Test head of the testing machine
CN310129833SActive Publication Date: 2026-08-04HANGZHOU CHANGCHUAN TECH CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- HANGZHOU CHANGCHUAN TECH CO LTD
- Filing Date
- 2025-12-31
- Publication Date
- 2026-08-04
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Test head of a testing machine. 2. Purpose of this design: To be installed on a testing machine for testing the electrical parameters of the device under test (e.g., a chip). 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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