Chip Aging Tester (CYC-590)
CN309682162SActive Publication Date: 2025-12-19SHANGHAI QITAI FENHUA SEMICON TECH CO LTD
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Patent Information
- Application Number
- CN202530268992.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-14
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2040-05-14
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: chip aging test machine (CYC-590). 2. The use of the design product: for storing chip aging test. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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