Full-automatic sampling and preparing system for gaseous metal impurities
CN309653062SActive Publication Date: 2025-12-05SHIGAO (BEIJING) INTELLIGENT TECH CO LTD
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Patent Information
- Application Number
- CN202530151745.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-26
- Publication Date
- 2025-12-05
- Estimated Expiration
- 2040-03-26
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: gas metal impurities full-automatic sampling preparation system. 2. The use of the design product: for impurity detection and analysis of semiconductor, electronic special gas, high-purity gas and other samples. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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