Wafer Contact Angle Measuring Instrument (1)
CN309328586SActive Publication Date: 2025-06-10DONGGUAN SHENGDING PRECISION INSTR CO LTD
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Patent Information
- Application Number
- CN202430659705.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-18
- Publication Date
- 2025-06-10
- Estimated Expiration
- 2039-10-18
Smart Images
Figure 000008_ABST
Abstract
1. Name of the design product: Wafer Contact Angle Measuring Instrument (1). 2. Use of the design product: For anti-interference in contact angle measurement of the wetting performance of the wafer surface. 3. Design key points of the design product: Lies in the shape. 4. Picture or photo that best shows the design key points: Perspective view 1.
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