Main body of semiconductor wafer testing apparatus
CN309974888SActive Publication Date: 2026-05-12CHROMA ATE INC
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- CHROMA ATE INC
- Filing Date
- 2025-09-16
- Publication Date
- 2026-05-12
Smart Images
Figure 000007_ABST
Abstract
1. Name of the designed product: main body of semiconductor wafer testing equipment. 2. Use of the designed product: the whole product is used for semiconductor wafer testing equipment, and the part to be protected is used for the main body of the product. 3. Design points of the designed product: in shape. 4. Picture or photo best showing the design points: perspective view 1.
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