Test the end of the probe barrel

CN309434697SActive Publication Date: 2025-08-12LEENO IND INC
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Patent Information

Application Number
CN202430615980.0
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-09-27
Publication Date
2025-08-12
Estimated Expiration
2039-09-27

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Abstract

1. The name of this design product: the end of the test probe tube. 2. Purpose of the product of this design: The overall purpose of this application is a test probe tube for testing the electrical properties of substrates or semiconductors used in the information technology (IT) field; the local purpose of this application is the end of the test probe tube. 3. The key design features of this design product lie in the shape shown by the solid line. 4. The picture or photo that best illustrates the design points: three-dimensional picture. 5. Other situations that require explanation Other explanations: The solid line portion is the portion for which protection is claimed, the dotted line represents the portion for which protection is not claimed, and the dot-dash line represents the dividing line between the portion for which protection is claimed and the portion for which protection is not claimed.
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