Laser gyro dynamic lock range test system graphical user interface for electronic devices

Abstract

1. The name of the design product: graphical user interface of laser gyro dynamic lock area test system for electronic device. 2. The use of the design product: for running laser gyro dynamic lock area test system program and displaying information on electronic device. 3. The design points of the design product: graphical user interface on electronic device. 4. The picture or photo that best shows the design points: front view. 5. The electronic device is a common design, and the rear view, left view, right view, top view and bottom view are omitted. 6. The use of the graphical user interface: after opening the software, enter the main view, the system automatically searches for test equipment, each test equipment searched has 4 channels, which correspond to 4 cells respectively, as shown in [interface change state diagram 1]; click "test setting" in the upper left corner of [interface change state diagram 1], three options are popped up, as shown in [interface change state diagram 2], select the dynamic lock test option, and the dynamic lock area test pop-up sub-interface shown in [interface change state diagram 3] is popped up, the dynamic lock area test pop-up interface displays the temperature monitoring state of the oven and the monitoring state of the single-axis turntable, in the test setting column of [interface change state diagram 3], select the oven, and set the oven temperature, temperature change rate, waiting time, start pulse, end pulse and turntable speed in the test setting column, and check the unit channel that needs to be tested in the dynamic lock area automatic test column, in this example, it is the No. 1 unit channel, as shown in [interface change state diagram 4], click the start test button, enter [interface change state diagram 5], a channel unit confirmation pop-up window is popped up, click the confirm button of the pop-up window to confirm the selected test channel, the system will enter the automatic test, after starting the test, the oven will first change the temperature to the oven temperature set in the test setting, and display the remaining time of the temperature change, as shown in [interface change state diagram 6]; after the temperature reaches the target temperature of the oven set in the test setting, start waiting for the set waiting time, and display the remaining waiting time, as shown in [interface change state diagram 7]; after the waiting time is over, the system automatically opens the selected test unit channel, in this example, it is the No. 1 unit channel, starts data collection, and displays on the test interface, as shown in [interface change state diagram 8], in order to view the state change of the main interface, the dynamic lock area test pop-up sub-interface in [interface change state diagram 8] is minimized; at the same time when the channel is automatically opened, the turntable automatically returns to zero position, the current position in the turntable state column of the dynamic lock area test pop-up interface displays 0°, as shown in [interface change state diagram 9], and the system background automatically starts to find the corresponding start position and end position of the turntable according to the set start pulse and end pulse, after the background calculates the start position and end position, the turntable first returns to the start position, and displays in the turntable state column of the dynamic lock area test pop-up interface, as shown in [interface change state diagram 10], after the turntable returns to the start position, it starts to move to the end position at 0.01 / s, at this time, the position to position indicator in the state of the turntable is off, the running indicator is on, the turntable returns to the starting position, at the same time, the test interface unit 1 is cleared, from this moment, the digital gyroscope test data is collected and stored again, as shown in [interface change state diagram 11], for the convenience of viewing the main interface state change, the dynamic lock area test pop-up window sub-interface is minimized in [interface change state diagram 11]; the collected points are displayed on the dynamic lock area test result column of the dynamic lock area test pop-up window sub-interface after 20 s sliding average, and the calculated fitting straight line is displayed synchronously, as shown in [interface change state diagram 12], until the turntable moves to the end position; after the turntable moves to the end position, the dynamic lock area test is completed, the lock area position is calculated automatically and displayed on the fitting curve, as shown in [interface change state diagram 13]; clicking the data record button on the dynamic lock area test result column of [interface change state diagram 13], the saved test data file and the calculated starting position and inflection point corresponding to the lock area can be seen on the displayed data record sub-page, as shown in [interface change state diagram 14], after minimizing the dynamic lock area test pop-up window interface, the original curve of the collected data in this test can also be seen on the test interface, as shown in [interface change state diagram 15].

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