Replaceable plug-in test probe
CN309791766SActive Publication Date: 2026-02-13承盛航空测试科技(苏州)有限公司
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Patent Information
- Application Number
- CN202530406041.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-11
- Publication Date
- 2026-02-13
- Estimated Expiration
- 2040-07-11
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Figure 000007_ABST
Abstract
1. The name of the design product: replaceable plug-in test probe. 2. The use of the design product: the design product is used for chip testing. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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