Spring portion of the probe for conduction inspection

Abstract

1. Name of the design product: Spring part of the probe for conduction inspection. 2. Use of the design product: The overall product is a probe for conduction inspection, used for conduction inspection of inspection objects such as liquid crystal panels, semiconductor devices, substrates, etc. in the technical field of products that require confirmation of electrical conduction, such as electrified products, electrical and electronic equipment; the claimed part is its spring part, which is used for elastic deformation when the contact part contacts the inspection substrate and the inspection object. 3. Design key points of the design product: lie in the shape of the claimed part. 4. Picture or photograph that best shows the design key points: Perspective view 1 of Design 1. 5. The rear views of each design are symmetrical to the front views, and the rear views of each design are omitted. 6. Design 1 is designated as the basic design. 7. Other circumstances that need to be explained: Other explanations: Each design is a partial design. The red transparent covering part in the view is the part that is not claimed, and the color is not claimed.

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