Abstract
1. The name of the product of this design: Online detector for defects in photovoltaic wafers. 2. Purpose of the product of this design: to detect defects in solar ultra-clear rolled original glass online, and to automatically classify and judge the defects according to their characteristics. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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