Probe testing all-in-one machine
CN310053994SActive Publication Date: 2026-06-26SHENZHEN IN CUBE AUTOMATION
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHENZHEN IN CUBE AUTOMATION
- Filing Date
- 2025-11-20
- Publication Date
- 2026-06-26
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: probe test all-in-one machine. 2. The use of the design product: for semiconductor chip testing. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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